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G01B9/06
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B9/00
Instruments as specified in the subgroups and characterised by the use of optical measuring means
Current Industry
G01B9/06
Measuring telescopes
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Patents Grants
last 30 patents
Information
Patent Grant
Modular interferometric telescope
Patent number
10,422,625
Issue date
Sep 24, 2019
The Boeing Company
David Roderick Gerwe
G01 - MEASURING TESTING
Information
Patent Grant
Chip-scale star tracker
Patent number
9,891,305
Issue date
Feb 13, 2018
The Charles Stark Draper Laboratory, Inc.
Juha-Pekka Laine
G02 - OPTICS
Information
Patent Grant
Chip-scale star tracker
Patent number
9,372,250
Issue date
Jun 21, 2016
The Charles Stark Draper Laboratory, Inc.
Juha-Pekka Laine
G01 - MEASURING TESTING
Information
Patent Grant
Polychromatic imaging method
Patent number
9,055,240
Issue date
Jun 9, 2015
AIRBUS DEFENCE AND SPACE SAS
Laurent Brouard
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Alignment interferometer telescope apparatus and method
Patent number
7,929,150
Issue date
Apr 19, 2011
Lockheed Martin Corporation
Paul F. Schweiger
G01 - MEASURING TESTING
Information
Patent Grant
Alignment interferometer telescope apparatus and method
Patent number
7,835,012
Issue date
Nov 16, 2010
Lockheed Martin Corporation
Paul F. Schweiger
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring retarded light through very long baseline inte...
Patent number
5,847,830
Issue date
Dec 8, 1998
Allen D. Allen
G01 - MEASURING TESTING
Information
Patent Grant
Optical position detector having scale pattern spot-illuminated to...
Patent number
5,548,392
Issue date
Aug 20, 1996
Kabushikikaisha Wacom
Yasuji Ogawa
G01 - MEASURING TESTING
Information
Patent Grant
Digital optical micrometer
Patent number
5,414,646
Issue date
May 9, 1995
Brunson Instrument Company
David L. Sanders
G01 - MEASURING TESTING
Information
Patent Grant
Polaris axis finder
Patent number
4,436,421
Issue date
Mar 13, 1984
Asahi Kogaku Kogyo Kabushiki Kaisha
Kozaburo Suzuki
G02 - OPTICS
Information
Patent Grant
Stereoscopic projection microscopy
Patent number
4,072,967
Issue date
Feb 7, 1978
Leslie P. Dudley
G01 - MEASURING TESTING
Information
Patent Grant
3712739
Patent number
3,712,739
Issue date
Jan 23, 1973
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
System and Method for Detection, Characterization, and Imaging of a...
Publication number
20170227351
Publication date
Aug 10, 2017
David C. Hyland
G01 - MEASURING TESTING
Information
Patent Application
CHIP-SCALE STAR TRACKER
Publication number
20160282441
Publication date
Sep 29, 2016
The Charles Stark Draper Laboratory, Inc.
Juha-Pekka Laine
G02 - OPTICS
Information
Patent Application
CHIP-SCALE STAR TRACKER
Publication number
20150226830
Publication date
Aug 13, 2015
The Charles Stark Draper Laboratory, Inc.
Juha-Pekka Laine
G02 - OPTICS
Information
Patent Application
POLYCHROMATIC IMAGING METHOD
Publication number
20130050488
Publication date
Feb 28, 2013
ASTRIUM SAS
Laurent Brouard
G02 - OPTICS