MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy

Industry

CPC
G01Q60/08

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Parent Industries

GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

Current Industry

G01Q60/08MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy

Industries

Patents Grantslast 30 patents

Information Patent Grant
Nanoscale scanning sensors
- Patent number 11,815,528
- Issue date Nov 14, 2023
- President and Fellows of Harvard College
- Michael S. Grinolds
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring magnetic field strength
- Patent number 11,762,046
- Issue date Sep 19, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Baohua Niu
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic distribution detection method
- Patent number 11,719,766
- Issue date Aug 8, 2023
- Yi-Chun Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for measuring magnetic field strength
- Patent number 10,753,990
- Issue date Aug 25, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Baohua Niu
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale scanning sensors
- Patent number 10,041,971
- Issue date Aug 7, 2018
- President and Fellows of Harvard College
- Michael S. Grinolds
- G01 - MEASURING TESTING
Information Patent Grant
Method for controlling a scanning microscope
- Patent number 9,091,704
- Issue date Jul 28, 2015
- UNIVERSIDAD AUTONOMA DE MADRID
- David Martinez Martin
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscopy system and method for nanoscale measurement
- Patent number 8,726,410
- Issue date May 13, 2014
- The United States of America as represented by the Secretary of the Air Force
- Shamachary Sathish
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Local injector of spin-polarized electrons with semiconductor tip u...
- Patent number 7,841,016
- Issue date Nov 23, 2010
- Ecole Polytechnique
- Daniel Paget
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Spin microscope based on optically detected magnetic resonance
- Patent number 7,752,899
- Issue date Jul 13, 2010
- The United States of America as represented by the United States Department o...
- Gennady P. Berman
- G01 - MEASURING TESTING
Information Patent Grant
Spin microscope based on optically detected magnetic resonance
- Patent number 7,743,648
- Issue date Jun 29, 2010
- The United States of America as represented by the United States Department o...
- Gennady P. Berman
- G01 - MEASURING TESTING
Information Patent Grant
Spin microscope based on optically detected magnetic resonance
- Patent number 7,608,820
- Issue date Oct 27, 2009
- The United States of America as represented by the United States Department o...
- Gennady P. Berman
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probes for nanoscale magnetic and atomic force microscopy
- Patent number 7,462,270
- Issue date Dec 9, 2008
- The Trustees of Boston College
- Michael J. Naughton
- G01 - MEASURING TESTING
Information Patent Grant
Probe for a scanning microscope
- Patent number 7,398,678
- Issue date Jul 15, 2008
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic resonance force microscope
- Patent number 7,400,144
- Issue date Jul 15, 2008
- Jeol Ltd.
- Shigenori Tsuji
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probes for nanoscale magnetic and atomic force microscopy
- Patent number 7,214,303
- Issue date May 8, 2007
- The Trustees of Boston College
- Michael J. Naughton
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic force microscope
- Patent number 6,504,365
- Issue date Jan 7, 2003
- Jeol Ltd.
- Shinichi Kitamura
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field characteristics evaluation apparatus and magnetic fi...
- Patent number 6,437,562
- Issue date Aug 20, 2002
- Kabushiki Kaisha Toshiba
- Masayuki Abe
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of producing magnetic force image and scanning probe microscope
- Patent number 6,281,495
- Issue date Aug 28, 2001
- Jeol Ltd.
- Shinichi Kitamura
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of measuring exchange force and method of evaluating magneti...
- Patent number 6,081,115
- Issue date Jun 27, 2000
- Hokkaido University
- Koichi Mukasa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus for measuring exchange force
- Patent number 6,078,174
- Issue date Jun 20, 2000
- Hokkaido University
- Koichi Mukasa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 5,939,715
- Issue date Aug 17, 1999
- Jeol Ltd.
- Shinichi Kitamura
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning method with scanning probe microscope
- Patent number 5,652,377
- Issue date Jul 29, 1997
- Olympus Optical Co., Ltd.
- Akira Yagi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetic resonance method and apparatus for detecting an atomic str...
- Patent number 5,619,139
- Issue date Apr 8, 1997
- Bruker Analytische Messtechnik GmbH
- Karoly Holczer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus for measuring physical properties of micro area
- Patent number 5,585,722
- Issue date Dec 17, 1996
- Hitachi, Ltd.
- Shigeyuki Hosoki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Micromechanical sensor and sensor fabrication process
- Patent number 5,455,419
- Issue date Oct 3, 1995
- International Business Machines Corporation
- Thomas Bayer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Surface observing apparatus and method
- Patent number 5,436,448
- Issue date Jul 25, 1995
- Hitachi, Ltd.
- Sumio Hosaka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Micromechanical sensor fabrication process
- Patent number 5,282,924
- Issue date Feb 1, 1994
- International Business Machines Corporation
- Thomas Bayer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever unit and atomic force microscope, magnetic force microsc...
- Patent number 5,260,567
- Issue date Nov 9, 1993
- Canon Kabushiki Kaisha
- Ryo Kuroda
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH
- Publication number 20230358829
- Publication date Nov 9, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- Baohua NIU
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC DISTRIBUTION DETECTION METHOD
- Publication number 20230078584
- Publication date Mar 16, 2023
- National Cheng Kung University
- Yi-Chun Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM FOR SCANNING PROBE MICROSCOPY APPLICATIONS AND METHOD FOR OB...
- Publication number 20210318352
- Publication date Oct 14, 2021
- Consejo Superior de Investigaciones Cientificas (CSIC)
- Lidia MARTINEZ ORELLANA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH
- Publication number 20200386832
- Publication date Dec 10, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Baohua NIU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CONTROLLING A SCANNING MICROSCOPE
- Publication number 20140317789
- Publication date Oct 23, 2014
- David Martinez Martin
- B82 - NANO-TECHNOLOGY
Information Patent Application
AFM-COUPLED MICROSCALE RADIOFREQUENCY PROBE FOR MAGNETIC RESONANCE...
- Publication number 20140237690
- Publication date Aug 21, 2014
- Purdue Research Foundation
- Corey P. Neu
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HEAD
- Publication number 20140092717
- Publication date Apr 3, 2014
- Hitachi High-Technologies Corporation
- Teruaki TOKUTOMI
- B82 - NANO-TECHNOLOGY
Information Patent Application
Atomic Force Microscopy System and Method for Nanoscale Measurement
- Publication number 20120030846
- Publication date Feb 2, 2012
- Government of the United States, as represented by the Secretary of the Air F...
- Shamachary Sathish
- G01 - MEASURING TESTING
Information Patent Application
Local Injector of Spin-Polarized Electrons with Semiconductor Tip U...
- Publication number 20080210864
- Publication date Sep 4, 2008
- ECOLE POLYTECHNIQUE
- Daniel Paget
- G01 - MEASURING TESTING
Information Patent Application
Cantilever probes for nanoscale magnetic and atomic force microscopy
- Publication number 20070235340
- Publication date Oct 11, 2007
- The Trustees of Boston College
- Michael J. Naughton
- G01 - MEASURING TESTING
Information Patent Application
Magnetic resonance force microscope
- Publication number 20070216412
- Publication date Sep 20, 2007
- JEOL Ltd.
- Shigenori Tsuji
- G01 - MEASURING TESTING
Information Patent Application
Probe for a scanning microscope
- Publication number 20060150720
- Publication date Jul 13, 2006
- YOSHIKAZU NAKAYAMA
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Application
Cantilever probes for nanoscale magnetic and atomic force microscopy
- Publication number 20050241375
- Publication date Nov 3, 2005
- The Trustees of Boston College
- Michael J. Naughton
- G01 - MEASURING TESTING
Information Patent Application
Magnetic force microscope
- Publication number 20020097046
- Publication date Jul 25, 2002
- JEOL Ltd.
- Shinichi Kitamura
- B82 - NANO-TECHNOLOGY
Information Patent Application
Magnetic field characteristics evaluation apparatus and magnetic fi...
- Publication number 20010030536
- Publication date Oct 18, 2001
- Masayuki Abe
- B82 - NANO-TECHNOLOGY

MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Nanoscale scanning sensors

Method and apparatus for measuring magnetic field strength

Magnetic distribution detection method

Method and apparatus for measuring magnetic field strength

Nanoscale scanning sensors

Method for controlling a scanning microscope

Atomic force microscopy system and method for nanoscale measurement

Local injector of spin-polarized electrons with semiconductor tip u...

Spin microscope based on optically detected magnetic resonance

Spin microscope based on optically detected magnetic resonance

Spin microscope based on optically detected magnetic resonance

Cantilever probes for nanoscale magnetic and atomic force microscopy

Probe for a scanning microscope

Magnetic resonance force microscope

Cantilever probes for nanoscale magnetic and atomic force microscopy

Magnetic force microscope

Magnetic field characteristics evaluation apparatus and magnetic fi...

Method of producing magnetic force image and scanning probe microscope

Method of measuring exchange force and method of evaluating magneti...

Apparatus for measuring exchange force

Scanning probe microscope

Scanning method with scanning probe microscope

Magnetic resonance method and apparatus for detecting an atomic str...

Apparatus for measuring physical properties of micro area

Micromechanical sensor and sensor fabrication process

Surface observing apparatus and method

Micromechanical sensor fabrication process

Cantilever unit and atomic force microscope, magnetic force microsc...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH

MAGNETIC DISTRIBUTION DETECTION METHOD

SYSTEM FOR SCANNING PROBE MICROSCOPY APPLICATIONS AND METHOD FOR OB...

METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH

METHOD FOR CONTROLLING A SCANNING MICROSCOPE

AFM-COUPLED MICROSCALE RADIOFREQUENCY PROBE FOR MAGNETIC RESONANCE...

METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HEAD

Atomic Force Microscopy System and Method for Nanoscale Measurement

Local Injector of Spin-Polarized Electrons with Semiconductor Tip U...

Cantilever probes for nanoscale magnetic and atomic force microscopy

Magnetic resonance force microscope

Probe for a scanning microscope

Cantilever probes for nanoscale magnetic and atomic force microscopy

Magnetic force microscope

Magnetic field characteristics evaluation apparatus and magnetic fi...