Number | Date | Country | Kind |
---|---|---|---|
59-253529 | Nov 1984 | JPX | |
59-253530 | Nov 1984 | JPX | |
60-266638 | Nov 1985 | JPX |
Number | Name | Date | Kind |
---|---|---|---|
4124803 | Bowers | Nov 1978 | |
4408880 | Tsuji et al. | Oct 1983 | |
4585343 | Schave et al. | Apr 1986 |
Number | Date | Country |
---|---|---|
60-97204 | May 1985 | JPX |
2123139A | Jan 1984 | GBX |
Entry |
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Eckerle et al., "NBS Reference Retroreflectometer", Applied Optics, vol. 19, No. 8, pp. 1253-1259, Apr. 15, 1980. |
DE-U-1 944 088 (Farbenfabriken Bayer AG) FIG. 1; p. 3, line 10-p. 4, line 19, 08/11/1966. |
WO-A-8 400 213 (Labsystems OY) abstract p. 3, line 20-p. 4, line 22, 06/29/1982. |
P. Beckmann et al. "The Scattering of Electromagnetic Waves from Rough Surfaces", chapters 3 and 5. |
"Tetsu-to-Hagane (Iron & Steel)", vol. 70 (1984) pp. 1095-1102. |