Measuring instruments characterised by the selection of material therefor

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G01B1/00

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS

Current Industry

G01B1/00Measuring instruments characterised by the selection of material therefor

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method for inspecting welding quality of welded portion between ele...
- Patent number 12,358,082
- Issue date Jul 15, 2025
- LG ENERGY SOLUTION, LTD.
- Sang Ho Bae
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System and method for automatic detection of dual wheels
- Patent number 12,360,011
- Issue date Jul 15, 2025
- AGCO INTERNATIONAL GmbH
- Paolo Turcato
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
External illumination with reduced detectability
- Patent number 12,360,379
- Issue date Jul 15, 2025
- Microsoft Technology Licensing, LLC
- Raymond Kirk Price
- G02 - OPTICS
Information Patent Grant
Integration of an optical height sensor in mask inspection tools
- Patent number 12,360,058
- Issue date Jul 15, 2025
- KLA Corporation
- Zefram Marks
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring interfaces of an optical element
- Patent number 12,359,910
- Issue date Jul 15, 2025
- FOGALE NANOTECH
- Sylvain Petitgrand
- G01 - MEASURING TESTING
Information Patent Grant
System and method for identifying lengths of harvested particles
- Patent number 12,361,683
- Issue date Jul 15, 2025
- CLAAS E-Systems GmbH
- Christoffer Rasmussen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems, methods, and apparatus for providing interactive inspectio...
- Patent number 12,358,141
- Issue date Jul 15, 2025
- Gecko Robotics, Inc.
- Mark J. Loosararian
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Calibration method for computer vision system and three-dimensional...
- Patent number 12,359,912
- Issue date Jul 15, 2025
- Omron Corporation
- Yoshinori Konishi
- G05 - CONTROLLING REGULATING
Information Patent Grant
Absolute phase unwrapping for fringe analysis in an eye tracking ap...
- Patent number 12,360,593
- Issue date Jul 15, 2025
- Meta Platforms Technologies, LLC
- Yatong An
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scan engine ranging failure handling
- Patent number 12,361,241
- Issue date Jul 15, 2025
- Zebra Technologies Corporation
- Carl D. Wittenberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional measurement device
- Patent number 12,359,906
- Issue date Jul 15, 2025
- CKD Corporation
- Hiroyuki Ishigaki
- G01 - MEASURING TESTING
Information Patent Grant
Member distinguish apparatus, member distinguish method, and comput...
- Patent number 12,359,908
- Issue date Jul 15, 2025
- NEC Corporation
- Akira Tsuji
- G01 - MEASURING TESTING
Information Patent Grant
Uniform machined parts inspection process
- Patent number 12,359,909
- Issue date Jul 15, 2025
- Rolls-Royce Corporation
- Monica Sy Munoz
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Detection method and detection device for detecting concentration o...
- Patent number 12,360,040
- Issue date Jul 15, 2025
- HONOR DEVICE CO., LTD.
- Ye Lv
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and system for automatically collecting multiple information...
- Patent number 12,361,577
- Issue date Jul 15, 2025
- China Railway Economic and Planning Research Institute Co., Ltd.
- Siming Tian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of calculating thickness of graphene layer and method of mea...
- Patent number 12,359,911
- Issue date Jul 15, 2025
- Samsung Electronics Co., Ltd.
- Eunkyu Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Intraoral scanning apparatus
- Patent number 12,355,936
- Issue date Jul 8, 2025
- 3Shape A/S
- Rune Fisker
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Operation of a coordinate measuring machine with a person-guided se...
- Patent number 12,352,554
- Issue date Jul 8, 2025
- Carl Zeiss Industrielle Messtechnik GmbH
- Benjamin Weber
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional optical measuring mobile apparatus for ropes with...
- Patent number 12,352,555
- Issue date Jul 8, 2025
- BRIDON INTERNATIONAL LTD.
- Cristiano Bonetti
- G01 - MEASURING TESTING
Information Patent Grant
Optical displacement sensor
- Patent number 12,352,556
- Issue date Jul 8, 2025
- Sensibel AS
- Håkon Sagberg
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical measuring machine and measuring method
- Patent number 12,352,560
- Issue date Jul 8, 2025
- VICI & C. S.P.A.
- Stefano Andreini
- G01 - MEASURING TESTING
Information Patent Grant
Eye tracking system for use in head-mounted display units and metho...
- Patent number 12,353,618
- Issue date Jul 8, 2025
- Inseye Inc.
- Piotr Krukowski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample depth-measuring device and method
- Patent number 12,354,290
- Issue date Jul 8, 2025
- Industrial Technology Research Institute
- Chia-Hung Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing device, information processing method, and p...
- Patent number 12,354,291
- Issue date Jul 8, 2025
- FUJIFILM Corporation
- Tomonori Masuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Resilient flooring product and methods of making same
- Patent number 12,352,561
- Issue date Jul 8, 2025
- Columbia Insurance Company
- Tom Odum
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and coordinate measuring machine
- Patent number 12,352,562
- Issue date Jul 8, 2025
- Klingelnberg GmbH
- Markus Finkeldey
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Physical unclonable function from an integrated photonic interferom...
- Patent number 12,352,568
- Issue date Jul 8, 2025
- Clemson University Research Foundation
- Judson D. Ryckman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Rotary kiln brick layer thermal monitoring systems
- Patent number 12,352,499
- Issue date Jul 8, 2025
- QUANTUM IR TECHNOLOGIES, LLC
- Mark Israelsen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Orthodontic aligner with strain measurement features, and methods o...
- Patent number 12,352,557
- Issue date Jul 8, 2025
- Regents of The University of Minnesota
- Alex Fok
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Back-face dynamic profiling system
- Patent number 12,352,559
- Issue date Jul 8, 2025
- Alan Goertz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Methods and Systems for Characterizing Laser Machining Properties b...
- Publication number 20250229357
- Publication date Jul 17, 2025
- IPG PHOTONICS CORPORATION
- Paul J.L. Webster
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Coating Thickness Measuring Device and Coating Device Including the...
- Publication number 20250231020
- Publication date Jul 17, 2025
- LG CHEM, LTD.
- Do-Hyun Lee
- G01 - MEASURING TESTING
Information Patent Application
COORDINATE MEASUREMENT SYSTEM WITH AUXILIARY AXIS
- Publication number 20250231546
- Publication date Jul 17, 2025
- FARO TECHNOLOGIES, INC.
- Kishore Lankalapalli
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL FOR POSITIONAL ERROR COMPENSATION IN ASSEMBLY OF DISCRETE...
- Publication number 20250233002
- Publication date Jul 17, 2025
- KULICKE & SOFFA NETHERLANDS B.V.
- Matthew R. Semler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GLASS SUBSTRATE, GLASS LAMINATE, MEMBER FOR DISPLAY DEVICE, DISPLAY...
- Publication number 20250234468
- Publication date Jul 17, 2025
- DAI NIPPON PRINTING CO., LTD.
- Makoto NANAUMI
- B32 - LAYERED PRODUCTS
Information Patent Application
WAFER BONDING OVERLAY MEASUREMENT SYSTEM
- Publication number 20250233022
- Publication date Jul 17, 2025
- TOKYO ELECTRON LIMITED
- Ilseok SON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETERMINING A HEIGHT MAP USING A WHITE LIGHT INTERFEROME...
- Publication number 20250231019
- Publication date Jul 17, 2025
- MITUTOYO CORPORATION
- Nitish KUMAR
- G01 - MEASURING TESTING
Information Patent Application
SURFACE SHAPE MEASUREMENT DEVICE
- Publication number 20250231021
- Publication date Jul 17, 2025
- Mitutoyo Corporation
- Tetsuro Tanabe
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL SHAPE MEASUREMENT APPARATUS AND MEASUREMENT METHO...
- Publication number 20250231022
- Publication date Jul 17, 2025
- Konica Minolta, Inc.
- Masayuki Iijima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method/Process for In-Field Measurements of Plant Crops
- Publication number 20250231299
- Publication date Jul 17, 2025
- Agriculture Victoria Services PTY LTD
- German Carlos Spangenberg
- G01 - MEASURING TESTING
Information Patent Application
WIDE-WAVELENGTH RANGE DEMODULATION METHOD FOR CASCADED FBGS OF SIX-...
- Publication number 20250224229
- Publication date Jul 10, 2025
- TAIYUAN UNIVERSITY OF TECHNOLOGY
- XIAO DENG
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION OF TUBULAR CONNECTION HEIGHT ABOVE A RIG FLOOR
- Publication number 20250223877
- Publication date Jul 10, 2025
- Weatherford Technology Holdings, LLC.
- Leonardo J. GUTIERREZ
- E21 - EARTH DRILLING MINING
Information Patent Application
DISTANCE MEASUREMENT DEVICE AND NON-TRANSITORY STORAGE MEDIUM STORI...
- Publication number 20250224499
- Publication date Jul 10, 2025
- ASAHI GOLF CO., LTD.
- Hiroshi Uchimoto
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING DEVICE, ACQUISITION METHOD, AND RECORDING MEDIUM
- Publication number 20250224225
- Publication date Jul 10, 2025
- Mitsubishi Electric Corporation
- Nobuki KOTAKE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR PERFORMING VEHICLE INSPECTIONS
- Publication number 20250224310
- Publication date Jul 10, 2025
- Clay Skelton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, SYSTEM AND SENSOR FOR ANALYSING A SAMPLE, AND PROCESS FOR M...
- Publication number 20250224331
- Publication date Jul 10, 2025
- TERAVIEW LIMITED
- Ian Alasdair Pentland
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20250224348
- Publication date Jul 10, 2025
- TORAY INDUSTRIES, INC.
- Takahiro MURAI
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL IMAGER AND PROJECTION DEVICE
- Publication number 20250226700
- Publication date Jul 10, 2025
- Austin Russell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING THICKNESS OF PIPE BASED ON IMAGE...
- Publication number 20250225672
- Publication date Jul 10, 2025
- DOOSAN ENERBILITY CO., LTD.
- Eun KWON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT METHOD AND MEASUREMENT SYSTEM
- Publication number 20250224227
- Publication date Jul 10, 2025
- Kabushiki Kaisha Toshiba
- Daisuke HIRATSUKA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD TO MAP THICKNESS VARIATIONS OF SUBSTRATES IN MANU...
- Publication number 20250224228
- Publication date Jul 10, 2025
- Applied Materials, Inc.
- Mehdi Vaez-Iravani
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SYSTEM AND METHOD FOR ENABLING MIXED REALITY ON MOBILE DEVICES IN A...
- Publication number 20250224231
- Publication date Jul 10, 2025
- LIGHTYX SYSTEMS LTD
- Uri YEHUDAY
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DEVICE FOR MEASURING SEMICONDUCTORS
- Publication number 20250224328
- Publication date Jul 10, 2025
- Samsung Electronics Co., Ltd.
- Sangwoo BAE
- G01 - MEASURING TESTING
Information Patent Application
IMAGE RECOGNITION DEVICE
- Publication number 20250225669
- Publication date Jul 10, 2025
- NTT DoCoMo, Inc.
- Takuya KITADE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BIOLOGICAL SAMPLE MEASUREMENT DEVICE
- Publication number 20250224267
- Publication date Jul 10, 2025
- Hitachi High-Tech Corporation
- Mayu SAO
- G01 - MEASURING TESTING
Information Patent Application
FIBER BRAGG GRATING FOR MEASURING INTERNAL METAL LOSS
- Publication number 20250224287
- Publication date Jul 10, 2025
- Saudi Arabian Oil Company
- Abderrahim Fakiri
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
STABILIZATION OF A MANUFACTURING PROCESS OF A SPECIMEN BY SHAPE ANA...
- Publication number 20250225642
- Publication date Jul 10, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Einat FRISHMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for manufacturing and inspecting a factory joint during inst...
- Publication number 20250217961
- Publication date Jul 3, 2025
- NEXANS
- Espen DOEDENS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR MANUFACTURING ELECTRODE
- Publication number 20250219047
- Publication date Jul 3, 2025
- Samsung SDI Co., Ltd.
- Hyun Woo KIM
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Application
Resilient Dynamic Projection Mapping System and Methods
- Publication number 20250218005
- Publication date Jul 3, 2025
- NIKE, Inc.
- Robert G. LeGaye
- G06 - COMPUTING CALCULATING COUNTING

Measuring instruments characterised by the selection of material therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for inspecting welding quality of welded portion between ele...

System and method for automatic detection of dual wheels

External illumination with reduced detectability

Integration of an optical height sensor in mask inspection tools

Device and method for measuring interfaces of an optical element

System and method for identifying lengths of harvested particles

Systems, methods, and apparatus for providing interactive inspectio...

Calibration method for computer vision system and three-dimensional...

Absolute phase unwrapping for fringe analysis in an eye tracking ap...

Scan engine ranging failure handling

Three-dimensional measurement device

Member distinguish apparatus, member distinguish method, and comput...

Uniform machined parts inspection process

Detection method and detection device for detecting concentration o...

Method and system for automatically collecting multiple information...

Method of calculating thickness of graphene layer and method of mea...

Intraoral scanning apparatus

Operation of a coordinate measuring machine with a person-guided se...

Three-dimensional optical measuring mobile apparatus for ropes with...

Optical displacement sensor

Optical measuring machine and measuring method

Eye tracking system for use in head-mounted display units and metho...

Sample depth-measuring device and method

Information processing device, information processing method, and p...

Resilient flooring product and methods of making same

Method and coordinate measuring machine

Physical unclonable function from an integrated photonic interferom...

Rotary kiln brick layer thermal monitoring systems

Orthodontic aligner with strain measurement features, and methods o...

Back-face dynamic profiling system

Patents Applicationslast 30 patents

Methods and Systems for Characterizing Laser Machining Properties b...

Coating Thickness Measuring Device and Coating Device Including the...

COORDINATE MEASUREMENT SYSTEM WITH AUXILIARY AXIS

MATERIAL FOR POSITIONAL ERROR COMPENSATION IN ASSEMBLY OF DISCRETE...

GLASS SUBSTRATE, GLASS LAMINATE, MEMBER FOR DISPLAY DEVICE, DISPLAY...

WAFER BONDING OVERLAY MEASUREMENT SYSTEM

METHOD FOR DETERMINING A HEIGHT MAP USING A WHITE LIGHT INTERFEROME...

SURFACE SHAPE MEASUREMENT DEVICE

THREE-DIMENSIONAL SHAPE MEASUREMENT APPARATUS AND MEASUREMENT METHO...

System and Method/Process for In-Field Measurements of Plant Crops

WIDE-WAVELENGTH RANGE DEMODULATION METHOD FOR CASCADED FBGS OF SIX-...

DETERMINATION OF TUBULAR CONNECTION HEIGHT ABOVE A RIG FLOOR

DISTANCE MEASUREMENT DEVICE AND NON-TRANSITORY STORAGE MEDIUM STORI...

OPTICAL MEASURING DEVICE, ACQUISITION METHOD, AND RECORDING MEDIUM

SYSTEMS AND METHODS FOR PERFORMING VEHICLE INSPECTIONS

METHOD, SYSTEM AND SENSOR FOR ANALYSING A SAMPLE, AND PROCESS FOR M...

INSPECTION DEVICE AND INSPECTION METHOD

THREE-DIMENSIONAL IMAGER AND PROJECTION DEVICE

APPARATUS AND METHOD FOR MEASURING THICKNESS OF PIPE BASED ON IMAGE...

MEASUREMENT METHOD AND MEASUREMENT SYSTEM

SYSTEM AND METHOD TO MAP THICKNESS VARIATIONS OF SUBSTRATES IN MANU...

SYSTEM AND METHOD FOR ENABLING MIXED REALITY ON MOBILE DEVICES IN A...

DEVICE FOR MEASURING SEMICONDUCTORS

IMAGE RECOGNITION DEVICE

BIOLOGICAL SAMPLE MEASUREMENT DEVICE

FIBER BRAGG GRATING FOR MEASURING INTERNAL METAL LOSS

STABILIZATION OF A MANUFACTURING PROCESS OF A SPECIMEN BY SHAPE ANA...

Method for manufacturing and inspecting a factory joint during inst...

APPARATUS AND METHOD FOR MANUFACTURING ELECTRODE

Resilient Dynamic Projection Mapping System and Methods