Membership
Tour
Register
Log in
moving sheet, web
Follow
Industry
CPC
G01N2223/642
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00
Investigating materials by wave or particle radiation
Current Industry
G01N2223/642
moving sheet, web
Industries
Overview
Organizations
People
Information
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
Device and method for determining the microstructure of a metal pro...
Patent number
11,249,037
Issue date
Feb 15, 2022
SMS group GMBH
Mostafa Biglari
B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information
Patent Grant
Inspection device for conveyor belt
Patent number
10,746,541
Issue date
Aug 18, 2020
The Yokohama Rubber Co., Ltd.
Mitsutaka Masuda
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for radioscopic examination of a strip-shaped mat...
Patent number
10,309,911
Issue date
Jun 4, 2019
Troester GmbH & Co. KG
Kurt Schoppmann
G01 - MEASURING TESTING
Information
Patent Grant
X-ray transmission inspection apparatus
Patent number
9,863,896
Issue date
Jan 9, 2018
Hitachi High-Tech Science Corporation
Yoshiki Matoba
G01 - MEASURING TESTING
Information
Patent Grant
Automatic z-correction for basis weight sensors
Patent number
9,612,213
Issue date
Apr 4, 2017
Honeywell ASCA Inc.
Reena Meijer Drees
G01 - MEASURING TESTING
Information
Patent Grant
X-ray inspection device, inspection method, and X-ray detector
Patent number
9,506,876
Issue date
Nov 29, 2016
Hitachi High-Technologies Corporation
Yuta Urano
G01 - MEASURING TESTING
Information
Patent Grant
Grammage detection sensor for recording material and image forming...
Patent number
9,383,704
Issue date
Jul 5, 2016
Canon Kabushiki Kaisha
Teruhiko Namiki
G01 - MEASURING TESTING
Information
Patent Grant
3106641
Patent number
3,106,641
Issue date
Oct 8, 1963
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Substrate Alloy Influence Compensation
Publication number
20250003897
Publication date
Jan 2, 2025
THERMO FISHER SCIENTIFIC MESSTECHNIK GMBH
Alexander Britting
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION SAMPLE SET AND METHOD FOR LI-ION BATTERY GAUGING SYSTEMS
Publication number
20230184698
Publication date
Jun 15, 2023
THERMO FISHER SCIENTIFIC MESSTECHNIK GMBH
Alexander BRITTING
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEVICE AND METHOD FOR DETERMINING THE MICROSTRUCTURE OF A METAL PRO...
Publication number
20190292624
Publication date
Sep 26, 2019
SMS group GMBH
Mostafa BIGLARI
C21 - METALLURGY OF IRON
Information
Patent Application
Automatic z-Correction for Basis Weight Sensors
Publication number
20150323375
Publication date
Nov 12, 2015
Honeywell ASCA Inc.
Reena Meijer Drees
G01 - MEASURING TESTING
Information
Patent Application
X-Ray Transmission Inspection Apparatus
Publication number
20150276626
Publication date
Oct 1, 2015
HITACHI HIGH-TECH SCIENCE CORPORATION
Yoshiki Matoba
G01 - MEASURING TESTING
Information
Patent Application
X-RAY INSPECTION DEVICE, INSPECTION METHOD, AND X-RAY DETECTOR
Publication number
20140328459
Publication date
Nov 6, 2014
Hitachi High-Technologies Corporation
Yuta Urano
G01 - MEASURING TESTING