Measuring or plotting hysteresis curves

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G01R33/14

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R33/00Arrangements or instruments for measuring magnetic variables

Current Industry

G01R33/14Measuring or plotting hysteresis curves

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Test and measurement instrument for determining magnetic core losses
- Patent number 12,020,855
- Issue date Jun 25, 2024
- Tektronix, Inc.
- Shubha B
- G01 - MEASURING TESTING
Information Patent Grant
Hysteresis effect-based field free point-magnetic particle imaging...
- Patent number 11,779,237
- Issue date Oct 10, 2023
- Beihang University
- Jie Tian
- G01 - MEASURING TESTING
Information Patent Grant
Tension measuring method
- Patent number 11,480,635
- Issue date Oct 25, 2022
- Kyoto University
- Kazuhiko Tsukada
- G01 - MEASURING TESTING
Information Patent Grant
Test and measurement instrument for determining maximum flux density
- Patent number 11,275,131
- Issue date Mar 15, 2022
- Tektronix, Inc.
- U N Vasudev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test and measurement instrument with a hysteresis loop mask
- Patent number 10,895,612
- Issue date Jan 19, 2021
- Tektronix, Inc.
- U N Vasudev
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring magnetic field using spin hall effect
- Patent number 10,809,319
- Issue date Oct 20, 2020
- Korea University Research and Business Foundation, Sejong Campus
- Kung-Won Rhie
- G01 - MEASURING TESTING
Information Patent Grant
Mobile transformer test device and method for testing a power trans...
- Patent number 10,775,449
- Issue date Sep 15, 2020
- Omicron Electronics GmbH
- Ulrich Klapper
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for vector hysteresis analysis
- Patent number 10,345,398
- Issue date Jul 9, 2019
- Ansys, Inc.
- Ping Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for determining temperature using a magnetic junc...
- Patent number 10,297,300
- Issue date May 21, 2019
- Samsung Electronics Co., Ltd.
- Sebastian Schafer
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for determining temperature using a magnetic junc...
- Patent number 10,276,226
- Issue date Apr 30, 2019
- Samsung Electronics Co., Ltd.
- Sebastian Schafer
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for magnetic characterization of induction heatin...
- Patent number 9,995,799
- Issue date Jun 12, 2018
- The Boeing Company
- John R. Hull
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for controlling the turn-on time of a device that...
- Patent number 9,520,712
- Issue date Dec 13, 2016
- Electricite de France
- Didier Cavallera
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
High frequency loss measurement apparatus and methods for inductors...
- Patent number 8,823,370
- Issue date Sep 2, 2014
- Virginia Tech Intellectual Properties, Inc.
- Mingkai Mu
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for characterizing magnetic properties of mat...
- Patent number 8,633,686
- Issue date Jan 21, 2014
- Purdue Research Foundation
- Scott D. Sudhoff
- G01 - MEASURING TESTING
Information Patent Grant
Residual magnetic flux determining apparatus
- Patent number 8,093,885
- Issue date Jan 10, 2012
- Mitsubishi Electric Corporation
- Hiroyuki Tsutada
- G01 - MEASURING TESTING
Information Patent Grant
Probe for a magnetic remanence measurement method, and method for d...
- Patent number 8,049,495
- Issue date Nov 1, 2011
- MTU Aero Engines GmbH
- Thomas Beller
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for the individualized characterization of magnet...
- Patent number 7,898,251
- Issue date Mar 1, 2011
- Micromag 2000, S.L.
- Pilar Marin Palacios
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for analyzing distribution of coercive force in v...
- Patent number 7,560,921
- Issue date Jul 14, 2009
- Japan Science and Technology Agency
- Shunji Ishio
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for measuring morphology of a conductive film...
- Patent number 7,403,001
- Issue date Jul 22, 2008
- Lam Research Corporation
- Andrew D. Bailey, III
- G01 - MEASURING TESTING
Information Patent Grant
In-circuit measurement of saturation flux density Bsat, coercivity...
- Patent number 7,222,034
- Issue date May 22, 2007
- Tektronix, Inc.
- P. E. Ramesh
- G01 - MEASURING TESTING
Information Patent Grant
Measurement probe and authentication device comprising the same
- Patent number 7,173,416
- Issue date Feb 6, 2007
- SICPA Holding S.A.
- Edgar Muller
- G07 - CHECKING-DEVICES
Information Patent Grant
Hysteresis loop tracer with symmetric balance coil
- Patent number 6,538,432
- Issue date Mar 25, 2003
- SHB Instruments, Inc.
- Stanley H. Bacon
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring remanence curve of a magnetic ma...
- Patent number 6,407,545
- Issue date Jun 18, 2002
- Fujitsu Limited
- Kenji Sato
- G01 - MEASURING TESTING
Information Patent Grant
Surface magnetometer with modulated flux gate section
- Patent number 5,287,056
- Issue date Feb 15, 1994
- LDJ Electronics, Inc.
- Leon D. Jackson
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring hysteresis characteristics in a...
- Patent number 5,241,269
- Issue date Aug 31, 1993
- Hewlett-Packard Company
- Shigeo Kamiya
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring characteristic magnetic distributio...
- Patent number 4,940,938
- Issue date Jul 10, 1990
- Glory Kogyo Kabushiki Kaisha
- Seishi Naito
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring the hysteresis loop of magnetic film
- Patent number 4,922,200
- Issue date May 1, 1990
- LDJ Electronics, Inc.
- Leon D. Jackson
- G01 - MEASURING TESTING
Information Patent Grant
Device having a magnetic head for measuring magnetization character...
- Patent number 4,901,016
- Issue date Feb 13, 1990
- Glory Kogyo Kabushiki Kaisha
- Sadatoshi Kusatani
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive M-H hysteresis testers for magnetic discs for comput...
- Patent number 4,843,316
- Issue date Jun 27, 1989
- Hewlett-Packard Company
- Victor W. Hesterman
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring magnetic properties of magnetic...
- Patent number 4,623,841
- Issue date Nov 18, 1986
- Motorola, Inc.
- Michael K. Stinson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR MAPPING THE OPEN CIRCUIT DEMAGNETISATION C...
- Publication number 20240210499
- Publication date Jun 27, 2024
- James CLEWETT
- G01 - MEASURING TESTING
Information Patent Application
TENSION MEASURING METHOD
- Publication number 20220075011
- Publication date Mar 10, 2022
- KYOTO UNIVERSITY
- Kazuhiko TSUKADA
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT FOR DETERMINING MAGNETIC CORE LOSSES
- Publication number 20210358685
- Publication date Nov 18, 2021
- Tektronix, Inc.
- Shubha B
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, MAGNETIC FIELD SIMULATOR METHOD,...
- Publication number 20200408859
- Publication date Dec 31, 2020
- Fujitsu Limited
- Koichi Shimizu
- G01 - MEASURING TESTING
Information Patent Application
Test and Measurement Instrument with a Hysteresis Loop Mask
- Publication number 20200116805
- Publication date Apr 16, 2020
- Tektronix, Inc.
- U N Vasudev
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING MAGNETIC FIELD USING SPIN HALL EFFECT
- Publication number 20190079147
- Publication date Mar 14, 2019
- KOREA UNIVERSITY RESEARCH AND BUSINESS FOUNDATION SEJONG CAMPUS
- Kung-Won RHIE
- G01 - MEASURING TESTING
Information Patent Application
CALCULATING METHOD FOR ULTIMATE DEMAGNETIZATION TEMPERATURE OF LOUD...
- Publication number 20190049531
- Publication date Feb 14, 2019
- Premium Loudspeakers (Hui Zhou) Co., Ltd.
- Zhiwen CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MOBILE TRANSFORMER TEST DEVICE AND METHOD FOR TESTING A POWER TRANS...
- Publication number 20180372787
- Publication date Dec 27, 2018
- OMICRON Electronics GmbH
- Ulrich Klapper
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING TEMPERATURE USING A MAGNETIC JUNC...
- Publication number 20180294024
- Publication date Oct 11, 2018
- Samsung Electronics Co., Ltd.
- Sebastian Schafer
- G11 - INFORMATION STORAGE
Information Patent Application
SIMULATION DEVICE, SIMULATION PROGRAM, AND SIMULATION METHOD
- Publication number 20170068762
- Publication date Mar 9, 2017
- Fujitsu Limited
- Koichi Shimizu
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Magnetic Characterization of Induction Heatin...
- Publication number 20170016967
- Publication date Jan 19, 2017
- The Boeing Company
- John R. Hull
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING TEMPERATURE USING A MAGNETIC JUNC...
- Publication number 20160104544
- Publication date Apr 14, 2016
- Sebastian Schafer
- G01 - MEASURING TESTING
Information Patent Application
ACCELERATING FIRST ORDER REVERSAL CURVE DISTRIBUTION MEASURMENTS
- Publication number 20160011283
- Publication date Jan 14, 2016
- Magnetic Daneshpajoh Kashan Company
- Mohammad Almasi Kashi
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CONTROLLING THE TURN-ON TIME OF A DEVICE THAT...
- Publication number 20140097704
- Publication date Apr 10, 2014
- NTT DoCoMo, Inc.
- Didier Cavallera
- G01 - MEASURING TESTING
Information Patent Application
High Frequency Loss Measurement Apparatus and Methods for Inductors...
- Publication number 20130049744
- Publication date Feb 28, 2013
- Mingkai Mu
- G01 - MEASURING TESTING
Information Patent Application
PERMANENT MAGNETIC ASSEMBLY FOR
- Publication number 20110273175
- Publication date Nov 10, 2011
- Koninklijke Philips Electronics N.V.
- Holger Timinger
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
RESIDUAL MAGNETIC FLUX DETERMINING APPARATUS
- Publication number 20100013470
- Publication date Jan 21, 2010
- Mitsubishi Electric Corporation
- Hiroyuki Tsutada
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR A MAGNETIC REMANENCE MEASUREMENT METHOD, AND METHOD FOR D...
- Publication number 20090102471
- Publication date Apr 23, 2009
- Thomas BELLER
- G01 - MEASURING TESTING
Information Patent Application
Method and Device for Analyzing Distribution of Coercive Force in V...
- Publication number 20080284422
- Publication date Nov 20, 2008
- Japan Science and Technology Agency
- Shunji Ishio
- G01 - MEASURING TESTING
Information Patent Application
Direct flux control system for magnetic structures
- Publication number 20070285195
- Publication date Dec 13, 2007
- Thomas W. Nehl
- G01 - MEASURING TESTING
Information Patent Application
Method and system for the individualized characterization of magnet...
- Publication number 20070187513
- Publication date Aug 16, 2007
- Pilar Marin Palacios
- G01 - MEASURING TESTING
Information Patent Application
Method of measuring sub-micrometer hysteresis loops of magnetic films
- Publication number 20060250129
- Publication date Nov 9, 2006
- National Yunlin University of Science and Technology
- Te-Ho Wu
- G01 - MEASURING TESTING
Information Patent Application
Measurement probe and authentication device comprising the same
- Publication number 20050225322
- Publication date Oct 13, 2005
- SICPA Holding S.A.
- Edgar Muller
- G07 - CHECKING-DEVICES
Information Patent Application
In-circuit measurement of saturation flux density Bsat, coercivity...
- Publication number 20050184736
- Publication date Aug 25, 2005
- P. E. Ramesh
- G01 - MEASURING TESTING

Measuring or plotting hysteresis curves

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Test and measurement instrument for determining magnetic core losses

Hysteresis effect-based field free point-magnetic particle imaging...

Tension measuring method

Test and measurement instrument for determining maximum flux density

Test and measurement instrument with a hysteresis loop mask

Device and method for measuring magnetic field using spin hall effect

Mobile transformer test device and method for testing a power trans...

Systems and methods for vector hysteresis analysis

Method and system for determining temperature using a magnetic junc...

Method and system for determining temperature using a magnetic junc...

System and method for magnetic characterization of induction heatin...

Method and system for controlling the turn-on time of a device that...

High frequency loss measurement apparatus and methods for inductors...

Methods and apparatus for characterizing magnetic properties of mat...

Residual magnetic flux determining apparatus

Probe for a magnetic remanence measurement method, and method for d...

Method and system for the individualized characterization of magnet...

Method and device for analyzing distribution of coercive force in v...

Methods and apparatus for measuring morphology of a conductive film...

In-circuit measurement of saturation flux density Bsat, coercivity...

Measurement probe and authentication device comprising the same

Hysteresis loop tracer with symmetric balance coil

Apparatus and method for measuring remanence curve of a magnetic ma...

Surface magnetometer with modulated flux gate section

Apparatus and method for measuring hysteresis characteristics in a...

Method and device for measuring characteristic magnetic distributio...

Apparatus for measuring the hysteresis loop of magnetic film

Device having a magnetic head for measuring magnetization character...

Nondestructive M-H hysteresis testers for magnetic discs for comput...

Method and apparatus for measuring magnetic properties of magnetic...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR MAPPING THE OPEN CIRCUIT DEMAGNETISATION C...

TENSION MEASURING METHOD

TEST AND MEASUREMENT INSTRUMENT FOR DETERMINING MAGNETIC CORE LOSSES

INFORMATION PROCESSING APPARATUS, MAGNETIC FIELD SIMULATOR METHOD,...

Test and Measurement Instrument with a Hysteresis Loop Mask

DEVICE AND METHOD FOR MEASURING MAGNETIC FIELD USING SPIN HALL EFFECT

CALCULATING METHOD FOR ULTIMATE DEMAGNETIZATION TEMPERATURE OF LOUD...

MOBILE TRANSFORMER TEST DEVICE AND METHOD FOR TESTING A POWER TRANS...

METHOD AND SYSTEM FOR DETERMINING TEMPERATURE USING A MAGNETIC JUNC...

SIMULATION DEVICE, SIMULATION PROGRAM, AND SIMULATION METHOD

System and Method for Magnetic Characterization of Induction Heatin...

METHOD AND SYSTEM FOR DETERMINING TEMPERATURE USING A MAGNETIC JUNC...

ACCELERATING FIRST ORDER REVERSAL CURVE DISTRIBUTION MEASURMENTS

METHOD AND SYSTEM FOR CONTROLLING THE TURN-ON TIME OF A DEVICE THAT...

High Frequency Loss Measurement Apparatus and Methods for Inductors...

PERMANENT MAGNETIC ASSEMBLY FOR

RESIDUAL MAGNETIC FLUX DETERMINING APPARATUS

PROBE FOR A MAGNETIC REMANENCE MEASUREMENT METHOD, AND METHOD FOR D...

Method and Device for Analyzing Distribution of Coercive Force in V...

Direct flux control system for magnetic structures

Method and system for the individualized characterization of magnet...

Method of measuring sub-micrometer hysteresis loops of magnetic films

Measurement probe and authentication device comprising the same

In-circuit measurement of saturation flux density Bsat, coercivity...