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G01N2223/642
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00
Investigating materials by wave or particle radiation
Current Industry
G01N2223/642
moving sheet, web
Industries
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Patents Grants
last 30 patents
Information
Patent Grant
Device and method for determining the microstructure of a metal pro...
Patent number
11,249,037
Issue date
Feb 15, 2022
SMS group GMBH
Mostafa Biglari
B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information
Patent Grant
Inspection device for conveyor belt
Patent number
10,746,541
Issue date
Aug 18, 2020
The Yokohama Rubber Co., Ltd.
Mitsutaka Masuda
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for radioscopic examination of a strip-shaped mat...
Patent number
10,309,911
Issue date
Jun 4, 2019
Troester GmbH & Co. KG
Kurt Schoppmann
G01 - MEASURING TESTING
Information
Patent Grant
X-ray transmission inspection apparatus
Patent number
9,863,896
Issue date
Jan 9, 2018
Hitachi High-Tech Science Corporation
Yoshiki Matoba
G01 - MEASURING TESTING
Information
Patent Grant
Automatic z-correction for basis weight sensors
Patent number
9,612,213
Issue date
Apr 4, 2017
Honeywell ASCA Inc.
Reena Meijer Drees
G01 - MEASURING TESTING
Information
Patent Grant
X-ray inspection device, inspection method, and X-ray detector
Patent number
9,506,876
Issue date
Nov 29, 2016
Hitachi High-Technologies Corporation
Yuta Urano
G01 - MEASURING TESTING
Information
Patent Grant
Grammage detection sensor for recording material and image forming...
Patent number
9,383,704
Issue date
Jul 5, 2016
Canon Kabushiki Kaisha
Teruhiko Namiki
G01 - MEASURING TESTING
Information
Patent Grant
3106641
Patent number
3,106,641
Issue date
Oct 8, 1963
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CALIBRATION SAMPLE SET AND METHOD FOR LI-ION BATTERY GAUGING SYSTEMS
Publication number
20230184698
Publication date
Jun 15, 2023
THERMO FISHER SCIENTIFIC MESSTECHNIK GMBH
Alexander BRITTING
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEVICE AND METHOD FOR DETERMINING THE MICROSTRUCTURE OF A METAL PRO...
Publication number
20190292624
Publication date
Sep 26, 2019
SMS group GMBH
Mostafa BIGLARI
C21 - METALLURGY OF IRON
Information
Patent Application
Automatic z-Correction for Basis Weight Sensors
Publication number
20150323375
Publication date
Nov 12, 2015
Honeywell ASCA Inc.
Reena Meijer Drees
G01 - MEASURING TESTING
Information
Patent Application
X-Ray Transmission Inspection Apparatus
Publication number
20150276626
Publication date
Oct 1, 2015
HITACHI HIGH-TECH SCIENCE CORPORATION
Yoshiki Matoba
G01 - MEASURING TESTING
Information
Patent Application
X-RAY INSPECTION DEVICE, INSPECTION METHOD, AND X-RAY DETECTOR
Publication number
20140328459
Publication date
Nov 6, 2014
Hitachi High-Technologies Corporation
Yuta Urano
G01 - MEASURING TESTING