Measuring the characteristics of individual optical pulses or of optical pulse trains

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

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G01J11/00Measuring the characteristics of individual optical pulses or of optical pulse trains

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Screen flicker debugging method, apparatus and system of display panel
- Patent number 12,190,837
- Issue date Jan 7, 2025
- HKC CORPORATION LIMITED
- Shixin Wei
- G01 - MEASURING TESTING
Information Patent Grant
Light-receiving apparatus with cycle setting according to illuminat...
- Patent number 12,188,816
- Issue date Jan 7, 2025
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Hongbo Zhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Real-time measurement method and system for ultrafast space-time-fr...
- Patent number 12,181,841
- Issue date Dec 31, 2024
- South China University of Technology
- Zhongmin Yang
- G04 - HOROLOGY
Information Patent Grant
Silicon photomultipliers reflective pulse compression
- Patent number 12,164,070
- Issue date Dec 10, 2024
- Thorlabs, Inc.
- Bill Radtke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
All-optical light field sampling with attosecond resolution
- Patent number 12,092,519
- Issue date Sep 17, 2024
- Arizona Board of Regents on behalf of the University of Arizona
- Mohammed Tharwat Hassan Mohammed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multichannel photoconductive terahertz receiving antenna, re-ceiver...
- Patent number 12,034,207
- Issue date Jul 9, 2024
- Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung E.V.
- Simon Nellen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for ultrashort pulse temporal measurement
- Patent number 12,007,274
- Issue date Jun 11, 2024
- SPHERE ULTRAFAST PHOTONICS SA
- Miguel Nicolau Da Costa Ribeiro De Miranda
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring two-dimensional flicker
- Patent number 11,892,350
- Issue date Feb 6, 2024
- Konica Minolta, Inc.
- Satoshi Masuda
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring optical pulses
- Patent number 11,828,647
- Issue date Nov 28, 2023
- Mesa Photonics, LLC
- Daniel J Kane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dispersion measuring device, pulse light source, dispersion measuri...
- Patent number 11,821,793
- Issue date Nov 21, 2023
- Hamamatsu Photonics K.K.
- Koyo Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for pulsed power measurement
- Patent number 11,782,078
- Issue date Oct 10, 2023
- Aselsan Elektronik Sanayi Ve Ticaret Anonim Sirketi
- Ismail Ugur
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Light pulse signal processing system comprising a cylindrical lens...
- Patent number 11,768,113
- Issue date Sep 26, 2023
- South China University of Technology
- Zhongmin Yang
- G01 - MEASURING TESTING
Information Patent Grant
Light-receiving apparatus with cycle setting according to photon co...
- Patent number 11,754,442
- Issue date Sep 12, 2023
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Hongbo Zhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring device and measuring method
- Patent number 11,733,103
- Issue date Aug 22, 2023
- NATIONAL YANG MING CHIAO TUNG UNIVERSITY
- Chih-Wei Luo
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus of wavefront and polarization profile of vect...
- Patent number 11,709,097
- Issue date Jul 25, 2023
- University of South Florida
- Zhimin Shi
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring a pulse signal with high dynamic range
- Patent number 11,692,879
- Issue date Jul 4, 2023
- The Secretary of State for Defence
- David Lanto Hillier
- G01 - MEASURING TESTING
Information Patent Grant
Reducing speckle in an excimer light source
- Patent number 11,686,951
- Issue date Jun 27, 2023
- Cymer, LLC
- Wilhelmus Patrick Elisabeth Maria op 't Root
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Timing-tolerant optical pulse energy conversion circuit comprising...
- Patent number 11,680,853
- Issue date Jun 20, 2023
- Rockwell Collins, Inc.
- Han Chi Hsieh
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electronic device with auxiliary lighting function and operation me...
- Patent number 11,682,275
- Issue date Jun 20, 2023
- Compal Electronics, Inc.
- Po-Yang Chien
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Geodetic surveying with time synchronization
- Patent number 11,644,309
- Issue date May 9, 2023
- Trimble AB
- Johan Carlén
- G01 - MEASURING TESTING
Information Patent Grant
Optical system for generating arbitrary-order optical vortex arrays...
- Patent number 11,625,001
- Issue date Apr 11, 2023
- Zhejiang University
- Ligang Wang
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Methods and apparatus for measuring and locking ultra-fast laser pu...
- Patent number 11,522,334
- Issue date Dec 6, 2022
- Institute of Physics, Chinese Academy of Sciences
- Shaobo Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Linear time-gate method and system for ultrashort pulse characteriz...
- Patent number 11,415,461
- Issue date Aug 16, 2022
- INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Philippe Lassonde
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for generating time-frequency representation of a...
- Patent number 11,366,012
- Issue date Jun 21, 2022
- Institut National de la Recherche Scientifique (INRS)
- Jose Azana
- G01 - MEASURING TESTING
Information Patent Grant
Method and a system for homodyne solid-state biased coherent detect...
- Patent number 11,360,023
- Issue date Jun 14, 2022
- INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Alessandro Tomasino
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength determination using an optical filter having complementa...
- Patent number 11,333,556
- Issue date May 17, 2022
- Simmonds Precision Products, Inc.
- Tyler Arsenault
- G01 - MEASURING TESTING
Information Patent Grant
Degradation detection for a pulsed laser
- Patent number 11,336,071
- Issue date May 17, 2022
- Lumentum Operations LLC
- Tobyn VanVeghten
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compressed ultrafast imaging velocity interferometer system for any...
- Patent number 11,313,668
- Issue date Apr 26, 2022
- East China Normal University
- Shi'an Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Method and assembly for optical analysis of an ultrashort laser pulse
- Patent number 11,231,328
- Issue date Jan 25, 2022
- FEMTO EASY
- Antoine Dubrouil
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device and measuring method
- Patent number 11,169,031
- Issue date Nov 9, 2021
- National Chiao Tung University
- Chih-Wei Luo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR MEASURING THE CARRIER-ENVELOPE PHASE OFFSET O...
- Publication number 20240344892
- Publication date Oct 17, 2024
- Sphere Ultrafast Photonics, SA
- Chen Guo
- G01 - MEASURING TESTING
Information Patent Application
SCREEN FLICKER DEBUGGING METHOD, APPARATUS AND SYSTEM OF DISPLAY PANEL
- Publication number 20240312424
- Publication date Sep 19, 2024
- HKC Corporation Limited
- Shixin WEI
- G01 - MEASURING TESTING
Information Patent Application
ALL-OPTICAL LIGHT FIELD SAMPLING WITH ATTOSECOND RESOLUTION
- Publication number 20240230419
- Publication date Jul 11, 2024
- Arizona Board of Regents on behalf of The University of Arizona
- Mohammed Tharwat Hassan MOHAMMED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR PHOTONIC SAMPLING OF A TEST WAVE-FORM
- Publication number 20240201017
- Publication date Jun 20, 2024
- Max-Planck-Gesellschaft zur Forderung der Wissenschaften e.V.
- Dmitry Zimin
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZATION OF A RADIATION PULSE BY TIME-RESOLVED OPTICAL GATING
- Publication number 20240102866
- Publication date Mar 28, 2024
- UNIVERSITE DE BOURGOGNE
- Pierre BEJOT
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ULTRAFAST ELECTRIC PULSE GENERATION AND DETECTION DEVICE AND USE ME...
- Publication number 20240056065
- Publication date Feb 15, 2024
- BEIHANG UNIVERSITY
- Boyu ZHANG
- G01 - MEASURING TESTING
Information Patent Application
DISPERSION MEASURING DEVICE, PULSE LIGHT SOURCE, DISPERSION MEASURI...
- Publication number 20240003744
- Publication date Jan 4, 2024
- HAMAMATSU PHOTONICS K. K.
- Koyo WATANABE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT-RECEIVING APPARATUS
- Publication number 20230358608
- Publication date Nov 9, 2023
- Sony Semiconductor Solutions Corporation
- Hongbo Zhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR MEASURING AND CONTROLLING CHIRP OF ULTRAFA...
- Publication number 20230318244
- Publication date Oct 5, 2023
- THE HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Jingdi ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING DEVICE AND MEASURING METHOD
- Publication number 20230258504
- Publication date Aug 17, 2023
- National Yang Ming Chiao Tung University
- Chih-Wei LUO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SIGNAL DETECTION SYSTEM, OPTICAL SIGNAL DETECTION DEVICE, A...
- Publication number 20230213384
- Publication date Jul 6, 2023
- OSAKA UNIVERSITY
- Tsuyoshi KONISHI
- G01 - MEASURING TESTING
Information Patent Application
Laser System With Self-Referencing Shaper
- Publication number 20230204431
- Publication date Jun 29, 2023
- Board of Trustees of Michigan State University
- Marcos DANTUS
- G01 - MEASURING TESTING
Information Patent Application
TIMING-TOLERANT OPTICAL PULSE ENERGY CONVERSION CIRCUIT
- Publication number 20230038468
- Publication date Feb 9, 2023
- Han Chi Hsieh
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND SYSTEM FOR MEASURING CARRIER-TO-ENVELOPE PHASE FLUCTUATI...
- Publication number 20230028731
- Publication date Jan 26, 2023
- Institut National de la Recherche Scientifique
- ADRIEN LEBLANC
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR THE TEMPORAL AND SPECTRAL CHARACTERIZATION OF...
- Publication number 20220407279
- Publication date Dec 22, 2022
- UNIVERSIDAD DE SALAMANCA
- Iñigo Juan SOLA LARRAÑAGA
- G01 - MEASURING TESTING
Information Patent Application
LIGHT PULSE SIGNAL PROCESSING SYSTEM
- Publication number 20220326087
- Publication date Oct 13, 2022
- SOUTH CHINA UNIVERSITY OF TECHNOLOGY
- Zhongmin YANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR ACQUIRING THREE-DOMAIN INFORMATION OF ULTRAFA...
- Publication number 20220299374
- Publication date Sep 22, 2022
- SOUTH CHINA UNIVERSITY OF TECHNOLOGY
- Zhongmin YANG
- G01 - MEASURING TESTING
Information Patent Application
DISPERSION MEASURING DEVICE, PULSE LIGHT SOURCE, DISPERSION MEASURI...
- Publication number 20220178752
- Publication date Jun 9, 2022
- Hamamatsu Photonics K.K.
- Koyo WATANABE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT-RECEIVING APPARATUS
- Publication number 20220155153
- Publication date May 19, 2022
- Sony Semiconductor Solutions Corporation
- Hongbo Zhu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND DEVICE FOR MEASURING A PULSE SIGNAL WITH HIGH DYNAMIC RANGE
- Publication number 20220107224
- Publication date Apr 7, 2022
- The Secretary of State for Defence
- David Lanto Hillier
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR PULSED POWER MEASUREMENT
- Publication number 20220018883
- Publication date Jan 20, 2022
- ASELSAN ELEKTRONIK SANAYI VE TICARET ANONIM SIRKETI
- Ismail UGUR
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MEASUREMENT APPARATUS OF WAVEFRONT AND POLARIZATION PROFILE OF VECT...
- Publication number 20220011163
- Publication date Jan 13, 2022
- The University of Rochester
- Zhimin Shi
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR ULTRASHORT PULSE TEMPORAL MEASUREMENT
- Publication number 20220011166
- Publication date Jan 13, 2022
- SPHERE ULTRAFAST PHOTONICS SA
- Miguel Nicolau DA COSTA RIBEIRO DE MIRANDA
- G01 - MEASURING TESTING
Information Patent Application
GEODETIC SURVEYING WITH TIME SYNCHRONIZATION
- Publication number 20220011101
- Publication date Jan 13, 2022
- Trimble AB
- Johan Carlén
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE AND MEASURING METHOD
- Publication number 20220011167
- Publication date Jan 13, 2022
- National Yang Ming Chiao Tung University
- Chih-Wei LUO
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL IMAGING METHOD BASED ON SUPERCONDUCTING NANOWIRE...
- Publication number 20210398345
- Publication date Dec 23, 2021
- Nanjing University
- Labao Zhang
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE WITH AUXILIARY LIGHTING FUNCTION AND OPERATION ME...
- Publication number 20210383659
- Publication date Dec 9, 2021
- Compal Electronics, Inc.
- Po-Yang Chien
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARACTERIZING AN OPTICAL ELEMENT
- Publication number 20210384696
- Publication date Dec 9, 2021
- Quantum-Si Incorporated
- Jonathan C Schultz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Device for Measuring Two-Dimensional Flicker
- Publication number 20210356327
- Publication date Nov 18, 2021
- Konica Minolta, Inc.
- Satoshi MASUDA
- G01 - MEASURING TESTING
Information Patent Application
REDUCING SPECKLE IN AN EXCIMER LIGHT SOURCE
- Publication number 20210239998
- Publication date Aug 5, 2021
- CYMER, LLC
- Wilhelmus Patrick Elisabeth Maria op `t Root
- G01 - MEASURING TESTING

Measuring the characteristics of individual optical pulses or of optical pulse trains

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Screen flicker debugging method, apparatus and system of display panel

Light-receiving apparatus with cycle setting according to illuminat...

Real-time measurement method and system for ultrafast space-time-fr...

Silicon photomultipliers reflective pulse compression

All-optical light field sampling with attosecond resolution

Multichannel photoconductive terahertz receiving antenna, re-ceiver...

Device and method for ultrashort pulse temporal measurement

Device for measuring two-dimensional flicker

Method and apparatus for measuring optical pulses

Dispersion measuring device, pulse light source, dispersion measuri...

Method and apparatus for pulsed power measurement

Light pulse signal processing system comprising a cylindrical lens...

Light-receiving apparatus with cycle setting according to photon co...

Measuring device and measuring method

Measurement apparatus of wavefront and polarization profile of vect...

Method and device for measuring a pulse signal with high dynamic range

Reducing speckle in an excimer light source

Timing-tolerant optical pulse energy conversion circuit comprising...

Electronic device with auxiliary lighting function and operation me...

Geodetic surveying with time synchronization

Optical system for generating arbitrary-order optical vortex arrays...

Methods and apparatus for measuring and locking ultra-fast laser pu...

Linear time-gate method and system for ultrashort pulse characteriz...

Method and system for generating time-frequency representation of a...

Method and a system for homodyne solid-state biased coherent detect...

Wavelength determination using an optical filter having complementa...

Degradation detection for a pulsed laser

Compressed ultrafast imaging velocity interferometer system for any...

Method and assembly for optical analysis of an ultrashort laser pulse

Measuring device and measuring method

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR MEASURING THE CARRIER-ENVELOPE PHASE OFFSET O...

SCREEN FLICKER DEBUGGING METHOD, APPARATUS AND SYSTEM OF DISPLAY PANEL

ALL-OPTICAL LIGHT FIELD SAMPLING WITH ATTOSECOND RESOLUTION

METHOD AND DEVICE FOR PHOTONIC SAMPLING OF A TEST WAVE-FORM

CHARACTERIZATION OF A RADIATION PULSE BY TIME-RESOLVED OPTICAL GATING

ULTRAFAST ELECTRIC PULSE GENERATION AND DETECTION DEVICE AND USE ME...

DISPERSION MEASURING DEVICE, PULSE LIGHT SOURCE, DISPERSION MEASURI...

LIGHT-RECEIVING APPARATUS

APPARATUS AND METHOD FOR MEASURING AND CONTROLLING CHIRP OF ULTRAFA...

MEASURING DEVICE AND MEASURING METHOD

OPTICAL SIGNAL DETECTION SYSTEM, OPTICAL SIGNAL DETECTION DEVICE, A...

Laser System With Self-Referencing Shaper

TIMING-TOLERANT OPTICAL PULSE ENERGY CONVERSION CIRCUIT

METHOD AND SYSTEM FOR MEASURING CARRIER-TO-ENVELOPE PHASE FLUCTUATI...

METHOD AND SYSTEM FOR THE TEMPORAL AND SPECTRAL CHARACTERIZATION OF...

LIGHT PULSE SIGNAL PROCESSING SYSTEM

METHOD AND SYSTEM FOR ACQUIRING THREE-DOMAIN INFORMATION OF ULTRAFA...

DISPERSION MEASURING DEVICE, PULSE LIGHT SOURCE, DISPERSION MEASURI...

LIGHT-RECEIVING APPARATUS

METHOD AND DEVICE FOR MEASURING A PULSE SIGNAL WITH HIGH DYNAMIC RANGE

METHOD AND APPARATUS FOR PULSED POWER MEASUREMENT

MEASUREMENT APPARATUS OF WAVEFRONT AND POLARIZATION PROFILE OF VECT...

DEVICE AND METHOD FOR ULTRASHORT PULSE TEMPORAL MEASUREMENT

GEODETIC SURVEYING WITH TIME SYNCHRONIZATION

MEASURING DEVICE AND MEASURING METHOD

THREE-DIMENSIONAL IMAGING METHOD BASED ON SUPERCONDUCTING NANOWIRE...

ELECTRONIC DEVICE WITH AUXILIARY LIGHTING FUNCTION AND OPERATION ME...

CHARACTERIZING AN OPTICAL ELEMENT

Device for Measuring Two-Dimensional Flicker

REDUCING SPECKLE IN AN EXCIMER LIGHT SOURCE