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Measuring instruments characterised by the selection of material therefor
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G01B1/00
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PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
Current Industry
G01B1/00
Measuring instruments characterised by the selection of material therefor
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Patents Grants
last 30 patents
Information
Patent Grant
System and method for 3D scanning
Patent number
11,969,231
Issue date
Apr 30, 2024
Koninklijke Philips N.V.
Elizabeth Powell Margaria
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Quick measurement module
Patent number
11,969,845
Issue date
Apr 30, 2024
Hiwin Mikrosystem Corp.
Chen Yi Wang
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method of polishing a surface of a waveguide
Patent number
11,969,849
Issue date
Apr 30, 2024
LUMUS LTD.
Amit Maziel
B24 - GRINDING POLISHING
Information
Patent Grant
Method and microscope for determining the thickness of a cover slip...
Patent number
11,971,531
Issue date
Apr 30, 2024
Leica Microsystems CMS GmbH
Alexander Weiss
G01 - MEASURING TESTING
Information
Patent Grant
Oil rig drill pipe and tubing tally system
Patent number
11,971,247
Issue date
Apr 30, 2024
Helmerich & Payne Technologies, LLC
Peter A. Torrione
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Laser level alignment tool
Patent number
11,971,255
Issue date
Apr 30, 2024
Milwaukee Electric Tool Corporation
Benjamin T. Jones
G01 - MEASURING TESTING
Information
Patent Grant
Temperature measurement system, temperature measurement method, and...
Patent number
11,972,921
Issue date
Apr 30, 2024
Tokyo Electron Limited
Takeshi Kobayashi
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Image-based fitting of a wearable computing device
Patent number
11,971,246
Issue date
Apr 30, 2024
Google LLC
Idris Syed Aleem
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical parallelism system for extended reality metrology
Patent number
11,971,249
Issue date
Apr 30, 2024
MLOptic Corp.
Pengfei Wu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical parallelism system for extended reality metrology
Patent number
11,971,555
Issue date
Apr 30, 2024
MLOptic Corp.
Pengfei Wu
G01 - MEASURING TESTING
Information
Patent Grant
Warehouse inspection system
Patent number
11,970,378
Issue date
Apr 30, 2024
Jungheinrich Aktiengesellschaft
Hannes Bistry
G05 - CONTROLLING REGULATING
Information
Patent Grant
Agile depth sensing using triangulation light curtains
Patent number
11,972,586
Issue date
Apr 30, 2024
Carnegie Mellon University
Srinivasa Narasimhan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for producing an optical fibre for a distributed measurement...
Patent number
11,971,310
Issue date
Apr 30, 2024
Commissariat a l'Energie Atomique et Energies Alternatives
Patrick Bulot
C03 - GLASS MINERAL OR SLAG WOOL
Information
Patent Grant
Wavelength-tunable fiber optic light source and overlay measurement...
Patent number
11,971,248
Issue date
Apr 30, 2024
AUROS TECHNOLOGY, INC.
Hyeon Gi Shin
G01 - MEASURING TESTING
Information
Patent Grant
Method and THz measuring device for measuring a measurement object...
Patent number
11,971,350
Issue date
Apr 30, 2024
1NOEX GMBH INNOVATIONEN UND AUSRÜSTUNGEN FÜR DIE EXTRUSIONSTECHNIK
Ralph Klose
G01 - MEASURING TESTING
Information
Patent Grant
System and method for operator guided identification of vehicle ref...
Patent number
11,971,250
Issue date
Apr 30, 2024
Hunter Engineering Company
Brian M Cejka
G01 - MEASURING TESTING
Information
Patent Grant
System for assembling composite group image from individual subject...
Patent number
11,972,588
Issue date
Apr 30, 2024
Shutterfly, LLC
Keith A. Benson
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Reducing device overlay errors
Patent number
11,971,664
Issue date
Apr 30, 2024
KLA-Tencor Corporation
Liran Yerushalmi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
External illumination with reduced detectability
Patent number
11,971,553
Issue date
Apr 30, 2024
Microsoft Technology Licensing, LLC
Raymond Kirk Price
G01 - MEASURING TESTING
Information
Patent Grant
Confocal sensor
Patent number
11,965,729
Issue date
Apr 23, 2024
Omron Corporation
Hisayasu Morino
G01 - MEASURING TESTING
Information
Patent Grant
Laser welding device and laser welding method
Patent number
11,964,339
Issue date
Apr 23, 2024
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Toru Sakai
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Endpoint detection system for enhanced spectral data collection
Patent number
11,965,798
Issue date
Apr 23, 2024
Applied Materials, Inc.
Pengyu Han
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring film thickness distribution of wafer with thin...
Patent number
11,965,730
Issue date
Apr 23, 2024
Shin-Etsu Handotai Co., Ltd.
Susumu Kuwabara
G01 - MEASURING TESTING
Information
Patent Grant
Package structure and measurement method for the package structure
Patent number
11,965,731
Issue date
Apr 23, 2024
Taiwan Semiconductor Manufacturing Company Ltd.
Kuei-Sung Chang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical sensor and geometry measurement apparatus
Patent number
11,965,733
Issue date
Apr 23, 2024
Mitutoyo Corporation
Takamitsu Watanabe
G01 - MEASURING TESTING
Information
Patent Grant
Measurement routine motion represented by 3D virtual model
Patent number
11,965,736
Issue date
Apr 23, 2024
Hexagon Metrology, Inc.
Michael Mariani
G01 - MEASURING TESTING
Information
Patent Grant
Image processing system and image processing method
Patent number
11,967,095
Issue date
Apr 23, 2024
Omron Corporation
Motoharu Okuno
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Imaging device provided with light source that emits pulsed light a...
Patent number
11,965,778
Issue date
Apr 23, 2024
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Toshiya Fujii
G01 - MEASURING TESTING
Information
Patent Grant
Intelligent piping inspection machine
Patent number
11,965,728
Issue date
Apr 23, 2024
Saudi Arabian Oil Company
Mazin M. Fathi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and sensor for measuring strain
Patent number
11,965,732
Issue date
Apr 23, 2024
Touch Netix Limited
Christopher Holmes
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MEASUREMENT DEVICE, LITHOGRAPHY SYSTEM AND EXPOSURE APPARATUS, AND...
Publication number
20240134294
Publication date
Apr 25, 2024
Nikon Corporation
Yuichi Shibazaki
G01 - MEASURING TESTING
Information
Patent Application
OPTICS FOR VEHICLE OCCUPANT MONITORING SYSTEMS
Publication number
20240133676
Publication date
Apr 25, 2024
Neonode Inc.
Björn Alexander Jubner
B60 - VEHICLES IN GENERAL
Information
Patent Application
HIGH-RESOLUTION HANDHELD OCT IMAGING SYSTEM
Publication number
20240133674
Publication date
Apr 25, 2024
THE FIRST AFFILIATED HOSPITAL OF JINAN UNIVERSITY (GUANGZHOU OVERSEAS CHINESE
Shuixing Zhang
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
REFLECTION REFUTING LASER SCANNER
Publication number
20240133678
Publication date
Apr 25, 2024
Path Robotics, Inc.
Alexander James LONSBERRY
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR CALIBRATING LASER LEVEL
Publication number
20240133681
Publication date
Apr 25, 2024
NORTHWEST INSTRUMENT INC.
Xin Shi
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT DEVICE, METHOD OF ADJUSTING MEASUREMENT DEVICE, AND MEA...
Publication number
20240133720
Publication date
Apr 25, 2024
National University Corporation Tokyo University Of Agriculture And Technology
Yosuke TANAKA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ENCODING SYSTEM WITH REDUCED TOTAL HARMONIC DISTORTION
Publication number
20240133680
Publication date
Apr 25, 2024
PIXART IMAGING INC.
Meng-Yee LIM
G01 - MEASURING TESTING
Information
Patent Application
Method and System for Determining the Location of Artefacts and/or...
Publication number
20240133822
Publication date
Apr 25, 2024
The Australian National University
Roland Fleddermann
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method And Device For Measuring Height Of Pouch Cup Portion Accommo...
Publication number
20240133677
Publication date
Apr 25, 2024
LG ENERGY SOLUTION, LTD.
Daehyung Kang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PROJECTOR FOR DIFFUSE ILLUMINATION AND STRUCTURED LIGHT
Publication number
20240133679
Publication date
Apr 25, 2024
trinamiX GmbH
Hamed HAMID MUHAMMED
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OVERLAY MEASURING METHOD AND SYSTEM, AND METHOD OF MANUFACTURING A...
Publication number
20240133683
Publication date
Apr 25, 2024
Samsung Electronics Co., Ltd.
Inho KWAK
G01 - MEASURING TESTING
Information
Patent Application
SUBSTRATE PROCESSING SYSTEM AND SUBSTRATE PROCESSING METHOD, AND DE...
Publication number
20240134295
Publication date
Apr 25, 2024
Nikon Corporation
Yuichi Shibazaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Load Scanning Apparatus
Publication number
20240133675
Publication date
Apr 25, 2024
Robotics Plus Limited
Alistair John Scarfe
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
GAP INSPECTION APPARATUS AND GAP INSPECTION METHOD
Publication number
20240133682
Publication date
Apr 25, 2024
CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
Fenglin ZHANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IN-PROCESS DIAMETER MEASUREMENT GAGE
Publication number
20240125590
Publication date
Apr 18, 2024
GAGEMAKER, LP
Jimmy I. FRANK
G01 - MEASURING TESTING
Information
Patent Application
FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS MEASURING METHOD
Publication number
20240125589
Publication date
Apr 18, 2024
Hamamatsu Photonics K.K.
Kenichi OHTSUKA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND SYSTEM FOR CAPTURING AND PROVIDING DATA FOR A PURCHASE O...
Publication number
20240125593
Publication date
Apr 18, 2024
Sikora AG
Harald Sikora
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS AND METHOD MONITORING SEMICONDUCTOR MANUFACTURING EQUIPMENT
Publication number
20240128102
Publication date
Apr 18, 2024
Samsung Electronics Co., Ltd.
SUNGHO JANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTEGRATED OPTICAL SENSOR CONTROLLER FOR DEVICEMANUFACTURING MACHINES
Publication number
20240128114
Publication date
Apr 18, 2024
Applied Materials, Inc.
Kiyki-Shiy Shang
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
BEAM MEASURING DEVICE, SAMPLE PROCESSOR AND METHOD OF MEASURING BEAM
Publication number
20240125592
Publication date
Apr 18, 2024
Beckman Coulter Biotechnology (Suzhou) Co., Ltd.
Wei SHI
G01 - MEASURING TESTING
Information
Patent Application
HOLOGRAPHIC MICROSCOPE
Publication number
20240126206
Publication date
Apr 18, 2024
KOREA PHOTONICS TECHNOLOGY INSTITUTE
Seon Kyu YOON
G01 - MEASURING TESTING
Information
Patent Application
WIDE FIELD-OF-VIEW METASURFACE OPTICS, SENSORS, CAMERAS AND PROJECTORS
Publication number
20240125591
Publication date
Apr 18, 2024
2Pi Inc.
Tian GU
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR DETERMINING A THREE-DIMENSIONAL DEFINITION OF...
Publication number
20240125594
Publication date
Apr 18, 2024
VIRELUX INSPECTION SYSTEMS SARL
Tom REICHERT
G01 - MEASURING TESTING
Information
Patent Application
CONCRETE SURFACE MAPPING ROBOTS, SYSTEMS, AND METHODS FOR PROCESSIN...
Publication number
20240118715
Publication date
Apr 11, 2024
HUSQVARNA AB
Andreas Jönsson
B24 - GRINDING POLISHING
Information
Patent Application
STRETCHABLE STRAIN SENSOR, COMBINATION SENSOR, AND DISPLAY PANEL AN...
Publication number
20240118149
Publication date
Apr 11, 2024
Samsung Electronics Co., Ltd.
Gae Hwang LEE
G01 - MEASURING TESTING
Information
Patent Application
LEVEL SENSOR AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME
Publication number
20240118072
Publication date
Apr 11, 2024
Samsung Electronics Co., Ltd.
Sungho Jang
G01 - MEASURING TESTING
Information
Patent Application
STRUCTURED-LIGHT 3D SCANNING SYSTEM AND METHOD
Publication number
20240119613
Publication date
Apr 11, 2024
HIMAX TECHNOLOGIES LIMITED
Hsueh-Tsung Lu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Load Port and Wafer Inspection Method Using the Same
Publication number
20240120222
Publication date
Apr 11, 2024
Sheng Chuan Technology Co., Ltd.
Tsung-Che Yu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEPTH AND ANGLE SENSOR ATTACHMENT FOR A POWER TOOL
Publication number
20240116156
Publication date
Apr 11, 2024
Milwaukee Electric Tool Corporation
Gareth Mueckl
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
Apparatus for Three-Dimensional Measurement of an Object, Method an...
Publication number
20240118074
Publication date
Apr 11, 2024
Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V.
Jens DÖGE
G06 - COMPUTING CALCULATING COUNTING