Measuring leads Measuring probes

Industry

CPC
G01R1/06

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/06Measuring leads Measuring probes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Optical probe, probe card, measuring system, and measuring method
- Patent number 12,360,155
- Issue date Jul 15, 2025
- Kabushiki Kaisha Nihon Micronics
- Michitaka Okuta
- G01 - MEASURING TESTING
Information Patent Grant
Probe holder and probe unit
- Patent number 12,345,738
- Issue date Jul 1, 2025
- NHK Spring Co., Ltd.
- Osamu Ito
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection method and inspection apparatus
- Patent number 12,345,741
- Issue date Jul 1, 2025
- CHROMA ATE INC.
- Tsun-I Wang
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for probing device-under-test
- Patent number 12,345,760
- Issue date Jul 1, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chuan-Hsiang Sun
- G01 - MEASURING TESTING
Information Patent Grant
High-bandwidth coaxial interface test fixture
- Patent number 12,345,778
- Issue date Jul 1, 2025
- NVIDIA Corporation
- Yongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer inspection system
- Patent number 12,332,295
- Issue date Jun 17, 2025
- CHROMA ATE INC.
- Wei-Chih Chen
- G01 - MEASURING TESTING
Information Patent Grant
Thermal management system for a test-and-measurement probe
- Patent number 12,332,277
- Issue date Jun 17, 2025
- Tektronix, Inc.
- Matthew J. Hull
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Method for probe pin retrieval
- Patent number 12,332,291
- Issue date Jun 17, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Ming-Cheng Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Probe card needle shape and method of manufacturing
- Patent number 12,326,463
- Issue date Jun 10, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ting-Yu Chiu
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Probe head and probe assembly
- Patent number 12,326,462
- Issue date Jun 10, 2025
- AZOTH STUDIO LTD. CO.
- Zhou Yi Lin
- G01 - MEASURING TESTING
Information Patent Grant
Micromachined mechanical part and methods of fabrication thereof
- Patent number 12,313,652
- Issue date May 27, 2025
- The University Court of the University of Glasgow
- Thomas McMullen
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Carbon nanomaterial functionalized needle tip modified with low wor...
- Patent number 12,313,653
- Issue date May 27, 2025
- National Center for Nanoscience and Technology
- Jianxun Xu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Multi-beam cantilever style contact pin for IC testing
- Patent number 12,313,650
- Issue date May 27, 2025
- Equiptest Engineering Pte Ltd
- Michael Goh
- G01 - MEASURING TESTING
Information Patent Grant
Probe joint and spring probe comprising the same
- Patent number 12,313,651
- Issue date May 27, 2025
- AZOTH STUDIO LTD. CO.
- Zhou Yi Lin
- G01 - MEASURING TESTING
Information Patent Grant
Planarity control for load pull tuner on wafer
- Patent number 12,313,676
- Issue date May 27, 2025
- Christos Tsironis
- G01 - MEASURING TESTING
Information Patent Grant
Rotational electrical probe
- Patent number 12,313,649
- Issue date May 27, 2025
- INNOVA ELECTRONICS CORPORATION
- Phuong Pham
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having improved frequency properties
- Patent number 12,313,655
- Issue date May 27, 2025
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Power sensor arrangement for on-wafer power calibration
- Patent number 12,313,719
- Issue date May 27, 2025
- Rohde & Schwarz GmbH & Co. KG
- Christopher Stumpf
- G01 - MEASURING TESTING
Information Patent Grant
Connection line for high currents and/or voltages, testing device,...
- Patent number 12,308,145
- Issue date May 20, 2025
- Lisa Draxlmaier GmbH
- Manuel Kagerhuber
- G01 - MEASURING TESTING
Information Patent Grant
High current extension for a dual-stage source measure unit
- Patent number 12,306,209
- Issue date May 20, 2025
- KEITHLEY INSTRUMENTS, LLC
- Wayne C. Goeke
- G01 - MEASURING TESTING
Information Patent Grant
Space transformers configured to be utilized in a probe system, pro...
- Patent number 12,306,243
- Issue date May 20, 2025
- FormFactor, Inc.
- Ernest Gammon McReynolds
- G01 - MEASURING TESTING
Information Patent Grant
Controlling alignment during a thermal cycle
- Patent number 12,298,328
- Issue date May 13, 2025
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Flexible membrane adapted to carry high-frequency (RF) power signal...
- Patent number 12,292,457
- Issue date May 6, 2025
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Oscilloscope probe having probe identification module
- Patent number 12,287,354
- Issue date Apr 29, 2025
- Keysight Technologies, Inc.
- Paul Doyle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-contact circuit testing systems and methods
- Patent number 12,282,041
- Issue date Apr 22, 2025
- COBHAM ADVANCED ELECTRONIC SOLUTIONS INC.
- Mark Bates
- G01 - MEASURING TESTING
Information Patent Grant
Methods and compositions for increasing the potency of antifungal a...
- Patent number 12,280,032
- Issue date Apr 22, 2025
- Pacific Northwest Research Institute
- Catherine Ludlow
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Electrical wire management tool
- Patent number 12,276,678
- Issue date Apr 15, 2025
- MECHANICAL DYNAMIX SOLUTIONS LLC
- John Mason
- G01 - MEASURING TESTING
Information Patent Grant
Coupling probe for micro device inspection
- Patent number 12,276,679
- Issue date Apr 15, 2025
- VueReal Inc.
- Gholamreza Chaji
- G01 - MEASURING TESTING
Information Patent Grant
Load pull tuner for waveguide wafer probe
- Patent number 12,265,101
- Issue date Apr 1, 2025
- Christos Tsironis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical testing device with probe having portions with different...
- Patent number 12,265,100
- Issue date Apr 1, 2025
- Snap-on Incorporated
- Nicholas A. Gabbey
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE SYSTEM, METHOD OF UTILIZING PROBE SYSTEM, METHOD OF TESTING U...
- Publication number 20250237696
- Publication date Jul 24, 2025
- MPI CORPORATION
- STOJAN KANEV
- G01 - MEASURING TESTING
Information Patent Application
HIGH-QUALITY SIGNAL TRANSMISSION HIGH-FREQUENCY CONNECTION STRUCTUR...
- Publication number 20250224424
- Publication date Jul 10, 2025
- RESEARCH ON ELECTRICAL APPLIANCES OF SHANGHAI ASTRONAUTICS
- Hongji Wang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20250224423
- Publication date Jul 10, 2025
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
Electrical Testing Device with Probe Having Portions with Different...
- Publication number 20250216416
- Publication date Jul 3, 2025
- Snap-on Incorporated
- Nicholas A. Gabbey
- G01 - MEASURING TESTING
Information Patent Application
PROBE
- Publication number 20250216417
- Publication date Jul 3, 2025
- YOKOWO CO., LTD
- Kenichi SATO
- G01 - MEASURING TESTING
Information Patent Application
PROBE
- Publication number 20250216415
- Publication date Jul 3, 2025
- YOKOWO CO., LTD
- Takuya HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM FOR HIGH-VOLTAGE AND HIGH-CURRENT TESTING ON A PLURALIT...
- Publication number 20250216418
- Publication date Jul 3, 2025
- CREA COLLAUDI ELETTRONICI AUTOMATIZZATI S.R.L.
- Marco MARCINNO'
- G01 - MEASURING TESTING
Information Patent Application
TEST INSTRUMENT AND TEST LEAD EXTENSION FOR ONE HANDED TESTING OF A...
- Publication number 20250208167
- Publication date Jun 26, 2025
- John Riccitelli
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD, PROBE CARD, TEST EQUIPMENT, AND ELECTRONIC DEVICE TESTE...
- Publication number 20250208168
- Publication date Jun 26, 2025
- MPI CORPORATION
- Chin-Tien YANG
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND INSPECTION DEVICE
- Publication number 20250208169
- Publication date Jun 26, 2025
- TOKYO ELECTRON LIMITED
- Kentaro KONISHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ONE HANDED TEST LEADS HOLDER TOOL AND TEST LEADS HOLDER OF A TEST I...
- Publication number 20250208166
- Publication date Jun 26, 2025
- John Riccitelli
- G01 - MEASURING TESTING
Information Patent Application
METAL MOLDED ARTICLE, MANUFACTURING METHOD THEREFOR, AND INSPECTION...
- Publication number 20250199032
- Publication date Jun 19, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
PROBE, PROBE-HOLDING DEVICE, AND METHOD FOR MANUFACTURING PROBE
- Publication number 20250199031
- Publication date Jun 19, 2025
- Kabushiki Kaisha Nihon Micronics
- Yasutaka KISHI
- G01 - MEASURING TESTING
Information Patent Application
CHIP TESTING STRUCTURE
- Publication number 20250180604
- Publication date Jun 5, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kuan-Chun CHEN
- G01 - MEASURING TESTING
Information Patent Application
PROBE PASSING METHOD AND PROBE
- Publication number 20250180605
- Publication date Jun 5, 2025
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Akihito KURACHI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC CALIBRATION METHOD AND AUTOMATIC CALIBRATION EQUIPMENT FO...
- Publication number 20250180687
- Publication date Jun 5, 2025
- United Microelectronics Corp.
- Zheng-Yang LI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRO-CONDUCTIVE CONTACT PIN AND VERTICAL PROBE CARD HAVING SAME
- Publication number 20250180603
- Publication date Jun 5, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE SYSTEM, PROBE CARD, PROBE HEAD, AND PROBE FOR TESTING ELECTRO...
- Publication number 20250172589
- Publication date May 29, 2025
- MPI CORPORATION
- Chin-Tien YANG
- G01 - MEASURING TESTING
Information Patent Application
PORTABLE CONNECTOR TESTING DEVICE AND SYSTEM
- Publication number 20250164581
- Publication date May 22, 2025
- Illinois Tool Works Inc.
- Bryan HAWKES
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE, PROBE HOLDER AND PROBE UNIT
- Publication number 20250164525
- Publication date May 22, 2025
- NHK Spring Co., Ltd.
- Hajime Arai
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE AND CURRENT PROBE ASSEMBLIES FOR RADIO FREQUENCY CURRENT CA...
- Publication number 20250164526
- Publication date May 22, 2025
- LAM RESEARCH CORPORATION
- John PEASE
- G01 - MEASURING TESTING
Information Patent Application
A Probe Card Stroke Compensation System and Method
- Publication number 20250164527
- Publication date May 22, 2025
- Shanghai Zenfocus Semi-Tech Co., Ltd.
- Jian Liang
- G01 - MEASURING TESTING
Information Patent Application
TEST FIXTURE ASSEMBLY
- Publication number 20250155472
- Publication date May 15, 2025
- Universal Scientific Industrial (Shanghai) Co., Ltd.
- HAO LIANG HUNG
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM WITH INTEGRATED CHOKE INDUCTOR
- Publication number 20250147069
- Publication date May 8, 2025
- Northrop Grumman Systems Corporation
- Jesse H. Gonzales
- G01 - MEASURING TESTING
Information Patent Application
MERCURY PROBE APPARATUS WITH IMPROVED SAFETY
- Publication number 20250147070
- Publication date May 8, 2025
- SEMILAB Semiconductor Physics Laboratory Co'; Ltd.
- Attila MÁRTON
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD, PROBE HEAD, METHOD FOR MANUFACTURING THE PROBE HEAD, AN...
- Publication number 20250147072
- Publication date May 8, 2025
- MPI CORPORATION
- Chin-Tien YANG
- G01 - MEASURING TESTING
Information Patent Application
LOW FRICTION HORIZONTAL PROBING FIXTURE
- Publication number 20250147068
- Publication date May 8, 2025
- Kuan-Hung Chen
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT TESTING DEVICE
- Publication number 20250138057
- Publication date May 1, 2025
- Richard Martinez
- G01 - MEASURING TESTING
Information Patent Application
PROBE
- Publication number 20250138049
- Publication date May 1, 2025
- Kabushiki Kaisha Nihon Micronics
- Akihiro SHUTO
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD PMIC AND SIGNAL SWITCH IC SUPPORTING EFFICIENT CHANNEL C...
- Publication number 20250138051
- Publication date May 1, 2025
- TECHWIDU CO., LTD.
- Hyoung-Suk YOO
- G01 - MEASURING TESTING

Measuring leads Measuring probes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Optical probe, probe card, measuring system, and measuring method

Probe holder and probe unit

Wafer inspection method and inspection apparatus

Apparatus for probing device-under-test

High-bandwidth coaxial interface test fixture

Wafer inspection system

Thermal management system for a test-and-measurement probe

Method for probe pin retrieval

Probe card needle shape and method of manufacturing

Probe head and probe assembly

Micromachined mechanical part and methods of fabrication thereof

Carbon nanomaterial functionalized needle tip modified with low wor...

Multi-beam cantilever style contact pin for IC testing

Probe joint and spring probe comprising the same

Planarity control for load pull tuner on wafer

Rotational electrical probe

Testing head having improved frequency properties

Power sensor arrangement for on-wafer power calibration

Connection line for high currents and/or voltages, testing device,...

High current extension for a dual-stage source measure unit

Space transformers configured to be utilized in a probe system, pro...

Controlling alignment during a thermal cycle

Flexible membrane adapted to carry high-frequency (RF) power signal...

Oscilloscope probe having probe identification module

Non-contact circuit testing systems and methods

Methods and compositions for increasing the potency of antifungal a...

Electrical wire management tool

Coupling probe for micro device inspection

Load pull tuner for waveguide wafer probe

Electrical testing device with probe having portions with different...

Patents Applicationslast 30 patents

PROBE SYSTEM, METHOD OF UTILIZING PROBE SYSTEM, METHOD OF TESTING U...

HIGH-QUALITY SIGNAL TRANSMISSION HIGH-FREQUENCY CONNECTION STRUCTUR...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

Electrical Testing Device with Probe Having Portions with Different...

PROBE

PROBE

TEST SYSTEM FOR HIGH-VOLTAGE AND HIGH-CURRENT TESTING ON A PLURALIT...

TEST INSTRUMENT AND TEST LEAD EXTENSION FOR ONE HANDED TESTING OF A...

PROBE HEAD, PROBE CARD, TEST EQUIPMENT, AND ELECTRONIC DEVICE TESTE...

INSPECTION METHOD AND INSPECTION DEVICE

ONE HANDED TEST LEADS HOLDER TOOL AND TEST LEADS HOLDER OF A TEST I...

METAL MOLDED ARTICLE, MANUFACTURING METHOD THEREFOR, AND INSPECTION...

PROBE, PROBE-HOLDING DEVICE, AND METHOD FOR MANUFACTURING PROBE

CHIP TESTING STRUCTURE

PROBE PASSING METHOD AND PROBE

AUTOMATIC CALIBRATION METHOD AND AUTOMATIC CALIBRATION EQUIPMENT FO...

ELECTRO-CONDUCTIVE CONTACT PIN AND VERTICAL PROBE CARD HAVING SAME

PROBE SYSTEM, PROBE CARD, PROBE HEAD, AND PROBE FOR TESTING ELECTRO...

PORTABLE CONNECTOR TESTING DEVICE AND SYSTEM

CONTACT PROBE, PROBE HOLDER AND PROBE UNIT

VOLTAGE AND CURRENT PROBE ASSEMBLIES FOR RADIO FREQUENCY CURRENT CA...

A Probe Card Stroke Compensation System and Method

TEST FIXTURE ASSEMBLY

PROBE SYSTEM WITH INTEGRATED CHOKE INDUCTOR

MERCURY PROBE APPARATUS WITH IMPROVED SAFETY

PROBE CARD, PROBE HEAD, METHOD FOR MANUFACTURING THE PROBE HEAD, AN...

LOW FRICTION HORIZONTAL PROBING FIXTURE

CIRCUIT TESTING DEVICE

PROBE

PROBE CARD PMIC AND SIGNAL SWITCH IC SUPPORTING EFFICIENT CHANNEL C...