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Modifications of instruments to indicate the maximum or the minimum value reached in a time interval

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  • CPC
  • G01R1/40
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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

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G01R1/40Modifications of instruments to indicate the maximum or the minimum value reached in a time interval
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Patents Grantslast 30 patents

  • Information Patent Grant

    High speed digital transient waveform detection system and method f...
    • Patent number 11,307,227
    • Issue date Apr 19, 2022
    • Electro Industries/Gauge Tech
    • Joseph Spanier
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Valley and peak detection for switching power converter
    • Patent number 10,666,152
    • Issue date May 26, 2020
    • Dialog Semiconductor Inc.
    • Henry Jun
    • H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
  • Information Patent Grant

    Method and apparatus for comparing load current in an electrical ci...
    • Patent number 5,644,238
    • Issue date Jul 1, 1997
    • Gregory J. Seifert
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3913014
    • Patent number 3,913,014
    • Issue date Oct 14, 1975
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3908166
    • Patent number 3,908,166
    • Issue date Sep 23, 1975
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3892921
    • Patent number 3,892,921
    • Issue date Jul 1, 1975
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3403657
    • Patent number 3,403,657
    • Issue date Oct 1, 1968
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2854535
    • Patent number 2,854,535
    • Issue date Sep 30, 1958
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2425407
    • Patent number 2,425,407
    • Issue date Aug 12, 1947
    • G01 - MEASURING TESTING
  • Information Patent Grant

    1963303
    • Patent number 1,963,303
    • Issue date Jun 19, 1934
    • G01 - MEASURING TESTING
  • Information Patent Grant

    1947816
    • Patent number 1,947,816
    • Issue date Feb 20, 1934
    • G01 - MEASURING TESTING
  • Information Patent Grant

    1695422
    • Patent number 1,695,422
    • Issue date Dec 18, 1928
    • G01 - MEASURING TESTING
  • Information Patent Grant

    1588581
    • Patent number 1,588,581
    • Issue date Jun 15, 1926
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents