Measuring total reflection power

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CPC
G01N2021/555

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/555Measuring total reflection power

Industries

Patents Grantslast 30 patents

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- Hunter Associates Laboratory, Inc.
- Michael T. Scardina
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Compositions and methods for evaluation of liquid contact angle pro...
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- The Texas A&M University System
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- G06 - COMPUTING CALCULATING COUNTING
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UV-VIS spectroscopy instrument and methods for color appearance and...
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- Issue date May 23, 2023
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Structure of optical sensor having light-emitting element and plura...
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- Issue date Feb 14, 2023
- Canon Kabushiki Kaisha
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- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Transparent article
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- Issue date Jan 17, 2023
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Inspection system, inspection method, program, and storage medium
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- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
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UV-VIS spectroscopy instrument and methods for color appearance and...
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- Issue date May 11, 2021
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Vent monitoring system
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Measurement device, electronic apparatus and measurement method
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- Issue date Dec 22, 2020
- Seiko Epson Corporation
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Information processing apparatus, method of deriving reflection cha...
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Apparatus for measuring light scattering
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Device for processing a surface
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- Issue date Apr 2, 2019
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Optic distribution meter
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- Issue date Apr 24, 2018
- National Central University
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Method of evaluating optical characteristics of transparent substrate
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Terminal and electronic water-resistance method
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- Issue date Mar 7, 2017
- ZTE Corporation
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Systems and methods for semiconductor device process determination...
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Large particle detection for multi-spot surface scanning inspection...
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Method for calculating optical constants and substrate processing s...
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Multi-channel integrating sphere
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- Wayne D. Jung
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Apparatus for measuring grain sizes in metalized layers
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Method and apparatus for optically measuring characteristics of a t...
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- Issue date Oct 10, 1989
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- Anthony Juliana
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Apparatus for locating and testing areas of interest on a workpiece
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- Issue date Jan 3, 1989
- Therma-Wave, Inc.
- John Schuur
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Method of and apparatus for determining glossiness of surface of a...
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- Issue date Jun 7, 1988
- Kawasaki Steel Corporation
- Yuichiro Asano
- G01 - MEASURING TESTING
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Spectrophotometer
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- Issue date May 24, 1988
- Shimadzu Corporation
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- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

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- THE TEXAS A&M UNIVERSITY SYSTEM
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- Kazushi Ino
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TRANSPARENT ARTICLE
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VENT MONITORING SYSTEM
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OPTICAL SENSOR, IMAGE FORMING APPARATUS AND DETERMINATION METHOD
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- Yoshihiro OBA
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Large Particle Detection For Multi-Spot Surface Scanning Inspection...
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Light Measurement Method and Apparatus
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- Gordon Ivan Dodds
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METHOD FOR CALCULATING OPTICAL CONSTANTS AND SUBSTRATE PROCESSING S...
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- Publication date Dec 4, 2008
- TOKYO ELECTRON LIMITED
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- G01 - MEASURING TESTING
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APPARATUS FOR TESTING REFLECTIVITY OF LENS
- Publication number 20080165349
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- HON HAI Precision Industry CO., LTD.
- KUAN-TE HUANG
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Information Patent Application
Measuring a surface characteristic
- Publication number 20070153285
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- Nick Elton
- G01 - MEASURING TESTING

Measuring total reflection power

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Instruments and methods for characterizing the appearance of samples

Compositions and methods for evaluation of liquid contact angle pro...

Recovering material properties with active illumination and camera...

Inspection system, inspection method, program, and storage medium

UV-VIS spectroscopy instrument and methods for color appearance and...

Structure of optical sensor having light-emitting element and plura...

Transparent article

Droplet sensor

Inspection system, inspection method, program, and storage medium

UV-VIS spectroscopy instrument and methods for color appearance and...

Vent monitoring system

Measurement device, electronic apparatus and measurement method

Information processing apparatus, method of deriving reflection cha...

Apparatus for measuring light scattering

Device for processing a surface

Optic distribution meter

Method of evaluating optical characteristics of transparent substrate

Terminal and electronic water-resistance method

Systems and methods for semiconductor device process determination...

Large particle detection for multi-spot surface scanning inspection...

Measuring a surface characteristic

Method for calculating optical constants and substrate processing s...

Multi-channel integrating sphere

Apparatus and method for measuring optical characteristics of an ob...

Apparatus for measuring grain sizes in metalized layers

Method and apparatus for optically measuring characteristics of a t...

Apparatus for locating and testing areas of interest on a workpiece

Method of and apparatus for determining glossiness of surface of a...

Spectrophotometer

Patents Applicationslast 30 patents

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

LIGHTING DEVICE

COMPOSITIONS AND METHODS FOR EVALUATION OF LIQUID CONTACT ANGLE PRO...

STRUCTURE OF OPTICAL SENSOR HAVING LIGHT-EMITTING ELEMENT AND PLURA...

Measurement Device, Electronic Apparatus And Measurement Method

TRANSPARENT ARTICLE

VENT MONITORING SYSTEM

INFORMATION PROCESSING APPARATUS, METHOD OF DERIVING REFLECTION CHA...

DEVICE FOR PROCESSING A SURFACE

Cosmetic Evaluation Box for Used Electronics

OPTICAL SENSOR, IMAGE FORMING APPARATUS AND DETERMINATION METHOD

Large Particle Detection For Multi-Spot Surface Scanning Inspection...

Light Measurement Method and Apparatus

METHOD FOR CALCULATING OPTICAL CONSTANTS AND SUBSTRATE PROCESSING S...

APPARATUS FOR TESTING REFLECTIVITY OF LENS

Measuring a surface characteristic