Mechano-optical scan

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CPC
G01N2201/104

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

Current Industry

G01N2201/104Mechano-optical scan

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Combined scatter and transmission multi-view imaging system
- Patent number 12,235,226
- Issue date Feb 25, 2025
- Rapiscan Systems, Inc.
- Edward James Morton
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Multi-modal imaging systems and methods
- Patent number 12,184,037
- Issue date Dec 31, 2024
- LI-COR BIOTECH, LLC
- Andrew Ragatz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical interrogation system and method
- Patent number 12,169,173
- Issue date Dec 17, 2024
- Universite Laval
- Maxime Joly
- G01 - MEASURING TESTING
Information Patent Grant
Appearance inspection device and defect inspection method
- Patent number 11,936,985
- Issue date Mar 19, 2024
- Omron Corporation
- Shingo Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
System and method for characterization of patterns marked on a fabric
- Patent number 11,851,795
- Issue date Dec 26, 2023
- JEANOLOGIA, S. L.
- Pere Pérez Millán
- D06 - TREATMENT OF TEXTILES OR THE LIKE LAUNDERING FLEXIBLE MATERIALS NOT OTH...
Information Patent Grant
Multi-spectral microparticle-fluorescence photon cytometry
- Patent number 11,835,525
- Issue date Dec 5, 2023
- MIFTEK CORPORATION
- Masanobu Yamamoto
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Apparatus and method for automatically recovering breast fillets fr...
- Patent number 11,793,207
- Issue date Oct 24, 2023
- Nordischer Maschinenbau Rud. Baader Gmbh + Co. KG
- Adrian Schulze
- A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Information Patent Grant
Apparatus and method for monitoring particle flow in a stack
- Patent number 11,609,179
- Issue date Mar 21, 2023
- ENVEA UK Ltd
- David Christopher Unitt
- G08 - SIGNALLING
Information Patent Grant
Inspection system for inspection of a lateral surface of a three-di...
- Patent number 11,506,616
- Issue date Nov 22, 2022
- MÜHLBAUER GMBH & CO. KG
- Oliver Habermann
- G01 - MEASURING TESTING
Information Patent Grant
Method of observing objects using a spinning localized observation
- Patent number 11,460,527
- Issue date Oct 4, 2022
- Vassili Peidous
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for measuring serum phosphate levels using portab...
- Patent number 11,460,395
- Issue date Oct 4, 2022
- The Regents of the University of California
- Aydogan Ozcan
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Measuring device, observing device and measuring method
- Patent number 11,402,200
- Issue date Aug 2, 2022
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Multi-view imaging system
- Patent number 11,371,948
- Issue date Jun 28, 2022
- Rapiscan Systems, Inc.
- Edward James Morton
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Recording dynamics of cellular processes
- Patent number 11,255,837
- Issue date Feb 22, 2022
- University of Vienna
- Alipasha Vaziri
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and apparatus for characterizing objects
- Patent number 11,041,714
- Issue date Jun 22, 2021
- Vassili Peidous
- G01 - MEASURING TESTING
Information Patent Grant
Transmission Raman spectroscopy
- Patent number 10,876,894
- Issue date Dec 29, 2020
- Renishaw plc
- Timothy Smith
- G02 - OPTICS
Information Patent Grant
Detecting metal contamination in polymer sheets
- Patent number 10,782,229
- Issue date Sep 22, 2020
- Honeywell International Inc.
- Tobias Nebel
- G01 - MEASURING TESTING
Information Patent Grant
Combined scatter and transmission multi-view imaging system
- Patent number 10,746,674
- Issue date Aug 18, 2020
- Rapiscan Systems, Inc.
- Edward James Morton
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Multi-spectral microparticle-fluorescence photon cytometry
- Patent number 10,613,096
- Issue date Apr 7, 2020
- CAPTL LLC
- Masanobu Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Method of irradiating a target
- Patent number 10,535,441
- Issue date Jan 14, 2020
- Mevex Corporation
- David A. Brown
- G01 - MEASURING TESTING
Information Patent Grant
Scanning in angle-resolved reflectometry and algorithmically elimin...
- Patent number 10,533,940
- Issue date Jan 14, 2020
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Color measuring device and color measuring method
- Patent number 10,502,627
- Issue date Dec 10, 2019
- Konica Minolta, Inc.
- Yasutaka Tanimura
- G01 - MEASURING TESTING
Information Patent Grant
Recording dynamics of cellular processes
- Patent number 10,317,390
- Issue date Jun 11, 2019
- University of Vienna
- Alipasha Vaziri
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Scanning in angle-resolved reflectometry and algorithmically elimin...
- Patent number 10,126,238
- Issue date Nov 13, 2018
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
System and method for surface inspection
- Patent number 10,126,248
- Issue date Nov 13, 2018
- General Electric Company
- Manuel Kenneth Bueno
- G01 - MEASURING TESTING
Information Patent Grant
Imaging apparatus and method
- Patent number 10,094,780
- Issue date Oct 9, 2018
- FUJIFILM Corporation
- Yasutake Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Scanning in angle-resolved reflectometry and algorithmically elimin...
- Patent number 9,958,385
- Issue date May 1, 2018
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
System and method for oblique incidence scanning with 2D array of s...
- Patent number 9,891,175
- Issue date Feb 13, 2018
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Grant
Infrared imaging system with automatic referencing
- Patent number 9,739,661
- Issue date Aug 22, 2017
- Agilent Technologies, Inc.
- Andrew Ghetler
- G01 - MEASURING TESTING
Information Patent Grant
System and method for surface inspection
- Patent number 9,651,503
- Issue date May 16, 2017
- General Electric Company
- Manuel Kenneth Bueno
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TOMOGRAPHIC REFRACTIVE INDEX PROFILE EVALUATION OF NON-SYMMETRICAL...
- Publication number 20240426750
- Publication date Dec 26, 2024
- Heraeus Quartz North America LLC
- Maximilian SCHMITT
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR INSPECTING LATERAL SURFACE OF CYLINDRICAL BATTERY
- Publication number 20240361252
- Publication date Oct 31, 2024
- LG ENERGY SOLUTION, LTD.
- Tae Young KIM
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THREE-DIMENSIONAL (3D) IMAGE CALIBRATION FOR A SPECTRAL...
- Publication number 20240302274
- Publication date Sep 12, 2024
- LEICA MICROSYSTEMS NC, INC.
- Robert H. HART
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT DEVICE
- Publication number 20240201085
- Publication date Jun 20, 2024
- Ushio Denki Kabushiki Kaisha
- Toshikazu NAGASHIMA
- G01 - MEASURING TESTING
Information Patent Application
DUAL-BEAM OPTOMECHANICAL STEERER AND ASSOCIATED METHODS
- Publication number 20240201074
- Publication date Jun 20, 2024
- The Regents of the University of Colorado, a Body Corporate
- Caroline B. Alden
- G01 - MEASURING TESTING
Information Patent Application
IMAGE SENSOR, SCANNER INCLUDING THE SAME, AND METHOD OF OPERATING T...
- Publication number 20230178582
- Publication date Jun 8, 2023
- Samsung Electronics Co., Ltd.
- Heejin CHOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPEARANCE INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20220360720
- Publication date Nov 10, 2022
- Omron Corporation
- Shingo HAYASHI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MICROSCOPE WITH SPATIAL IMAGING AND BEAM HOMOGENIZER
- Publication number 20220206280
- Publication date Jun 30, 2022
- Q-STATE BIOSCIENCES, INC.
- Christopher Werley
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR CHARACTERIZATION OF PATTERNS MARKED ON A FABRIC
- Publication number 20210238786
- Publication date Aug 5, 2021
- JEANOLOGIA, S. L.
- Pere PÉREZ MILLÁN
- G01 - MEASURING TESTING
Information Patent Application
LIGHT IRRADIATION APPARATUS
- Publication number 20210140874
- Publication date May 13, 2021
- Cellsystem Co., Ltd.
- Osamu WATARI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MEASURING SERUM PHOSPHATE LEVELS USING PORTAB...
- Publication number 20200393359
- Publication date Dec 17, 2020
- The Regents of the University of California
- Aydogan Ozcan
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
DETECTING METAL CONTAMINATION IN POLYMER SHEETS
- Publication number 20200292449
- Publication date Sep 17, 2020
- Honeywell International Inc.
- Tobias Nebel
- G01 - MEASURING TESTING
Information Patent Application
Multiplexed Single Molecule Analyzer
- Publication number 20200249164
- Publication date Aug 6, 2020
- NOVILUX, LLC
- Richard Livingston
- G01 - MEASURING TESTING
Information Patent Application
RECORDING DYNAMICS OF CELLULAR PROCESSES
- Publication number 20190277827
- Publication date Sep 12, 2019
- UNIVERSITY OF VIENNA
- Alipasha Vaziri
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
MEASURING DEVICE, OBSERVING DEVICE AND MEASURING METHOD
- Publication number 20190101492
- Publication date Apr 4, 2019
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
Scanning in Angle-Resolved Reflectometry and Algorithmically Elimin...
- Publication number 20190094142
- Publication date Mar 28, 2019
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
SCANNING IN ANGLE-RESOLVED REFLECTOMETRY AND ALGORITHMICALLY ELIMIN...
- Publication number 20180106723
- Publication date Apr 19, 2018
- KLA-Tencor Corporation
- Amnon MANASSEN
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSION RAMAN SPECTROSCOPY
- Publication number 20180045570
- Publication date Feb 15, 2018
- RENISHAW PLC
- Timothy SMITH
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR SURFACE INSPECTION
- Publication number 20170234806
- Publication date Aug 17, 2017
- GENERAL ELECTRIC COMPANY
- Manuel Kenneth Bueno
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR OPTICALLY INSPECTING AND ANALYZING STENT-LIKE...
- Publication number 20170030842
- Publication date Feb 2, 2017
- Ferran LAGUARTA BERTRAN
- G01 - MEASURING TESTING
Information Patent Application
NON-INSTRUSIVE FILTER SCANNING
- Publication number 20160097705
- Publication date Apr 7, 2016
- CAMFIL USA, INC.
- Keith G. WOOLARD
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR SURFACE INSPECTION
- Publication number 20160069820
- Publication date Mar 10, 2016
- GENERAL ELECTRIC COMPANY
- Manuel Kenneth Bueno
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ILLUMINATING DEVICE, IMAGING DEVICE COMPRISING SAME AND ME...
- Publication number 20150346120
- Publication date Dec 3, 2015
- Commissariat A L'Energie Atomique Et Aux Energies Alternatives
- Rene VOGLER
- G01 - MEASURING TESTING
Information Patent Application
FLUORESCENCE DETECTION DEVICE
- Publication number 20150153281
- Publication date Jun 4, 2015
- Sharp Kabushiki Kaisha
- Ryohhei Kawamuki
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEFECT INSPECTION APPARATUS
- Publication number 20130301042
- Publication date Nov 14, 2013
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Application
Motion Control Systems and Methods For Biosensor Scanning
- Publication number 20130063724
- Publication date Mar 14, 2013
- Cameron John Tovey
- G01 - MEASURING TESTING
Information Patent Application
CONFOCAL FLUORESCENCE SLIDE SCANNER WITH PARALLEL DETECTION
- Publication number 20130015370
- Publication date Jan 17, 2013
- Huron Technologies International In
- Savvas Damaskinos
- G01 - MEASURING TESTING
Information Patent Application
DATA ACQUISITION METHOD USING A LASER SCANNER
- Publication number 20110006219
- Publication date Jan 13, 2011
- Alois Schausberger
- G02 - OPTICS
Information Patent Application
BEAM SCANNER AND SURFACE MEASUREMENT APPARATUS
- Publication number 20100201993
- Publication date Aug 12, 2010
- Samsung Electro-Mechanics CO., LTD.
- Tak Gyum KIM
- G02 - OPTICS
Information Patent Application
SORTING DEVICE WITH A BROAD SPECTRUM LIGHT SOURCE AND ACCORDING METHOD
- Publication number 20100198397
- Publication date Aug 5, 2010
- Belgian Electronic Sorting Technology N.V.
- Paul Berghmans
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING

Mechano-optical scan

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Combined scatter and transmission multi-view imaging system

Multi-modal imaging systems and methods

Optical interrogation system and method

Appearance inspection device and defect inspection method

System and method for characterization of patterns marked on a fabric

Multi-spectral microparticle-fluorescence photon cytometry

Apparatus and method for automatically recovering breast fillets fr...

Apparatus and method for monitoring particle flow in a stack

Inspection system for inspection of a lateral surface of a three-di...

Method of observing objects using a spinning localized observation

System and method for measuring serum phosphate levels using portab...

Measuring device, observing device and measuring method

Multi-view imaging system

Recording dynamics of cellular processes

Method and apparatus for characterizing objects

Transmission Raman spectroscopy

Detecting metal contamination in polymer sheets

Combined scatter and transmission multi-view imaging system

Multi-spectral microparticle-fluorescence photon cytometry

Method of irradiating a target

Scanning in angle-resolved reflectometry and algorithmically elimin...

Color measuring device and color measuring method

Recording dynamics of cellular processes

Scanning in angle-resolved reflectometry and algorithmically elimin...

System and method for surface inspection

Imaging apparatus and method

Scanning in angle-resolved reflectometry and algorithmically elimin...

System and method for oblique incidence scanning with 2D array of s...

Infrared imaging system with automatic referencing

System and method for surface inspection

Patents Applicationslast 30 patents

TOMOGRAPHIC REFRACTIVE INDEX PROFILE EVALUATION OF NON-SYMMETRICAL...

DEVICE FOR INSPECTING LATERAL SURFACE OF CYLINDRICAL BATTERY

METHOD FOR THREE-DIMENSIONAL (3D) IMAGE CALIBRATION FOR A SPECTRAL...

OPTICAL MEASUREMENT DEVICE

DUAL-BEAM OPTOMECHANICAL STEERER AND ASSOCIATED METHODS

IMAGE SENSOR, SCANNER INCLUDING THE SAME, AND METHOD OF OPERATING T...

APPEARANCE INSPECTION DEVICE AND DEFECT INSPECTION METHOD

MICROSCOPE WITH SPATIAL IMAGING AND BEAM HOMOGENIZER

SYSTEM AND METHOD FOR CHARACTERIZATION OF PATTERNS MARKED ON A FABRIC

LIGHT IRRADIATION APPARATUS

SYSTEM AND METHOD FOR MEASURING SERUM PHOSPHATE LEVELS USING PORTAB...

DETECTING METAL CONTAMINATION IN POLYMER SHEETS

Multiplexed Single Molecule Analyzer

RECORDING DYNAMICS OF CELLULAR PROCESSES

MEASURING DEVICE, OBSERVING DEVICE AND MEASURING METHOD

Scanning in Angle-Resolved Reflectometry and Algorithmically Elimin...

SCANNING IN ANGLE-RESOLVED REFLECTOMETRY AND ALGORITHMICALLY ELIMIN...

TRANSMISSION RAMAN SPECTROSCOPY

SYSTEM AND METHOD FOR SURFACE INSPECTION

DEVICE AND METHOD FOR OPTICALLY INSPECTING AND ANALYZING STENT-LIKE...

NON-INSTRUSIVE FILTER SCANNING

SYSTEM AND METHOD FOR SURFACE INSPECTION

SCANNING ILLUMINATING DEVICE, IMAGING DEVICE COMPRISING SAME AND ME...

FLUORESCENCE DETECTION DEVICE

DEFECT INSPECTION METHOD AND DEFECT INSPECTION APPARATUS

Motion Control Systems and Methods For Biosensor Scanning

CONFOCAL FLUORESCENCE SLIDE SCANNER WITH PARALLEL DETECTION

DATA ACQUISITION METHOD USING A LASER SCANNER

BEAM SCANNER AND SURFACE MEASUREMENT APPARATUS

SORTING DEVICE WITH A BROAD SPECTRUM LIGHT SOURCE AND ACCORDING METHOD