Measuring total reflection power

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G01N2021/555

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

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G01N2021/555Measuring total reflection power

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Patents Grantslast 30 patents

Information Patent Grant
Instruments and methods for characterizing the appearance of samples
- Patent number 12,111,258
- Issue date Oct 8, 2024
- Hunter Associates Laboratory, Inc.
- Michael T. Scardina
- G01 - MEASURING TESTING
Information Patent Grant
Compositions and methods for evaluation of liquid contact angle pro...
- Patent number 11,852,585
- Issue date Dec 26, 2023
- The Texas A&M University System
- Iltai Isaac Kim
- G01 - MEASURING TESTING
Information Patent Grant
Recovering material properties with active illumination and camera...
- Patent number 11,745,353
- Issue date Sep 5, 2023
- Google LLC
- Guy Satat
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Inspection system, inspection method, program, and storage medium
- Patent number 11,727,554
- Issue date Aug 15, 2023
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Takanobu Ojima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
UV-VIS spectroscopy instrument and methods for color appearance and...
- Patent number 11,656,178
- Issue date May 23, 2023
- Hunter Associates Laboratory, Inc.
- Michael T. Scardina
- G01 - MEASURING TESTING
Information Patent Grant
Structure of optical sensor having light-emitting element and plura...
- Patent number 11,579,081
- Issue date Feb 14, 2023
- Canon Kabushiki Kaisha
- Kazushi Ino
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Transparent article
- Patent number 11,555,950
- Issue date Jan 17, 2023
- Nippon Electric Glass Co., Ltd.
- Koji Ikegami
- G01 - MEASURING TESTING
Information Patent Grant
Droplet sensor
- Patent number 11,525,776
- Issue date Dec 13, 2022
- Mitsumi Electric Co., Ltd.
- Yuya Kawasaki
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Inspection system, inspection method, program, and storage medium
- Patent number 11,379,968
- Issue date Jul 5, 2022
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Takanobu Ojima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
UV-VIS spectroscopy instrument and methods for color appearance and...
- Patent number 11,002,676
- Issue date May 11, 2021
- Hunter Associates Laboratory, Inc.
- Michael T. Scardina
- G01 - MEASURING TESTING
Information Patent Grant
Vent monitoring system
- Patent number 10,981,023
- Issue date Apr 20, 2021
- Cardinal IP Holding, LLC
- Jill L. Gantos
- A62 - LIFE-SAVING FIRE-FIGHTING
Information Patent Grant
Measurement device, electronic apparatus and measurement method
- Patent number 10,871,446
- Issue date Dec 22, 2020
- Seiko Epson Corporation
- Hideaki Kasahara
- G01 - MEASURING TESTING
Information Patent Grant
Information processing apparatus, method of deriving reflection cha...
- Patent number 10,837,903
- Issue date Nov 17, 2020
- Canon Kabushiki Kaisha
- Toshiyuki Ishii
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring light scattering
- Patent number 10,302,560
- Issue date May 28, 2019
- Fundacio Institute de Ciencies Fotoniques
- Valerio Pruneri
- G01 - MEASURING TESTING
Information Patent Grant
Device for processing a surface
- Patent number 10,247,669
- Issue date Apr 2, 2019
- Vorwerk & Co. Interholding GmbH
- Harald Windorfer
- G01 - MEASURING TESTING
Information Patent Grant
Optic distribution meter
- Patent number 9,952,152
- Issue date Apr 24, 2018
- National Central University
- Tsung-Hsun Yang
- G01 - MEASURING TESTING
Information Patent Grant
Method of evaluating optical characteristics of transparent substrate
- Patent number 9,606,020
- Issue date Mar 28, 2017
- Asahi Glass Company, Limited
- Minoru Tamada
- G02 - OPTICS
Information Patent Grant
Terminal and electronic water-resistance method
- Patent number 9,590,433
- Issue date Mar 7, 2017
- ZTE Corporation
- Xiaotang Li
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Systems and methods for semiconductor device process determination...
- Patent number 9,482,518
- Issue date Nov 1, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chun Hsiung Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Large particle detection for multi-spot surface scanning inspection...
- Patent number 8,755,044
- Issue date Jun 17, 2014
- KLA-Tencor Corporation
- Juergen Reich
- G01 - MEASURING TESTING
Information Patent Grant
Measuring a surface characteristic
- Patent number 7,742,168
- Issue date Jun 22, 2010
- Surfoptic Limited
- Nick Elton
- G01 - MEASURING TESTING
Information Patent Grant
Method for calculating optical constants and substrate processing s...
- Patent number 7,663,760
- Issue date Feb 16, 2010
- Tokyo Electron Limited
- Toshihiko Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Multi-channel integrating sphere
- Patent number 6,424,413
- Issue date Jul 23, 2002
- GretagMacbeth LLC
- William L. Weber
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring optical characteristics of an ob...
- Patent number 5,926,262
- Issue date Jul 20, 1999
- LJ Laboratories, L.L.C.
- Wayne D. Jung
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Apparatus for measuring grain sizes in metalized layers
- Patent number 5,149,978
- Issue date Sep 22, 1992
- Therma-Wave, Inc.
- Jon Opsal
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for optically measuring characteristics of a t...
- Patent number 4,873,430
- Issue date Oct 10, 1989
- International Business Machines Corporation
- Anthony Juliana
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for locating and testing areas of interest on a workpiece
- Patent number 4,795,260
- Issue date Jan 3, 1989
- Therma-Wave, Inc.
- John Schuur
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for determining glossiness of surface of a...
- Patent number 4,750,140
- Issue date Jun 7, 1988
- Kawasaki Steel Corporation
- Yuichiro Asano
- G01 - MEASURING TESTING
Information Patent Grant
Spectrophotometer
- Patent number 4,746,214
- Issue date May 24, 1988
- Shimadzu Corporation
- Osamu Akiyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20240272089
- Publication date Aug 15, 2024
- Samsung Electronics Co., Ltd.
- Minsu Kim
- G01 - MEASURING TESTING
Information Patent Application
LIGHTING DEVICE
- Publication number 20240060623
- Publication date Feb 22, 2024
- SCHOTT AG
- Albrecht Seidl
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
COMPOSITIONS AND METHODS FOR EVALUATION OF LIQUID CONTACT ANGLE PRO...
- Publication number 20220120681
- Publication date Apr 21, 2022
- THE TEXAS A&M UNIVERSITY SYSTEM
- Iltai Isaac KIM
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE OF OPTICAL SENSOR HAVING LIGHT-EMITTING ELEMENT AND PLURA...
- Publication number 20210255102
- Publication date Aug 19, 2021
- Canon Kabushiki Kaisha
- Kazushi Ino
- G01 - MEASURING TESTING
Information Patent Application
Measurement Device, Electronic Apparatus And Measurement Method
- Publication number 20200003686
- Publication date Jan 2, 2020
- SEIKO EPSON CORPORATION
- Hideaki KASAHARA
- G01 - MEASURING TESTING
Information Patent Application
TRANSPARENT ARTICLE
- Publication number 20190391303
- Publication date Dec 26, 2019
- Nippon Electric Glass Co., Ltd.
- Koji Ikegami
- G02 - OPTICS
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VENT MONITORING SYSTEM
- Publication number 20190351267
- Publication date Nov 21, 2019
- Air Distribution Technologies IP, LLC.
- Jill L. Gantos
- G01 - MEASURING TESTING
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INFORMATION PROCESSING APPARATUS, METHOD OF DERIVING REFLECTION CHA...
- Publication number 20190120764
- Publication date Apr 25, 2019
- Canon Kabushiki Kaisha
- Toshiyuki Ishii
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR PROCESSING A SURFACE
- Publication number 20180164213
- Publication date Jun 14, 2018
- Vorwerk & Co. lnterholding GmbH
- Harald WINDORFER
- A47 - FURNITURE DOMESTIC ARTICLES OR APPLIANCES COFFEE MILLS SPICE MILLS SUCT...
Information Patent Application
Cosmetic Evaluation Box for Used Electronics
- Publication number 20170167986
- Publication date Jun 15, 2017
- Tu Nguyen
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SENSOR, IMAGE FORMING APPARATUS AND DETERMINATION METHOD
- Publication number 20130057868
- Publication date Mar 7, 2013
- Yoshihiro OBA
- G01 - MEASURING TESTING
Information Patent Application
Large Particle Detection For Multi-Spot Surface Scanning Inspection...
- Publication number 20130050689
- Publication date Feb 28, 2013
- KLA-Tencor Corporation
- Juergen Reich
- G01 - MEASURING TESTING
Information Patent Application
Light Measurement Method and Apparatus
- Publication number 20090177426
- Publication date Jul 9, 2009
- Gordon Ivan Dodds
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALCULATING OPTICAL CONSTANTS AND SUBSTRATE PROCESSING S...
- Publication number 20080297801
- Publication date Dec 4, 2008
- TOKYO ELECTRON LIMITED
- Toshihiko Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING REFLECTIVITY OF LENS
- Publication number 20080165349
- Publication date Jul 10, 2008
- HON HAI Precision Industry CO., LTD.
- KUAN-TE HUANG
- G01 - MEASURING TESTING
Information Patent Application
Measuring a surface characteristic
- Publication number 20070153285
- Publication date Jul 5, 2007
- Nick Elton
- G01 - MEASURING TESTING

Measuring total reflection power

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Instruments and methods for characterizing the appearance of samples

Compositions and methods for evaluation of liquid contact angle pro...

Recovering material properties with active illumination and camera...

Inspection system, inspection method, program, and storage medium

UV-VIS spectroscopy instrument and methods for color appearance and...

Structure of optical sensor having light-emitting element and plura...

Transparent article

Droplet sensor

Inspection system, inspection method, program, and storage medium

UV-VIS spectroscopy instrument and methods for color appearance and...

Vent monitoring system

Measurement device, electronic apparatus and measurement method

Information processing apparatus, method of deriving reflection cha...

Apparatus for measuring light scattering

Device for processing a surface

Optic distribution meter

Method of evaluating optical characteristics of transparent substrate

Terminal and electronic water-resistance method

Systems and methods for semiconductor device process determination...

Large particle detection for multi-spot surface scanning inspection...

Measuring a surface characteristic

Method for calculating optical constants and substrate processing s...

Multi-channel integrating sphere

Apparatus and method for measuring optical characteristics of an ob...

Apparatus for measuring grain sizes in metalized layers

Method and apparatus for optically measuring characteristics of a t...

Apparatus for locating and testing areas of interest on a workpiece

Method of and apparatus for determining glossiness of surface of a...

Spectrophotometer

Patents Applicationslast 30 patents

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

LIGHTING DEVICE

COMPOSITIONS AND METHODS FOR EVALUATION OF LIQUID CONTACT ANGLE PRO...

STRUCTURE OF OPTICAL SENSOR HAVING LIGHT-EMITTING ELEMENT AND PLURA...

Measurement Device, Electronic Apparatus And Measurement Method

TRANSPARENT ARTICLE

VENT MONITORING SYSTEM

INFORMATION PROCESSING APPARATUS, METHOD OF DERIVING REFLECTION CHA...

DEVICE FOR PROCESSING A SURFACE

Cosmetic Evaluation Box for Used Electronics

OPTICAL SENSOR, IMAGE FORMING APPARATUS AND DETERMINATION METHOD

Large Particle Detection For Multi-Spot Surface Scanning Inspection...

Light Measurement Method and Apparatus

METHOD FOR CALCULATING OPTICAL CONSTANTS AND SUBSTRATE PROCESSING S...

APPARATUS FOR TESTING REFLECTIVITY OF LENS

Measuring a surface characteristic