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Modifiable path multiple paths in one sample
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G01N2201/066
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2201/00
Features of devices classified in G01N21/00
Current Industry
G01N2201/066
Modifiable path multiple paths in one sample
Industries
Overview
Organizations
People
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Impact
Patents Grants
last 30 patents
Information
Patent Grant
Resolve path optical sampling architectures
Patent number
12,332,173
Issue date
Jun 17, 2025
Mark Alan Arbore
G01 - MEASURING TESTING
Information
Patent Grant
Dual lens inspection device
Patent number
12,332,181
Issue date
Jun 17, 2025
Sun Yang Optics Development Co., Ltd.
Sheng Che Wu
G01 - MEASURING TESTING
Information
Patent Grant
Measuring device for measuring the absorption of gases
Patent number
12,326,400
Issue date
Jun 10, 2025
Drager Safety AG & Co. KGaA
Arne Tröllsch
G01 - MEASURING TESTING
Information
Patent Grant
Gas sensing
Patent number
12,313,533
Issue date
May 27, 2025
Koninklijke Philips N.V.
Zhi-Xing Jiang
G01 - MEASURING TESTING
Information
Patent Grant
Masking to eliminate direct line of sight between light emitter and...
Patent number
12,270,760
Issue date
Apr 8, 2025
Carrier Corporation
Jacob Kerling
G08 - SIGNALLING
Information
Patent Grant
Microfluidic detection device
Patent number
12,253,456
Issue date
Mar 18, 2025
AUO Corporation
Shu-Jiang Liu
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
System and method for authenticating and classifying products using...
Patent number
12,253,463
Issue date
Mar 18, 2025
BottleVin, Inc.
Leslie Young Harvill
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method for display device
Patent number
12,247,930
Issue date
Mar 11, 2025
Samsung Display Co., Ltd.
Sangjun Seok
G01 - MEASURING TESTING
Information
Patent Grant
Gas detection using differential path length measurement
Patent number
12,228,502
Issue date
Feb 18, 2025
Analog Devices, Inc.
Shrenik Deliwala
G01 - MEASURING TESTING
Information
Patent Grant
Optical inspection device and inspecting method using the same
Patent number
12,222,294
Issue date
Feb 11, 2025
Samsung Display Co., Ltd.
Jeong Moon Lee
G01 - MEASURING TESTING
Information
Patent Grant
Dark tracking, hybrid method, conical diffraction microscopy and da...
Patent number
12,203,858
Issue date
Jan 21, 2025
BioAxial SAS
Gabriel Y. Sirat
G01 - MEASURING TESTING
Information
Patent Grant
Flow cell system for optical fluid analysis and bioreactor system
Patent number
12,174,125
Issue date
Dec 24, 2024
World Precision Instruments Germany GmbH
Mathias Belz
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Optical flow cell
Patent number
12,135,276
Issue date
Nov 5, 2024
Cytiva Sweden AB
Hanno Ehring
G02 - OPTICS
Information
Patent Grant
Optical flow cell for an optical measuring device
Patent number
12,117,389
Issue date
Oct 15, 2024
Cytiva Sweden AB
Henrik Svanberg
G01 - MEASURING TESTING
Information
Patent Grant
Optical flow cell
Patent number
12,066,375
Issue date
Aug 20, 2024
Cytiva Sweden AB
Hanno Ehring
G01 - MEASURING TESTING
Information
Patent Grant
Non-invasive measurement of physiological parameters or substance c...
Patent number
12,050,177
Issue date
Jul 30, 2024
Opsolution GMBH
Bjoern Magnussen
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Wafer inspection apparatus and method
Patent number
12,038,389
Issue date
Jul 16, 2024
Taiwan Semiconductor Manufacturing Company, Ltd
Chung-Pin Chou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical sensor and method of operating the optical sensor
Patent number
12,016,654
Issue date
Jun 25, 2024
Samsung Electronics Co., Ltd.
Sangkyu Kim
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
System suitability method for use with protein concentration determ...
Patent number
12,000,775
Issue date
Jun 4, 2024
Amgen Inc.
Robert John Duff
G01 - MEASURING TESTING
Information
Patent Grant
Method and devices for analyzing sperm samples
Patent number
11,971,341
Issue date
Apr 30, 2024
MINITUB GMBH
Georg Wippenbeck
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Total organic carbon sensor utilizing down conversion
Patent number
11,953,486
Issue date
Apr 9, 2024
Sensirion AG
Raffaele Di Giacomo
G01 - MEASURING TESTING
Information
Patent Grant
Compact gas sensor
Patent number
11,921,031
Issue date
Mar 5, 2024
Elichens
Hélène Duprez
G01 - MEASURING TESTING
Information
Patent Grant
Beam conducting cavity structure, gas sensor and method for product...
Patent number
11,867,617
Issue date
Jan 9, 2024
OSRAM OLED GmbH
Farhang Ghasemi Afshar
G01 - MEASURING TESTING
Information
Patent Grant
Sample carrier for optical measurements
Patent number
11,808,758
Issue date
Nov 7, 2023
S.D. SIGHT DIAGNOSTICS LTD.
Joseph Joel Pollak
G01 - MEASURING TESTING
Information
Patent Grant
Gas detection using differential path length measurement
Patent number
11,747,272
Issue date
Sep 5, 2023
Analog Devices, Inc.
Shrenik Deliwala
G01 - MEASURING TESTING
Information
Patent Grant
Optical inspection system and method including accounting for varia...
Patent number
11,726,036
Issue date
Aug 15, 2023
Apple Inc.
Mark Alan Arbore
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for determining a concentration in a sample
Patent number
11,662,309
Issue date
May 30, 2023
Opsolution GMBH
Bjoern Magnussen
G01 - MEASURING TESTING
Information
Patent Grant
Resolve path optical sampling architectures
Patent number
11,579,080
Issue date
Feb 14, 2023
Mark Alan Arbore
G01 - MEASURING TESTING
Information
Patent Grant
Dark tracking, hybrid method, conical diffraction microscopy, and d...
Patent number
11,567,010
Issue date
Jan 31, 2023
BioAxial SAS
Gabriel Y. Sirat
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for measuring the light absorbance of a substa...
Patent number
11,543,344
Issue date
Jan 3, 2023
Cytiva Sweden AB
Hanno Ehring
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Device, system and method for optical gas analysis
Publication number
20250189441
Publication date
Jun 12, 2025
AXETRIS AG
Paolo Antonio Losio
G01 - MEASURING TESTING
Information
Patent Application
NON-INVASIVE MEASUREMENT OF PHYSIOLOGICAL PARAMETERS OR SUBSTANCE C...
Publication number
20250180475
Publication date
Jun 5, 2025
OPSOLUTION GMBH
BJOERN MAGNUSSEN
G01 - MEASURING TESTING
Information
Patent Application
TIME-RESOLVED SPECTRUM RAPID MEASUREMENT SYSTEM AND METHOD
Publication number
20250172489
Publication date
May 29, 2025
GBA BRANCH OF AEROSPACE INFORMATION RESEARCH INSTITUTE, CHINESE ACADEMY OF SC...
Zhenyou WANG
G01 - MEASURING TESTING
Information
Patent Application
MICROSCOPE DEVICE AND DATA GENERATION METHOD
Publication number
20250123475
Publication date
Apr 17, 2025
Nikon Corporation
Satoshi IKEDA
G01 - MEASURING TESTING
Information
Patent Application
DUAL SCAN BEAM SEPARATION WITH INDEPENDENT ANGLE OF INCIDENCE DEFEC...
Publication number
20250093274
Publication date
Mar 20, 2025
Lumina Instruments Inc.
Steven W. Meeks
G01 - MEASURING TESTING
Information
Patent Application
TESTING DEVICE FOR AN OPTICAL SAMPLE AND METHOD FOR TESTING AN OPTI...
Publication number
20250067659
Publication date
Feb 27, 2025
Trioptics GmbH
Aiko RUPRECHT
G01 - MEASURING TESTING
Information
Patent Application
BEAM SPLITTER USING MULTI-REFRACTIVE INDEX LAYER AND DEFECTIVE ELEM...
Publication number
20250060607
Publication date
Feb 20, 2025
Korea Institute of Machinery and Materials
Mi Kyung LIM
G01 - MEASURING TESTING
Information
Patent Application
DUAL LENS INSPECTION DEVICE
Publication number
20250052690
Publication date
Feb 13, 2025
SUN YANG OPTICS DEVELOPMENT CO., LTD.
SHENG CHE WU
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SENSOR DEVICE
Publication number
20250035541
Publication date
Jan 30, 2025
TIANMA JAPAN, LTD.
Nobuya SEKO
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ANALYSIS SYSTEM AND OPTICAL ANALYZER THEREOF
Publication number
20250012720
Publication date
Jan 9, 2025
Dalian Mega Crystal Biological Technology Co., Ltd.
Yi-sheng TING
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR THREE-DIMENSIONAL IMAGING OF SAMPLES USING A...
Publication number
20240378716
Publication date
Nov 14, 2024
ORBOTECH LTD.
Chay Goldenberg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Optical Flow Cell
Publication number
20240369472
Publication date
Nov 7, 2024
CYTIVA SWEDEN AB
Hanno Ehring
G01 - MEASURING TESTING
Information
Patent Application
GAS MEASUREMENT APPARATUS
Publication number
20240361236
Publication date
Oct 31, 2024
YOKOGAWA ELECTRIC CORPORATION
Yasuo Sakamaki
G01 - MEASURING TESTING
Information
Patent Application
DETECTING SYSTEM USING SPECTRUM MEASUREMENT DEVICE
Publication number
20240319079
Publication date
Sep 26, 2024
InnoSpectra Corporation
Fei-Peng Chang
G01 - MEASURING TESTING
Information
Patent Application
WAFER INSPECTION APPARATUS AND METHOD
Publication number
20240319109
Publication date
Sep 26, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Chung-Pin Chou
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR AUTHENTICATING AND CLASSIFYING PRODUCTS USING...
Publication number
20240310278
Publication date
Sep 19, 2024
BottleVin, Inc.
Leslie Young Harvill
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR MEASURING AT LEAST ONE GASEOUS OR SOLID MATERIAL
Publication number
20240264087
Publication date
Aug 8, 2024
AVL LIST GMBH
Andreas Pein
G08 - SIGNALLING
Information
Patent Application
WATER QUALITY SENSOR AND METHOD FOR MEASURING CONCENTRATION OF SUBS...
Publication number
20240255416
Publication date
Aug 1, 2024
Kazusei TAMAI
G01 - MEASURING TESTING
Information
Patent Application
ACCURATE TURBIDITY MEASUREMENT SYSTEM AND METHOD, USING SPECKLE PAT...
Publication number
20240230531
Publication date
Jul 11, 2024
The Wave Talk, Inc.
Young Dug KIM
D06 - TREATMENT OF TEXTILES OR THE LIKE LAUNDERING FLEXIBLE MATERIALS NOT OTH...
Information
Patent Application
OPTICAL MEASURING SYSTEM
Publication number
20240192127
Publication date
Jun 13, 2024
Endress + Hauser Conducta GmbH + Co. KG
Joachim Bolle
G01 - MEASURING TESTING
Information
Patent Application
HYBRID SYSTEMS AND METHODS FOR CHARACTERIZING STRESS IN CHEMICALLY...
Publication number
20240175812
Publication date
May 30, 2024
Corning Incorporated
Ryan Claude Andrews
G01 - MEASURING TESTING
Information
Patent Application
EVALUATING APPARATUS FOR THERMAL BOUNDARY CONDUCTANCE USING ACOUSTI...
Publication number
20240159658
Publication date
May 16, 2024
GIST(Gwangju Institute of Science and Technology)
Young Dahl JHO
G01 - MEASURING TESTING
Information
Patent Application
ACCURATE TURBIDITY MEASUREMENT SYSTEM AND METHOD, USING SPECKLE PAT...
Publication number
20240133808
Publication date
Apr 25, 2024
The Wave Talk, Inc.
Young Dug KIM
D06 - TREATMENT OF TEXTILES OR THE LIKE LAUNDERING FLEXIBLE MATERIALS NOT OTH...
Information
Patent Application
MASKING TO ELIMINATE DIRECT LINE OF SIGHT BETWEEN LIGHT EMITTER AND...
Publication number
20240068942
Publication date
Feb 29, 2024
Carrier Corporation
Jacob Kerling
G01 - MEASURING TESTING
Information
Patent Application
MICROFLUIDIC DETECTION DEVICE
Publication number
20240044776
Publication date
Feb 8, 2024
AUO Corporation
Shu-Jiang Liu
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20240011915
Publication date
Jan 11, 2024
SEMES CO., LTD.
Hark Ryong KIM
G01 - MEASURING TESTING
Information
Patent Application
METHODS, SYSTEMS, DEVICES, AND ELECTRONIC APPARATUSES FOR MEASURING...
Publication number
20230375461
Publication date
Nov 23, 2023
BEIHANG UNIVERSITY
Yanyu ZHAO
G01 - MEASURING TESTING
Information
Patent Application
Dark Tracking, Hybrid Method, Conical Diffraction Microscopy and Da...
Publication number
20230168199
Publication date
Jun 1, 2023
Bioaxial SAS
Gabriel Y. Sirat
G01 - MEASURING TESTING
Information
Patent Application
GAS DETECTION USING DIFFERENTIAL PATH LENGTH MEASUREMENT
Publication number
20230120444
Publication date
Apr 20, 2023
Analog Devices, Inc.
Shrenik Deliwala
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD FOR DISPLAY DEVICE
Publication number
20230123595
Publication date
Apr 20, 2023
SAMSUNG DISPLAY CO., LTD.
Sangjun SEOK
G01 - MEASURING TESTING