Measuring reflection coefficients Measuring standing-wave ratio

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom

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G01R27/06Measuring reflection coefficients Measuring standing-wave ratio

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Patents Grantslast 30 patents

Information Patent Grant
Local oscillator (LO) generation for carrier aggregation in phased...
- Patent number 12,191,897
- Issue date Jan 7, 2025
- Intel Corporation
- Ashoke Ravi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Closed-loop multiple-output radio frequency (RF) matching
- Patent number 12,136,938
- Issue date Nov 5, 2024
- Lam Research Corporation
- Eller Y. Juco
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-stage device and process for production of a low sulfur heavy...
- Patent number 12,025,435
- Issue date Jul 2, 2024
- Magemã Technology LLC
- Michael Joseph Moore
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Oil recovery sensor
- Patent number 12,025,605
- Issue date Jul 2, 2024
- Battelle Memorial Institute
- Slawomir Winecki
- G01 - MEASURING TESTING
Information Patent Grant
Electronic devices with background-cancelled ultra short range obje...
- Patent number 12,013,455
- Issue date Jun 18, 2024
- Apple Inc.
- Joonhoi Hur
- G01 - MEASURING TESTING
Information Patent Grant
Injection-locked clock-multiplication for mixer local oscillator (L...
- Patent number 11,967,980
- Issue date Apr 23, 2024
- Intel Corporation
- Ashoke Ravi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for non-invasive microwave testing of bottles o...
- Patent number 11,953,485
- Issue date Apr 9, 2024
- The Trustees of Dartmouth College
- Paul M. Meaney
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for monitoring a condition of an electrical power transmi...
- Patent number 11,927,617
- Issue date Mar 12, 2024
- General Electric Technology GmbH
- Robert Stephen Whitehouse
- G01 - MEASURING TESTING
Information Patent Grant
Real-equivalent-time oscilloscope with time domain reflectometer
- Patent number 11,898,927
- Issue date Feb 13, 2024
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Grant
Multi-level RF pulse monitoring and RF pulsing parameter optimizati...
- Patent number 11,874,234
- Issue date Jan 16, 2024
- Applied Materials, Inc.
- Dermot Cantwell
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for digital VSWR measurement in advanced anten...
- Patent number 11,867,735
- Issue date Jan 9, 2024
- Telefonaktiebolaget LM Ericsson (publ)
- Ahmed Badawy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection system and inspection method
- Patent number 11,815,472
- Issue date Nov 14, 2023
- NEC Corporation
- Naoya Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Dual directional asymmetric coupler with a shared through-line
- Patent number 11,774,475
- Issue date Oct 3, 2023
- National Instruments Corporation
- Justin Regis Magers
- G01 - MEASURING TESTING
Information Patent Grant
Sensor system to apply electromagnetic fields for electromagnetic i...
- Patent number 11,680,912
- Issue date Jun 20, 2023
- TransTech Systems, Inc.
- Adam D. Blot
- G01 - MEASURING TESTING
Information Patent Grant
Self-calibrating transmission line resonator oscillating driver app...
- Patent number 11,668,737
- Issue date Jun 6, 2023
- Dell Products L.P.
- Steven Jay Lash
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Methods and apparatuses for reflection measurements
- Patent number 11,646,702
- Issue date May 9, 2023
- ANDREW WIRELESS SYSTEMS GMBH
- Peter Gunzner
- G01 - MEASURING TESTING
Information Patent Grant
RF signature detection for waveguide deformation
- Patent number 11,592,405
- Issue date Feb 28, 2023
- National Technology & Engineering Solutions of Sandia, LLC
- Shane Keawe Curtis
- G08 - SIGNALLING
Information Patent Grant
Multi-level RF pulse monitoring and RF pulsing parameter optimizati...
- Patent number 11,585,764
- Issue date Feb 21, 2023
- Applied Materials, Inc.
- Dermot Cantwell
- G01 - MEASURING TESTING
Information Patent Grant
Compact brillouin antenna for detecting metal in free space area
- Patent number 11,567,231
- Issue date Jan 31, 2023
- Robert Alfano
- G01 - MEASURING TESTING
Information Patent Grant
Anisotropic constitutive parameters for launching a Zenneck surface...
- Patent number 11,555,840
- Issue date Jan 17, 2023
- CPG TECHNOLOGIES, LLC
- Buford Randall Jean
- G01 - MEASURING TESTING
Information Patent Grant
Broadband vector network analyzer with cascaded reflectometers
- Patent number 11,506,694
- Issue date Nov 22, 2022
- Rohde & Schwarz GmbH & Co. KG
- Tobias Fastner
- G01 - MEASURING TESTING
Information Patent Grant
Time-domain reflectometry protocol for sensors
- Patent number 11,402,418
- Issue date Aug 2, 2022
- International Business Machines Corporation
- Eric J. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Noise-independent loss characterization of networks
- Patent number 11,397,204
- Issue date Jul 26, 2022
- Achronix Semiconductor Corporation
- Hansel Desmond Dsilva
- G01 - MEASURING TESTING
Information Patent Grant
Anisotropic constitutive parameters for launching a Zenneck surface...
- Patent number 11,340,275
- Issue date May 24, 2022
- CPG TECHNOLOGIES, LLC
- Buford Randall Jean
- G01 - MEASURING TESTING
Information Patent Grant
System and method of production testing of impedance of radio frequ...
- Patent number 11,226,371
- Issue date Jan 18, 2022
- Silicon Laboratories Inc.
- Yuwono Kurnia Rahman
- G01 - MEASURING TESTING
Information Patent Grant
Detecting structural integrity of a structural component
- Patent number 11,199,470
- Issue date Dec 14, 2021
- International Business Machines Corporation
- Bruce H. Hyre
- G01 - MEASURING TESTING
Information Patent Grant
Low frequency active load pull tuner
- Patent number 11,193,966
- Issue date Dec 7, 2021
- Christos Tsironis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Trigonometry dependent plot creation
- Patent number 11,169,192
- Issue date Nov 9, 2021
- The Government of the United States, as represented by the Secretary of the Army
- Brandon Underwood
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for determining probe angle, high-frequency test system, pro...
- Patent number 11,131,699
- Issue date Sep 28, 2021
- National Institute of Advanced Science and Technology
- Ryo Sakamaki
- G01 - MEASURING TESTING
Information Patent Grant
Shielded RF and thermal connection for on-wafer load pull
- Patent number 11,125,777
- Issue date Sep 21, 2021
- Christos Tsironis
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CLOSED-LOOP MULTIPLE-OUTPUT RADIO FREQUENCY (RF) MATCHING
- Publication number 20250015819
- Publication date Jan 9, 2025
- LAM RESEARCH CORPORATION
- Eller Y. Juco
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DOWNHOLE FAULT DETECTION IN WELL SYSTEM USING SPREAD SPECTRUM TIME...
- Publication number 20240401473
- Publication date Dec 5, 2024
- Halliburton Energy Services, Inc.
- Jonathon N. Joubran
- E21 - EARTH DRILLING MINING
Information Patent Application
Multi-Stage Process and Device for Production of Low Sulfur Heavy M...
- Publication number 20240210156
- Publication date Jun 27, 2024
- Magëmä Technology LLC
- Michael Joseph Moore
- G01 - MEASURING TESTING
Information Patent Application
POSITION SENSOR
- Publication number 20240154370
- Publication date May 9, 2024
- Sanmina Corporation
- Michael C. Simmons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-LEVEL RF PULSE MONITORING AND RF PULSING PARAMETER OPTIMIZATI...
- Publication number 20240151656
- Publication date May 9, 2024
- Applied Materials, Inc.
- Dermot Cantwell
- G01 - MEASURING TESTING
Information Patent Application
LOCAL OSCILLATOR (LO) GENERATION FOR CARRIER AGGREGATION IN PHASED...
- Publication number 20240137051
- Publication date Apr 25, 2024
- Intel Corporation
- Ashoke Ravi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dual Directional Asymmetric Coupler with a Shared Through-Line
- Publication number 20230393180
- Publication date Dec 7, 2023
- National Instruments Corporation
- Justin Regis Magers
- G01 - MEASURING TESTING
Information Patent Application
Dual Directional Asymmetric Coupler with a Shared Through-Line
- Publication number 20230019522
- Publication date Jan 19, 2023
- National Instruments Corporation
- Justin Regis Magers
- G01 - MEASURING TESTING
Information Patent Application
Multi-Stage Device and Process for Production of a Low Sulfur Heavy...
- Publication number 20220381547
- Publication date Dec 1, 2022
- Magëmä Technology LLC
- Michael Joseph Moore
- G01 - MEASURING TESTING
Information Patent Application
BROADBAND VECTOR NETWORK ANALYZER WITH CASCADED REFLECTOMETERS
- Publication number 20220357379
- Publication date Nov 10, 2022
- ROHDE & SCHWARZ GMBH & CO. KG
- Tobias Fastner
- G01 - MEASURING TESTING
Information Patent Application
REAL-EQUIVALENT-TIME OSCILLOSCOPE WITH TIME DOMAIN REFLECTOMETER
- Publication number 20220357237
- Publication date Nov 10, 2022
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Application
TIME-DOMAIN REFLECTOMETRY PROTOCOL FOR SENSORS
- Publication number 20220326287
- Publication date Oct 13, 2022
- International Business Machines Corporation
- Eric J. Campbell
- G01 - MEASURING TESTING
Information Patent Application
NOISE-INDEPENDENT LOSS CHARACTERIZATION OF NETWORKS
- Publication number 20220317169
- Publication date Oct 6, 2022
- Anchronix Semiconductor Corporation
- Hansel Desmond Dsilva
- G01 - MEASURING TESTING
Information Patent Application
SELF-CALIBRATING TRANSMISSION LINE RESONATOR OSCILLATING DRIVER APP...
- Publication number 20220291265
- Publication date Sep 15, 2022
- Dell Products L.P.
- Steven Jay Lash
- G01 - MEASURING TESTING
Information Patent Application
ANISOTROPIC CONSTITUTIVE PARAMETERS FOR LAUNCHING A ZENNECK SURFACE...
- Publication number 20220214389
- Publication date Jul 7, 2022
- CPG Technologies, LLC
- Buford Randall Jean
- G01 - MEASURING TESTING
Information Patent Application
CLOSED-LOOP MULTIPLE-OUTPUT RADIO FREQUENCY (RF) MATCHING
- Publication number 20220190854
- Publication date Jun 16, 2022
- LAM RESEARCH CORPORATION
- Eller Y. Juco
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DIGITAL VSWR MEASUREMENT IN ADVANCED ANTEN...
- Publication number 20210389357
- Publication date Dec 16, 2021
- Telefonaktiebolaget LM Ericsson (publ)
- Ahmed BADAWY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIGITAL RADIO HEAD CONTROL
- Publication number 20210367629
- Publication date Nov 25, 2021
- Intel Corporation
- Ashoke Ravi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND APPARATUSES FOR REFLECTION MEASUREMENTS
- Publication number 20210313934
- Publication date Oct 7, 2021
- ANDREW WIRELESS SYSTEMS GMBH
- Peter Gunzner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR MONITORING A CONDITION OF AN ELECTRICAL POWER TRANSMI...
- Publication number 20210231725
- Publication date Jul 29, 2021
- General Electric Technology GmbH
- Robert Stephen WHITEHOUSE
- G01 - MEASURING TESTING
Information Patent Application
ANISOTROPIC CONSTITUTIVE PARAMETERS FOR LAUNCHING A ZENNECK SURFACE...
- Publication number 20210172988
- Publication date Jun 10, 2021
- CPG Technologies, LLC
- Buford Randall Jean
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF PRODUCTION TESTING OF IMPEDANCE OF RADIO FREQU...
- Publication number 20210148973
- Publication date May 20, 2021
- Silicon Laboratories Inc.
- Yuwono Kurnia Rahman
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CHARACTERISING A FAULT IN A NETWORK OF TRANSM...
- Publication number 20210141011
- Publication date May 13, 2021
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Wafa BEN HASSEN
- G01 - MEASURING TESTING
Information Patent Application
TIME-DOMAIN REFLECTOMETRY PROTOCOL FOR SENSORS
- Publication number 20210072296
- Publication date Mar 11, 2021
- International Business Machines Corporation
- Eric J. Campbell
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL RADIO HEAD CONTROL
- Publication number 20210067182
- Publication date Mar 4, 2021
- Intel Corporation
- Ashoke Ravi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD FOR DETERMINING PROBE ANGLE, HIGH-FREQUENCY TEST SYSTEM, PRO...
- Publication number 20200233022
- Publication date Jul 23, 2020
- NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Ryo SAKAMAKI
- G01 - MEASURING TESTING
Information Patent Application
Proximity Detection
- Publication number 20200182602
- Publication date Jun 11, 2020
- Neodrón Limited
- Daniel Arthur Ujvari
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING ANTENNA REFLECTION COEFFICIENT
- Publication number 20200169276
- Publication date May 28, 2020
- Samsung Electronics Co., Ltd.
- Daeyoung Kim
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHODS AND APPARATUSES FOR REFLECTION MEASUREMENTS
- Publication number 20200144973
- Publication date May 7, 2020
- ANDREW WIRELESS SYSTEMS GMBH
- Peter Gunzner
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
DETECTING STRUCTURAL INTEGRITY OF A STRUCTURAL COMPONENT
- Publication number 20200110002
- Publication date Apr 9, 2020
- International Business Machines Corporation
- Bruce H. Hyre
- G01 - MEASURING TESTING

Measuring reflection coefficients Measuring standing-wave ratio

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Local oscillator (LO) generation for carrier aggregation in phased...

Closed-loop multiple-output radio frequency (RF) matching

Multi-stage device and process for production of a low sulfur heavy...

Oil recovery sensor

Electronic devices with background-cancelled ultra short range obje...

Injection-locked clock-multiplication for mixer local oscillator (L...

Systems and methods for non-invasive microwave testing of bottles o...

Apparatus for monitoring a condition of an electrical power transmi...

Real-equivalent-time oscilloscope with time domain reflectometer

Multi-level RF pulse monitoring and RF pulsing parameter optimizati...

Method and apparatus for digital VSWR measurement in advanced anten...

Inspection system and inspection method

Dual directional asymmetric coupler with a shared through-line

Sensor system to apply electromagnetic fields for electromagnetic i...

Self-calibrating transmission line resonator oscillating driver app...

Methods and apparatuses for reflection measurements

RF signature detection for waveguide deformation

Multi-level RF pulse monitoring and RF pulsing parameter optimizati...

Compact brillouin antenna for detecting metal in free space area

Anisotropic constitutive parameters for launching a Zenneck surface...

Broadband vector network analyzer with cascaded reflectometers

Time-domain reflectometry protocol for sensors

Noise-independent loss characterization of networks

Anisotropic constitutive parameters for launching a Zenneck surface...

System and method of production testing of impedance of radio frequ...

Detecting structural integrity of a structural component

Low frequency active load pull tuner

Trigonometry dependent plot creation

Method for determining probe angle, high-frequency test system, pro...

Shielded RF and thermal connection for on-wafer load pull

Patents Applicationslast 30 patents

CLOSED-LOOP MULTIPLE-OUTPUT RADIO FREQUENCY (RF) MATCHING

DOWNHOLE FAULT DETECTION IN WELL SYSTEM USING SPREAD SPECTRUM TIME...

Multi-Stage Process and Device for Production of Low Sulfur Heavy M...

POSITION SENSOR

MULTI-LEVEL RF PULSE MONITORING AND RF PULSING PARAMETER OPTIMIZATI...

LOCAL OSCILLATOR (LO) GENERATION FOR CARRIER AGGREGATION IN PHASED...

Dual Directional Asymmetric Coupler with a Shared Through-Line

Dual Directional Asymmetric Coupler with a Shared Through-Line

Multi-Stage Device and Process for Production of a Low Sulfur Heavy...

BROADBAND VECTOR NETWORK ANALYZER WITH CASCADED REFLECTOMETERS

REAL-EQUIVALENT-TIME OSCILLOSCOPE WITH TIME DOMAIN REFLECTOMETER

TIME-DOMAIN REFLECTOMETRY PROTOCOL FOR SENSORS

NOISE-INDEPENDENT LOSS CHARACTERIZATION OF NETWORKS

SELF-CALIBRATING TRANSMISSION LINE RESONATOR OSCILLATING DRIVER APP...

ANISOTROPIC CONSTITUTIVE PARAMETERS FOR LAUNCHING A ZENNECK SURFACE...

CLOSED-LOOP MULTIPLE-OUTPUT RADIO FREQUENCY (RF) MATCHING

METHOD AND APPARATUS FOR DIGITAL VSWR MEASUREMENT IN ADVANCED ANTEN...

DIGITAL RADIO HEAD CONTROL

METHODS AND APPARATUSES FOR REFLECTION MEASUREMENTS

APPARATUS FOR MONITORING A CONDITION OF AN ELECTRICAL POWER TRANSMI...

ANISOTROPIC CONSTITUTIVE PARAMETERS FOR LAUNCHING A ZENNECK SURFACE...

SYSTEM AND METHOD OF PRODUCTION TESTING OF IMPEDANCE OF RADIO FREQU...

METHOD AND SYSTEM FOR CHARACTERISING A FAULT IN A NETWORK OF TRANSM...

TIME-DOMAIN REFLECTOMETRY PROTOCOL FOR SENSORS

DIGITAL RADIO HEAD CONTROL

METHOD FOR DETERMINING PROBE ANGLE, HIGH-FREQUENCY TEST SYSTEM, PRO...

Proximity Detection

METHOD AND DEVICE FOR MEASURING ANTENNA REFLECTION COEFFICIENT

METHODS AND APPARATUSES FOR REFLECTION MEASUREMENTS

DETECTING STRUCTURAL INTEGRITY OF A STRUCTURAL COMPONENT