Measuring probes

Industry

CPC
G01R1/067

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/067Measuring probes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Contact pins for test sockets and test sockets comprising the same
- Patent number 12,222,367
- Issue date Feb 11, 2025
- Okins Electronics Co., Ltd.
- Jin Kook Jun
- G01 - MEASURING TESTING
Information Patent Grant
Liquid analysis device and sensor unit
- Patent number 12,222,368
- Issue date Feb 11, 2025
- HORIBA ADVANCED TECHNO, CO., LTD.
- Manabu Shibata
- G01 - MEASURING TESTING
Information Patent Grant
Probe head and probe card having same
- Patent number 12,222,370
- Issue date Feb 11, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Vascular sap measurement sensor
- Patent number 12,216,076
- Issue date Feb 4, 2025
- National University Corporation Kagawa University
- Fusao Shimokawa
- G01 - MEASURING TESTING
Information Patent Grant
Multi-mode measurement probe
- Patent number 12,210,039
- Issue date Jan 28, 2025
- Tektronix, Inc.
- Joshua J. O'Brien
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a probe tip and a probe tip manufactured by...
- Patent number 12,210,038
- Issue date Jan 28, 2025
- TSE CO., LTD.
- Young Min Lee
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Probe array and probe structure
- Patent number 12,210,037
- Issue date Jan 28, 2025
- VUETTE PTE. LTD.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing fixture and process for electrode of neuromodulation...
- Patent number 12,203,960
- Issue date Jan 21, 2025
- Industrial Technology Research Institute
- Jo-Ping Lee
- G01 - MEASURING TESTING
Information Patent Grant
Methods of establishing contact between a probe tip of a probe syst...
- Patent number 12,203,959
- Issue date Jan 21, 2025
- FormFactor, Inc.
- Martin Schindler
- G01 - MEASURING TESTING
Information Patent Grant
Probe system and machine apparatus thereof
- Patent number 12,196,779
- Issue date Jan 14, 2025
- MPI CORPORATION
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Probes with planar unbiased spring elements for electronic componen...
- Patent number 12,196,782
- Issue date Jan 14, 2025
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Grant
Probes with planar unbiased spring elements for electronic componen...
- Patent number 12,196,781
- Issue date Jan 14, 2025
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Grant
Waveguide component for high frequency testing
- Patent number 12,199,691
- Issue date Jan 14, 2025
- SAGE Millimeter, Inc.
- Yonghui Shu
- G01 - MEASURING TESTING
Information Patent Grant
Method for accurate pad contact testing
- Patent number 12,188,961
- Issue date Jan 7, 2025
- International Business Machines Corporation
- Kushagra Sinha
- G01 - MEASURING TESTING
Information Patent Grant
Probe structure for micro device inspection
- Patent number 12,188,978
- Issue date Jan 7, 2025
- VueReal Inc.
- Gholamreza Chaji
- G01 - MEASURING TESTING
Information Patent Grant
Vehicular camera testing system using spring-loaded electrical conn...
- Patent number 12,184,830
- Issue date Dec 31, 2024
- Magna Electronics Inc.
- Anthony N. Rinaldo
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Test device
- Patent number 12,181,495
- Issue date Dec 31, 2024
- Quanta Computer Inc.
- Wei-Chih Hung
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe card and probe module thereof
- Patent number 12,181,496
- Issue date Dec 31, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Probe sheet with contact tip on stacked multi-layer and method of m...
- Patent number 12,181,494
- Issue date Dec 31, 2024
- PROTEC MEMS TECHNOLOGY INC
- Yong Ho Cho
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Compliant probes including dual independently operable probe contac...
- Patent number 12,181,493
- Issue date Dec 31, 2024
- Microfabrica Inc.
- Ming Ting Wu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring intraocular pressure
- Patent number 12,171,497
- Issue date Dec 24, 2024
- ICARE FINLAND OY
- Pauliina Mäkkeli
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly, system and method for testing rf device of phased a...
- Patent number 12,174,243
- Issue date Dec 24, 2024
- TRON FUTURE TECH INC.
- Yu-Jiu Wang
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit spike check probing apparatus and method
- Patent number 12,169,220
- Issue date Dec 17, 2024
- Texas Instruments Incorporated
- William Joshua Bush
- G01 - MEASURING TESTING
Information Patent Grant
Probe tip with rigid frame and flexible tip portion
- Patent number 12,169,210
- Issue date Dec 17, 2024
- Keysight Technologies, Inc.
- Nicholas Fernandez
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe pin and a probe card having same
- Patent number 12,169,211
- Issue date Dec 17, 2024
- TSE CO., LTD.
- Seok Ho Son
- G01 - MEASURING TESTING
Information Patent Grant
Probe and elastic structure thereof
- Patent number 12,163,980
- Issue date Dec 10, 2024
- TECAT TECHNOLOGIES (SUZHOU) LIMITED
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Contact pin with individually movable contact elements
- Patent number 12,163,981
- Issue date Dec 10, 2024
- Feinmetall GmbH
- Lutz Benedix
- G01 - MEASURING TESTING
Information Patent Grant
Microbump cluster probing architecture for 2.5D and 3D dies
- Patent number 12,163,982
- Issue date Dec 10, 2024
- Intel Corporation
- Jagat Shakya
- G01 - MEASURING TESTING
Information Patent Grant
Inspection jig and inspection device
- Patent number 12,158,480
- Issue date Dec 3, 2024
- Nidec-Read Corporation
- Kohei Tsumura
- G01 - MEASURING TESTING
Information Patent Grant
Wire bond damage detector including a detection bond pad over a fir...
- Patent number 12,159,808
- Issue date Dec 3, 2024
- Texas Instruments Incorporated
- Hung-Yun Lin
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES AND CORRESPONDI...
- Publication number 20250052783
- Publication date Feb 13, 2025
- TECHNOPROBE S.P.A.
- Riccardo VETTORI
- G01 - MEASURING TESTING
Information Patent Application
POWER SENSOR ARRANGEMENT FOR ON-WAFER POWER CALIBRATION
- Publication number 20250052845
- Publication date Feb 13, 2025
- ROHDE & SCHWARZ GMBH & CO. KG
- Christopher STUMPF
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SOCKET
- Publication number 20250052782
- Publication date Feb 13, 2025
- YOKOWO CO., LTD
- Hirotaka TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
PROBE PIN AND PROBE CARD
- Publication number 20250052784
- Publication date Feb 13, 2025
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Koki OKUMA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING PROBING PARAMETERS FOR PROBE SYSTEM TO TEST D...
- Publication number 20250044350
- Publication date Feb 6, 2025
- MPI Corporation
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Application
DETACHABLE PROTECTIVE STRUCTURE OF DETECTION DEVICE
- Publication number 20250044320
- Publication date Feb 6, 2025
- NATIONAL APPLIED RESEARCH LABORATORIES
- GUO-WEI HUANG
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PIN ASSEMBLY FOR KELVIN TEST AND KELVIN TEST DEVICE COMPRIS...
- Publication number 20250044321
- Publication date Feb 6, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
QUICK COUPLING PROBE HEAD
- Publication number 20250044322
- Publication date Feb 6, 2025
- MPI CORPORATION
- Ya-Hung Lo
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPLICATION CONTROL DEVICE, NETWORK COMMUNICATION DEVIC...
- Publication number 20250035672
- Publication date Jan 30, 2025
- Rohde& Schwarz GmbH & Co. KG
- Andreas GEROLD
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICALLY CONDUCTIVE CONTACT PIN AND INSPECTION DEVICE HAVING SAME
- Publication number 20250035670
- Publication date Jan 30, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE AND CONTACTING MEMBER THEREOF, METHOD OF MANUFACTURIN...
- Publication number 20250035671
- Publication date Jan 30, 2025
- MPI Corporation
- CHENG-NIEN SU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20250027973
- Publication date Jan 23, 2025
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Chikaomi MORI
- G01 - MEASURING TESTING
Information Patent Application
CHARGING STATION HEALTH MONITORING DEVICE AND METHOD
- Publication number 20250028011
- Publication date Jan 23, 2025
- TE Connectivity Solutions GMBH
- Ram Kishore Venkatesan
- B60 - VEHICLES IN GENERAL
Information Patent Application
ELECTRO-CONDUCTIVE CONTACT PIN, MANUFACTURING METHOD THEREFOR, AND...
- Publication number 20250020691
- Publication date Jan 16, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
PROBES, PROBE BLADES, TOOLS FOR PROBE BLADES, BLADE HOLDERS, AND PR...
- Publication number 20250020689
- Publication date Jan 16, 2025
- FormFactor, Inc.
- Choon Beng Sia
- G01 - MEASURING TESTING
Information Patent Application
GUIDE MEMBER, INSPECTION DEVICE, AND ELECTRO-CONDUCTIVE CONTACT PIN
- Publication number 20250020690
- Publication date Jan 16, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
METAL PRODUCT, METHOD OF MANUFACTURING SAME, AND TEST DEVICE HAVING...
- Publication number 20240426872
- Publication date Dec 26, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE CARD
- Publication number 20240426871
- Publication date Dec 26, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER
- Publication number 20240410934
- Publication date Dec 12, 2024
- NANYA TECHNOLOGY CORPORATION
- Wei Zhong LI
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD STRUCTURE FOR HIGH FREQUENCY TEST AND TESTING METHOD THE...
- Publication number 20240410918
- Publication date Dec 12, 2024
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
SPACE TRANSFORMERS CONFIGURED TO BE UTILIZED IN A PROBE SYSTEM, PRO...
- Publication number 20240410936
- Publication date Dec 12, 2024
- FormFactor, Inc.
- Ernest Gammon McReynolds
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOA...
- Publication number 20240402217
- Publication date Dec 5, 2024
- Smiths Interconnect Americas, Inc.
- Khaled Elmadbouly
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...
- Publication number 20240393368
- Publication date Nov 28, 2024
- MPI CORPORATION
- CHIN-TIEN YANG
- G01 - MEASURING TESTING
Information Patent Application
ROTATING BODY INSPECTION DEVICE FOR ELECTRIFICATION COMPONENT
- Publication number 20240393365
- Publication date Nov 28, 2024
- VIEWON CO., LTD.
- Young Wook YOON
- G01 - MEASURING TESTING
Information Patent Application
TEST PIN STRUCTURE
- Publication number 20240393366
- Publication date Nov 28, 2024
- Cheong Kheng OOI
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...
- Publication number 20240393367
- Publication date Nov 28, 2024
- MPI CORPORATION
- CHIN-TIEN YANG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND SOLDER RECEIVING PROBE
- Publication number 20240385223
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
Test head for a finger tester, and method for testing printed circu...
- Publication number 20240385215
- Publication date Nov 21, 2024
- ATG LUTHER & MAELZER GMBH
- Christian Weindel
- G01 - MEASURING TESTING
Information Patent Application
Electrical and Optical Semiconductor Probe Head
- Publication number 20240385216
- Publication date Nov 21, 2024
- Teramount Ltd.
- Hesham Taha
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND CLIMB-RESTRICTING PROBE
- Publication number 20240385217
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING

Measuring probes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Contact pins for test sockets and test sockets comprising the same

Liquid analysis device and sensor unit

Probe head and probe card having same

Vascular sap measurement sensor

Multi-mode measurement probe

Method of manufacturing a probe tip and a probe tip manufactured by...

Probe array and probe structure

Manufacturing fixture and process for electrode of neuromodulation...

Methods of establishing contact between a probe tip of a probe syst...

Probe system and machine apparatus thereof

Probes with planar unbiased spring elements for electronic componen...

Probes with planar unbiased spring elements for electronic componen...

Waveguide component for high frequency testing

Method for accurate pad contact testing

Probe structure for micro device inspection

Vehicular camera testing system using spring-loaded electrical conn...

Test device

Cantilever probe card and probe module thereof

Probe sheet with contact tip on stacked multi-layer and method of m...

Compliant probes including dual independently operable probe contac...

Apparatus for measuring intraocular pressure

Probe assembly, system and method for testing rf device of phased a...

Integrated circuit spike check probing apparatus and method

Probe tip with rigid frame and flexible tip portion

Vertical probe pin and a probe card having same

Probe and elastic structure thereof

Contact pin with individually movable contact elements

Microbump cluster probing architecture for 2.5D and 3D dies

Inspection jig and inspection device

Wire bond damage detector including a detection bond pad over a fir...

Patents Applicationslast 30 patents

CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES AND CORRESPONDI...

POWER SENSOR ARRANGEMENT FOR ON-WAFER POWER CALIBRATION

INSPECTION SOCKET

PROBE PIN AND PROBE CARD

METHOD OF DETERMINING PROBING PARAMETERS FOR PROBE SYSTEM TO TEST D...

DETACHABLE PROTECTIVE STRUCTURE OF DETECTION DEVICE

CONTACT PIN ASSEMBLY FOR KELVIN TEST AND KELVIN TEST DEVICE COMPRIS...

QUICK COUPLING PROBE HEAD

MEASUREMENT APPLICATION CONTROL DEVICE, NETWORK COMMUNICATION DEVIC...

ELECTRICALLY CONDUCTIVE CONTACT PIN AND INSPECTION DEVICE HAVING SAME

CONTACT PROBE AND CONTACTING MEMBER THEREOF, METHOD OF MANUFACTURIN...

PROBE CARD

CHARGING STATION HEALTH MONITORING DEVICE AND METHOD

ELECTRO-CONDUCTIVE CONTACT PIN, MANUFACTURING METHOD THEREFOR, AND...

PROBES, PROBE BLADES, TOOLS FOR PROBE BLADES, BLADE HOLDERS, AND PR...

GUIDE MEMBER, INSPECTION DEVICE, AND ELECTRO-CONDUCTIVE CONTACT PIN

METAL PRODUCT, METHOD OF MANUFACTURING SAME, AND TEST DEVICE HAVING...

VERTICAL PROBE CARD

SEMICONDUCTOR WAFER

PROBE CARD STRUCTURE FOR HIGH FREQUENCY TEST AND TESTING METHOD THE...

SPACE TRANSFORMERS CONFIGURED TO BE UTILIZED IN A PROBE SYSTEM, PRO...

SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOA...

PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...

ROTATING BODY INSPECTION DEVICE FOR ELECTRIFICATION COMPONENT

TEST PIN STRUCTURE

PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...

CANTILEVER PROBE CARD DEVICE AND SOLDER RECEIVING PROBE

Test head for a finger tester, and method for testing printed circu...

Electrical and Optical Semiconductor Probe Head

CANTILEVER PROBE CARD DEVICE AND CLIMB-RESTRICTING PROBE