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Wafer holder
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Patent number 11,127,605
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Issue date Sep 21, 2021
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Sumitomo Electric Industries, Ltd.
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Koichi Kimura
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H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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Specimen observation method
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Patent number 10,852,253
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Issue date Dec 1, 2020
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HITACHI HIGH-TECH CORPORATION
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Kiyotaka Nakano
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G01 - MEASURING TESTING
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Specimen holder
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Patent number 10,768,124
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Issue date Sep 8, 2020
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Mel-Build Corporation
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Hiroya Miyazaki
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H01 - BASIC ELECTRIC ELEMENTS
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Charged particle instruments
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Patent number 10,475,620
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Issue date Nov 12, 2019
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NANOSCOPE SERVICES LIMITED
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Lloyd Peto
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H01 - BASIC ELECTRIC ELEMENTS
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