Microprobes

Industry

CPC
H01J2237/2555

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/2555Microprobes

Industries

Patents Grantslast 30 patents

Information Patent Grant
3D metrology from 3D datacube created from stack of registered imag...
- Patent number 11,728,126
- Issue date Aug 15, 2023
- Applied Materials Israel Ltd.
- Ilya Blayvas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope with plural X-ray detectors for acquiring eleme...
- Patent number 10,002,741
- Issue date Jun 19, 2018
- Industrial Technology Research Institute
- Fu-Rong Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of acquiring EBSP patterns
- Patent number 9,618,463
- Issue date Apr 11, 2017
- FEI Company
- Marek Uncovský
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for material analysis of a microscopic element
- Patent number 8,546,756
- Issue date Oct 1, 2013
- Applied Materials Israel, Ltd.
- Dmitry Shur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for cleaning an analytical instrument while op...
- Patent number 6,667,475
- Issue date Dec 23, 2003
- Applied Materials, Inc.
- Shachar Parran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection system
- Patent number 6,573,509
- Issue date Jun 3, 2003
- Oxford Instruments Analytical Limited
- Ian Radley
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Grant
Ion-induced electron emission microscopy
- Patent number 6,291,823
- Issue date Sep 18, 2001
- Sandia Corporation
- Barney L. Doyle
- G01 - MEASURING TESTING
Information Patent Grant
Collimator for high takeoff angle energy dispersive spectroscopy (E...
- Patent number 5,847,388
- Issue date Dec 8, 1998
- Noran Instruments, Inc.
- Steven J. Foote
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cold finger design in an energy dispersive x-ray analyzer
- Patent number 5,821,176
- Issue date Oct 13, 1998
- Philips Electronics North America Corporation
- Lun-Shu Ray Yeh
- B32 - LAYERED PRODUCTS
Information Patent Grant
Method and apparatus for mechanically cooling energy dispersive X-r...
- Patent number 5,816,052
- Issue date Oct 6, 1998
- Noran Instruments, Inc.
- Steven J. Foote
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Grant
Closed cycle gas cryogenically cooled radiation detector
- Patent number 5,811,816
- Issue date Sep 22, 1998
- U.S. Philips Corporation
- Brian William Gallagher
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information Patent Grant
Closed cycle gas cryogenically cooled radiation detector
- Patent number 5,552,608
- Issue date Sep 3, 1996
- Philips Electronics North America Corporation
- Brian W. Gallagher
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information Patent Grant
Surface analyzing and processing apparatus
- Patent number 5,440,122
- Issue date Aug 8, 1995
- Seiko Instruments Inc.
- Masatoshi Yasutake
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
3D METROLOGY FROM 3D DATACUBE CREATED FROM STACK OF REGISTERED IMAG...
- Publication number 20230335370
- Publication date Oct 19, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Ilya Blayvas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTROL IMAGING METHODS IN ADVANCED ULTRAFAST ELECTRON MICROSCOPY
- Publication number 20140131574
- Publication date May 15, 2014
- California Institute of Technology
- Ahmed H. Zewail
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MATERIAL ANALYSYS OF A MICROSCOPIC ELEMENT
- Publication number 20110024622
- Publication date Feb 3, 2011
- Dmitry Shur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detection system
- Publication number 20020117628
- Publication date Aug 29, 2002
- Ian Radley
- G01 - MEASURING TESTING

Microprobes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

3D metrology from 3D datacube created from stack of registered imag...

Electron microscope with plural X-ray detectors for acquiring eleme...

Method of acquiring EBSP patterns

System and method for material analysis of a microscopic element

Method and apparatus for cleaning an analytical instrument while op...

Detection system

Ion-induced electron emission microscopy

Collimator for high takeoff angle energy dispersive spectroscopy (E...

Cold finger design in an energy dispersive x-ray analyzer

Method and apparatus for mechanically cooling energy dispersive X-r...

Closed cycle gas cryogenically cooled radiation detector

Closed cycle gas cryogenically cooled radiation detector

Surface analyzing and processing apparatus

Patents Applicationslast 30 patents

3D METROLOGY FROM 3D DATACUBE CREATED FROM STACK OF REGISTERED IMAG...

CONTROL IMAGING METHODS IN ADVANCED ULTRAFAST ELECTRON MICROSCOPY

SYSTEM AND METHOD FOR MATERIAL ANALYSYS OF A MICROSCOPIC ELEMENT

Detection system