Measuring inductance or capacitance Measuring quality factor

Industry

CPC
G01R27/26

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom

Current Industry

G01R27/26Measuring inductance or capacitance Measuring quality factor

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Inductive sensing methods, devices and systems
- Patent number 12,326,467
- Issue date Jun 10, 2025
- Cypress Semiconductor Corporation
- Andriy Maharyta
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Display substrates, display apparatuses and methods of detecting cr...
- Patent number 12,326,412
- Issue date Jun 10, 2025
- Chengdu BOE Optoelectronics Technology Co., Ltd.
- Tingliang Liu
- G01 - MEASURING TESTING
Information Patent Grant
Combined processing of borehole imagers and dielectric tools
- Patent number 12,326,389
- Issue date Jun 10, 2025
- Halliburton Energy Services, Inc.
- Ahmed Fouda
- E21 - EARTH DRILLING MINING
Information Patent Grant
Aerosol-generating device for detecting insertion of aerosol-genera...
- Patent number 12,317,935
- Issue date Jun 3, 2025
- KT & G Corporation
- Yong Hwan Kim
- A24 - TOBACCO CIGARS CIGARETTES SMOKERS' REQUISITES
Information Patent Grant
Method and apparatus for determining gate capacitance
- Patent number 12,313,663
- Issue date May 27, 2025
- Microsoft Technology Licensing, LLC
- Jonne Verneri Koski
- G01 - MEASURING TESTING
Information Patent Grant
Capacitance measurement circuit
- Patent number 12,313,664
- Issue date May 27, 2025
- ELITE SEMICONDUCTOR MICROELECTRONICS TECHNOLOGY INC.
- Yi-Chou Huang
- G01 - MEASURING TESTING
Information Patent Grant
Theft detection and prevention in a power generation system
- Patent number 12,306,215
- Issue date May 20, 2025
- Solaredge Technologies Ltd.
- Guy Sella
- G01 - MEASURING TESTING
Information Patent Grant
Sensor apparatus and water amount measurement apparatus
- Patent number 12,306,115
- Issue date May 20, 2025
- Sony Group Corporation
- Atsushi Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Measuring DC link capacitance in power conversion systems
- Patent number 12,306,266
- Issue date May 20, 2025
- Rockwell Automation Technologies, Inc.
- Zhongyuan Cheng
- G01 - MEASURING TESTING
Information Patent Grant
System and method for determining the impedance properties of a loa...
- Patent number 12,298,334
- Issue date May 13, 2025
- Essam Samir Elsahwi
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of tissue viability
- Patent number 12,290,377
- Issue date May 6, 2025
- BBI Medical Innovations, LLC
- Martin F. Burns
- G01 - MEASURING TESTING
Information Patent Grant
Far field interference cancellation for resistive-inductive-capacit...
- Patent number 12,295,102
- Issue date May 6, 2025
- Cirrus Logic Inc.
- Zhong You
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inductance measurement circuits and methods using auto-adaptive flo...
- Patent number 12,292,462
- Issue date May 6, 2025
- Infineon Technologies AG
- Koami Kpoto
- G01 - MEASURING TESTING
Information Patent Grant
Noise measurements with a capacitance sensor
- Patent number 12,287,940
- Issue date Apr 29, 2025
- Cirque Corporation
- Brian Monson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for determination of capacitive and resistive characteris...
- Patent number 12,276,686
- Issue date Apr 15, 2025
- Micron Technology, Inc.
- Dan Xu
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods and systems for estimating coil impedance of an electromagn...
- Patent number 12,276,687
- Issue date Apr 15, 2025
- Cirrus Logic Inc.
- Emmanuel Marchais
- G01 - MEASURING TESTING
Information Patent Grant
Inductive broad-band sensors for electromagnetic waves
- Patent number 12,272,532
- Issue date Apr 8, 2025
- COMET Technologies USA, Inc.
- Stephen E. Savas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methodology for measuring dielectric and magnetic material properties
- Patent number 12,270,845
- Issue date Apr 8, 2025
- Pingshan Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for measuring microwave surface resistance of die...
- Patent number 12,265,109
- Issue date Apr 1, 2025
- University of Electronic Science and Technology of China
- Cheng Zeng
- G01 - MEASURING TESTING
Information Patent Grant
On-chip capacitance measurement method and apparatus
- Patent number 12,265,108
- Issue date Apr 1, 2025
- Qorvo US, Inc.
- Alexandru Aurelian Ciubotaru
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Nano-power capacitance-to-digital converter
- Patent number 12,254,155
- Issue date Mar 18, 2025
- Cypress Semiconductor Corporation
- Paul M. Walsh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuits and methods to calibrate mirror displacement
- Patent number 12,253,356
- Issue date Mar 18, 2025
- Texas Instruments Incorporated
- Robert Floyd Payne
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Zero excess energy storage transformer
- Patent number 12,249,981
- Issue date Mar 11, 2025
- QUANTUM POWER TRANSFORMATION LIMITED
- Robert William Gwynne
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Determination of an unbalanced load in a high-voltage system and re...
- Patent number 12,248,006
- Issue date Mar 11, 2025
- MERCEDES-BENZ GROUP AG
- Tobias Aurand
- G01 - MEASURING TESTING
Information Patent Grant
Capacitor measurement
- Patent number 12,241,946
- Issue date Mar 4, 2025
- STMicroelectronics S.r.l.
- Davide Argento
- G01 - MEASURING TESTING
Information Patent Grant
Dielectric-constant measuring device
- Patent number 12,241,853
- Issue date Mar 4, 2025
- ENDRESS+HAUSER SE+CO.KG
- Thomas Blödt
- G01 - MEASURING TESTING
Information Patent Grant
Diagnostic device for the characterization of electromagnetic mater...
- Patent number 12,235,335
- Issue date Feb 25, 2025
- United States of America as represented by the Secretary of the Air Force
- Andrew J. Hamilton
- G01 - MEASURING TESTING
Information Patent Grant
Detection circuit, appliance and control method
- Patent number 12,235,298
- Issue date Feb 25, 2025
- Guangdong Midea White Home Appliance Technology Innovation Center Co., Ltd.
- Kunren Yin
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive-sensing rotary encoder
- Patent number 12,228,432
- Issue date Feb 18, 2025
- Texas Instruments Incorporated
- Lichang Cheng
- G01 - MEASURING TESTING
Information Patent Grant
System and method of measuring capacitance of device-under-test
- Patent number 12,228,598
- Issue date Feb 18, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Mao-Hsuan Chou
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Circuit arrangement for evaluating an output signal, and sensor device
- Publication number 20250189611
- Publication date Jun 12, 2025
- Balluff GmbH
- Marton Palmann
- G01 - MEASURING TESTING
Information Patent Application
CIRCUITS AND METHODS TO CALIBRATE MIRROR DISPLACEMENT
- Publication number 20250189291
- Publication date Jun 12, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Robert Floyd Payne
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
CIRCUIT AND METHOD FOR MEASURING AND TUNING QUALITY FACTOR OF RESON...
- Publication number 20250180615
- Publication date Jun 5, 2025
- MEDIATEK INC.
- Yunzhi Dong
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Component with one or more electrically conductive patterns for an...
- Publication number 20250185170
- Publication date Jun 5, 2025
- JET METAL TECHNOLOGIES
- Samuel Paul Henry STREMSDOERFER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTIVELY ENHANCING THE RESONANCE FREQUENCY AND QUALITY FACTORY O...
- Publication number 20250174399
- Publication date May 29, 2025
- Dell Products L.P.
- Tejinder Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR ESTIMATING IMPEDANCE OF CONVERTER OUTPUT ELEMENT
- Publication number 20250164534
- Publication date May 22, 2025
- POSTECH Research and Business Development Foundation
- Suyong CHAE
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PARAMETER EXTRACTION OF SENSITIVE PROBE AND DEGREE-OF-FR...
- Publication number 20250155482
- Publication date May 15, 2025
- HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Hong Ma
- G01 - MEASURING TESTING
Information Patent Application
BATTERY MONITORING SYSTEMS WITH DIRECT ELECTRICAL CONNECTION FOR CA...
- Publication number 20250158254
- Publication date May 15, 2025
- GM GLOBAL TECHNOLOGY OPERATIONS LLC
- Michael P. BALOGH
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OF TISSUE VIABILITY
- Publication number 20250152089
- Publication date May 15, 2025
- BBI MEDICAL INNOVATIONS, LLC
- Martin F. BURNS
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SEMICONDUCTOR MEASUREMENT DEVICE AND SEMICONDUCTOR MEASUREMENT METHOD
- Publication number 20250155483
- Publication date May 15, 2025
- RENESAS ELECTRONICS CORPORATION
- Takehiro UEDA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS WITH FREQUENCY CHARACTERISTICS ANALYSIS OF PRI...
- Publication number 20250155484
- Publication date May 15, 2025
- Samsung Electronics Co., Ltd.
- Doyun KIM
- G01 - MEASURING TESTING
Information Patent Application
RATING SUBSTRATE SUPPORT ASSEMBLIES BASED ON IMPEDANCE CIRCUIT ELEC...
- Publication number 20250157788
- Publication date May 15, 2025
- Applied Materials, Inc.
- Arvind Shankar Raman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FERROELECTRIC SENSOR
- Publication number 20250146880
- Publication date May 8, 2025
- TDK Electronics AG
- Sandro Kappert
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
SYSTEM AND METHOD OF MEASURING CAPACITANCE OF DEVICE-UNDER-TEST
- Publication number 20250147086
- Publication date May 8, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- MAO-HSUAN CHOU
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR IN-SITU MEASUREMENT OF MUTUTAL INDUCTANCE...
- Publication number 20250138071
- Publication date May 1, 2025
- The Boeing Company
- Aaron James BLUESTONE
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ELECTRONIC DEVICE HAVING A TESTING METHOD FOR DETERMINING DEFECTS I...
- Publication number 20250138070
- Publication date May 1, 2025
- SAMSUNG DISPLAY CO., LTD.
- EUNSOL SEO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CIRCUIT FOR OPERATING A CAPACITIVE SENSOR AND SENSOR APPARATUS
- Publication number 20250130260
- Publication date Apr 24, 2025
- ROBERT BOSCH GmbH
- Alice Lanniel
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SENSOR CONTROLLER, ELECTRONIC DEVICE, AND CONTROL METHOD OF SENSOR...
- Publication number 20250123708
- Publication date Apr 17, 2025
- WACOM CO., LTD.
- Kenichi ONO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SENSOR CIRCUIT HAVING A COMPENSATING RESISTOR FOR COMPENSATING A TE...
- Publication number 20250110160
- Publication date Apr 3, 2025
- INFINEON TECHNOLOGIES AG
- Michael EMMERT
- G01 - MEASURING TESTING
Information Patent Application
SOLAR CELL TEST METHOD, SOLAR CELL TEST DEVICE AND COMPUTER-READABL...
- Publication number 20250112591
- Publication date Apr 3, 2025
- WAVELABS SOLAR METROLOGY SYSTEMS GMBH
- Donald Andrew Locker CLUGSTON
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
METHOD AND DEVICE FOR SLOT GENERATION IN WIRELESS POWER TRANSMISSIO...
- Publication number 20250105678
- Publication date Mar 27, 2025
- LG ELECTRONICS INC.
- Taewook KWON
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
COMPLEX DIELECTRIC CONSTANT SENSING SYSTEM AND METHOD
- Publication number 20250102551
- Publication date Mar 27, 2025
- Taibah University
- Muhammad Amin
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT AND METHOD FOR MEASURING CAPACITANCE AND CAPACITANCE-VOLTAG...
- Publication number 20250085322
- Publication date Mar 13, 2025
- CENTRAL CHINA NORMAL UNIVERSITY
- Yingqing Xia
- G01 - MEASURING TESTING
Information Patent Application
TRANSVERSE MAGNETIC MODE SPLIT POST DIELECTRIC RESONATOR
- Publication number 20250070443
- Publication date Feb 27, 2025
- THE CURATORS OF THE UNIVERSITY OF MISSOURI
- DongHyun Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CURRENT ESTIMATION IN A POWER CONVERTER
- Publication number 20250070671
- Publication date Feb 27, 2025
- Cirrus Logic International Semiconductor Ltd.
- Malcolm BLYTH
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
AVOIDING PING-PONG BETWEEN DIFFERENT ANTENNA TUNING CONFIGURATIONS
- Publication number 20250062788
- Publication date Feb 20, 2025
- QUALCOMM Incorporated
- Diego CALZOLARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POWER CONVERSION SYSTEM AND CONTROL METHOD THEREFOR
- Publication number 20250062684
- Publication date Feb 20, 2025
- ZHEJIANG JINKO ENERGY STORAGE CO., LTD.
- Qi XIAO
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
CHANNEL DEVICE
- Publication number 20250060397
- Publication date Feb 20, 2025
- SCREEN Holdings Co., Ltd.
- Noriyuki NAKATANI
- G01 - MEASURING TESTING
Information Patent Application
CAPACITANCE MEASUREMENT CIRCUIT
- Publication number 20250060398
- Publication date Feb 20, 2025
- Elite Semiconductor Microelectronics Technology Inc.
- Yi-Chou Huang
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CHARACTERISTIC ACQUIRING DEVICE
- Publication number 20250052794
- Publication date Feb 13, 2025
- FUJI CORPORATION
- Tsuyoshi MIZUKOSHI
- G01 - MEASURING TESTING

Measuring inductance or capacitance Measuring quality factor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Inductive sensing methods, devices and systems

Display substrates, display apparatuses and methods of detecting cr...

Combined processing of borehole imagers and dielectric tools

Aerosol-generating device for detecting insertion of aerosol-genera...

Method and apparatus for determining gate capacitance

Capacitance measurement circuit

Theft detection and prevention in a power generation system

Sensor apparatus and water amount measurement apparatus

Measuring DC link capacitance in power conversion systems

System and method for determining the impedance properties of a loa...

Measurement of tissue viability

Far field interference cancellation for resistive-inductive-capacit...

Inductance measurement circuits and methods using auto-adaptive flo...

Noise measurements with a capacitance sensor

Apparatus for determination of capacitive and resistive characteris...

Methods and systems for estimating coil impedance of an electromagn...

Inductive broad-band sensors for electromagnetic waves

Methodology for measuring dielectric and magnetic material properties

Device and method for measuring microwave surface resistance of die...

On-chip capacitance measurement method and apparatus

Nano-power capacitance-to-digital converter

Circuits and methods to calibrate mirror displacement

Zero excess energy storage transformer

Determination of an unbalanced load in a high-voltage system and re...

Capacitor measurement

Dielectric-constant measuring device

Diagnostic device for the characterization of electromagnetic mater...

Detection circuit, appliance and control method

Capacitive-sensing rotary encoder

System and method of measuring capacitance of device-under-test

Patents Applicationslast 30 patents

Circuit arrangement for evaluating an output signal, and sensor device

CIRCUITS AND METHODS TO CALIBRATE MIRROR DISPLACEMENT

CIRCUIT AND METHOD FOR MEASURING AND TUNING QUALITY FACTOR OF RESON...

Component with one or more electrically conductive patterns for an...

SELECTIVELY ENHANCING THE RESONANCE FREQUENCY AND QUALITY FACTORY O...

METHOD AND DEVICE FOR ESTIMATING IMPEDANCE OF CONVERTER OUTPUT ELEMENT

METHOD FOR PARAMETER EXTRACTION OF SENSITIVE PROBE AND DEGREE-OF-FR...

BATTERY MONITORING SYSTEMS WITH DIRECT ELECTRICAL CONNECTION FOR CA...

MEASUREMENT OF TISSUE VIABILITY

SEMICONDUCTOR MEASUREMENT DEVICE AND SEMICONDUCTOR MEASUREMENT METHOD

METHOD AND APPARATUS WITH FREQUENCY CHARACTERISTICS ANALYSIS OF PRI...

RATING SUBSTRATE SUPPORT ASSEMBLIES BASED ON IMPEDANCE CIRCUIT ELEC...

FERROELECTRIC SENSOR

SYSTEM AND METHOD OF MEASURING CAPACITANCE OF DEVICE-UNDER-TEST

METHODS AND APPARATUS FOR IN-SITU MEASUREMENT OF MUTUTAL INDUCTANCE...

ELECTRONIC DEVICE HAVING A TESTING METHOD FOR DETERMINING DEFECTS I...

CIRCUIT FOR OPERATING A CAPACITIVE SENSOR AND SENSOR APPARATUS

SENSOR CONTROLLER, ELECTRONIC DEVICE, AND CONTROL METHOD OF SENSOR...

SENSOR CIRCUIT HAVING A COMPENSATING RESISTOR FOR COMPENSATING A TE...

SOLAR CELL TEST METHOD, SOLAR CELL TEST DEVICE AND COMPUTER-READABL...

METHOD AND DEVICE FOR SLOT GENERATION IN WIRELESS POWER TRANSMISSIO...

COMPLEX DIELECTRIC CONSTANT SENSING SYSTEM AND METHOD

CIRCUIT AND METHOD FOR MEASURING CAPACITANCE AND CAPACITANCE-VOLTAG...

TRANSVERSE MAGNETIC MODE SPLIT POST DIELECTRIC RESONATOR

CURRENT ESTIMATION IN A POWER CONVERTER

AVOIDING PING-PONG BETWEEN DIFFERENT ANTENNA TUNING CONFIGURATIONS

POWER CONVERSION SYSTEM AND CONTROL METHOD THEREFOR

CHANNEL DEVICE

CAPACITANCE MEASUREMENT CIRCUIT

ELECTRICAL CHARACTERISTIC ACQUIRING DEVICE