Measuring leads Measuring probes

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CPC
G01R1/06

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/06Measuring leads Measuring probes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Micromachined mechanical part and methods of fabrication thereof
- Patent number 12,313,652
- Issue date May 27, 2025
- The University Court of the University of Glasgow
- Thomas McMullen
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Carbon nanomaterial functionalized needle tip modified with low wor...
- Patent number 12,313,653
- Issue date May 27, 2025
- National Center for Nanoscience and Technology
- Jianxun Xu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Multi-beam cantilever style contact pin for IC testing
- Patent number 12,313,650
- Issue date May 27, 2025
- Equiptest Engineering Pte Ltd
- Michael Goh
- G01 - MEASURING TESTING
Information Patent Grant
Planarity control for load pull tuner on wafer
- Patent number 12,313,676
- Issue date May 27, 2025
- Christos Tsironis
- G01 - MEASURING TESTING
Information Patent Grant
Probe joint and spring probe comprising the same
- Patent number 12,313,651
- Issue date May 27, 2025
- AZOTH STUDIO LTD. CO.
- Zhou Yi Lin
- G01 - MEASURING TESTING
Information Patent Grant
Rotational electrical probe
- Patent number 12,313,649
- Issue date May 27, 2025
- INNOVA ELECTRONICS CORPORATION
- Phuong Pham
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having improved frequency properties
- Patent number 12,313,655
- Issue date May 27, 2025
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Power sensor arrangement for on-wafer power calibration
- Patent number 12,313,719
- Issue date May 27, 2025
- Rohde & Schwarz GmbH & Co. KG
- Christopher Stumpf
- G01 - MEASURING TESTING
Information Patent Grant
Connection line for high currents and/or voltages, testing device,...
- Patent number 12,308,145
- Issue date May 20, 2025
- Lisa Draxlmaier GmbH
- Manuel Kagerhuber
- G01 - MEASURING TESTING
Information Patent Grant
High current extension for a dual-stage source measure unit
- Patent number 12,306,209
- Issue date May 20, 2025
- KEITHLEY INSTRUMENTS, LLC
- Wayne C. Goeke
- G01 - MEASURING TESTING
Information Patent Grant
Space transformers configured to be utilized in a probe system, pro...
- Patent number 12,306,243
- Issue date May 20, 2025
- FormFactor, Inc.
- Ernest Gammon McReynolds
- G01 - MEASURING TESTING
Information Patent Grant
Controlling alignment during a thermal cycle
- Patent number 12,298,328
- Issue date May 13, 2025
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Flexible membrane adapted to carry high-frequency (RF) power signal...
- Patent number 12,292,457
- Issue date May 6, 2025
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Oscilloscope probe having probe identification module
- Patent number 12,287,354
- Issue date Apr 29, 2025
- Keysight Technologies, Inc.
- Paul Doyle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-contact circuit testing systems and methods
- Patent number 12,282,041
- Issue date Apr 22, 2025
- COBHAM ADVANCED ELECTRONIC SOLUTIONS INC.
- Mark Bates
- G01 - MEASURING TESTING
Information Patent Grant
Methods and compositions for increasing the potency of antifungal a...
- Patent number 12,280,032
- Issue date Apr 22, 2025
- Pacific Northwest Research Institute
- Catherine Ludlow
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Electrical wire management tool
- Patent number 12,276,678
- Issue date Apr 15, 2025
- MECHANICAL DYNAMIX SOLUTIONS LLC
- John Mason
- G01 - MEASURING TESTING
Information Patent Grant
Coupling probe for micro device inspection
- Patent number 12,276,679
- Issue date Apr 15, 2025
- VueReal Inc.
- Gholamreza Chaji
- G01 - MEASURING TESTING
Information Patent Grant
Load pull tuner for waveguide wafer probe
- Patent number 12,265,101
- Issue date Apr 1, 2025
- Christos Tsironis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical testing device with probe having portions with different...
- Patent number 12,265,100
- Issue date Apr 1, 2025
- Snap-on Incorporated
- Nicholas A. Gabbey
- G01 - MEASURING TESTING
Information Patent Grant
Adjustment control device for precise measurement
- Patent number 12,259,405
- Issue date Mar 25, 2025
- PAMTEK Co., Ltd.
- Jae Woong Kim
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Elastic electrical contact device and contact conductor thereof
- Patent number 12,259,406
- Issue date Mar 25, 2025
- SUNLIT PRECISION TECHNOLOGY CO., LTD.
- Wen-Han Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact probe for probe heads of electronic devices
- Patent number 12,259,407
- Issue date Mar 25, 2025
- Technoprobe S.p.A.
- Riccardo Vettori
- G01 - MEASURING TESTING
Information Patent Grant
Constant force ultrasound probe handle
- Patent number 12,248,002
- Issue date Mar 11, 2025
- New York Society for the Relief of the Ruptured and Crippled, Maintaining the...
- Daniel R. Sturnick
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Clustered rigid wafer test probe
- Patent number 12,248,003
- Issue date Mar 11, 2025
- International Business Machines Corporation
- David Michael Audette
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing a probe used for testing integrated electronic...
- Patent number 12,248,012
- Issue date Mar 11, 2025
- STMicroelectronics S.r.l.
- Alberto Pagani
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe, probe holder and probe unit
- Patent number 12,241,913
- Issue date Mar 4, 2025
- NHK Spring Co., Ltd.
- Hajime Arai
- G01 - MEASURING TESTING
Information Patent Grant
Liquid analysis device and sensor unit
- Patent number 12,222,368
- Issue date Feb 11, 2025
- HORIBA ADVANCED TECHNO, CO., LTD.
- Manabu Shibata
- G01 - MEASURING TESTING
Information Patent Grant
Contact pins for test sockets and test sockets comprising the same
- Patent number 12,222,367
- Issue date Feb 11, 2025
- Okins Electronics Co., Ltd.
- Jin Kook Jun
- G01 - MEASURING TESTING
Information Patent Grant
Probe head and probe card having same
- Patent number 12,222,370
- Issue date Feb 11, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo Ahn
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE SYSTEM, PROBE CARD, PROBE HEAD, AND PROBE FOR TESTING ELECTRO...
- Publication number 20250172589
- Publication date May 29, 2025
- MPI CORPORATION
- Chin-Tien YANG
- G01 - MEASURING TESTING
Information Patent Application
PORTABLE CONNECTOR TESTING DEVICE AND SYSTEM
- Publication number 20250164581
- Publication date May 22, 2025
- Illinois Tool Works Inc.
- Bryan HAWKES
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE, PROBE HOLDER AND PROBE UNIT
- Publication number 20250164525
- Publication date May 22, 2025
- NHK Spring Co., Ltd.
- Hajime Arai
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE AND CURRENT PROBE ASSEMBLIES FOR RADIO FREQUENCY CURRENT CA...
- Publication number 20250164526
- Publication date May 22, 2025
- LAM RESEARCH CORPORATION
- John PEASE
- G01 - MEASURING TESTING
Information Patent Application
A Probe Card Stroke Compensation System and Method
- Publication number 20250164527
- Publication date May 22, 2025
- Shanghai Zenfocus Semi-Tech Co., Ltd.
- Jian Liang
- G01 - MEASURING TESTING
Information Patent Application
TEST FIXTURE ASSEMBLY
- Publication number 20250155472
- Publication date May 15, 2025
- Universal Scientific Industrial (Shanghai) Co., Ltd.
- HAO LIANG HUNG
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM WITH INTEGRATED CHOKE INDUCTOR
- Publication number 20250147069
- Publication date May 8, 2025
- Northrop Grumman Systems Corporation
- Jesse H. Gonzales
- G01 - MEASURING TESTING
Information Patent Application
MERCURY PROBE APPARATUS WITH IMPROVED SAFETY
- Publication number 20250147070
- Publication date May 8, 2025
- SEMILAB Semiconductor Physics Laboratory Co'; Ltd.
- Attila MÁRTON
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD, PROBE HEAD, METHOD FOR MANUFACTURING THE PROBE HEAD, AN...
- Publication number 20250147072
- Publication date May 8, 2025
- MPI CORPORATION
- Chin-Tien YANG
- G01 - MEASURING TESTING
Information Patent Application
LOW FRICTION HORIZONTAL PROBING FIXTURE
- Publication number 20250147068
- Publication date May 8, 2025
- Kuan-Hung Chen
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT TESTING DEVICE
- Publication number 20250138057
- Publication date May 1, 2025
- Richard Martinez
- G01 - MEASURING TESTING
Information Patent Application
PROBE
- Publication number 20250138049
- Publication date May 1, 2025
- Kabushiki Kaisha Nihon Micronics
- Akihiro SHUTO
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD PMIC AND SIGNAL SWITCH IC SUPPORTING EFFICIENT CHANNEL C...
- Publication number 20250138051
- Publication date May 1, 2025
- TECHWIDU CO., LTD.
- Hyoung-Suk YOO
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE, PROBE HEAD AND METHOD OF MAKING THE VERTICAL PROBE
- Publication number 20250138050
- Publication date May 1, 2025
- MPI Corporation
- CHIN-YI LIN
- G01 - MEASURING TESTING
Information Patent Application
CONTACT SENSOR FOR DETECTING LOOSE SPROCKET SEGMENTS OF A FINAL DRIVE
- Publication number 20250130255
- Publication date Apr 24, 2025
- Caterpillar Inc.
- Michael S Galat
- G01 - MEASURING TESTING
Information Patent Application
MANAGEMENT SYSTEM FOR PROBE CARDS
- Publication number 20250130253
- Publication date Apr 24, 2025
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
BINARY SCAN SYSTEM FOR LEAKAGE DETECTION IN WIRE HARNESSES
- Publication number 20250130291
- Publication date Apr 24, 2025
- DIT-MCO INTERNATIONAL LLC
- David Alan Shier
- G01 - MEASURING TESTING
Information Patent Application
POWER PROBE FIXTURES AND ADAPTERS
- Publication number 20250130259
- Publication date Apr 24, 2025
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
POGO PIN WITH MULTI-STAGE BRUSH SETS
- Publication number 20250130254
- Publication date Apr 24, 2025
- IWIN SOLUTION CORPORATION
- Sangyang PAK
- G01 - MEASURING TESTING
Information Patent Application
ELECTRO-OPTICAL PROBING AND MECHANICAL MICROPROBING OF MEMORY DIE U...
- Publication number 20250123305
- Publication date Apr 17, 2025
- Micron Technology, Inc.
- Soeparto Tandjoeng
- G01 - MEASURING TESTING
Information Patent Application
Probe Integrated Circuit and Measurement System
- Publication number 20250123306
- Publication date Apr 17, 2025
- National Instruments Corporation
- Mark Whittington
- G01 - MEASURING TESTING
Information Patent Application
APPROACHES AND PROBES FOR EXCITATION, DETECTION, AND SENSING OF DEV...
- Publication number 20250123320
- Publication date Apr 17, 2025
- InZiv Ltd.
- David Judah Lewis
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR LED TEST SYSTEM
- Publication number 20250123319
- Publication date Apr 17, 2025
- Teradyne, Inc.
- Frank Brian Parrish
- G01 - MEASURING TESTING
Information Patent Application
PROBE STORAGE JIG, PROBE STORAGE SYSTEM, AND PROBE STORAGE METHOD
- Publication number 20250116685
- Publication date Apr 10, 2025
- Kabushiki Kaisha Nihon Micronics
- Toshinaga TAKEYA
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND THERMAL CONDUCTION DEVICE THEREOF
- Publication number 20250110153
- Publication date Apr 3, 2025
- STAR TECHNOLOGIES, INC.
- Choon Leong LOU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE
- Publication number 20250110154
- Publication date Apr 3, 2025
- teCat Technologies (Suzhou) Limited
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM AND MACHINE APPARATUS THEREOF
- Publication number 20250102539
- Publication date Mar 27, 2025
- MPI CORPORATION
- STOJAN KANEV
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MANUFACTURING METHOD AND TEST METHOD OF POWER MODULE
- Publication number 20250105063
- Publication date Mar 27, 2025
- Hyundai Motor Company
- Tae Woo KWANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REMOVABLE HIGH-SPEED SIGNAL MEASUREMENT DEVICE
- Publication number 20250093383
- Publication date Mar 20, 2025
- International Business Machines Corporation
- Kyle Olson
- G01 - MEASURING TESTING
Information Patent Application
Wireless Harness Automated Measurement Systems and Methods
- Publication number 20250093382
- Publication date Mar 20, 2025
- Lockheed Martin Corporation
- Kevin Bell
- G01 - MEASURING TESTING

Measuring leads Measuring probes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Micromachined mechanical part and methods of fabrication thereof

Carbon nanomaterial functionalized needle tip modified with low wor...

Multi-beam cantilever style contact pin for IC testing

Planarity control for load pull tuner on wafer

Probe joint and spring probe comprising the same

Rotational electrical probe

Testing head having improved frequency properties

Power sensor arrangement for on-wafer power calibration

Connection line for high currents and/or voltages, testing device,...

High current extension for a dual-stage source measure unit

Space transformers configured to be utilized in a probe system, pro...

Controlling alignment during a thermal cycle

Flexible membrane adapted to carry high-frequency (RF) power signal...

Oscilloscope probe having probe identification module

Non-contact circuit testing systems and methods

Methods and compositions for increasing the potency of antifungal a...

Electrical wire management tool

Coupling probe for micro device inspection

Load pull tuner for waveguide wafer probe

Electrical testing device with probe having portions with different...

Adjustment control device for precise measurement

Elastic electrical contact device and contact conductor thereof

Contact probe for probe heads of electronic devices

Constant force ultrasound probe handle

Clustered rigid wafer test probe

Method for producing a probe used for testing integrated electronic...

Contact probe, probe holder and probe unit

Liquid analysis device and sensor unit

Contact pins for test sockets and test sockets comprising the same

Probe head and probe card having same

Patents Applicationslast 30 patents

PROBE SYSTEM, PROBE CARD, PROBE HEAD, AND PROBE FOR TESTING ELECTRO...

PORTABLE CONNECTOR TESTING DEVICE AND SYSTEM

CONTACT PROBE, PROBE HOLDER AND PROBE UNIT

VOLTAGE AND CURRENT PROBE ASSEMBLIES FOR RADIO FREQUENCY CURRENT CA...

A Probe Card Stroke Compensation System and Method

TEST FIXTURE ASSEMBLY

PROBE SYSTEM WITH INTEGRATED CHOKE INDUCTOR

MERCURY PROBE APPARATUS WITH IMPROVED SAFETY

PROBE CARD, PROBE HEAD, METHOD FOR MANUFACTURING THE PROBE HEAD, AN...

LOW FRICTION HORIZONTAL PROBING FIXTURE

CIRCUIT TESTING DEVICE

PROBE

PROBE CARD PMIC AND SIGNAL SWITCH IC SUPPORTING EFFICIENT CHANNEL C...

VERTICAL PROBE, PROBE HEAD AND METHOD OF MAKING THE VERTICAL PROBE

CONTACT SENSOR FOR DETECTING LOOSE SPROCKET SEGMENTS OF A FINAL DRIVE

MANAGEMENT SYSTEM FOR PROBE CARDS

BINARY SCAN SYSTEM FOR LEAKAGE DETECTION IN WIRE HARNESSES

POWER PROBE FIXTURES AND ADAPTERS

POGO PIN WITH MULTI-STAGE BRUSH SETS

ELECTRO-OPTICAL PROBING AND MECHANICAL MICROPROBING OF MEMORY DIE U...

Probe Integrated Circuit and Measurement System

APPROACHES AND PROBES FOR EXCITATION, DETECTION, AND SENSING OF DEV...

PROBE HEAD FOR LED TEST SYSTEM

PROBE STORAGE JIG, PROBE STORAGE SYSTEM, AND PROBE STORAGE METHOD

PROBE CARD AND THERMAL CONDUCTION DEVICE THEREOF

PROBE CARD DEVICE

PROBE SYSTEM AND MACHINE APPARATUS THEREOF

MANUFACTURING METHOD AND TEST METHOD OF POWER MODULE

REMOVABLE HIGH-SPEED SIGNAL MEASUREMENT DEVICE

Wireless Harness Automated Measurement Systems and Methods