Measuring instruments characterised by the selection of material therefor

Industry

CPC
G01B1/00

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS

Current Industry

G01B1/00Measuring instruments characterised by the selection of material therefor

Industries

Patents Grantslast 30 patents

Information Patent Grant
Focused light beam alignment apparatus for aligning fixture relativ...
- Patent number 12,173,836
- Issue date Dec 24, 2024
- Snap-on Incorporated
- Craig F. Govekar
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Pattern measurement device and pattern measurement method
- Patent number 12,174,551
- Issue date Dec 24, 2024
- Hitachi High-Technologies Corporation
- Takuma Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hand-held tire scanner and method for obtaining a three-dimensional...
- Patent number 12,174,007
- Issue date Dec 24, 2024
- Snap-on Equipment SRL a Unico Socio
- Andrew Pryce
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Device and method for inspecting reflective surfaces
- Patent number 12,174,008
- Issue date Dec 24, 2024
- NEXTSENSE GMBH
- Eduard Luttenberger
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Calibration system for an extreme ultraviolet light source
- Patent number 12,174,550
- Issue date Dec 24, 2024
- ASML Netherlands B.V.
- Daniel Jason Riggs
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Current assisted photonic demodulator (CAPD) indirect time of fligh...
- Patent number 12,176,371
- Issue date Dec 24, 2024
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Takeshi Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metrology system with position and orientation tracking utilizing l...
- Patent number 12,174,005
- Issue date Dec 24, 2024
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Grant
Locating system for medical devices
- Patent number 12,171,500
- Issue date Dec 24, 2024
- Baxter Medical Systems GmbH & Co. KG
- Tobias Klemm
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for predicting inclination angle, and method and...
- Patent number 12,176,252
- Issue date Dec 24, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Bo Shao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Distance measurement device, method of controlling distance measure...
- Patent number 12,174,297
- Issue date Dec 24, 2024
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Kazuki Ohashi
- G01 - MEASURING TESTING
Information Patent Grant
Devices and methods for measuring using augmented reality
- Patent number 12,174,006
- Issue date Dec 24, 2024
- Apple Inc.
- Allison W. Dryer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scatterometry with high harmonic generation (HHG) sources
- Patent number 12,174,009
- Issue date Dec 24, 2024
- B.G. Negev Technologies and Applications Ltd., at Ben-Gurion University
- Evgeny Frumker
- G01 - MEASURING TESTING
Information Patent Grant
Laser device and laser beam detector for detecting light of a laser...
- Patent number 12,174,019
- Issue date Dec 24, 2024
- Spectra Precision (Kaiserslautern) GmbH
- Lars Schumacher
- G01 - MEASURING TESTING
Information Patent Grant
Measurement tool for cable-preparation system
- Patent number 12,176,689
- Issue date Dec 24, 2024
- 3M Innovative Properties Company
- Douglas B. Gundel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for monitoring toilet paper rolls
- Patent number 12,171,378
- Issue date Dec 24, 2024
- 7-Eleven, Inc.
- Matthew O'Daniel Redmond
- G01 - MEASURING TESTING
Information Patent Grant
Sealing arrangement for detecting thickness of a sealing element of...
- Patent number 12,173,798
- Issue date Dec 24, 2024
- Andritz Oy
- Simo Karjalainen
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Method and apparatus for planning an obstacle-free measurement traj...
- Patent number 12,174,645
- Issue date Dec 24, 2024
- Carl Zeiss Industrielle Messetechnik GmbH
- Yu Kou
- G05 - CONTROLLING REGULATING
Information Patent Grant
Device for testing reaction between supercritical carbon dioxide an...
- Patent number 12,174,156
- Issue date Dec 24, 2024
- NORTHEAST PETROLEUM UNIVERSITY
- Mengdi Sun
- G01 - MEASURING TESTING
Information Patent Grant
Nanopore fabrication
- Patent number 12,168,265
- Issue date Dec 17, 2024
- Technion Research & Development Foundation Limited
- Amit Meller
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Screen display control method and electronic device
- Patent number 12,169,122
- Issue date Dec 17, 2024
- VIVO MOBILE COMMUNICATION CO., LTD.
- Yakui Zang
- G01 - MEASURING TESTING
Information Patent Grant
Railcar acoustic monitoring system and method of use
- Patent number 12,168,468
- Issue date Dec 17, 2024
- voestalpine SIGNALING USA Inc.
- James R. Bilodeau
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale thin film deposition systems
- Patent number 12,168,244
- Issue date Dec 17, 2024
- Board of Regents, The University of Texas System
- Sidlgata V. Sreenivasan
- B82 - NANO-TECHNOLOGY
Information Patent Grant
User interface for three-dimensional measurement device
- Patent number 12,169,121
- Issue date Dec 17, 2024
- Faro Technologies, Inc.
- Daniel Döring
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generation of one or more edges of luminosity to form three-dimensi...
- Patent number 12,169,123
- Issue date Dec 17, 2024
- VISIE Inc.
- Aaron Charles Bernstein
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fiber optic voltage conditioning
- Patent number 12,163,773
- Issue date Dec 10, 2024
- iSenseCloud, Inc.
- An-Dien Nguyen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of detecting a distortion of a light pattern defining a code...
- Patent number 12,163,775
- Issue date Dec 10, 2024
- VITRONIC Dr.-Ing. Stein Bildverarbeitungssysteme GmbH
- Konstantin Ott
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for imaging and interferometry measurements
- Patent number 12,163,777
- Issue date Dec 10, 2024
- FOGALE NANOTECH
- Alain Courteville
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Measurement device and measurement method, exposure apparatus and e...
- Patent number 12,164,236
- Issue date Dec 10, 2024
- Nikon Corporation
- Akihiro Ueda
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus and method for measuring a three-dimensional shape
- Patent number 12,163,776
- Issue date Dec 10, 2024
- Koh Young Technology Inc.
- Seung-Jun Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Image sensing device using a single analog to digital conversion op...
- Patent number 12,166,949
- Issue date Dec 10, 2024
- SK Hynix Inc.
- Jeong Eun Song
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
Method And System For Utilizing Radio-Opaque Fillers In Multiple La...
- Publication number 20240424351
- Publication date Dec 26, 2024
- Topgolf Callaway Brands Corp.
- David M. Melanson
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Application
OPTICAL MEASURING DEVICE AND METHOD FOR THE THREE-DIMENSIONAL OPTIC...
- Publication number 20240426601
- Publication date Dec 26, 2024
- Carl Zeiss GOM Metrology GmbH
- Thorsten Bothe
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE, METHOD FOR MEASURING AN ACTUAL TILT OF AN OPTICAL S...
- Publication number 20240426603
- Publication date Dec 26, 2024
- Carl Zeiss SMT GMBH
- Heiner ZWICKEL
- G01 - MEASURING TESTING
Information Patent Application
IMAGE ANALYSIS DEVICE, ANALYIS DEVICE, SHAPE MEASUREMENT DEVICE, IM...
- Publication number 20240426599
- Publication date Dec 26, 2024
- Nikon Corporation
- Sumito NAKANO
- G01 - MEASURING TESTING
Information Patent Application
SCANNER SYSTEM FOR THREE-DIMENSIONAL SCANNING OF MOVING OBJECTS
- Publication number 20240426596
- Publication date Dec 26, 2024
- Northrop Grumman Systems Corporation
- Grant Camden Miars
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WELDING CONDITION EVALUATION METHOD
- Publication number 20240424613
- Publication date Dec 26, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- Kenta KUBOTA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
DIMENSION MEASUREMENT APPARATUS
- Publication number 20240426595
- Publication date Dec 26, 2024
- CONTEMPORARY AMPEREX TECHNOLOGY(HONG KONG) LIMITED
- Qizhi Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM TO DETERMINE SURFACE SHAPES OF HELIOSTATS USING F...
- Publication number 20240426597
- Publication date Dec 26, 2024
- Arizona Board of Regents on behalf of The University of Arizona
- James Roger P . Angel
- F24 - HEATING RANGES VENTILATING
Information Patent Application
SYSTEM AND METHOD FOR CREATING A CUSTOM PROTECTIVE EQUIPMENT ITEM
- Publication number 20240426598
- Publication date Dec 26, 2024
- Riddell, Inc.
- Steven King
- G01 - MEASURING TESTING
Information Patent Application
Method to Control Gap for Sheet Manufacturing Measurement Processes
- Publication number 20240426604
- Publication date Dec 26, 2024
- Honeywell International Inc.
- Greg Reynen
- G01 - MEASURING TESTING
Information Patent Application
PATTERN SHAPE MEASUREMENT METHOD, PATTERN SHAPE MEASUREMENT APPARAT...
- Publication number 20240426605
- Publication date Dec 26, 2024
- KIOXIA Corporation
- Taiki ITO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IDENTIFICATION APPARATUS
- Publication number 20240426758
- Publication date Dec 26, 2024
- Canon Kabushiki Kaisha
- Yuki Yonetani
- G01 - MEASURING TESTING
Information Patent Application
SINKAGE PREDICTION DEVICE AND SINKAGE PREDICTION METHOD
- Publication number 20240427012
- Publication date Dec 26, 2024
- Synspective Inc.
- Tomoyuki IMAIZUMI
- G01 - MEASURING TESTING
Information Patent Application
DETECTION DEVICE FOR VEHICLES
- Publication number 20240426345
- Publication date Dec 26, 2024
- DENSO CORPORATION
- Yoshihiro KIDA
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
SHAPE MEASURING DEVICE AND SHAPE MEASURING METHOD
- Publication number 20240426600
- Publication date Dec 26, 2024
- TOKYO SEIMITSU CO., LTD.
- Kyohei HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
Laser Level with Direct Projection to Multiple Targets
- Publication number 20240426602
- Publication date Dec 26, 2024
- Milwaukee Electric Tool Corporation
- Austin Alexander Borkowski
- G01 - MEASURING TESTING
Information Patent Application
COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...
- Publication number 20240418633
- Publication date Dec 19, 2024
- KLA Corporation
- Shova Subedi
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING APPARATUS, ELECTRONIC APPARATUS, PROCESSING METHOD, AND...
- Publication number 20240418862
- Publication date Dec 19, 2024
- FUJIFILM CORPORATION
- Kenkichi HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
AN INSTALLATION DEVICE
- Publication number 20240418494
- Publication date Dec 19, 2024
- Nathaen Lucas
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR THE CONTACTLESS MEASUREMENT OF OBJECTS
- Publication number 20240420292
- Publication date Dec 19, 2024
- Carl Zeiss Industrielle Messtechnik GmbH
- Niklas Mevenkamp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR DETERMINING A FLUID HEIGHT AND/OR A FLUID V...
- Publication number 20240421009
- Publication date Dec 19, 2024
- TOKYO ELECTRON LIMITED
- Michael Carcasi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPERATION OF A COORDINATE MEASURING MACHINE WITH A PERSON-GUIDED SE...
- Publication number 20240418500
- Publication date Dec 19, 2024
- Carl Zeiss Industrielle Messtechnik GmbH
- Benjamin Weber
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SENSOR FOR FILM THICKNESS MEASUREMENT
- Publication number 20240418501
- Publication date Dec 19, 2024
- TOKYO ELECTRON LIMITED
- Ivan MALEEV
- G01 - MEASURING TESTING
Information Patent Application
ULTRASONIC REMOTE CONDITION MONITORING SYSTEM
- Publication number 20240418505
- Publication date Dec 19, 2024
- Evident Scientific, Inc.
- Anthony E. Sayegh
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DISTORTION CORRECTION FOR IMAGED SAMPLES
- Publication number 20240420294
- Publication date Dec 19, 2024
- Illumina, Inc.
- Robert Langlois
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Tape Measure with Reinforced Tape Blade
- Publication number 20240418491
- Publication date Dec 19, 2024
- Milwaukee Electric Tool Corporation
- Abhijeet A. Khangar
- G01 - MEASURING TESTING
Information Patent Application
THREAD SHAPE DIMENSION MEASURING DEVICE AND THREAD SHAPE DIMENSION...
- Publication number 20240418502
- Publication date Dec 19, 2024
- NIPPON STEEL CORPORATION
- Shinichi OSHIMA
- G01 - MEASURING TESTING
Information Patent Application
RECALIBRATION OF A 3D DETECTOR BASED ON STRUCTURED LIGHT
- Publication number 20240418503
- Publication date Dec 19, 2024
- trinamiX GmbH
- Benjamin REIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND SYSTEM FOR DETERMINING A FORCE APPLIED ON A DEFORMABL...
- Publication number 20240418585
- Publication date Dec 19, 2024
- THE HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Yajing SHEN
- G01 - MEASURING TESTING
Information Patent Application
CAP-SHAPED PORTABLE STADIOMETER
- Publication number 20240415411
- Publication date Dec 19, 2024
- Andrew LEE
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Measuring instruments characterised by the selection of material therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Focused light beam alignment apparatus for aligning fixture relativ...

Pattern measurement device and pattern measurement method

Hand-held tire scanner and method for obtaining a three-dimensional...

Device and method for inspecting reflective surfaces

Calibration system for an extreme ultraviolet light source

Current assisted photonic demodulator (CAPD) indirect time of fligh...

Metrology system with position and orientation tracking utilizing l...

Locating system for medical devices

Method and device for predicting inclination angle, and method and...

Distance measurement device, method of controlling distance measure...

Devices and methods for measuring using augmented reality

Scatterometry with high harmonic generation (HHG) sources

Laser device and laser beam detector for detecting light of a laser...

Measurement tool for cable-preparation system

Systems and methods for monitoring toilet paper rolls

Sealing arrangement for detecting thickness of a sealing element of...

Method and apparatus for planning an obstacle-free measurement traj...

Device for testing reaction between supercritical carbon dioxide an...

Nanopore fabrication

Screen display control method and electronic device

Railcar acoustic monitoring system and method of use

Nanoscale thin film deposition systems

User interface for three-dimensional measurement device

Generation of one or more edges of luminosity to form three-dimensi...

Fiber optic voltage conditioning

Method of detecting a distortion of a light pattern defining a code...

Device and method for imaging and interferometry measurements

Measurement device and measurement method, exposure apparatus and e...

Apparatus and method for measuring a three-dimensional shape

Image sensing device using a single analog to digital conversion op...

Patents Applicationslast 30 patents

Method And System For Utilizing Radio-Opaque Fillers In Multiple La...

OPTICAL MEASURING DEVICE AND METHOD FOR THE THREE-DIMENSIONAL OPTIC...

OPTICAL DEVICE, METHOD FOR MEASURING AN ACTUAL TILT OF AN OPTICAL S...

IMAGE ANALYSIS DEVICE, ANALYIS DEVICE, SHAPE MEASUREMENT DEVICE, IM...

SCANNER SYSTEM FOR THREE-DIMENSIONAL SCANNING OF MOVING OBJECTS

WELDING CONDITION EVALUATION METHOD

DIMENSION MEASUREMENT APPARATUS

METHOD AND SYSTEM TO DETERMINE SURFACE SHAPES OF HELIOSTATS USING F...

SYSTEM AND METHOD FOR CREATING A CUSTOM PROTECTIVE EQUIPMENT ITEM

Method to Control Gap for Sheet Manufacturing Measurement Processes

PATTERN SHAPE MEASUREMENT METHOD, PATTERN SHAPE MEASUREMENT APPARAT...

IDENTIFICATION APPARATUS

SINKAGE PREDICTION DEVICE AND SINKAGE PREDICTION METHOD

DETECTION DEVICE FOR VEHICLES

SHAPE MEASURING DEVICE AND SHAPE MEASURING METHOD

Laser Level with Direct Projection to Multiple Targets

COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...

PROCESSING APPARATUS, ELECTRONIC APPARATUS, PROCESSING METHOD, AND...

AN INSTALLATION DEVICE

METHOD AND APPARATUS FOR THE CONTACTLESS MEASUREMENT OF OBJECTS

SYSTEMS AND METHODS FOR DETERMINING A FLUID HEIGHT AND/OR A FLUID V...

OPERATION OF A COORDINATE MEASURING MACHINE WITH A PERSON-GUIDED SE...

OPTICAL SENSOR FOR FILM THICKNESS MEASUREMENT

ULTRASONIC REMOTE CONDITION MONITORING SYSTEM

OPTICAL DISTORTION CORRECTION FOR IMAGED SAMPLES

Tape Measure with Reinforced Tape Blade

THREAD SHAPE DIMENSION MEASURING DEVICE AND THREAD SHAPE DIMENSION...

RECALIBRATION OF A 3D DETECTOR BASED ON STRUCTURED LIGHT

APPARATUS AND SYSTEM FOR DETERMINING A FORCE APPLIED ON A DEFORMABL...

CAP-SHAPED PORTABLE STADIOMETER