Measuring probes

Industry

CPC
G01R1/067

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/067Measuring probes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Load pull tuner for waveguide wafer probe
- Patent number 12,265,101
- Issue date Apr 1, 2025
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical testing device with probe having portions with different...
- Patent number 12,265,100
- Issue date Apr 1, 2025
- Snap-on Incorporated
- G01 - MEASURING TESTING
Information Patent Grant
Adjustment control device for precise measurement
- Patent number 12,259,405
- Issue date Mar 25, 2025
- PAMTEK Co., Ltd.
- Jae Woong Kim
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Elastic electrical contact device and contact conductor thereof
- Patent number 12,259,406
- Issue date Mar 25, 2025
- SUNLIT PRECISION TECHNOLOGY CO., LTD.
- Wen-Han Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact probe for probe heads of electronic devices
- Patent number 12,259,407
- Issue date Mar 25, 2025
- Technoprobe S.p.A.
- Riccardo Vettori
- G01 - MEASURING TESTING
Information Patent Grant
Constant force ultrasound probe handle
- Patent number 12,248,002
- Issue date Mar 11, 2025
- New York Society for the Relief of the Ruptured and Crippled, Maintaining the...
- Daniel R. Sturnick
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Clustered rigid wafer test probe
- Patent number 12,248,003
- Issue date Mar 11, 2025
- International Business Machines Corporation
- David Michael Audette
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing a probe used for testing integrated electronic...
- Patent number 12,248,012
- Issue date Mar 11, 2025
- STMicroelectronics S.r.l.
- Alberto Pagani
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe, probe holder and probe unit
- Patent number 12,241,913
- Issue date Mar 4, 2025
- NHK Spring Co., Ltd.
- Hajime Arai
- G01 - MEASURING TESTING
Information Patent Grant
Liquid analysis device and sensor unit
- Patent number 12,222,368
- Issue date Feb 11, 2025
- HORIBA ADVANCED TECHNO, CO., LTD.
- Manabu Shibata
- G01 - MEASURING TESTING
Information Patent Grant
Contact pins for test sockets and test sockets comprising the same
- Patent number 12,222,367
- Issue date Feb 11, 2025
- Okins Electronics Co., Ltd.
- Jin Kook Jun
- G01 - MEASURING TESTING
Information Patent Grant
Probe head and probe card having same
- Patent number 12,222,370
- Issue date Feb 11, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Vascular sap measurement sensor
- Patent number 12,216,076
- Issue date Feb 4, 2025
- National University Corporation Kagawa University
- Fusao Shimokawa
- G01 - MEASURING TESTING
Information Patent Grant
Multi-mode measurement probe
- Patent number 12,210,039
- Issue date Jan 28, 2025
- Tektronix, Inc.
- Joshua J. O'Brien
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a probe tip and a probe tip manufactured by...
- Patent number 12,210,038
- Issue date Jan 28, 2025
- TSE CO., LTD.
- Young Min Lee
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Probe array and probe structure
- Patent number 12,210,037
- Issue date Jan 28, 2025
- VUETTE PTE. LTD.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing fixture and process for electrode of neuromodulation...
- Patent number 12,203,960
- Issue date Jan 21, 2025
- Industrial Technology Research Institute
- Jo-Ping Lee
- G01 - MEASURING TESTING
Information Patent Grant
Methods of establishing contact between a probe tip of a probe syst...
- Patent number 12,203,959
- Issue date Jan 21, 2025
- FormFactor, Inc.
- Martin Schindler
- G01 - MEASURING TESTING
Information Patent Grant
Probe system and machine apparatus thereof
- Patent number 12,196,779
- Issue date Jan 14, 2025
- MPI CORPORATION
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Probes with planar unbiased spring elements for electronic componen...
- Patent number 12,196,782
- Issue date Jan 14, 2025
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Grant
Probes with planar unbiased spring elements for electronic componen...
- Patent number 12,196,781
- Issue date Jan 14, 2025
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Grant
Waveguide component for high frequency testing
- Patent number 12,199,691
- Issue date Jan 14, 2025
- SAGE Millimeter, Inc.
- Yonghui Shu
- G01 - MEASURING TESTING
Information Patent Grant
Method for accurate pad contact testing
- Patent number 12,188,961
- Issue date Jan 7, 2025
- International Business Machines Corporation
- Kushagra Sinha
- G01 - MEASURING TESTING
Information Patent Grant
Probe structure for micro device inspection
- Patent number 12,188,978
- Issue date Jan 7, 2025
- VueReal Inc.
- Gholamreza Chaji
- G01 - MEASURING TESTING
Information Patent Grant
Vehicular camera testing system using spring-loaded electrical conn...
- Patent number 12,184,830
- Issue date Dec 31, 2024
- Magna Electronics Inc.
- Anthony N. Rinaldo
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Test device
- Patent number 12,181,495
- Issue date Dec 31, 2024
- Quanta Computer Inc.
- Wei-Chih Hung
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe card and probe module thereof
- Patent number 12,181,496
- Issue date Dec 31, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Probe sheet with contact tip on stacked multi-layer and method of m...
- Patent number 12,181,494
- Issue date Dec 31, 2024
- PROTEC MEMS TECHNOLOGY INC
- Yong Ho Cho
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Compliant probes including dual independently operable probe contac...
- Patent number 12,181,493
- Issue date Dec 31, 2024
- Microfabrica Inc.
- Ming Ting Wu
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly, system and method for testing rf device of phased a...
- Patent number 12,174,243
- Issue date Dec 24, 2024
- TRON FUTURE TECH INC.
- Yu-Jiu Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE SYSTEM AND MACHINE APPARATUS THEREOF
- Publication number 20250102539
- Publication date Mar 27, 2025
- MPI CORPORATION
- STOJAN KANEV
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MANUFACTURING METHOD AND TEST METHOD OF POWER MODULE
- Publication number 20250105063
- Publication date Mar 27, 2025
- Hyundai Motor Company
- Tae Woo KWANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REMOVABLE HIGH-SPEED SIGNAL MEASUREMENT DEVICE
- Publication number 20250093383
- Publication date Mar 20, 2025
- International Business Machines Corporation
- Kyle Olson
- G01 - MEASURING TESTING
Information Patent Application
Wireless Harness Automated Measurement Systems and Methods
- Publication number 20250093382
- Publication date Mar 20, 2025
- Lockheed Martin Corporation
- Kevin Bell
- G01 - MEASURING TESTING
Information Patent Application
PROBE STRUCTURE FOR MICRO DEVICE INSPECTION
- Publication number 20250093412
- Publication date Mar 20, 2025
- VueReal Inc.
- Gholamreza CHAJI
- G01 - MEASURING TESTING
Information Patent Application
RESISTANCE MEASUREMENTS IN ELECTRICAL CHARACTERIZATION SYSTEM
- Publication number 20250085310
- Publication date Mar 13, 2025
- International Business Machines Corporation
- Eric Zhang
- G01 - MEASURING TESTING
Information Patent Application
LOW CROSS-TALK INTERCONNECTION DEVICE WITH IMPEDANCE-TUNED HYBRID S...
- Publication number 20250085309
- Publication date Mar 13, 2025
- ESSAI, INC.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEMS AND METHODS OF OPERATING PROBE SYSTEMS
- Publication number 20250067799
- Publication date Feb 27, 2025
- FormFactor, Inc.
- Jörg Hertwig
- G01 - MEASURING TESTING
Information Patent Application
PROBE
- Publication number 20250067774
- Publication date Feb 27, 2025
- Rolls-Royce plc
- Xin DONG
- G01 - MEASURING TESTING
Information Patent Application
TESTING MODULE
- Publication number 20250060405
- Publication date Feb 20, 2025
- NANYA TECHNOLOGY CORPORATION
- Wei-Zhong LI
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD
- Publication number 20250060393
- Publication date Feb 20, 2025
- YOKOWO CO., LTD.
- Yusuke SHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES AND CORRESPONDI...
- Publication number 20250052783
- Publication date Feb 13, 2025
- TECHNOPROBE S.P.A.
- Riccardo VETTORI
- G01 - MEASURING TESTING
Information Patent Application
POWER SENSOR ARRANGEMENT FOR ON-WAFER POWER CALIBRATION
- Publication number 20250052845
- Publication date Feb 13, 2025
- ROHDE & SCHWARZ GMBH & CO. KG
- Christopher STUMPF
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SOCKET
- Publication number 20250052782
- Publication date Feb 13, 2025
- YOKOWO CO., LTD
- Hirotaka TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
PROBE PIN AND PROBE CARD
- Publication number 20250052784
- Publication date Feb 13, 2025
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Koki OKUMA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING PROBING PARAMETERS FOR PROBE SYSTEM TO TEST D...
- Publication number 20250044350
- Publication date Feb 6, 2025
- MPI Corporation
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Application
DETACHABLE PROTECTIVE STRUCTURE OF DETECTION DEVICE
- Publication number 20250044320
- Publication date Feb 6, 2025
- NATIONAL APPLIED RESEARCH LABORATORIES
- GUO-WEI HUANG
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PIN ASSEMBLY FOR KELVIN TEST AND KELVIN TEST DEVICE COMPRIS...
- Publication number 20250044321
- Publication date Feb 6, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
QUICK COUPLING PROBE HEAD
- Publication number 20250044322
- Publication date Feb 6, 2025
- MPI CORPORATION
- Ya-Hung Lo
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPLICATION CONTROL DEVICE, NETWORK COMMUNICATION DEVIC...
- Publication number 20250035672
- Publication date Jan 30, 2025
- Rohde& Schwarz GmbH & Co. KG
- Andreas GEROLD
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICALLY CONDUCTIVE CONTACT PIN AND INSPECTION DEVICE HAVING SAME
- Publication number 20250035670
- Publication date Jan 30, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE AND CONTACTING MEMBER THEREOF, METHOD OF MANUFACTURIN...
- Publication number 20250035671
- Publication date Jan 30, 2025
- MPI Corporation
- CHENG-NIEN SU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20250027973
- Publication date Jan 23, 2025
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Chikaomi MORI
- G01 - MEASURING TESTING
Information Patent Application
CHARGING STATION HEALTH MONITORING DEVICE AND METHOD
- Publication number 20250028011
- Publication date Jan 23, 2025
- TE Connectivity Solutions GMBH
- Ram Kishore Venkatesan
- B60 - VEHICLES IN GENERAL
Information Patent Application
ELECTRO-CONDUCTIVE CONTACT PIN, MANUFACTURING METHOD THEREFOR, AND...
- Publication number 20250020691
- Publication date Jan 16, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
PROBES, PROBE BLADES, TOOLS FOR PROBE BLADES, BLADE HOLDERS, AND PR...
- Publication number 20250020689
- Publication date Jan 16, 2025
- FormFactor, Inc.
- Choon Beng Sia
- G01 - MEASURING TESTING
Information Patent Application
GUIDE MEMBER, INSPECTION DEVICE, AND ELECTRO-CONDUCTIVE CONTACT PIN
- Publication number 20250020690
- Publication date Jan 16, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
METAL PRODUCT, METHOD OF MANUFACTURING SAME, AND TEST DEVICE HAVING...
- Publication number 20240426872
- Publication date Dec 26, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE CARD
- Publication number 20240426871
- Publication date Dec 26, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER
- Publication number 20240410934
- Publication date Dec 12, 2024
- NANYA TECHNOLOGY CORPORATION
- Wei Zhong LI
- G01 - MEASURING TESTING

Measuring probes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Load pull tuner for waveguide wafer probe

Electrical testing device with probe having portions with different...

Adjustment control device for precise measurement

Elastic electrical contact device and contact conductor thereof

Contact probe for probe heads of electronic devices

Constant force ultrasound probe handle

Clustered rigid wafer test probe

Method for producing a probe used for testing integrated electronic...

Contact probe, probe holder and probe unit

Liquid analysis device and sensor unit

Contact pins for test sockets and test sockets comprising the same

Probe head and probe card having same

Vascular sap measurement sensor

Multi-mode measurement probe

Method of manufacturing a probe tip and a probe tip manufactured by...

Probe array and probe structure

Manufacturing fixture and process for electrode of neuromodulation...

Methods of establishing contact between a probe tip of a probe syst...

Probe system and machine apparatus thereof

Probes with planar unbiased spring elements for electronic componen...

Probes with planar unbiased spring elements for electronic componen...

Waveguide component for high frequency testing

Method for accurate pad contact testing

Probe structure for micro device inspection

Vehicular camera testing system using spring-loaded electrical conn...

Test device

Cantilever probe card and probe module thereof

Probe sheet with contact tip on stacked multi-layer and method of m...

Compliant probes including dual independently operable probe contac...

Probe assembly, system and method for testing rf device of phased a...

Patents Applicationslast 30 patents

PROBE SYSTEM AND MACHINE APPARATUS THEREOF

MANUFACTURING METHOD AND TEST METHOD OF POWER MODULE

REMOVABLE HIGH-SPEED SIGNAL MEASUREMENT DEVICE

Wireless Harness Automated Measurement Systems and Methods

PROBE STRUCTURE FOR MICRO DEVICE INSPECTION

RESISTANCE MEASUREMENTS IN ELECTRICAL CHARACTERIZATION SYSTEM

LOW CROSS-TALK INTERCONNECTION DEVICE WITH IMPEDANCE-TUNED HYBRID S...

PROBE SYSTEMS AND METHODS OF OPERATING PROBE SYSTEMS

PROBE

TESTING MODULE

PROBE HEAD

CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES AND CORRESPONDI...

POWER SENSOR ARRANGEMENT FOR ON-WAFER POWER CALIBRATION

INSPECTION SOCKET

PROBE PIN AND PROBE CARD

METHOD OF DETERMINING PROBING PARAMETERS FOR PROBE SYSTEM TO TEST D...

DETACHABLE PROTECTIVE STRUCTURE OF DETECTION DEVICE

CONTACT PIN ASSEMBLY FOR KELVIN TEST AND KELVIN TEST DEVICE COMPRIS...

QUICK COUPLING PROBE HEAD

MEASUREMENT APPLICATION CONTROL DEVICE, NETWORK COMMUNICATION DEVIC...

ELECTRICALLY CONDUCTIVE CONTACT PIN AND INSPECTION DEVICE HAVING SAME

CONTACT PROBE AND CONTACTING MEMBER THEREOF, METHOD OF MANUFACTURIN...

PROBE CARD

CHARGING STATION HEALTH MONITORING DEVICE AND METHOD

ELECTRO-CONDUCTIVE CONTACT PIN, MANUFACTURING METHOD THEREFOR, AND...

PROBES, PROBE BLADES, TOOLS FOR PROBE BLADES, BLADE HOLDERS, AND PR...

GUIDE MEMBER, INSPECTION DEVICE, AND ELECTRO-CONDUCTIVE CONTACT PIN

METAL PRODUCT, METHOD OF MANUFACTURING SAME, AND TEST DEVICE HAVING...

VERTICAL PROBE CARD

SEMICONDUCTOR WAFER