Modifying objects while observing

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CPC
H01J2237/206

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/206Modifying objects while observing

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Testing assembly including a multiple degree of freedom stage
- Patent number 12,140,571
- Issue date Nov 12, 2024
- Bruker Nano, Inc.
- Edward Cyrankowski
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Plasma processing apparatus and method of manufacturing semiconduct...
- Patent number 12,106,945
- Issue date Oct 1, 2024
- Samsung Electronics Co., Ltd.
- Siqing Lu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for temperature monitoring in cryo-electron microscopy
- Patent number 12,070,753
- Issue date Aug 27, 2024
- FEI Company
- Jakub Drahotsky
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Semiconductor manufacturing apparatus and wafer holding table for s...
- Patent number 12,046,488
- Issue date Jul 23, 2024
- Sumitomo Electric Industries, Ltd.
- Koichi Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Operating a gas feed device for a particle beam apparatus
- Patent number 12,002,656
- Issue date Jun 4, 2024
- Carl Zeiss Microscopy GmbH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Operating a gas supply device for a particle beam device
- Patent number 11,764,036
- Issue date Sep 19, 2023
- Carl Zeiss Microscopy GmbH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for non line-of-sight doping
- Patent number 11,631,588
- Issue date Apr 18, 2023
- Varian Semiconductor Equipment Associates, Inc.
- Christopher R. Hatem
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device with at least one adjustable sample holder and method of cha...
- Patent number 11,476,080
- Issue date Oct 18, 2022
- TESCAN Brno, s.r.o.
- Pavel Dolezel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing assembly including a multiple degree of freedom stage
- Patent number 11,237,087
- Issue date Feb 1, 2022
- Bruker Nano, Inc.
- Edward Cyrankowski
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam inspection tool and method of controlling heat load
- Patent number 11,158,484
- Issue date Oct 26, 2021
- ASML Netherlands B.V.
- Dennis Herman Caspar Van Banning
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer holder
- Patent number 11,127,605
- Issue date Sep 21, 2021
- Sumitomo Electric Industries, Ltd.
- Koichi Kimura
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Roll to roll fabrication apparatus for preventing thermal impact
- Patent number 11,008,656
- Issue date May 18, 2021
- LG Display Co., Ltd.
- Seunghyun Youk
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Specimen observation method
- Patent number 10,852,253
- Issue date Dec 1, 2020
- HITACHI HIGH-TECH CORPORATION
- Kiyotaka Nakano
- G01 - MEASURING TESTING
Information Patent Grant
Method of analyzing surface modification of a specimen in a charged...
- Patent number 10,811,223
- Issue date Oct 20, 2020
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stage device and charged particle beam device
- Patent number 10,770,259
- Issue date Sep 8, 2020
- HITACHI HIGH-TECH CORPORATION
- Motohiro Takahashi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Specimen holder
- Patent number 10,768,124
- Issue date Sep 8, 2020
- Mel-Build Corporation
- Hiroya Miyazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of observing liquid specimen, method of analyzing liquid spe...
- Patent number 10,741,357
- Issue date Aug 11, 2020
- Jeol Ltd.
- Noriyuki Inoue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for using multimodal imaging to determine struc...
- Patent number 10,707,052
- Issue date Jul 7, 2020
- Atomnaut Inc.
- Peter V. Liddicoat
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing assembly including a multiple degree of freedom stage
- Patent number 10,663,380
- Issue date May 26, 2020
- Bruker Nano, Inc.
- Edward Cyrankowski
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
System and method for performing nano beam diffraction analysis
- Patent number 10,658,154
- Issue date May 19, 2020
- International Business Machines Corporation
- Marc Adam Bergendahl
- G01 - MEASURING TESTING
Information Patent Grant
Examination container and electron microscope
- Patent number 10,607,808
- Issue date Mar 31, 2020
- TAIWAN ELECTRON MICROSCOPE INSTRUMENT CORPORATION
- Tsu-Wei Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enhanced FIB-SEM systems for large-volume 3D imaging
- Patent number 10,600,615
- Issue date Mar 24, 2020
- Howard Hughes Medical Institute
- C. Shan Xu
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle instruments
- Patent number 10,475,620
- Issue date Nov 12, 2019
- NANOSCOPE SERVICES LIMITED
- Lloyd Peto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and method for using multimodal imaging to determine struct...
- Patent number 10,446,368
- Issue date Oct 15, 2019
- Atomnaut Inc.
- Peter V. Liddicoat
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Double-tilt in-situ nanoindentation platform for transmission elect...
- Patent number 10,410,822
- Issue date Sep 10, 2019
- Beijing University of Technology
- Xiaodong Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for acquiring image and ion beam apparatus
- Patent number 10,276,343
- Issue date Apr 30, 2019
- Tomokazu Kozakai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming an electrical connection to a sample support in...
- Patent number 10,256,563
- Issue date Apr 9, 2019
- Protochips, Inc.
- John Damiano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contactless temperature measurement in a charged particle microscope
- Patent number 10,134,563
- Issue date Nov 20, 2018
- FEI Company
- Jacob Simon Faber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of modifying a sample surface layer from a microscopic sample
- Patent number 10,105,734
- Issue date Oct 23, 2018
- FEI Company
- Tomas Vystavel
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
System and method for performing nano beam diffraction analysis
- Patent number 10,109,455
- Issue date Oct 23, 2018
- International Business Machines Corporation
- Marc Adam Bergendahl
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method and System for Sample Preparation
- Publication number 20240426717
- Publication date Dec 26, 2024
- FEI Company
- Jakub Kuba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESSING METHOD AND PLASMA PROCESSING APPARATUS
- Publication number 20240213000
- Publication date Jun 27, 2024
- TOKYO ELECTRON LIMITED
- Kazuya NAGASEKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PROCESSING ION BEAM BASED ON OPTICAL MICROSCOPY IMAGING
- Publication number 20240112880
- Publication date Apr 4, 2024
- Institute of Biophysics, Chinese Academy of Sciences
- Tao XU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR PREPARING SAMPLES FOR IMAGING
- Publication number 20240038486
- Publication date Feb 1, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu-Ching Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPERATING A GAS SUPPLY DEVICE FOR A PARTICLE BEAM DEVICE
- Publication number 20230420224
- Publication date Dec 28, 2023
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR OBSERVING PERMEATION AND DIFFUSION PATH OF OBSERVATION T...
- Publication number 20230127466
- Publication date Apr 27, 2023
- National Institute for Materials Science
- Akiko Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSMISSION ELECTRON MICROSCOPE IN-SITU CHIP AND PREPARATION METHO...
- Publication number 20230103943
- Publication date Apr 6, 2023
- Xiamen Chip-Nova Technology Co., Ltd.
- Honggang Liao
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CONTINUOUS CHAINED ENERGY ION IMPLANTATION
- Publication number 20230038565
- Publication date Feb 9, 2023
- Axcelis Technologies, Inc.
- Causon Jen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE
- Publication number 20220357251
- Publication date Nov 10, 2022
- Bruker Nano, Inc.
- Edward Cyrankowski
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
PLASMA PROCESSING APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCT...
- Publication number 20220076931
- Publication date Mar 10, 2022
- Samsung Electronics Co., Ltd.
- Siqing Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Device with at Least One Adjustable Sample Holder and Method of Cha...
- Publication number 20210384005
- Publication date Dec 9, 2021
- TESCAN Brno, s.r.o.
- Pavel Dolezel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR TEMPERATURE MONITORING IN CRYO-ELECTRON MICROSCOPY
- Publication number 20210299665
- Publication date Sep 30, 2021
- FEI Company
- Jakub Drahotsky
- G01 - MEASURING TESTING
Information Patent Application
TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE
- Publication number 20200408655
- Publication date Dec 31, 2020
- Bruker Nano, Inc.
- Edward Cyrankowski
- G01 - MEASURING TESTING
Information Patent Application
OPERATING A GAS SUPPLY DEVICE FOR A PARTICLE BEAM DEVICE
- Publication number 20200335309
- Publication date Oct 22, 2020
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR USING MULTIMODAL IMAGING TO DETERMINE STRUC...
- Publication number 20200020507
- Publication date Jan 16, 2020
- Atomnaut Inc.
- Peter V. LIDDICOAT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Observing Liquid Specimen, Method of Analyzing Liquid Spe...
- Publication number 20190295813
- Publication date Sep 26, 2019
- JEOL Ltd.
- Noriyuki Inoue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STAGE DEVICE AND CHARGED PARTICLE BEAM DEVICE
- Publication number 20190228947
- Publication date Jul 25, 2019
- Hitachi High-Technologies Corporation
- Motohiro TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR USING MULTIMODAL IMAGING TO DETERMINE STRUC...
- Publication number 20190074160
- Publication date Mar 7, 2019
- Atomnaut Inc.
- Peter V. Liddicoat
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF ANALYZING SURFACE MODIFICATION OF A SPECIMEN IN A CHARGED...
- Publication number 20190051492
- Publication date Feb 14, 2019
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Performing Nano Beam Diffraction Analysis
- Publication number 20190035599
- Publication date Jan 31, 2019
- International Business Machines Corporation
- Marc Adam BERGENDAHL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Performing Nano Beam Diffraction Analysis
- Publication number 20180190470
- Publication date Jul 5, 2018
- International Business Machines Corporation
- Marc Adam BERGENDAHL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ROLL TO ROLL FABRICATION APPARATUS FOR PREVENTING THERMAL IMPACT
- Publication number 20180148843
- Publication date May 31, 2018
- LG Display Co., Ltd.
- Seunghyun YOUK
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD FOR FORMING AN ELECTRICAL CONNECTION TO A SAMPLE SUPPORT IN...
- Publication number 20180097307
- Publication date Apr 5, 2018
- PROTOCHIPS, INC.
- John DAMIANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A DOUBLE-TILT IN-SITU NANOINDENTATION PLATFORM FOR TRANSMISSION ELE...
- Publication number 20180053625
- Publication date Feb 22, 2018
- BEIJING UNIVERSITY OF TECHNOLOGY
- XIAODONG HAN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR PERFORMING NANO BEAM DIFFRACTION ANALYSIS
- Publication number 20180005798
- Publication date Jan 4, 2018
- International Business Machines Corporation
- Marc Adam BERGENDAHL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE
- Publication number 20170030812
- Publication date Feb 2, 2017
- HYSITRON, INC.
- Edward Cyrankowski
- G02 - OPTICS
Information Patent Application
SPECIMEN HOLDER FOR A CHARGED PARTICLE MICROSCOPE
- Publication number 20160181059
- Publication date Jun 23, 2016
- FEI Company
- Tomas Vystavel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Technique For Temperature Measurement And Calibration Of Semiconduc...
- Publication number 20150276487
- Publication date Oct 1, 2015
- Varian Semiconductor Equipment Associates, Inc.
- Jeffrey E. Krampert
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PREPARING AND ANALYZING AN OBJECT AS WELL AS PARTICLE BE...
- Publication number 20150214004
- Publication date Jul 30, 2015
- CARL ZEISS MICROSCOPY GMBH
- Giuseppe Pavia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20150060695
- Publication date Mar 5, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- H01 - BASIC ELECTRIC ELEMENTS

Modifying objects while observing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Testing assembly including a multiple degree of freedom stage

Plasma processing apparatus and method of manufacturing semiconduct...

Method for temperature monitoring in cryo-electron microscopy

Semiconductor manufacturing apparatus and wafer holding table for s...

Operating a gas feed device for a particle beam apparatus

Operating a gas supply device for a particle beam device

Method and apparatus for non line-of-sight doping

Device with at least one adjustable sample holder and method of cha...

Testing assembly including a multiple degree of freedom stage

Electron beam inspection tool and method of controlling heat load

Wafer holder

Roll to roll fabrication apparatus for preventing thermal impact

Specimen observation method

Method of analyzing surface modification of a specimen in a charged...

Stage device and charged particle beam device

Specimen holder

Method of observing liquid specimen, method of analyzing liquid spe...

Systems and methods for using multimodal imaging to determine struc...

Testing assembly including a multiple degree of freedom stage

System and method for performing nano beam diffraction analysis

Examination container and electron microscope

Enhanced FIB-SEM systems for large-volume 3D imaging

Charged particle instruments

Systems and method for using multimodal imaging to determine struct...

Double-tilt in-situ nanoindentation platform for transmission elect...

Method for acquiring image and ion beam apparatus

Method for forming an electrical connection to a sample support in...

Contactless temperature measurement in a charged particle microscope

Method of modifying a sample surface layer from a microscopic sample

System and method for performing nano beam diffraction analysis

Patents Applicationslast 30 patents

Method and System for Sample Preparation

PROCESSING METHOD AND PLASMA PROCESSING APPARATUS

METHOD OF PROCESSING ION BEAM BASED ON OPTICAL MICROSCOPY IMAGING

METHOD AND APPARATUS FOR PREPARING SAMPLES FOR IMAGING

OPERATING A GAS SUPPLY DEVICE FOR A PARTICLE BEAM DEVICE

DEVICE FOR OBSERVING PERMEATION AND DIFFUSION PATH OF OBSERVATION T...

TRANSMISSION ELECTRON MICROSCOPE IN-SITU CHIP AND PREPARATION METHO...

METHOD AND APPARATUS FOR CONTINUOUS CHAINED ENERGY ION IMPLANTATION

TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE

PLASMA PROCESSING APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCT...

Device with at Least One Adjustable Sample Holder and Method of Cha...

METHOD FOR TEMPERATURE MONITORING IN CRYO-ELECTRON MICROSCOPY

TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE

OPERATING A GAS SUPPLY DEVICE FOR A PARTICLE BEAM DEVICE

SYSTEMS AND METHODS FOR USING MULTIMODAL IMAGING TO DETERMINE STRUC...

Method of Observing Liquid Specimen, Method of Analyzing Liquid Spe...

STAGE DEVICE AND CHARGED PARTICLE BEAM DEVICE

SYSTEMS AND METHODS FOR USING MULTIMODAL IMAGING TO DETERMINE STRUC...

METHOD OF ANALYZING SURFACE MODIFICATION OF A SPECIMEN IN A CHARGED...

System and Method for Performing Nano Beam Diffraction Analysis

System and Method for Performing Nano Beam Diffraction Analysis

ROLL TO ROLL FABRICATION APPARATUS FOR PREVENTING THERMAL IMPACT

METHOD FOR FORMING AN ELECTRICAL CONNECTION TO A SAMPLE SUPPORT IN...

A DOUBLE-TILT IN-SITU NANOINDENTATION PLATFORM FOR TRANSMISSION ELE...

SYSTEM AND METHOD FOR PERFORMING NANO BEAM DIFFRACTION ANALYSIS

TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE

SPECIMEN HOLDER FOR A CHARGED PARTICLE MICROSCOPE

Technique For Temperature Measurement And Calibration Of Semiconduc...

METHOD FOR PREPARING AND ANALYZING AN OBJECT AS WELL AS PARTICLE BE...

CHARGED PARTICLE BEAM APPARATUS