Membership
Tour
Register
Log in
Measuring polarisation of light
Follow
Industry
CPC
G01J4/00
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
Current Industry
G01J4/00
Measuring polarisation of light
Sub Industries
G01J4/02
Polarimeters of separated-field type Polarimeters of half-shadow type
G01J4/04
Polarimeters using electric detection means
Industries
Overview
Organizations
People
Information
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
Simulator and test method of polarization transmission in sea fog
Patent number
12,203,810
Issue date
Jan 21, 2025
Changchun University of Science and Technology
Qiang Fu
G01 - MEASURING TESTING
Information
Patent Grant
Method and electronic device for detecting wearing using polarization
Patent number
12,188,824
Issue date
Jan 7, 2025
Samsung Electronics Co., Ltd.
Jeahyuck Lee
G01 - MEASURING TESTING
Information
Patent Grant
Reconfigurable polarization imaging system
Patent number
12,169,144
Issue date
Dec 17, 2024
Arizona Board of Regents on behalf of the University of Arizona
Rongguang Liang
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods of acquiring polarization information
Patent number
12,163,841
Issue date
Dec 10, 2024
General Atomics Aeronautical Systems, Inc.
Darren A. Miller
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Vehicle sensor occlusion detection
Patent number
12,162,497
Issue date
Dec 10, 2024
Ford Global Technologies, LLC
David Michael Herman
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Polarization event cameras
Patent number
12,142,025
Issue date
Nov 12, 2024
Intrinsic Innovation LLC
Vage Taamazyan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Polarization spectral filter, polarization spectral filter array, a...
Patent number
12,135,434
Issue date
Nov 5, 2024
Samsung Electronics Co., Ltd.
Yeonsang Park
G02 - OPTICS
Information
Patent Grant
Cooperative polarization skylight background radiation measurement...
Patent number
12,135,277
Issue date
Nov 5, 2024
Hefei Institutes of Physical Science, CAS
Congming Dai
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Heat assisted detection and ranging based on spectropolarimetric im...
Patent number
12,135,240
Issue date
Nov 5, 2024
Purdue Research Foundation
Zubin Jacob
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Polarization-fluctuation estimating device and polarization-fluctua...
Patent number
12,136,997
Issue date
Nov 5, 2024
NEC Corporation
Masaki Sato
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Single chip spectral polarization imaging sensor
Patent number
12,130,180
Issue date
Oct 29, 2024
The Board of Trustees of the University of Illinois
Viktor Gruev
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method of utilizing polarized light for remote optical c...
Patent number
12,123,951
Issue date
Oct 22, 2024
BAE Systems Information and Electronic Systems Integration Inc.
Michael J. DeWeert
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
On-chip polarization detection and polarimetric imaging
Patent number
12,117,344
Issue date
Oct 15, 2024
Arizona Board of Regents on behalf of Arizona State University
Yu Yao
G01 - MEASURING TESTING
Information
Patent Grant
Optical measurement device with universal metasurface and optical m...
Patent number
12,104,948
Issue date
Oct 1, 2024
Korea Advanced Institute of Science and Technology
Jonghwa Shin
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring optical constants of thin film of fluorine-con...
Patent number
12,105,018
Issue date
Oct 1, 2024
Shin-Etsu Chemical Co., Ltd.
Takashi Uchida
G01 - MEASURING TESTING
Information
Patent Grant
Information generation device, information generation method and pr...
Patent number
12,101,583
Issue date
Sep 24, 2024
Sony Corporation
Hajime Mihara
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for parallel polarization analysis
Patent number
12,078,834
Issue date
Sep 3, 2024
President and Fellows of Harvard College
Noah A. Rubin
G01 - MEASURING TESTING
Information
Patent Grant
Polarization analysis apparatus and method for adjusting angle of i...
Patent number
12,066,331
Issue date
Aug 20, 2024
AUROS TECHNOLOGY, INC.
Mi Ta Park
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for infrared sensing
Patent number
12,055,442
Issue date
Aug 6, 2024
Waymo LLC
Benjamin Frevert
G01 - MEASURING TESTING
Information
Patent Grant
Polarization diffraction element and vector beam mode detection sys...
Patent number
12,055,742
Issue date
Aug 6, 2024
HAYASHI TELEMPU CORPORATION
Takeya Sakai
C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information
Patent Grant
Method for detecting abnormal growth of graphene, measurement appar...
Patent number
12,037,246
Issue date
Jul 16, 2024
Tokyo Electron Limited
Ryota Ifuku
C01 - INORGANIC CHEMISTRY
Information
Patent Grant
Polarimeter and method of determining a state of polarization of an...
Patent number
12,038,330
Issue date
Jul 16, 2024
Universite Laval
Zhongjin Lin
G02 - OPTICS
Information
Patent Grant
Trace microanalysis microscope systems and methods
Patent number
12,025,498
Issue date
Jul 2, 2024
SPECTRICON IKE
Konstantinos Balas
G01 - MEASURING TESTING
Information
Patent Grant
Combined multi-spectral and polarization sensor
Patent number
12,018,983
Issue date
Jun 25, 2024
The Boeing Company
David Roderick Gerwe
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Stress engineering of transparent materials
Patent number
11,965,793
Issue date
Apr 23, 2024
Xerox Corporation
Jacob Chamoun
G01 - MEASURING TESTING
Information
Patent Grant
Polarization measuring device and method of fabricating semiconduct...
Patent number
11,946,809
Issue date
Apr 2, 2024
Samsung Electronics Co., Ltd.
Ingi Kim
G01 - MEASURING TESTING
Information
Patent Grant
Adaptive polarization filter grids
Patent number
11,940,676
Issue date
Mar 26, 2024
Maximilian Ralph Peter Liechtenstein
G01 - MEASURING TESTING
Information
Patent Grant
Single-shot Mueller matrix polarimeter
Patent number
11,921,033
Issue date
Mar 5, 2024
Oxford University Innovation Limited
Martin Booth
G01 - MEASURING TESTING
Information
Patent Grant
Monolayer transition metal dichalcogenides having giant valley-pola...
Patent number
11,892,529
Issue date
Feb 6, 2024
Rensselaer Polytechnic Institute
Sufei Shi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Circular dichroism measurement device and circular dichroism measur...
Patent number
11,879,833
Issue date
Jan 23, 2024
Jasco Corporation
Yuichi Miyoshi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
POLARIZATION FLUCTUATION MONITORING APPARATUS, COMMUNICATION SYSTEM...
Publication number
20250007618
Publication date
Jan 2, 2025
NEC Corporation
Yusuke SASAKI
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
ON-CHIP POLARIZATION DETECTION AND POLARIMETRIC IMAGING
Publication number
20240418570
Publication date
Dec 19, 2024
Arizona Board of Regents on behalf of Arizona State University
Yu Yao
G01 - MEASURING TESTING
Information
Patent Application
WEYL SEMIMETAL INTEGRATED POLARIMETERS AND METHODS FOR MAKING THE SAME
Publication number
20240418569
Publication date
Dec 19, 2024
University of Southern California
Mercedeh Khajavikhan
G01 - MEASURING TESTING
Information
Patent Application
IMAGE POLARIMETER USING A MICRO-ELECTRO-MECHANICAL SYSTEM (MEMS) MI...
Publication number
20240402016
Publication date
Dec 5, 2024
Raytheon Company
Eric Rogala
G02 - OPTICS
Information
Patent Application
Linear Polarization Component Detection System and Method
Publication number
20240377259
Publication date
Nov 14, 2024
National Central University
Ju-Yi LEE
G01 - MEASURING TESTING
Information
Patent Application
SCALABLE NANOIMPRINT MANUFACTURING OF FUNCTIONAL MULTI-LAYER METASU...
Publication number
20240369738
Publication date
Nov 7, 2024
Arizona Board of Regents on behalf of Arizona State University
Chao WANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Systems and Methods for Infrared Sensing
Publication number
20240353265
Publication date
Oct 24, 2024
WAYMO LLC
Benjamin Frevert
G01 - MEASURING TESTING
Information
Patent Application
THERMAL IMAGING DEVICE
Publication number
20240344889
Publication date
Oct 17, 2024
Rayprus Technology (Foshan) Co., Ltd.
HSIANG-CHIEH YU
G02 - OPTICS
Information
Patent Application
TUNABLE HYPERSPECTRAL-POLARIMETRIC IMAGING SYSTEM
Publication number
20240288309
Publication date
Aug 29, 2024
Purdue Research Foundation
Xueji Wang
G01 - MEASURING TESTING
Information
Patent Application
DEVICES AND METHODS FOR DETERMINING POLARIZATION CHARACTERISTICS FR...
Publication number
20240240986
Publication date
Jul 18, 2024
Arizona Board of Regents on behalf of The University of Arizona
Meredith Kupinski
G01 - MEASURING TESTING
Information
Patent Application
ADAPTIVE POLARIZATION FILTER GRIDS
Publication number
20240241393
Publication date
Jul 18, 2024
Maximilian Ralph Peter von Liechtenstein
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS OF IMAGING POLARIMETRY THROUGH METASURFACE POLA...
Publication number
20240210246
Publication date
Jun 27, 2024
President and Fellows of Harvard College
Noah A. RUBIN
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND A METHOD FOR POLARIZATION DEPENDENT IMAGING
Publication number
20240210245
Publication date
Jun 27, 2024
IMEC vzw
Farhan ALI
G01 - MEASURING TESTING
Information
Patent Application
POLARIMETRIC IMAGE SENSOR
Publication number
20240204021
Publication date
Jun 20, 2024
Commissariat a I'Energie Atomique et aux Energies Alternatives
François Deneuville
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
POLARIMETRIC IMAGE SENSOR
Publication number
20240201015
Publication date
Jun 20, 2024
Commissariat a I'Energie Atomique et aux Energies Alternatives
François Deneuville
G01 - MEASURING TESTING
Information
Patent Application
POLARIZING FILTER AND POLARIMETRIC IMAGE SENSOR INTEGRATING SUCH A...
Publication number
20240201016
Publication date
Jun 20, 2024
Commissariat a I'Energie Atomique et aux Energies Alternatives
François Deneuville
B82 - NANO-TECHNOLOGY
Information
Patent Application
OPTICAL ISOLATOR BASED ON VOLUME BRAGG GRATINGS
Publication number
20240192420
Publication date
Jun 13, 2024
University of Central Florida Research Foundation, Inc.
Ivan Divliansky
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR MEASURING THE POLARIZATION OF AN ELECTROMAGNETIC RADI...
Publication number
20240183715
Publication date
Jun 6, 2024
ELETTRA - SINCROTRONE TRIESTE S.C.P.A
Antonio CARETTA
G01 - MEASURING TESTING
Information
Patent Application
MONOLAYER TRANSITION METAL DICHALCOGENIDES HAVING GIANT VALLEY-POLA...
Publication number
20240175949
Publication date
May 30, 2024
Rensselaer Polytechnic Institute
Sufei Shi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
POLARIZATION STATE GENERATION WITH A METASURFACE
Publication number
20240142686
Publication date
May 2, 2024
President and Fellows of Harvard College
Noah A. RUBIN
G01 - MEASURING TESTING
Information
Patent Application
POLARIMETER WITH MULTIPLE INDEPENDENT TUNABLE CHANNELS AND METHOD F...
Publication number
20240142758
Publication date
May 2, 2024
ADVANCED OPTICAL TECHNOLOGIES, INC.
Brian G. Hoover
G01 - MEASURING TESTING
Information
Patent Application
PULSED SPECTROPOLARIMETER
Publication number
20240142308
Publication date
May 2, 2024
Roger Smith
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF GENERATING A SPATIALLY LIMITED FILM STACK ON A LIGHT SENS...
Publication number
20240125993
Publication date
Apr 18, 2024
ROLIC Technologies AG
David PIRES
G01 - MEASURING TESTING
Information
Patent Application
POLARIMETRY
Publication number
20240044712
Publication date
Feb 8, 2024
Oxford University Innovation Limited
Chao HE
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD TO MEASURE DIRECTION AND POLARIZATION OF ELECT...
Publication number
20240011836
Publication date
Jan 11, 2024
Arizona Board of Regents on behalf of The University of Arizona
Stanley Pau
G01 - MEASURING TESTING
Information
Patent Application
MATRIX-BASED CHARACTERIZATION AND MEASUREMENTS FOR SEMICONDUCTOR TH...
Publication number
20240003819
Publication date
Jan 4, 2024
The Board of Trustees of the Leland Stanford Junior University
Thaibao Phan
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR MEASURING AN ESTIMATED DEGREE OF LINEAR POLARIZATION OF...
Publication number
20230417598
Publication date
Dec 28, 2023
Commissariat A L'Energie Atomique et Aux Energies Alternatives
François Deneuville
G01 - MEASURING TESTING
Information
Patent Application
IMAGING ELLIPSOMETER AND METHOD OF MEASURING AN OVERLAY ERROR USING...
Publication number
20230408401
Publication date
Dec 21, 2023
Samsung Electronics Co., Ltd.
Jaehyeon Son
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND A METHOD FOR POLARIZATION DEPENDENT IMAGING
Publication number
20230392984
Publication date
Dec 7, 2023
Bruno FIGEYS
G01 - MEASURING TESTING
Information
Patent Application
LIGHT RECEIVING DEVICE
Publication number
20230384160
Publication date
Nov 30, 2023
Sony Semiconductor Solutions Corporation
Hisashi AKIYAMA
H01 - BASIC ELECTRIC ELEMENTS