Monolithic

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G01J3/0259

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J3/00Spectrometry Spectrophotometry Monochromators Measuring colour

Current Industry

G01J3/0259Monolithic

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Patents Grantslast 30 patents

Information Patent Grant
Spectrometry system with decreased light path
- Patent number 11,988,556
- Issue date May 21, 2024
- VERIFOOD LTD.
- Damian Goldring
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer including metasurface
- Patent number 11,867,556
- Issue date Jan 9, 2024
- Samsung Electronics Co., Ltd.
- Seunghoon Han
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Multi-environment Rayleigh interferometer
- Patent number 11,761,750
- Issue date Sep 19, 2023
- Aaron Pung
- G01 - MEASURING TESTING
Information Patent Grant
Instrument with multiple optical paths
- Patent number 11,703,386
- Issue date Jul 18, 2023
- Office National D'Etudes et de Recherches Aerospatiales
- Guillaume Druart
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometry system with decreased light path
- Patent number 11,624,651
- Issue date Apr 11, 2023
- VERIFOOD, LTD.
- Damian Goldring
- G01 - MEASURING TESTING
Information Patent Grant
Heterogeneous spectroscopic transceiving photonic integrated circui...
- Patent number 11,573,123
- Issue date Feb 7, 2023
- OpenLight Photonics, Inc.
- Gregory Alan Fish
- G02 - OPTICS
Information Patent Grant
Integrated bound-mode spectral/angular sensors
- Patent number 11,480,463
- Issue date Oct 25, 2022
- Steven R. J. Brueck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light detection device
- Patent number 11,448,553
- Issue date Sep 20, 2022
- Hamamatsu Photonics K.K.
- Masaki Hirose
- G02 - OPTICS
Information Patent Grant
Monolithic spectrometer
- Patent number 11,353,363
- Issue date Jun 7, 2022
- Integrated Device Technology, Inc.
- Dan Allen
- G01 - MEASURING TESTING
Information Patent Grant
Integrated bound-mode spectral sensors with chirped gratings
- Patent number 11,326,946
- Issue date May 10, 2022
- Steven R. J. Brueck
- G02 - OPTICS
Information Patent Grant
Infrared spectrometer having dielectric-polymer-based spectral filter
- Patent number 11,313,722
- Issue date Apr 26, 2022
- California Institute of Technology
- Axel Scherer
- G01 - MEASURING TESTING
Information Patent Grant
Miniaturized Fourier-transform Raman spectrometer systems and methods
- Patent number 11,313,725
- Issue date Apr 26, 2022
- Massachusetts Institute of Technology
- Tian Gu
- G01 - MEASURING TESTING
Information Patent Grant
Monolithic assembly of reflective spatial heterodyne spectrometer
- Patent number 11,237,056
- Issue date Feb 1, 2022
- California Institute of Technology
- Seyedeh Sona Hosseini
- G01 - MEASURING TESTING
Information Patent Grant
Heterogeneous spectroscopic transceiving photonic integrated circui...
- Patent number 11,231,320
- Issue date Jan 25, 2022
- Aurrion, Inc.
- Gregory Alan Fish
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photonic circuit with integrated light coupler
- Patent number 11,175,453
- Issue date Nov 16, 2021
- Imec VZW
- Tom Claes
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer including metasurface
- Patent number 11,162,841
- Issue date Nov 2, 2021
- Samsung Electronics Co., Ltd.
- Seunghoon Han
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Waveguide spectrometer to carry out the integrated interferogram sc...
- Patent number 11,105,680
- Issue date Aug 31, 2021
- MICOS ENGINEERING GMBH
- Benedict Joseph Guldimann
- G01 - MEASURING TESTING
Information Patent Grant
Compact folded metasurface spectrometer
- Patent number 11,092,486
- Issue date Aug 17, 2021
- California Institute of Technology
- MohammadSadegh Faraji-Dana
- G01 - MEASURING TESTING
Information Patent Grant
Miniaturized waveguide imaging spectrometer
- Patent number 11,067,442
- Issue date Jul 20, 2021
- MICOS ENGINEERING GMBH
- Mohammadreza Madi
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer, analysis equipment, and wavelength-variable light source
- Patent number 11,060,909
- Issue date Jul 13, 2021
- Ricoh Company, Ltd.
- Hidetaka Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Photovoltaic module comprising a concentration optic with subwavele...
- Patent number 11,031,518
- Issue date Jun 8, 2021
- Thales
- Mane-Si Laure Lee-Bouhours
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated bound-mode spectral/angular sensors
- Patent number 10,989,590
- Issue date Apr 27, 2021
- UNM Rainforest Innovations
- Steven R. J. Brueck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectrometry system with decreased light path
- Patent number 10,942,065
- Issue date Mar 9, 2021
- VERIFOOD, LTD.
- Damian Goldring
- G01 - MEASURING TESTING
Information Patent Grant
High-resolution integrated-optics-based spectrometer
- Patent number 10,914,634
- Issue date Feb 9, 2021
- Academisch Medisch Centrum
- Bakiye Imran Avci
- G01 - MEASURING TESTING
Information Patent Grant
Silicon germanium imager with photodiode in trench
- Patent number 10,861,888
- Issue date Dec 8, 2020
- Artilux, Inc.
- Yun-Chung Na
- G01 - MEASURING TESTING
Information Patent Grant
Filter array reconstructive spectrometry
- Patent number 10,852,189
- Issue date Dec 1, 2020
- The Regents of the University of California
- Zhaowei Liu
- G01 - MEASURING TESTING
Information Patent Grant
Compact spectrometer having reflective wedge structure
- Patent number 10,830,641
- Issue date Nov 10, 2020
- Hong Kong Applied Science and Technology Research Institute Co., Ltd.
- Jiangquan Mai
- G01 - MEASURING TESTING
Information Patent Grant
Chip-scale optical spectrometer
- Patent number 10,801,891
- Issue date Oct 13, 2020
- Nexus Photonics LLC
- Tin Komljenovic
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit using photonic bandgap structure
- Patent number 10,788,367
- Issue date Sep 29, 2020
- Texas Instruments Incorporated
- Benjamin Stassen Cook
- G01 - MEASURING TESTING
Information Patent Grant
Optoelectronic devices based on thin single-crystalline semiconduct...
- Patent number 10,777,700
- Issue date Sep 15, 2020
- Wisconsin Alumni Research Foundation
- Zhenqiang Ma
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
GAS-SENSING APPARATUS
- Publication number 20240385104
- Publication date Nov 21, 2024
- UNIVERSITAET WIEN
- Stefan PUTZ
- G01 - MEASURING TESTING
Information Patent Application
Spectrophotometer comprising phononic MEMS structure for sensing ab...
- Publication number 20240385037
- Publication date Nov 21, 2024
- William N. Carr
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETRY SYSTEMS WITH DECREASED LIGHT PATH
- Publication number 20240377253
- Publication date Nov 14, 2024
- Verifood Ltd
- Damian GOLDRING
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED BOUND-MODE SPECTRAL/ANGULAR SENSORS
- Publication number 20240377246
- Publication date Nov 14, 2024
- UNM Rainforest Innovations
- Steven R.J. BRUECK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT DETECTION DEVICE
- Publication number 20240377255
- Publication date Nov 14, 2024
- HAMAMATSU PHOTONICS K. K.
- Masaki HIROSE
- G01 - MEASURING TESTING
Information Patent Application
Serpentine Integrated Grating and Associated Devices
- Publication number 20240264460
- Publication date Aug 8, 2024
- The Regents of the University of Colorado, a Body Corporate
- Kelvin Wagner
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT SPECTROMETER
- Publication number 20240142303
- Publication date May 2, 2024
- Agency for Science, Technology and Research
- Anmin KONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ULTRATHIN MICRO-SPECTROMETER AND METHOD OF MANUFACTURING THE SAME
- Publication number 20240102859
- Publication date Mar 28, 2024
- Korea Advanced Institute of Science and Technology
- Ki Hun Jeong
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETRY SYSTEM WITH DECREASED LIGHT PATH
- Publication number 20240060820
- Publication date Feb 22, 2024
- VERIFOOD, LTD.
- Damian GOLDRING
- G01 - MEASURING TESTING
Information Patent Application
MULTI-CHANNEL INFEROMETER-BASED OPTICAL SENSOR
- Publication number 20230304861
- Publication date Sep 28, 2023
- ams Sensors Singapore Pte. Ltd.
- Peter Roentgen
- G01 - MEASURING TESTING
Information Patent Application
Multi-environment Rayleigh Interferometer
- Publication number 20230273009
- Publication date Aug 31, 2023
- Utah State University Space Dynamics Laboratory
- Aaron Pung
- G02 - OPTICS
Information Patent Application
SPECTROMETER, PORTABLE DEVICE AND METHOD FOR DETECTING ELECTROMAGNE...
- Publication number 20230175890
- Publication date Jun 8, 2023
- ams-Osram AG
- Deborah MORECROFT
- G01 - MEASURING TESTING
Information Patent Application
An Optoelectronic Apparatus
- Publication number 20230108848
- Publication date Apr 6, 2023
- ams-OSRAM International GmbH
- Massimo Cataldo Mazzillo
- G01 - MEASURING TESTING
Information Patent Application
LIGHT DETECTION DEVICE
- Publication number 20220333988
- Publication date Oct 20, 2022
- HAMAMATSU PHOTONICS K. K.
- Masaki HIROSE
- G01 - MEASURING TESTING
Information Patent Application
OPTOELECTRONIC MEASURING DEVICE FOR MEASURING THE INTENSITY OF ELEC...
- Publication number 20220283027
- Publication date Sep 8, 2022
- Osram Opto Semiconductors GmbH
- Sergey KUDAEV
- G01 - MEASURING TESTING
Information Patent Application
HETEROGENEOUS SPECTROSCOPIC TRANSCEIVING PHOTONIC INTEGRATED CIRCUI...
- Publication number 20220107219
- Publication date Apr 7, 2022
- Aurrion, Inc.
- Gregory Alan Fish
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSTRUMENT WITH MULTIPLE OPTICAL PATHS
- Publication number 20220082434
- Publication date Mar 17, 2022
- OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES
- Guillaume DRUART
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER INCLUDING METASURFACE
- Publication number 20220011161
- Publication date Jan 13, 2022
- Samsung Electronics Co., Ltd.
- Seunghoon Han
- B82 - NANO-TECHNOLOGY
Information Patent Application
SPECTROMETRY SYSTEM WITH DECREASED LIGHT PATH
- Publication number 20210302232
- Publication date Sep 30, 2021
- VERIFOOD, LTD.
- Damian GOLDRING
- G01 - MEASURING TESTING
Information Patent Application
Photonic Circuit With Integrated Light Coupler
- Publication number 20210294034
- Publication date Sep 23, 2021
- IMEC vzw
- Tom Claes
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED BOUND-MODE SPECTRAL/ANGULAR SENSORS
- Publication number 20210262854
- Publication date Aug 26, 2021
- UNM RAINFOREST INNOVATIONS
- Steven R.J. BRUECK
- G01 - MEASURING TESTING
Information Patent Application
Monolithic Spectrometer
- Publication number 20210096025
- Publication date Apr 1, 2021
- Integrated Device Technology, Inc.
- Dan ALLEN
- G01 - MEASURING TESTING
Information Patent Application
MINIATURIZED FOURIER-TRANSFORM RAMAN SPECTROMETER SYSTEMS AND METHODS
- Publication number 20210025756
- Publication date Jan 28, 2021
- Massachusetts Institute of Technology
- Tian GU
- G01 - MEASURING TESTING
Information Patent Application
VARIABLE OPTICAL FILTER AND A WAVELENGTH-SELECTIVE SENSOR BASED THE...
- Publication number 20210028213
- Publication date Jan 28, 2021
- VIAVI Solutions Inc.
- Karen Denise Hendrix
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETRY SYSTEM WITH DECREASED LIGHT PATH
- Publication number 20200393297
- Publication date Dec 17, 2020
- VERIFOOD, LTD.
- Damian GOLDRING
- G01 - MEASURING TESTING
Information Patent Application
HETEROGENEOUS SPECTROSCOPIC TRANSCEIVING PHOTONIC INTEGRATED CIRCUI...
- Publication number 20200340860
- Publication date Oct 29, 2020
- Aurrion, Inc.
- Gregory Alan Fish
- G02 - OPTICS
Information Patent Application
WAVEGUIDE SPECTROMETER TO CARRY OUT THE INTEGRATED INTERFEROGRAM SC...
- Publication number 20200278248
- Publication date Sep 3, 2020
- MICOS ENGINEERING GMBH
- Joseph Benedict GULDIMANN
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER INCLUDING METASURFACE
- Publication number 20200256725
- Publication date Aug 13, 2020
- Samsung Electronics Co., Ltd.
- Seunghoon Han
- B82 - NANO-TECHNOLOGY
Information Patent Application
CHIP-SCALE OPTICAL SPECTROMETER
- Publication number 20200217718
- Publication date Jul 9, 2020
- Tin Komljenovic
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT USING PHOTONIC BANDGAP STRUCTURE
- Publication number 20200141800
- Publication date May 7, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Benjamin Stassen Cook
- G02 - OPTICS

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Spectrometry system with decreased light path

Spectrometer including metasurface

Multi-environment Rayleigh interferometer

Instrument with multiple optical paths

Spectrometry system with decreased light path

Heterogeneous spectroscopic transceiving photonic integrated circui...

Integrated bound-mode spectral/angular sensors

Light detection device

Monolithic spectrometer

Integrated bound-mode spectral sensors with chirped gratings

Infrared spectrometer having dielectric-polymer-based spectral filter

Miniaturized Fourier-transform Raman spectrometer systems and methods

Monolithic assembly of reflective spatial heterodyne spectrometer

Heterogeneous spectroscopic transceiving photonic integrated circui...

Photonic circuit with integrated light coupler

Spectrometer including metasurface

Waveguide spectrometer to carry out the integrated interferogram sc...

Compact folded metasurface spectrometer

Miniaturized waveguide imaging spectrometer

Spectrometer, analysis equipment, and wavelength-variable light source

Photovoltaic module comprising a concentration optic with subwavele...

Integrated bound-mode spectral/angular sensors

Spectrometry system with decreased light path

High-resolution integrated-optics-based spectrometer

Silicon germanium imager with photodiode in trench

Filter array reconstructive spectrometry

Compact spectrometer having reflective wedge structure

Chip-scale optical spectrometer

Integrated circuit using photonic bandgap structure

Optoelectronic devices based on thin single-crystalline semiconduct...

Patents Applicationslast 30 patents

GAS-SENSING APPARATUS

Spectrophotometer comprising phononic MEMS structure for sensing ab...

SPECTROMETRY SYSTEMS WITH DECREASED LIGHT PATH

INTEGRATED BOUND-MODE SPECTRAL/ANGULAR SENSORS

LIGHT DETECTION DEVICE

Serpentine Integrated Grating and Associated Devices

INTEGRATED CIRCUIT SPECTROMETER

ULTRATHIN MICRO-SPECTROMETER AND METHOD OF MANUFACTURING THE SAME

SPECTROMETRY SYSTEM WITH DECREASED LIGHT PATH

MULTI-CHANNEL INFEROMETER-BASED OPTICAL SENSOR

Multi-environment Rayleigh Interferometer

SPECTROMETER, PORTABLE DEVICE AND METHOD FOR DETECTING ELECTROMAGNE...

An Optoelectronic Apparatus

LIGHT DETECTION DEVICE

OPTOELECTRONIC MEASURING DEVICE FOR MEASURING THE INTENSITY OF ELEC...

HETEROGENEOUS SPECTROSCOPIC TRANSCEIVING PHOTONIC INTEGRATED CIRCUI...

INSTRUMENT WITH MULTIPLE OPTICAL PATHS

SPECTROMETER INCLUDING METASURFACE

SPECTROMETRY SYSTEM WITH DECREASED LIGHT PATH

Photonic Circuit With Integrated Light Coupler

INTEGRATED BOUND-MODE SPECTRAL/ANGULAR SENSORS

Monolithic Spectrometer

MINIATURIZED FOURIER-TRANSFORM RAMAN SPECTROMETER SYSTEMS AND METHODS

VARIABLE OPTICAL FILTER AND A WAVELENGTH-SELECTIVE SENSOR BASED THE...

SPECTROMETRY SYSTEM WITH DECREASED LIGHT PATH

HETEROGENEOUS SPECTROSCOPIC TRANSCEIVING PHOTONIC INTEGRATED CIRCUI...

WAVEGUIDE SPECTROMETER TO CARRY OUT THE INTEGRATED INTERFEROGRAM SC...

SPECTROMETER INCLUDING METASURFACE

CHIP-SCALE OPTICAL SPECTROMETER

INTEGRATED CIRCUIT USING PHOTONIC BANDGAP STRUCTURE