microdefects

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CPC
G01N2223/6462

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/6462microdefects

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Sample holder, system and method
- Patent number 12,007,339
- Issue date Jun 11, 2024
- Carl Zeiss SMT Inc.
- Thomas Anthony Case
- G01 - MEASURING TESTING
Information Patent Grant
Geometry based three dimensional reconstruction of a semiconductor...
- Patent number 11,953,316
- Issue date Apr 9, 2024
- Applied Materials Israel Ltd.
- Rafael Bistritzer
- G01 - MEASURING TESTING
Information Patent Grant
System and method for in-situ X-ray diffraction-based real-time mon...
- Patent number 11,933,747
- Issue date Mar 19, 2024
- University of Maryland, College Park
- Peter Zavalij
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Non-destructive detection of surface and near surface abnormalities...
- Patent number 11,815,477
- Issue date Nov 14, 2023
- The University of Sheffield
- Matthew Brown
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus for inspecting semiconductor devices using cha...
- Patent number 11,754,517
- Issue date Sep 12, 2023
- Samsung Electronics Co., Ltd.
- Suyoung Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method acquiring projection image, control apparatus, control progr...
- Patent number 11,543,367
- Issue date Jan 3, 2023
- Rigaku Corporation
- Yoshihiro Takeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for determining the microstructure of a metal pro...
- Patent number 11,249,037
- Issue date Feb 15, 2022
- SMS group GMBH
- Mostafa Biglari
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Grant
Nanoscale X-ray tomosynthesis for rapid analysis of integrated circ...
- Patent number 11,152,130
- Issue date Oct 19, 2021
- Massachusetts Institute of Technology
- Akintunde I. Akinwande
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method of detecting an anomaly in a single crystal structure
- Patent number 11,099,143
- Issue date Aug 24, 2021
- Rolls-Royce PLC
- Jacqueline Griffiths
- G01 - MEASURING TESTING
Information Patent Grant
Defect discovery and recipe optimization for inspection of three-di...
- Patent number 11,047,806
- Issue date Jun 29, 2021
- KLA-Tencor Corporation
- Santosh Bhattacharyya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray scattering method and system for non-destructively inspecting...
- Patent number 11,022,571
- Issue date Jun 1, 2021
- The Boeing Company
- Morteza Safai
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection apparatus for inspecting semiconductor wafers
- Patent number 10,948,425
- Issue date Mar 16, 2021
- Nordson Corporation
- William T. Walker
- G01 - MEASURING TESTING
Information Patent Grant
X-ray based fatigue inspection of downhole component
- Patent number 10,539,518
- Issue date Jan 21, 2020
- Weatherford Technology Holdings, LLC
- Robert P. Badrak
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection apparatus
- Patent number 10,393,675
- Issue date Aug 27, 2019
- Nordson Corporation
- John Tingay
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection method and device
- Patent number 10,352,879
- Issue date Jul 16, 2019
- Hitachi High-Technologies Corporaiton
- Toshiyuki Nakao
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection apparatus for inspecting semiconductor wafers
- Patent number 10,215,716
- Issue date Feb 26, 2019
- Nordson Corporation
- John Tingay
- G01 - MEASURING TESTING
Information Patent Grant
Methods for in situ monitoring and control of defect formation or h...
- Patent number 10,203,295
- Issue date Feb 12, 2019
- Lockheed Martin Corporation
- Jacob L. Swett
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for generating image data relating to an object and particle...
- Patent number 9,857,318
- Issue date Jan 2, 2018
- Carl Zeiss Microscopy GmbH
- Fabian Pérez-Willard
- G02 - OPTICS
Information Patent Grant
X-ray diffraction (XRD) characterization methods for sigma=3 twin d...
- Patent number 9,835,570
- Issue date Dec 5, 2017
- The United States of America as represented by the Administrator of NASA
- Yeonjoon Park
- G01 - MEASURING TESTING
Information Patent Grant
Object production using an additive manufacturing process and quali...
- Patent number 9,764,517
- Issue date Sep 19, 2017
- BAE Systems plc
- Mark Alfred Potter
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Using multiple sources/detectors for high-throughput X-ray topograp...
- Patent number 9,726,624
- Issue date Aug 8, 2017
- BRUKER JV ISRAEL LTD.
- Paul Anthony Ryan
- G01 - MEASURING TESTING
Information Patent Grant
X-ray topography apparatus
- Patent number 9,658,174
- Issue date May 23, 2017
- Rigaku Corporation
- Kazuhiko Omote
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Graphene defect detection
- Patent number 9,091,634
- Issue date Jul 28, 2015
- EMPIRE TECHNOLOGY DEVELOPMENT LLC
- Seth A. Miller
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System for detecting pin hole of fuel cell stack parts
- Patent number 8,654,920
- Issue date Feb 18, 2014
- Hyundai Motor Company
- Sang Yeoul Ahn
- G01 - MEASURING TESTING
Information Patent Grant
3417240
- Patent number 3,417,240
- Issue date Dec 17, 1968
- G01 - MEASURING TESTING
Information Patent Grant
3025399
- Patent number 3,025,399
- Issue date Mar 13, 1962
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HIGH RESOLUTION, LOW ENERGY ELECTRON MICROSCOPE FOR PROVIDING TOPOG...
- Publication number 20240272099
- Publication date Aug 15, 2024
- Carl Zeiss SMT GMBH
- Daniel Schwarz
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGING SYSTEM AND LEARNED MODEL PRODUCTION METHOD
- Publication number 20240068962
- Publication date Feb 29, 2024
- Shimadzu Corporation
- Hiroaki TSUSHIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL RECONSTRUCTION OF A SEMICONDUCTOR SPECIMEN
- Publication number 20220082376
- Publication date Mar 17, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Rafael BISTRITZER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS FOR INSPECTING SEMICONDUCTOR DEVICES USING CHA...
- Publication number 20210333225
- Publication date Oct 28, 2021
- Samsung Electronics Co., Ltd.
- Suyoung Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-Ray Scattering Method and System for Non-Destructively Inspecting...
- Publication number 20200378905
- Publication date Dec 3, 2020
- The Boeing Company
- Morteza Safai
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE TESTING
- Publication number 20200173937
- Publication date Jun 4, 2020
- AIRBUS OPERATIONS LIMITED
- Venkatasubramanian NARAYANAN
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR DETERMINING THE MICROSTRUCTURE OF A METAL PRO...
- Publication number 20190292624
- Publication date Sep 26, 2019
- SMS group GMBH
- Mostafa BIGLARI
- C21 - METALLURGY OF IRON
Information Patent Application
ANGLED BEAM INSPECTION SYSTEM FOR SEMICONDUCTOR DEVICES
- Publication number 20190113469
- Publication date Apr 18, 2019
- GLOBALFOUNDRIES INC.
- Oliver D. Patterson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-Ray Based Fatigue Inspection of Downhole Component
- Publication number 20180328870
- Publication date Nov 15, 2018
- Weatherford Technology Holdings, LLC.
- Robert P. Badrak
- G01 - MEASURING TESTING
Information Patent Application
Defect Discovery And Recipe Optimization For Inspection Of Three-Di...
- Publication number 20180149603
- Publication date May 31, 2018
- KLA-Tencor Corporation
- Santosh Bhattacharyya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY INSPECTION APPARATUS FOR INSPECTING SEMICONDUCTOR WAFERS
- Publication number 20170011973
- Publication date Jan 12, 2017
- Nordson Corporation
- John Tingay
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR GENERATING IMAGE DATA RELATING TO AN OBJECT AND PARTICLE...
- Publication number 20160274040
- Publication date Sep 22, 2016
- CARL ZEISS MICROSCOPY GMBH
- Fabian PÉREZ-WILLARD
- G01 - MEASURING TESTING
Information Patent Application
Method and System for EUV Mask Blank Buried Defect Analysis
- Publication number 20160169816
- Publication date Jun 16, 2016
- Carl Zeiss SMT GMBH
- Jan Hendrik Peters
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING DEFECT OF SUBSTRATE
- Publication number 20140306109
- Publication date Oct 16, 2014
- Samsung Electronics Co., Ltd.
- Jong-Cheon SUN
- G01 - MEASURING TESTING
Information Patent Application
GRAPHENE DEFECT DETECTION
- Publication number 20130071941
- Publication date Mar 21, 2013
- EMPIRE TECHNOLOGY DEVELOPMENT LLC
- Seth A. Miller
- B82 - NANO-TECHNOLOGY
Information Patent Application
SYSTEM FOR DETECTING PIN HOLE OF FUEL CELL STACK PARTS
- Publication number 20120140880
- Publication date Jun 7, 2012
- Kia Motors Corporation
- Sang Yeoul Ahn
- G06 - COMPUTING CALCULATING COUNTING

microdefects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Sample holder, system and method

Geometry based three dimensional reconstruction of a semiconductor...

System and method for in-situ X-ray diffraction-based real-time mon...

Non-destructive detection of surface and near surface abnormalities...

Inspection apparatus for inspecting semiconductor devices using cha...

Method acquiring projection image, control apparatus, control progr...

Device and method for determining the microstructure of a metal pro...

Nanoscale X-ray tomosynthesis for rapid analysis of integrated circ...

Method of detecting an anomaly in a single crystal structure

Defect discovery and recipe optimization for inspection of three-di...

X-ray scattering method and system for non-destructively inspecting...

X-ray inspection apparatus for inspecting semiconductor wafers

X-ray based fatigue inspection of downhole component

X-ray inspection apparatus

X-ray inspection method and device

X-ray inspection apparatus for inspecting semiconductor wafers

Methods for in situ monitoring and control of defect formation or h...

Method for generating image data relating to an object and particle...

X-ray diffraction (XRD) characterization methods for sigma=3 twin d...

Object production using an additive manufacturing process and quali...

Using multiple sources/detectors for high-throughput X-ray topograp...

X-ray topography apparatus

Graphene defect detection

System for detecting pin hole of fuel cell stack parts

3417240

3025399

Patents Applicationslast 30 patents

HIGH RESOLUTION, LOW ENERGY ELECTRON MICROSCOPE FOR PROVIDING TOPOG...

X-RAY IMAGING SYSTEM AND LEARNED MODEL PRODUCTION METHOD

THREE-DIMENSIONAL RECONSTRUCTION OF A SEMICONDUCTOR SPECIMEN

INSPECTION APPARATUS FOR INSPECTING SEMICONDUCTOR DEVICES USING CHA...

X-Ray Scattering Method and System for Non-Destructively Inspecting...

NON-DESTRUCTIVE TESTING

DEVICE AND METHOD FOR DETERMINING THE MICROSTRUCTURE OF A METAL PRO...

ANGLED BEAM INSPECTION SYSTEM FOR SEMICONDUCTOR DEVICES

X-Ray Based Fatigue Inspection of Downhole Component

Defect Discovery And Recipe Optimization For Inspection Of Three-Di...

X-RAY INSPECTION APPARATUS FOR INSPECTING SEMICONDUCTOR WAFERS

METHOD FOR GENERATING IMAGE DATA RELATING TO AN OBJECT AND PARTICLE...

Method and System for EUV Mask Blank Buried Defect Analysis

METHOD FOR DETECTING DEFECT OF SUBSTRATE

GRAPHENE DEFECT DETECTION

SYSTEM FOR DETECTING PIN HOLE OF FUEL CELL STACK PARTS