Measuring optical wavelength

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CPC
G01J9/0246

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J9/00Measuring optical phase difference Determining degree of coherence Measuring optical wavelength

Current Industry

G01J9/0246Measuring optical wavelength

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method and device for detecting absolute or relative temperature an...
- Patent number 12,123,800
- Issue date Oct 22, 2024
- Adtran Networks SE
- Benjamin Wohlfeil
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic device and infrared communication method based on interf...
- Patent number 12,074,638
- Issue date Aug 27, 2024
- Samsung Electronics Co., Ltd.
- Kangho Byun
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Interferometer with at least one dispersive element
- Patent number 11,988,562
- Issue date May 21, 2024
- SYSTEMS & TECHNOLOGY RESEARCH, LLC
- Scott Bloom
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring wavelength for laser device
- Patent number 11,971,307
- Issue date Apr 30, 2024
- Beijing RSLaserOpto-Electronics Technology Co. Ltd
- Guangyi Liu
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer and optical instrument with integrated optical compo...
- Patent number 11,933,609
- Issue date Mar 19, 2024
- Yokogawa Electric Corporation
- Nobuhide Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Determination of measurement error in an etalon
- Patent number 11,860,036
- Issue date Jan 2, 2024
- Cymer, LLC
- Russell Allen Burdt
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for detecting absolute or relative temperature an...
- Patent number 11,846,559
- Issue date Dec 19, 2023
- Adtran Networks SE
- Benjamin Wohlfeil
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quantitative phase image generating method, quantitative phase imag...
- Patent number 11,808,929
- Issue date Nov 7, 2023
- Nikon Corporation
- Shota Tsuchida
- G01 - MEASURING TESTING
Information Patent Grant
High precision optical locker
- Patent number 11,662,508
- Issue date May 30, 2023
- Lumentum Operations LLC
- Adrian Perrin Janssen
- G01 - MEASURING TESTING
Information Patent Grant
Optical deflector parameter measurement device, method, and program
- Patent number 11,656,073
- Issue date May 23, 2023
- Nippon Telegraph and Telephone Corporation
- Masahiro Ueno
- G01 - MEASURING TESTING
Information Patent Grant
Calculation method, recording method, optical film, and phase modul...
- Patent number 11,573,527
- Issue date Feb 7, 2023
- Toppan Printing Co., Ltd.
- Akihito Kagotani
- B42 - BOOKBINDING ALBUMS FILES SPECIAL PRINTED MATTER
Information Patent Grant
Wavelength tracking system, method to calibrate a wavelength tracki...
- Patent number 11,525,737
- Issue date Dec 13, 2022
- ASML Netherland B.V.
- Maarten Jozef Jansen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Integrated wavelength locker
- Patent number 11,476,636
- Issue date Oct 18, 2022
- OpenLight Photonics, Inc.
- John Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical frequency measurement device
- Patent number 11,460,347
- Issue date Oct 4, 2022
- Lumentum Operations LLC
- Colin Smith
- G02 - OPTICS
Information Patent Grant
Increasing the measurement precision of optical instrumentation usi...
- Patent number 11,435,234
- Issue date Sep 6, 2022
- Quantum Valley Ideas Laboratories
- James Keaveney
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Wavelength determination using an optical filter having complementa...
- Patent number 11,333,556
- Issue date May 17, 2022
- Simmonds Precision Products, Inc.
- Tyler Arsenault
- G01 - MEASURING TESTING
Information Patent Grant
Laser system
- Patent number 11,329,447
- Issue date May 10, 2022
- M SQUARED LASERS LIMITED
- Gareth Thomas Maker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated optic wavemeter and method for fiber optic gyroscopes sc...
- Patent number 11,320,267
- Issue date May 3, 2022
- KVH Industries, Inc.
- Liming Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optoelectrical chip
- Patent number 11,237,060
- Issue date Feb 1, 2022
- FOS4X GMBH
- Markus Schmid
- G01 - MEASURING TESTING
Information Patent Grant
Laser detection system
- Patent number 11,169,030
- Issue date Nov 9, 2021
- Aston University
- David Benton
- G01 - MEASURING TESTING
Information Patent Grant
Coherent light detection system and method
- Patent number 11,047,742
- Issue date Jun 29, 2021
- The Boeing Company
- Thomas G. Chrien
- G01 - MEASURING TESTING
Information Patent Grant
Measuring wavelength of light
- Patent number 10,948,356
- Issue date Mar 16, 2021
- Quantum Valley Ideas Laboratories
- James Keaveney
- G01 - MEASURING TESTING
Information Patent Grant
Sine-cosine optical frequency encoder devices based on optical pola...
- Patent number 10,895,477
- Issue date Jan 19, 2021
- General Photonics Corporation
- Xiaotian Steve Yao
- G01 - MEASURING TESTING
Information Patent Grant
Wavemeter using pairs of interferometric optical cavities
- Patent number 10,845,251
- Issue date Nov 24, 2020
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscope, wavelength measuring device, and spectrum measuring m...
- Patent number 10,801,893
- Issue date Oct 13, 2020
- Osaka University
- Tsuyoshi Konishi
- G01 - MEASURING TESTING
Information Patent Grant
Process and device including a fixed cavity with a free spectral ra...
- Patent number 10,768,051
- Issue date Sep 8, 2020
- BLUE INDUSTRY AND SCIENCE
- Johann Georges Des Aulnois
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional interferometer and method for determining a phase...
- Patent number 10,663,351
- Issue date May 26, 2020
- Martin Berz
- G01 - MEASURING TESTING
Information Patent Grant
Compact wavelength meter and laser output measurement device
- Patent number 10,578,494
- Issue date Mar 3, 2020
- Lockheed Martin Coherent Technologies, Inc.
- Bruce Gregory Tiemann
- G01 - MEASURING TESTING
Information Patent Grant
Method for stabilizing a spectrometer using single spectral notch
- Patent number 10,545,049
- Issue date Jan 28, 2020
- Spectral Engines Oy
- Jarkko Antila
- G02 - OPTICS
Information Patent Grant
High precision wavelength measurement and control of a tunable laser
- Patent number 10,502,632
- Issue date Dec 10, 2019
- Intuitive Surgical Operations, Inc.
- Ryan Seeley
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC DETECTION SYSTEM
- Publication number 20240361185
- Publication date Oct 31, 2024
- ULTRA DISPLAY TECHNOLOGY CORP.
- Hsien-Te CHEN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL WAVELENGTH MEASURING DEVICE USING ABSORPTION-TYPE OPTICAL F...
- Publication number 20240280412
- Publication date Aug 22, 2024
- GIST (Gwangju Institue of Science and Technology)
- Bok Hyeon KIM
- G01 - MEASURING TESTING
Information Patent Application
Method and Device for Detecting Absolute or Relative Temperature an...
- Publication number 20240085267
- Publication date Mar 14, 2024
- Adtran Networks SE
- Benjamin Wohlfeil
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
QUANTITATIVE PHASE IMAGE GENERATING METHOD, QUANTITATIVE PHASE IMAG...
- Publication number 20240004176
- Publication date Jan 4, 2024
- Nikon Corporation
- Shota TSUCHIDA
- G02 - OPTICS
Information Patent Application
LASER SOURCE, LIDAR SYSTEM AND METHOD FOR CONTROLLING A LASER SOURCE
- Publication number 20230327402
- Publication date Oct 12, 2023
- ams-OSRAM International GmbH
- Hubert HALBRITTER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Optical Sensor Module Including an Interferometric Sensor and Exten...
- Publication number 20230314185
- Publication date Oct 5, 2023
- Apple Inc.
- Tong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR OPERATING OPTICAL WAVEMETER AND WAVEMETER...
- Publication number 20230204430
- Publication date Jun 29, 2023
- Huawei Technologies Canada Co., Ltd.
- Trevor James HALL
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION OF MEASUREMENT ERROR IN AN ETALON
- Publication number 20230142333
- Publication date May 11, 2023
- CYMER, LLC
- Russell Allen Burdt
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING WAVELENGTH FOR LASER DEVICE
- Publication number 20230144290
- Publication date May 11, 2023
- Beijing Rslaser Opto-Electronics Technology Co., Ltd.
- Guangyi LIU
- G01 - MEASURING TESTING
Information Patent Application
Wavelength Tracking System, Method to Calibrate a Wavelength Tracki...
- Publication number 20230056872
- Publication date Feb 23, 2023
- ASML NETHERLANDS B.V.
- Engelbertus Antonius Fransiscus VAN DER PASCH
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
HIGH PRECISION OPTICAL LOCKER
- Publication number 20230025759
- Publication date Jan 26, 2023
- Lumentum Operations LLC
- Adrian Perrin JANSSEN
- G02 - OPTICS
Information Patent Application
INTERFEROMETER WITH AT LEAST ONE DISPERSIVE ELEMENT
- Publication number 20220326086
- Publication date Oct 13, 2022
- Systems & Technology Research, LLC
- Scott Bloom
- G01 - MEASURING TESTING
Information Patent Application
Increasing the Measurement Precision of Optical Instrumentation usi...
- Publication number 20220260428
- Publication date Aug 18, 2022
- Quantum Valley Ideas Laboratories
- James Keaveney
- G01 - MEASURING TESTING
Information Patent Application
Optical Deflector Parameter Measurement Device, Method, and Program
- Publication number 20210404908
- Publication date Dec 30, 2021
- Nippon Telegraph and Telephone Corporation
- Masahiro Ueno
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE AND INFRARED COMMUNICATION METHOD BASED ON INTERF...
- Publication number 20210367667
- Publication date Nov 25, 2021
- Samsung Electronics Co., LTD
- Kangho BYUN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL FREQUENCY MEASUREMENT DEVICE
- Publication number 20210262862
- Publication date Aug 26, 2021
- Lumentum Operations LLC
- Colin SMITH
- G01 - MEASURING TESTING
Information Patent Application
COHERENT LIGHT DETECTION SYSTEM AND METHOD
- Publication number 20210148764
- Publication date May 20, 2021
- The Boeing Company
- THOMAS G. CHRIEN
- G01 - MEASURING TESTING
Information Patent Application
Wavelength Tracking System, Method to Calibrate a Wavelength Tracki...
- Publication number 20210072088
- Publication date Mar 11, 2021
- ASML NETHERLANDS B.V.
- Engelbertus Antonius Fransiscus VAN DER PASCH
- G01 - MEASURING TESTING
Information Patent Application
OPTOELECTRICAL CHIP
- Publication number 20200300709
- Publication date Sep 24, 2020
- fos4X GmbH
- Markus SCHMID
- G01 - MEASURING TESTING
Information Patent Application
LASER SYSTEM
- Publication number 20200295525
- Publication date Sep 17, 2020
- M Squared Lasers Limited
- Gareth Thomas MAKER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LASER DETECTION SYSTEM
- Publication number 20200278258
- Publication date Sep 3, 2020
- ASTON UNIVERSITY
- David Benton
- G01 - MEASURING TESTING
Information Patent Application
Refraction Measurement of the Human Eye with a Reverse Wavefront Se...
- Publication number 20200178793
- Publication date Jun 11, 2020
- EyeQue Inc.
- Noam Sapiens
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
HIGH PRECISION WAVELENGTH MEASUREMENT AND CONTROL OF A TUNABLE LASER
- Publication number 20200182702
- Publication date Jun 11, 2020
- Intuitive Surgical Operations, Inc.
- Ryan J. Seeley
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MODULE
- Publication number 20200018910
- Publication date Jan 16, 2020
- SUMITOMO ELECTRIC INDUSTRIES,LTD.
- Tomoya SAEKI
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPE, WAVELENGTH MEASURING DEVICE, AND SPECTRUM MEASURING M...
- Publication number 20190301938
- Publication date Oct 3, 2019
- OSAKA UNIVERSITY
- Tsuyoshi KONISHI
- G01 - MEASURING TESTING
Information Patent Application
CALCULATION METHOD, RECORDING METHOD, OPTICAL FILM, AND PHASE MODUL...
- Publication number 20190293492
- Publication date Sep 26, 2019
- Toppan Printing Co., Ltd.
- Akihito KAGOTANI
- B42 - BOOKBINDING ALBUMS FILES SPECIAL PRINTED MATTER
Information Patent Application
PROCESS AND DEVICE FOR CHARACTERISING AN OPTICAL SOURCE
- Publication number 20190293491
- Publication date Sep 26, 2019
- BLUE INDUSTRY AND SCIENCE
- Johann GEORGES DES AULNOIS
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED WAVELENGTH LOCKER
- Publication number 20190199060
- Publication date Jun 27, 2019
- Juniper Networks, Inc.
- John Parker
- G02 - OPTICS
Information Patent Application
INTEGRATED WAVELENGTH LOCKER
- Publication number 20190199061
- Publication date Jun 27, 2019
- Juniper Networks, Inc.
- John Parker
- G02 - OPTICS
Information Patent Application
Three-dimensional Interferometer and Method for Determining a Phase...
- Publication number 20190145831
- Publication date May 16, 2019
- Martin BERZ
- G01 - MEASURING TESTING

Measuring optical wavelength

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and device for detecting absolute or relative temperature an...

Electronic device and infrared communication method based on interf...

Interferometer with at least one dispersive element

Device and method for measuring wavelength for laser device

Interferometer and optical instrument with integrated optical compo...

Determination of measurement error in an etalon

Method and device for detecting absolute or relative temperature an...

Quantitative phase image generating method, quantitative phase imag...

High precision optical locker

Optical deflector parameter measurement device, method, and program

Calculation method, recording method, optical film, and phase modul...

Wavelength tracking system, method to calibrate a wavelength tracki...

Integrated wavelength locker

Optical frequency measurement device

Increasing the measurement precision of optical instrumentation usi...

Wavelength determination using an optical filter having complementa...

Laser system

Integrated optic wavemeter and method for fiber optic gyroscopes sc...

Optoelectrical chip

Laser detection system

Coherent light detection system and method

Measuring wavelength of light

Sine-cosine optical frequency encoder devices based on optical pola...

Wavemeter using pairs of interferometric optical cavities

Spectroscope, wavelength measuring device, and spectrum measuring m...

Process and device including a fixed cavity with a free spectral ra...

Three-dimensional interferometer and method for determining a phase...

Compact wavelength meter and laser output measurement device

Method for stabilizing a spectrometer using single spectral notch

High precision wavelength measurement and control of a tunable laser

Patents Applicationslast 30 patents

ELECTRONIC DETECTION SYSTEM

OPTICAL WAVELENGTH MEASURING DEVICE USING ABSORPTION-TYPE OPTICAL F...

Method and Device for Detecting Absolute or Relative Temperature an...

QUANTITATIVE PHASE IMAGE GENERATING METHOD, QUANTITATIVE PHASE IMAG...

LASER SOURCE, LIDAR SYSTEM AND METHOD FOR CONTROLLING A LASER SOURCE

Optical Sensor Module Including an Interferometric Sensor and Exten...

METHOD AND APPARATUS FOR OPERATING OPTICAL WAVEMETER AND WAVEMETER...

DETERMINATION OF MEASUREMENT ERROR IN AN ETALON

DEVICE AND METHOD FOR MEASURING WAVELENGTH FOR LASER DEVICE

Wavelength Tracking System, Method to Calibrate a Wavelength Tracki...

HIGH PRECISION OPTICAL LOCKER

INTERFEROMETER WITH AT LEAST ONE DISPERSIVE ELEMENT

Increasing the Measurement Precision of Optical Instrumentation usi...

Optical Deflector Parameter Measurement Device, Method, and Program

ELECTRONIC DEVICE AND INFRARED COMMUNICATION METHOD BASED ON INTERF...

OPTICAL FREQUENCY MEASUREMENT DEVICE

COHERENT LIGHT DETECTION SYSTEM AND METHOD

Wavelength Tracking System, Method to Calibrate a Wavelength Tracki...

OPTOELECTRICAL CHIP

LASER SYSTEM

LASER DETECTION SYSTEM

Refraction Measurement of the Human Eye with a Reverse Wavefront Se...

HIGH PRECISION WAVELENGTH MEASUREMENT AND CONTROL OF A TUNABLE LASER

OPTICAL MODULE

SPECTROSCOPE, WAVELENGTH MEASURING DEVICE, AND SPECTRUM MEASURING M...

CALCULATION METHOD, RECORDING METHOD, OPTICAL FILM, AND PHASE MODUL...

PROCESS AND DEVICE FOR CHARACTERISING AN OPTICAL SOURCE

INTEGRATED WAVELENGTH LOCKER

INTEGRATED WAVELENGTH LOCKER

Three-dimensional Interferometer and Method for Determining a Phase...