Measuring microscopes

Industry

CPC
G01B9/04

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/04Measuring microscopes

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Radiation detection device, recording medium, and positioning method
- Patent number 11,940,397
- Issue date Mar 26, 2024
- Horiba, Ltd.
- Tomoki Aoyama
- G01 - MEASURING TESTING
Information Patent Grant
Measurement machine and method for detecting a defect in solder joints
- Patent number 11,927,436
- Issue date Mar 12, 2024
- Hewlett Packard Enterprise Development LP
- Jaime E. Llinas
- G01 - MEASURING TESTING
Information Patent Grant
Imaging system
- Patent number 11,860,354
- Issue date Jan 2, 2024
- Scanogen Inc.
- Zhiguang Xu
- G01 - MEASURING TESTING
Information Patent Grant
System for spatial multiplexing
- Patent number 11,768,068
- Issue date Sep 26, 2023
- Ramot at Tel Aviv University Ltd.
- Natan Tzvi Shaked
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of metrology and associated apparatuses
- Patent number 11,733,614
- Issue date Aug 22, 2023
- ASML Netherlands B.V.
- Thomas Jarik Huisman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods, systems and apparatus of interferometry for imaging and se...
- Patent number 11,598,627
- Issue date Mar 7, 2023
- Virginia Tech Intellectual Properties, Inc.
- Yizheng Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Metrology method and apparatus, substrate, lithographic system and...
- Patent number 11,526,085
- Issue date Dec 13, 2022
- ASML Netherlands B.V.
- Hendrik Jan Hidde Smilde
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for determining the thickness and refractive index of a laye...
- Patent number 11,371,831
- Issue date Jun 28, 2022
- Carl Zeiss Microscopy GmbH
- Nils Langholz
- G01 - MEASURING TESTING
Information Patent Grant
Polarization holographic microscope system and sample image acquisi...
- Patent number 11,365,961
- Issue date Jun 21, 2022
- Korea University Research and Business Foundation
- Youngwoon Choi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging system
- Patent number 11,360,296
- Issue date Jun 14, 2022
- Scanogen Inc.
- Zhiguang Xu
- G02 - OPTICS
Information Patent Grant
Systems and methods for interferometric multifocus microscopy
- Patent number 11,340,057
- Issue date May 24, 2022
- Northwestern University
- Kuan He
- G01 - MEASURING TESTING
Information Patent Grant
Shearing interferometry measurement device for microscopy
- Patent number 11,248,901
- Issue date Feb 15, 2022
- NIKON CORPORATION
- Eric Peter Goodwin
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement and method for robust single-shot interferometry
- Patent number 11,231,269
- Issue date Jan 25, 2022
- Universitat Stuttgart
- Klaus Körner
- G01 - MEASURING TESTING
Information Patent Grant
Multiple offset interferometer
- Patent number 11,226,588
- Issue date Jan 18, 2022
- Siemens Healthcare GmbH
- Thomas Engel
- G01 - MEASURING TESTING
Information Patent Grant
Method of metrology and associated apparatuses
- Patent number 11,112,703
- Issue date Sep 7, 2021
- ASML Netherlands B.V.
- Thomas Jarik Huisman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reflectance confocal microscopy of blood cells
- Patent number 10,921,112
- Issue date Feb 16, 2021
- Technion Research and Development Foundation Ltd.
- Dvir Yelin
- G01 - MEASURING TESTING
Information Patent Grant
Data processing device for scanning probe microscope
- Patent number 10,871,505
- Issue date Dec 22, 2020
- SHIMADZIJ CORPORATION
- Kenji Yamasaki
- G01 - MEASURING TESTING
Information Patent Grant
Imaging system
- Patent number 10,768,406
- Issue date Sep 8, 2020
- Scanogen Inc.
- Zhiguang Xu
- G01 - MEASURING TESTING
Information Patent Grant
Metrology method and apparatus, substrate, lithographic system and...
- Patent number 10,739,687
- Issue date Aug 11, 2020
- ASML Netherlands B.V.
- Hendrik Jan Hidde Smilde
- G01 - MEASURING TESTING
Information Patent Grant
Sample shape measuring apparatus for calculating a shape of a sampl...
- Patent number 10,697,764
- Issue date Jun 30, 2020
- Olympus Corporation
- Mayumi Odaira
- G01 - MEASURING TESTING
Information Patent Grant
Scanning confocal microscope apparatus, scanning control method, an...
- Patent number 10,678,038
- Issue date Jun 9, 2020
- Olympus Corporation
- Akihiro Fujii
- G01 - MEASURING TESTING
Information Patent Grant
Sensor head
- Patent number 10,663,285
- Issue date May 26, 2020
- Omron Corporation
- Mariko Marukawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Device for imaging a sample surface
- Patent number 10,649,189
- Issue date May 12, 2020
- Witec Wissenschaftliche Instrumente und Technologie GmbH
- Olaf Hollricher
- G02 - OPTICS
Information Patent Grant
Probe system for measuring at least one measurement object in optic...
- Patent number 10,641,602
- Issue date May 5, 2020
- Carl Zeiss Industrielle Messtechnik GmbH
- Otto Ruck
- G02 - OPTICS
Information Patent Grant
Coherent fluorescence super-resolution microscopy
- Patent number 10,585,272
- Issue date Mar 10, 2020
- University of Utah Research Foundation
- Rajesh Menon
- G01 - MEASURING TESTING
Information Patent Grant
Single shot full-field reflection phase microscopy
- Patent number 10,451,402
- Issue date Oct 22, 2019
- Massachusetts Institute of Technology
- Zahid Yaqoob
- G01 - MEASURING TESTING
Information Patent Grant
Scanning microscope with controlled variable measurement parameters
- Patent number 10,338,367
- Issue date Jul 2, 2019
- Hitachi, Ltd.
- Ryoko Araki
- G02 - OPTICS
Information Patent Grant
Light microscope and method for image recording using a light micro...
- Patent number 10,261,300
- Issue date Apr 16, 2019
- Carl Zeiss Microscopy GmbH
- Helmut Lippert
- G02 - OPTICS
Information Patent Grant
Optical technique for coating characterization
- Patent number 10,247,661
- Issue date Apr 2, 2019
- Cook Medical Technologies LLC
- John Neilan
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for digital holographic microtomography
- Patent number 10,234,268
- Issue date Mar 19, 2019
- National Taiwan Normal University
- Chau-Jern Cheng
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR EXTRACTING SURFACE MORPHOLOGY AND FABRIC CHARACTERISTICS...
- Publication number 20240410689
- Publication date Dec 12, 2024
- Chengdu University of Technology
- Wenli ZHONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MEASURING SURFACE PARAMETER OF COPPER FOIL, METHOD FOR S...
- Publication number 20240328779
- Publication date Oct 3, 2024
- Mitsui Mining and Smelting Co., Ltd.
- Hiroaki KURIHARA
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC SYSTEM WITH DEEP LEARNING ALGORITHM TO PROCESS TWO...
- Publication number 20240210158
- Publication date Jun 27, 2024
- Arizona Board of Regents on behalf of The University of Arizona
- Rongguang Liang
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR STRUCTURED ILLUMINATION MICROSCOPY AND STRUCTURED ILLUMI...
- Publication number 20240210160
- Publication date Jun 27, 2024
- MITUTOYO CORPORATION
- Bart Geert ENTINK
- G01 - MEASURING TESTING
Information Patent Application
CALCULATION METHOD, IMAGE-CAPTURING METHOD, AND IMAGE-CAPTURING APP...
- Publication number 20230392919
- Publication date Dec 7, 2023
- Lasertec Corporation
- Yoshihiro NISHIMURA
- G01 - MEASURING TESTING
Information Patent Application
FOCAL PLANE SPACERS FOR MICROSCOPE SLIDES AND RELATED SYSTEMS AND M...
- Publication number 20230341672
- Publication date Oct 26, 2023
- Mark S. Evans
- G01 - MEASURING TESTING
Information Patent Application
IMAGING SYSTEM
- Publication number 20220276480
- Publication date Sep 1, 2022
- Scanogen Inc.
- Zhiguang Xu
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF METROLOGY AND ASSOCIATED APPARATUSES
- Publication number 20220107571
- Publication date Apr 7, 2022
- ASML NETHERLANDS B.V.
- Thomas Jarik Huisman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHEARING INTERFEROMETRY MEASUREMENT DEVICE FOR MICROSCOPY
- Publication number 20210302150
- Publication date Sep 30, 2021
- Nikon Corporation
- Eric Peter Goodwin
- G02 - OPTICS
Information Patent Application
Method for Determining the Thickness and Refractive Index of a Layer
- Publication number 20210293530
- Publication date Sep 23, 2021
- CARL ZEISS MICROSCOPY GMBH
- Nils LANGHOLZ
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR INTERFEROMETRIC MULTIFOCUS MICROSCOPY
- Publication number 20210215472
- Publication date Jul 15, 2021
- Northwestern University
- Kuan He
- G01 - MEASURING TESTING
Information Patent Application
Arrangement and Method for Robust Single-Shot Interferometry
- Publication number 20200408505
- Publication date Dec 31, 2020
- UNIVERSITAT STUTTGART
- Klaus Körner
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
IMAGING SYSTEM
- Publication number 20200400932
- Publication date Dec 24, 2020
- Scanogen Inc.
- Zhiguang Xu
- G02 - OPTICS
Information Patent Application
METROLOGY METHOD AND APPARATUS, SUBSTRATE, LITHOGRAPHIC SYSTEM AND...
- Publication number 20200379359
- Publication date Dec 3, 2020
- ASML NETHERLANDS B.V.
- Hendrik Jan Hidde SMILDE
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPE ASSEMBLY FOR CAPTURING AND DISPLAYING THREE-DIMENSIONAL...
- Publication number 20200371338
- Publication date Nov 26, 2020
- CARL ZEISS MICROSCOPY GMBH
- Ilja KARANIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR SUPER-RESOLUTION FULL-FIELD OPTICAL METROLOGY...
- Publication number 20200103224
- Publication date Apr 2, 2020
- UNIVERSITE DE STRASBOURG
- Paul MONTGOMERY
- G02 - OPTICS
Information Patent Application
DATA PROCESSING DEVICE FOR SCANNING PROBE MICROSCOPE
- Publication number 20190383855
- Publication date Dec 19, 2019
- SHIMADZU CORPORATION
- Kenji YAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF METROLOGY AND ASSOCIATED APPARATUSES
- Publication number 20190294055
- Publication date Sep 26, 2019
- ASML Netherlands B.V.
- Thomas Jarik Huisman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SAMPLE SHAPE MEASURING METHOD AND SAMPLE SHAPE MEASURING APPARATUS
- Publication number 20190265024
- Publication date Aug 29, 2019
- OLYMPUS CORPORATION
- Mayumi ODAIRA
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM FOR MEASURING AT LEAST ONE MEASUREMENT OBJECT IN OPTIC...
- Publication number 20190107383
- Publication date Apr 11, 2019
- Carl Zeiss Industrielle Messtechnik GmbH
- Otto Ruck
- G01 - MEASURING TESTING
Information Patent Application
SENSOR HEAD
- Publication number 20190101374
- Publication date Apr 4, 2019
- Omron Corporation
- Mariko MARUKAWA
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY METHOD AND APPARATUS, SUBSTRATE, LITHOGRAPHIC SYSTEM AND...
- Publication number 20190094712
- Publication date Mar 28, 2019
- ASML NETHERLANDS B.V.
- Hendrik Jan Hidde SMILDE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS, SYSTEMS AND APPARATUS OF INTERFEROMETRY FOR IMAGING AND SE...
- Publication number 20190056212
- Publication date Feb 21, 2019
- Virginia Tech Intellectual Properties, Inc.
- YIZHENG ZHU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DIGITAL HOLOGRAPHIC MICROTOMOGRAPHY
- Publication number 20180266806
- Publication date Sep 20, 2018
- National Taiwan Normal University
- Chau-Jern Cheng
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
REFLECTANCE CONFOCAL MICROSCOPY OF BLOOD CELLS
- Publication number 20180259318
- Publication date Sep 13, 2018
- Technion Research & Development Foundation Ltd.
- DVIR YELIN
- G01 - MEASURING TESTING
Information Patent Application
TRUE HETERODYNE SPECTRALLY CONTROLLED INTERFEROMETRY
- Publication number 20180149468
- Publication date May 31, 2018
- APRE INSTRUMENTS, LLC
- ARTUR OLSZAK
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR SIMULTANEOUSLY MEASURING SURFACE NORMAL VECTO...
- Publication number 20180087894
- Publication date Mar 29, 2018
- Korea Advanced Institute of Science and Technology
- MinHyuk Kim
- G02 - OPTICS
Information Patent Application
SCANNING MICROSCOPE
- Publication number 20180067294
- Publication date Mar 8, 2018
- Hitachi, Ltd
- Ryoko ARAKI
- G02 - OPTICS
Information Patent Application
IMAGING SYSTEM
- Publication number 20170363851
- Publication date Dec 21, 2017
- Scanogen Inc.
- Zhiguang Xu
- G02 - OPTICS
Information Patent Application
OPTICAL TELEMETRY DEVICE
- Publication number 20170299375
- Publication date Oct 19, 2017
- Centre National De La Recherche Scientifique-cnrs
- Pierre Bon
- G02 - OPTICS

Measuring microscopes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Radiation detection device, recording medium, and positioning method

Measurement machine and method for detecting a defect in solder joints

Imaging system

System for spatial multiplexing

Method of metrology and associated apparatuses

Methods, systems and apparatus of interferometry for imaging and se...

Metrology method and apparatus, substrate, lithographic system and...

Method for determining the thickness and refractive index of a laye...

Polarization holographic microscope system and sample image acquisi...

Imaging system

Systems and methods for interferometric multifocus microscopy

Shearing interferometry measurement device for microscopy

Arrangement and method for robust single-shot interferometry

Multiple offset interferometer

Method of metrology and associated apparatuses

Reflectance confocal microscopy of blood cells

Data processing device for scanning probe microscope

Imaging system

Metrology method and apparatus, substrate, lithographic system and...

Sample shape measuring apparatus for calculating a shape of a sampl...

Scanning confocal microscope apparatus, scanning control method, an...

Sensor head

Device for imaging a sample surface

Probe system for measuring at least one measurement object in optic...

Coherent fluorescence super-resolution microscopy

Single shot full-field reflection phase microscopy

Scanning microscope with controlled variable measurement parameters

Light microscope and method for image recording using a light micro...

Optical technique for coating characterization

Method and apparatus for digital holographic microtomography

Patents Applicationslast 30 patents

METHOD FOR EXTRACTING SURFACE MORPHOLOGY AND FABRIC CHARACTERISTICS...

METHOD FOR MEASURING SURFACE PARAMETER OF COPPER FOIL, METHOD FOR S...

INTERFEROMETRIC SYSTEM WITH DEEP LEARNING ALGORITHM TO PROCESS TWO...

METHOD FOR STRUCTURED ILLUMINATION MICROSCOPY AND STRUCTURED ILLUMI...

CALCULATION METHOD, IMAGE-CAPTURING METHOD, AND IMAGE-CAPTURING APP...

FOCAL PLANE SPACERS FOR MICROSCOPE SLIDES AND RELATED SYSTEMS AND M...

IMAGING SYSTEM

METHOD OF METROLOGY AND ASSOCIATED APPARATUSES

SHEARING INTERFEROMETRY MEASUREMENT DEVICE FOR MICROSCOPY

Method for Determining the Thickness and Refractive Index of a Layer

SYSTEMS AND METHODS FOR INTERFEROMETRIC MULTIFOCUS MICROSCOPY

Arrangement and Method for Robust Single-Shot Interferometry

IMAGING SYSTEM

METROLOGY METHOD AND APPARATUS, SUBSTRATE, LITHOGRAPHIC SYSTEM AND...

MICROSCOPE ASSEMBLY FOR CAPTURING AND DISPLAYING THREE-DIMENSIONAL...

SYSTEM AND METHOD FOR SUPER-RESOLUTION FULL-FIELD OPTICAL METROLOGY...

DATA PROCESSING DEVICE FOR SCANNING PROBE MICROSCOPE

METHOD OF METROLOGY AND ASSOCIATED APPARATUSES

SAMPLE SHAPE MEASURING METHOD AND SAMPLE SHAPE MEASURING APPARATUS

PROBE SYSTEM FOR MEASURING AT LEAST ONE MEASUREMENT OBJECT IN OPTIC...

SENSOR HEAD

METROLOGY METHOD AND APPARATUS, SUBSTRATE, LITHOGRAPHIC SYSTEM AND...

METHODS, SYSTEMS AND APPARATUS OF INTERFEROMETRY FOR IMAGING AND SE...

METHOD AND APPARATUS FOR DIGITAL HOLOGRAPHIC MICROTOMOGRAPHY

REFLECTANCE CONFOCAL MICROSCOPY OF BLOOD CELLS

TRUE HETERODYNE SPECTRALLY CONTROLLED INTERFEROMETRY

METHOD AND SYSTEM FOR SIMULTANEOUSLY MEASURING SURFACE NORMAL VECTO...

SCANNING MICROSCOPE

IMAGING SYSTEM

OPTICAL TELEMETRY DEVICE