Number | Date | Country | Kind |
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2000-299178 | Sep 2000 | JP |
Number | Name | Date | Kind |
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5308974 | Elings et al. | May 1994 | |
5519212 | Elings et al. | May 1996 | |
6281495 | Kitamura | Aug 2001 |
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“Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivity”, T.R. Albrecht et al., J. Appl. Phys. 69 (2), Jan. 15, 1991, pp. 668-673. |
“Separation of Magnetic and Topographic Effects in Force Microscopy”, C. Schönenberger et al., J. Appl. Phys. 67 (12), Jun. 15, 1990, pp. 7278-7280. |