Modifications of instruments for temperature compensation

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CPC
G01R1/44

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/44Modifications of instruments for temperature compensation

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Aging test system and aging test method for thermal interface mater...
- Patent number 12,196,806
- Issue date Jan 14, 2025
- CHROMA ATE INC.
- I-Shih Tseng
- G01 - MEASURING TESTING
Information Patent Grant
Test device
- Patent number 12,181,495
- Issue date Dec 31, 2024
- Quanta Computer Inc.
- Wei-Chih Hung
- G01 - MEASURING TESTING
Information Patent Grant
Heat dissipatable die unit and probe seat using the same
- Patent number 12,050,235
- Issue date Jul 30, 2024
- MPI Corporation
- Chin-Yi Lin
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus for temperature testing of electronic devices
- Patent number 11,828,793
- Issue date Nov 28, 2023
- Western Digital Technologies, Inc.
- Ba Duong Phan
- G01 - MEASURING TESTING
Information Patent Grant
Making determination of inductance-change immune to changes in envi...
- Patent number 11,796,577
- Issue date Oct 24, 2023
- Ningbo Aura Semiconductor Co., Limited
- Augusto Manuel Marques
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus for temperature testing of electronic devices
- Patent number 11,733,292
- Issue date Aug 22, 2023
- Western Digital Technologies, Inc.
- Ba Duong Phan
- G01 - MEASURING TESTING
Information Patent Grant
Probing system
- Patent number 11,549,968
- Issue date Jan 10, 2023
- TECAT TECHNOLOGIES (SUZHOU) LIMITED
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus
- Patent number 11,536,768
- Issue date Dec 27, 2022
- Tokyo Electron Limited
- Hiroyuki Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Testing device for burn-in test operations and control method thereof
- Patent number 11,531,059
- Issue date Dec 20, 2022
- Siliconware Precision Industries Co., Ltd.
- Chao-Ming Tu
- G01 - MEASURING TESTING
Information Patent Grant
High density waveguide assembly for millimeter and 5G applications
- Patent number 11,506,686
- Issue date Nov 22, 2022
- Advantest Corporation
- Roger McAleenan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stage and inspection apparatus for inspecting electronic device
- Patent number 11,499,993
- Issue date Nov 15, 2022
- Tokyo Electron Limited
- Dai Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Multi-chamber, explosion-proof, battery-testing apparatus
- Patent number 11,460,504
- Issue date Oct 4, 2022
- Chaojiong Zhang
- G12 - INSTRUMENT DETAILS
Information Patent Grant
Test board and test apparatus including a multi-type fluid supplier...
- Patent number 11,422,158
- Issue date Aug 23, 2022
- Samsung Electronics Co., Ltd.
- Hyeju Kim
- G01 - MEASURING TESTING
Information Patent Grant
Optical Pockels voltage sensor assembly device and methods of use t...
- Patent number 11,402,410
- Issue date Aug 2, 2022
- Micatu Inc.
- Atul Pradhan
- G01 - MEASURING TESTING
Information Patent Grant
Double-sided probe systems with thermal control systems and related...
- Patent number 11,378,619
- Issue date Jul 5, 2022
- FormFactor, Inc.
- Masahiro Sameshima
- G01 - MEASURING TESTING
Information Patent Grant
Temperature compensation method for SAR sensor of terminal, and ter...
- Patent number 11,366,137
- Issue date Jun 21, 2022
- XI'AN YEP TELECOMMUNICATION TECHNOLOGY, LTD.
- Wei Li
- G01 - MEASURING TESTING
Information Patent Grant
Leakage current detection circuit and fluxgate driver
- Patent number 11,366,177
- Issue date Jun 21, 2022
- iSentek Inc.
- Kang-Shuo Chang
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Probe station capable of maintaining position of probe tip upon tem...
- Patent number 11,313,883
- Issue date Apr 26, 2022
- MPI CORPORATION
- Yu-Hsun Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and method of controlling temperature of probe card
- Patent number 11,307,223
- Issue date Apr 19, 2022
- Tokyo Electron Limited
- Jun Fujihara
- G01 - MEASURING TESTING
Information Patent Grant
Temperature compensation for silicon resistor using interconnect metal
- Patent number 11,294,408
- Issue date Apr 5, 2022
- NXP USA, INC.
- Octavio A. Gonzalez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High voltage probe card system
- Patent number 11,275,106
- Issue date Mar 15, 2022
- Celadon Systems, Inc.
- Adam J. Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic bridge diagnostic
- Patent number 11,268,998
- Issue date Mar 8, 2022
- ALLEGRO MICROSYSTEMS, LLC
- Cedric Gillet
- G01 - MEASURING TESTING
Information Patent Grant
Leakage current sensor and leakage current monitoring device
- Patent number 11,163,016
- Issue date Nov 2, 2021
- Zhejiang Magtron Intelligent Technology Limited Cooperation
- Quan Chen
- G01 - MEASURING TESTING
Information Patent Grant
Current sensor and battery comprising such a current sensor
- Patent number 11,088,399
- Issue date Aug 10, 2021
- Robert Bosch GmbH
- Andreas Ruehle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe attenuator for reduced input capacitance
- Patent number 11,079,407
- Issue date Aug 3, 2021
- Tektronix, Inc.
- Jonathan S. Dandy
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field sensor and associated method that can store a measur...
- Patent number 11,009,565
- Issue date May 18, 2021
- ALLEGRO MICROSYSTEMS, LLC
- Devon Fernandez
- G01 - MEASURING TESTING
Information Patent Grant
Method for placing and contacting a test contact
- Patent number 10,914,759
- Issue date Feb 9, 2021
- PAC Tech-Packaging Technologies GmbH
- Thorsten Krause
- G01 - MEASURING TESTING
Information Patent Grant
Current measuring device
- Patent number 10,901,003
- Issue date Jan 26, 2021
- Isabellenhuette Heusler GmbH & Co. KG
- Ullrich Hetzler
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field sensor having a temperature compensated threshold on...
- Patent number 10,845,434
- Issue date Nov 24, 2020
- ALLEGRO MICROSYSTEMS, LLC
- Devon Fernandez
- G01 - MEASURING TESTING
Information Patent Grant
Active wafer prober preheat-precool system and method for testing w...
- Patent number 10,830,794
- Issue date Nov 10, 2020
- Hermes-Epitek Corp.
- Wen-Yuan Hsu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR CONDENSATION PREVENTION FOR 2-PHASE COOLIN...
- Publication number 20240361357
- Publication date Oct 31, 2024
- Advantest Corporation
- Peter Weixiang ZHENG
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PREHEATING CONTROL SYSTEM, PREHEATING CONTROL METHOD AND NON-TRANSI...
- Publication number 20240345135
- Publication date Oct 17, 2024
- NANYA TECHNOLOGY CORPORATION
- Tien Yu CHEN
- G01 - MEASURING TESTING
Information Patent Application
TEST FIXTURE AND EARLY WARNING SYSTEM
- Publication number 20240329079
- Publication date Oct 3, 2024
- TRIPLE WIN TECHNOLOGY(SHENZHEN) CO.LTD.
- YING-QUAN ZHAO
- G01 - MEASURING TESTING
Information Patent Application
POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING AP...
- Publication number 20240151746
- Publication date May 9, 2024
- CHROMA ATE INC.
- I-Shih TSENG
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE
- Publication number 20240069067
- Publication date Feb 29, 2024
- QUANTA COMPUTER INC.
- Wei-Chih HUNG
- G01 - MEASURING TESTING
Information Patent Application
PROBE-CARD MULTILAYER WIRING SUBSTRATE AND PROBE CARD
- Publication number 20230408547
- Publication date Dec 21, 2023
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Satoshi ABE
- G01 - MEASURING TESTING
Information Patent Application
AGING TEST SYSTEM AND AGING TEST METHOD FOR THERMAL INTERFACE MATER...
- Publication number 20230375615
- Publication date Nov 23, 2023
- CHROMA ATE INC.
- I-Shih TSENG
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR LASER INSPECTION APPARATUS
- Publication number 20230273241
- Publication date Aug 31, 2023
- Mitsubishi Electric Corporation
- Yohei MIKAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING APPARATUS FOR TEMPERATURE TESTING OF ELECTRONIC DEVICES
- Publication number 20230060664
- Publication date Mar 2, 2023
- Western Digital Technologies, Inc.
- Ba Duong Phan
- G01 - MEASURING TESTING
Information Patent Application
PROBING SYSTEM
- Publication number 20220221492
- Publication date Jul 14, 2022
- TECAT TECHNOLOGIES (SUZHOU) LIMITED
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE AND CONTROL METHOD THEREOF
- Publication number 20220214395
- Publication date Jul 7, 2022
- Siliconware Precision Industries Co., Ltd.
- Chao-Ming Tu
- G01 - MEASURING TESTING
Information Patent Application
HEAT DISSIPATABLE DIE UNIT AND PROBE SEAT USING THE SAME
- Publication number 20220214380
- Publication date Jul 7, 2022
- MPI Corporation
- CHIN-YI LIN
- G01 - MEASURING TESTING
Information Patent Application
MAKING DETERMINATION OF INDUCTANCE-CHANGE IMMUNE TO CHANGES IN ENVI...
- Publication number 20220074979
- Publication date Mar 10, 2022
- Ningbo Aura Semiconductor Co., Limited
- Augusto Manuel Marques
- G01 - MEASURING TESTING
Information Patent Application
PROBE STATION
- Publication number 20220074972
- Publication date Mar 10, 2022
- MPI Corporation
- Yu-Hsun HSU
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE COMPENSATION FOR SILICON RESISTOR USING INTERCONNECT METAL
- Publication number 20220057818
- Publication date Feb 24, 2022
- NXP USA, Inc.
- Octavio A. Gonzalez
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20220018898
- Publication date Jan 20, 2022
- TOKYO ELECTRON LIMITED
- Hiroyuki NAKAYAMA
- G01 - MEASURING TESTING
Information Patent Application
DOUBLE-SIDED PROBE SYSTEMS WITH THERMAL CONTROL SYSTEMS AND RELATED...
- Publication number 20210190860
- Publication date Jun 24, 2021
- FormFactor, Inc.
- Masahiro Sameshima
- G01 - MEASURING TESTING
Information Patent Application
TEST BOARD AND TEST APPARATUS FOR TESTING ELECTRONIC APPARATUSES HA...
- Publication number 20210172979
- Publication date Jun 10, 2021
- Samsung Electronics Co., Ltd.
- Hyeju Kim
- G01 - MEASURING TESTING
Information Patent Application
HIGH DENSITY WAVEGUIDE ASSEMBLY FOR MILLIMETER AND 5G APPLICATIONS
- Publication number 20210156889
- Publication date May 27, 2021
- Advantest Corporation
- Roger McAleenan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STAGE AND INSPECTION APPARATUS
- Publication number 20210156891
- Publication date May 27, 2021
- TOKYO ELECTRON LIMITED
- Dai KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
STAGE AND INSPECTION APPARATUS
- Publication number 20210156890
- Publication date May 27, 2021
- TOKYO ELECTRON LIMITED
- Dai KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
LEAKAGE CURRENT SENSOR AND LEAKAGE CURRENT MONITORING DEVICE
- Publication number 20210080512
- Publication date Mar 18, 2021
- Quan CHEN
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE COMPENSATION METHOD FOR SAR SENSOR OF TERMINAL, AND TER...
- Publication number 20210018534
- Publication date Jan 21, 2021
- XI'AN YEP TELECOMMUNICATION TECHNOLOGY, LTD.
- Wei Li
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND METHOD OF CONTROLLING TEMPERATURE OF PROBE CARD
- Publication number 20200341031
- Publication date Oct 29, 2020
- TOKYO ELECTRON LIMITED
- Jun FUJIHARA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL POCKELS VOLTAGE SENSOR ASSEMBLY DEVICE AND METHODS OF USE T...
- Publication number 20200241053
- Publication date Jul 30, 2020
- Micatu Inc.
- Atul Pradhan
- G01 - MEASURING TESTING
Information Patent Application
CURRENT MEASURING DEVICE
- Publication number 20200182909
- Publication date Jun 11, 2020
- ISABELLENHUETTE HEUSLER GMBH & CO. KG
- Ullrich Hetzler
- G01 - MEASURING TESTING
Information Patent Application
HIGH VOLTAGE PROBE CARD SYSTEM
- Publication number 20200110126
- Publication date Apr 9, 2020
- Celadon Systems, Inc.
- Adam J. SCHULTZ
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL POCKELS VOLTAGE SENSOR ASSEMBLY DEVICE AND METHODS OF USE T...
- Publication number 20190339308
- Publication date Nov 7, 2019
- Micatu Inc.
- Atul Pradhan
- G01 - MEASURING TESTING
Information Patent Application
CURRENT DETECTION APPARATUS
- Publication number 20190242930
- Publication date Aug 8, 2019
- DENSO TEN LIMITED
- Masato HISANAGA
- G01 - MEASURING TESTING
Information Patent Application
COOLING DEVICE FOR SEMICONDUCTOR INSPECTION APPARATUS
- Publication number 20190219614
- Publication date Jul 18, 2019
- ADTEX Inc.
- Hiroo SATO
- G01 - MEASURING TESTING

Modifications of instruments for temperature compensation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Aging test system and aging test method for thermal interface mater...

Test device

Heat dissipatable die unit and probe seat using the same

Testing apparatus for temperature testing of electronic devices

Making determination of inductance-change immune to changes in envi...

Testing apparatus for temperature testing of electronic devices

Probing system

Inspection apparatus

Testing device for burn-in test operations and control method thereof

High density waveguide assembly for millimeter and 5G applications

Stage and inspection apparatus for inspecting electronic device

Multi-chamber, explosion-proof, battery-testing apparatus

Test board and test apparatus including a multi-type fluid supplier...

Optical Pockels voltage sensor assembly device and methods of use t...

Double-sided probe systems with thermal control systems and related...

Temperature compensation method for SAR sensor of terminal, and ter...

Leakage current detection circuit and fluxgate driver

Probe station capable of maintaining position of probe tip upon tem...

Inspection device and method of controlling temperature of probe card

Temperature compensation for silicon resistor using interconnect metal

High voltage probe card system

Dynamic bridge diagnostic

Leakage current sensor and leakage current monitoring device

Current sensor and battery comprising such a current sensor

Probe attenuator for reduced input capacitance

Magnetic field sensor and associated method that can store a measur...

Method for placing and contacting a test contact

Current measuring device

Magnetic field sensor having a temperature compensated threshold on...

Active wafer prober preheat-precool system and method for testing w...

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR CONDENSATION PREVENTION FOR 2-PHASE COOLIN...

PREHEATING CONTROL SYSTEM, PREHEATING CONTROL METHOD AND NON-TRANSI...

TEST FIXTURE AND EARLY WARNING SYSTEM

POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING AP...

TEST DEVICE

PROBE-CARD MULTILAYER WIRING SUBSTRATE AND PROBE CARD

AGING TEST SYSTEM AND AGING TEST METHOD FOR THERMAL INTERFACE MATER...

SEMICONDUCTOR LASER INSPECTION APPARATUS

TESTING APPARATUS FOR TEMPERATURE TESTING OF ELECTRONIC DEVICES

PROBING SYSTEM

TESTING DEVICE AND CONTROL METHOD THEREOF

HEAT DISSIPATABLE DIE UNIT AND PROBE SEAT USING THE SAME

MAKING DETERMINATION OF INDUCTANCE-CHANGE IMMUNE TO CHANGES IN ENVI...

PROBE STATION

TEMPERATURE COMPENSATION FOR SILICON RESISTOR USING INTERCONNECT METAL

INSPECTION APPARATUS

DOUBLE-SIDED PROBE SYSTEMS WITH THERMAL CONTROL SYSTEMS AND RELATED...

TEST BOARD AND TEST APPARATUS FOR TESTING ELECTRONIC APPARATUSES HA...

HIGH DENSITY WAVEGUIDE ASSEMBLY FOR MILLIMETER AND 5G APPLICATIONS

STAGE AND INSPECTION APPARATUS

STAGE AND INSPECTION APPARATUS

LEAKAGE CURRENT SENSOR AND LEAKAGE CURRENT MONITORING DEVICE

TEMPERATURE COMPENSATION METHOD FOR SAR SENSOR OF TERMINAL, AND TER...

INSPECTION DEVICE AND METHOD OF CONTROLLING TEMPERATURE OF PROBE CARD

OPTICAL POCKELS VOLTAGE SENSOR ASSEMBLY DEVICE AND METHODS OF USE T...

CURRENT MEASURING DEVICE

HIGH VOLTAGE PROBE CARD SYSTEM

OPTICAL POCKELS VOLTAGE SENSOR ASSEMBLY DEVICE AND METHODS OF USE T...

CURRENT DETECTION APPARATUS

COOLING DEVICE FOR SEMICONDUCTOR INSPECTION APPARATUS