Multiple detectors for detecting interferometer signals

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CPC
G01B2290/45

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B2290/00Aspects of interferometers not specifically covered by any group under G01B9/02

Current Industry

G01B2290/45Multiple detectors for detecting interferometer signals

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Patents Grantslast 30 patents

Information Patent Grant
System and method for measuring using multiple modalities
- Patent number 12,085,380
- Issue date Sep 10, 2024
- Hexagon Metrology, Inc.
- Milan Kocic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Interferometer and optical instrument with integrated optical compo...
- Patent number 11,933,609
- Issue date Mar 19, 2024
- Yokogawa Electric Corporation
- Nobuhide Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Device for interferometric distance measurement
- Patent number 11,885,607
- Issue date Jan 30, 2024
- Dr. Johannes Heidenhain GmbH
- Herbert Huber-Lenk
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring using multiple modalities
- Patent number 11,802,760
- Issue date Oct 31, 2023
- Hexagon Metrology, Inc.
- Milan Kocic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Axial length measurement monitor
- Patent number 11,779,206
- Issue date Oct 10, 2023
- Acucela Inc.
- Ryo Kubota
- G01 - MEASURING TESTING
Information Patent Grant
System and method of phase-locked fiber interferometry
- Patent number 11,644,301
- Issue date May 9, 2023
- National Technology & Engineering Solutions of Sandia, LLC
- Aaron Michael Katzenmeyer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Displacement detection device
- Patent number 11,512,942
- Issue date Nov 29, 2022
- DMG MORI CO., LTD.
- Akinori Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for stabilization of multi-path optical interfero...
- Patent number 11,506,477
- Issue date Nov 22, 2022
- INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Mehedi Islam
- G01 - MEASURING TESTING
Information Patent Grant
Axial length measurement monitor
- Patent number 11,497,396
- Issue date Nov 15, 2022
- Acucela Inc.
- Ryo Kubota
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Infrared-optical hybrid imaging technology for all-digital histopat...
- Patent number 11,493,323
- Issue date Nov 8, 2022
- The Board of Trustees of the University of Illinois
- Martin Schnell
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Device and method for interferometric measurement of a two or three...
- Patent number 11,493,325
- Issue date Nov 8, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Lun Kai Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Optical coherence tomography apparatus and measurement method
- Patent number 11,357,403
- Issue date Jun 14, 2022
- FUJIFILM Corporation
- Sohichiro Nakamura
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Laser interference device
- Patent number 11,353,315
- Issue date Jun 7, 2022
- Mitutoyo Corporation
- Yuichiro Yokoyama
- G02 - OPTICS
Information Patent Grant
Retro-interferometer having active readjustment
- Patent number 11,326,950
- Issue date May 10, 2022
- BRUKER OPTICS GMBH & CO. KG
- Axel Keens
- G02 - OPTICS
Information Patent Grant
Method and system for determining the separation distance between a...
- Patent number 11,320,254
- Issue date May 3, 2022
- ADIGE S.P.A.
- Simone Donadello
- G01 - MEASURING TESTING
Information Patent Grant
Optical systems and methods for measuring rotational movement
- Patent number 11,280,603
- Issue date Mar 22, 2022
- OTM TECHNOLOGIES LTD.
- Opher Kinrot
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Coherent receiver array
- Patent number 11,187,517
- Issue date Nov 30, 2021
- Acacia Communications, Inc.
- Christopher Doerr
- G01 - MEASURING TESTING
Information Patent Grant
Stationary devices for determination of magnitude and polarity of e...
- Patent number 11,181,503
- Issue date Nov 23, 2021
- Robert Dickerman
- G01 - MEASURING TESTING
Information Patent Grant
Automated polarization control
- Patent number 11,175,126
- Issue date Nov 16, 2021
- Canon U.S.A., Inc.
- Badr Elmaanaoui
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Interferometry system and associated methods
- Patent number 11,009,341
- Issue date May 18, 2021
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Angular separation of scan channels
- Patent number 11,006,824
- Issue date May 18, 2021
- CELLVIEW IMAGING INC.
- Mark Hathaway
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Phase-sensitive optical coherence tomography to measure optical abe...
- Patent number 10,966,607
- Issue date Apr 6, 2021
- Alcon Inc.
- Muhammad K. Al-Qaisi
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric position sensor
- Patent number 10,928,192
- Issue date Feb 23, 2021
- MBDA UK Limited
- Ross Matthew Williams
- G01 - MEASURING TESTING
Information Patent Grant
Laser heterodyne interferometric apparatus and method based on plan...
- Patent number 10,907,950
- Issue date Feb 2, 2021
- National Institute of Metrology
- Yang Bai
- G01 - MEASURING TESTING
Information Patent Grant
Optical transforming and modulated interference pattern of a moving...
- Patent number 10,883,818
- Issue date Jan 5, 2021
- CONTINUSE BIOMETRICS LTD.
- Zeev Zalevsky
- G01 - MEASURING TESTING
Information Patent Grant
Method and instrument for measuring etch depth by differential pola...
- Patent number 10,859,366
- Issue date Dec 8, 2020
- HORIBA FRANCE SAS
- Simon Richard
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measurement of multilayer structures
- Patent number 10,761,021
- Issue date Sep 1, 2020
- Lumetrics, Inc
- Michael A. Marcus
- G01 - MEASURING TESTING
Information Patent Grant
Optical image measurement apparatus and optical image measurement m...
- Patent number 10,746,528
- Issue date Aug 18, 2020
- Hitachi-LG Data Storage, Inc.
- Kentaro Osawa
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems of holographic interferometry
- Patent number 10,725,428
- Issue date Jul 28, 2020
- RD Synergy Ltd.
- Dov Furman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical module for optical height measurement
- Patent number 10,724,845
- Issue date Jul 28, 2020
- Hitachi-LG Data Storage, Inc.
- Daisuke Tomita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Multi-Channel Self-Mixing Interferometric Sensor
- Publication number 20240384980
- Publication date Nov 21, 2024
- Apple Inc.
- Tong Chen
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC DISPLACEMENT MEASUREMENT APPARATUS
- Publication number 20240310158
- Publication date Sep 19, 2024
- Oxford University Innovation Limited
- Armin REICHOLD
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MEASURING USING MULTIPLE MODALITIES
- Publication number 20240027181
- Publication date Jan 25, 2024
- Hexagon Metrology, Inc.
- Milan Kocic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR MEASURING USING MULTIPLE MODALITIES
- Publication number 20240019241
- Publication date Jan 18, 2024
- Hexagon Metrology, Inc.
- Milan Kocic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AXIAL LENGTH MEASUREMENT MONITOR
- Publication number 20230414097
- Publication date Dec 28, 2023
- Acucela Inc.
- Ryo KUBOTA
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE FIBER INTERFEROMETER DISPLACEMENT MEASURING SYSTEM AND M...
- Publication number 20230408250
- Publication date Dec 21, 2023
- BEIJING U-PRECISION TECH CO.. LTD.
- Guohua SUN
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT DEVICE
- Publication number 20230366668
- Publication date Nov 16, 2023
- CKD CORPORATION
- Hiroyuki Ishigaki
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER SYSTEM AND LITHOGRAPHIC APPARATUS
- Publication number 20230332880
- Publication date Oct 19, 2023
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CONCURRENT MEASUREMENTS OF INTERFEROMETRIC...
- Publication number 20230098439
- Publication date Mar 30, 2023
- ALLAGI INC.
- Michael J. Darwin
- G01 - MEASURING TESTING
Information Patent Application
AXIAL LENGTH MEASUREMENT MONITOR
- Publication number 20230026753
- Publication date Jan 26, 2023
- Acucela Inc.
- Ryo KUBOTA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
OPTICAL SYSTEM AND METHOD OF FORMING THE SAME
- Publication number 20220326151
- Publication date Oct 13, 2022
- Agency for Science, Technology and Research
- Leonid KRIVITSKIY
- G01 - MEASURING TESTING
Information Patent Application
AXIAL LENGTH MEASUREMENT MONITOR
- Publication number 20220304573
- Publication date Sep 29, 2022
- Acucela Inc.
- Ryo KUBOTA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
DEVICE FOR INTERFEROMETRIC DISTANCE MEASUREMENT
- Publication number 20220276040
- Publication date Sep 1, 2022
- Dr. Johannes Heidenhain Gmbh
- Herbert HUBER-LENK
- G01 - MEASURING TESTING
Information Patent Application
COMPUTATIONAL SHEAR BY PHASE STEPPED SPECKLE HOLOGRAPHY
- Publication number 20220011091
- Publication date Jan 13, 2022
- BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC
- Andrew N. Acker
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR INTERFEROMETRIC MEASUREMENT OF A TWO OR THREE...
- Publication number 20210389118
- Publication date Dec 16, 2021
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Lun Kai CHENG
- G01 - MEASURING TESTING
Information Patent Application
LASER INTERFERENCE DEVICE
- Publication number 20210293523
- Publication date Sep 23, 2021
- MITUTOYO CORPORATION
- Yuichiro YOKOYAMA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR STABALIZATION OF MULTI-PATH OPTICAL INTERFERO...
- Publication number 20210063136
- Publication date Mar 4, 2021
- Institut National de la Recherche Scientifique
- MEHEDI ISLAM
- G01 - MEASURING TESTING
Information Patent Application
RETRO-INTERFEROMETER HAVING ACTIVE READADJUSTMENT
- Publication number 20210033381
- Publication date Feb 4, 2021
- Bruker Optik GmbH
- Axel KEENS
- G01 - MEASURING TESTING
Information Patent Application
Laser Heterodyne Interferometric Apparatus and Method Based on Plan...
- Publication number 20210010794
- Publication date Jan 14, 2021
- National Institute of Metrology
- Yang BAI
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND DEVICES FOR ADDING POLARIZATION SENSING FUNCTION TO STA...
- Publication number 20200249008
- Publication date Aug 6, 2020
- The Regents of the University of California
- Zhongping Chen
- G01 - MEASURING TESTING
Information Patent Application
Infrared-Optical Hybrid Imaging Technology for All-Digital Histopat...
- Publication number 20200217643
- Publication date Jul 9, 2020
- THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
- Martin Schnell
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SYSTEM AND METHOD FOR MEASURING USING MULTIPLE MODALITIES
- Publication number 20200182604
- Publication date Jun 11, 2020
- Hexagon Metrology, Inc.
- Milan Kocic
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEMS AND METHODS FOR MEASURING ROTATIONAL MOVEMENT
- Publication number 20200149864
- Publication date May 14, 2020
- OTM TECHNOLOGIES LTD.
- Opher Kinrot
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND INSTRUMENT FOR MEASURING ETCH DEPTH BY DIFFERENTIAL POLA...
- Publication number 20200103214
- Publication date Apr 2, 2020
- HORIBA FRANCE SAS
- Simon RICHARD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFEROMETRY SYSTEM AND METHODS FOR SUBSTRATE PROCESSING
- Publication number 20200011652
- Publication date Jan 9, 2020
- Applied Materials, Inc.
- Benjamin M. JOHNSTON
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY SYSTEM AND ASSOCIATED METHODS
- Publication number 20190353474
- Publication date Nov 21, 2019
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Application
COHERENT RECEIVER ARRAY
- Publication number 20190310071
- Publication date Oct 10, 2019
- Acacia Communications, Inc.
- Christopher Doerr
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MODULE FOR OPTICAL HEIGHT MEASUREMENT
- Publication number 20190293406
- Publication date Sep 26, 2019
- Hitachi-LG Data Storage, Inc.
- Daisuke TOMITA
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC POSITION SENSOR
- Publication number 20190257645
- Publication date Aug 22, 2019
- MBDA UK LIMITED
- Ross Matthew WILLIAMS
- G01 - MEASURING TESTING
Information Patent Application
DUAL-HOMODYNE LASER INTERFEROMETRIC NANOMETER DISPLACEMENT MEASURIN...
- Publication number 20180328710
- Publication date Nov 15, 2018
- ZHEJIANG SCI-TECH UNIVERSITY
- Liping YAN
- G01 - MEASURING TESTING

Multiple detectors for detecting interferometer signals

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and method for measuring using multiple modalities

Interferometer and optical instrument with integrated optical compo...

Device for interferometric distance measurement

System and method for measuring using multiple modalities

Axial length measurement monitor

System and method of phase-locked fiber interferometry

Displacement detection device

System and method for stabilization of multi-path optical interfero...

Axial length measurement monitor

Infrared-optical hybrid imaging technology for all-digital histopat...

Device and method for interferometric measurement of a two or three...

Optical coherence tomography apparatus and measurement method

Laser interference device

Retro-interferometer having active readjustment

Method and system for determining the separation distance between a...

Optical systems and methods for measuring rotational movement

Coherent receiver array

Stationary devices for determination of magnitude and polarity of e...

Automated polarization control

Interferometry system and associated methods

Angular separation of scan channels

Phase-sensitive optical coherence tomography to measure optical abe...

Interferometric position sensor

Laser heterodyne interferometric apparatus and method based on plan...

Optical transforming and modulated interference pattern of a moving...

Method and instrument for measuring etch depth by differential pola...

Apparatus and method for measurement of multilayer structures

Optical image measurement apparatus and optical image measurement m...

Methods and systems of holographic interferometry

Optical module for optical height measurement

Patents Applicationslast 30 patents

Multi-Channel Self-Mixing Interferometric Sensor

INTERFEROMETRIC DISPLACEMENT MEASUREMENT APPARATUS

SYSTEM AND METHOD FOR MEASURING USING MULTIPLE MODALITIES

SYSTEM AND METHOD FOR MEASURING USING MULTIPLE MODALITIES

AXIAL LENGTH MEASUREMENT MONITOR

HETERODYNE FIBER INTERFEROMETER DISPLACEMENT MEASURING SYSTEM AND M...

THREE-DIMENSIONAL MEASUREMENT DEVICE

INTERFEROMETER SYSTEM AND LITHOGRAPHIC APPARATUS

SYSTEMS AND METHODS FOR CONCURRENT MEASUREMENTS OF INTERFEROMETRIC...

AXIAL LENGTH MEASUREMENT MONITOR

OPTICAL SYSTEM AND METHOD OF FORMING THE SAME

AXIAL LENGTH MEASUREMENT MONITOR

DEVICE FOR INTERFEROMETRIC DISTANCE MEASUREMENT

COMPUTATIONAL SHEAR BY PHASE STEPPED SPECKLE HOLOGRAPHY

DEVICE AND METHOD FOR INTERFEROMETRIC MEASUREMENT OF A TWO OR THREE...

LASER INTERFERENCE DEVICE

SYSTEM AND METHOD FOR STABALIZATION OF MULTI-PATH OPTICAL INTERFERO...

RETRO-INTERFEROMETER HAVING ACTIVE READADJUSTMENT

Laser Heterodyne Interferometric Apparatus and Method Based on Plan...

METHODS AND DEVICES FOR ADDING POLARIZATION SENSING FUNCTION TO STA...

Infrared-Optical Hybrid Imaging Technology for All-Digital Histopat...

SYSTEM AND METHOD FOR MEASURING USING MULTIPLE MODALITIES

OPTICAL SYSTEMS AND METHODS FOR MEASURING ROTATIONAL MOVEMENT

METHOD AND INSTRUMENT FOR MEASURING ETCH DEPTH BY DIFFERENTIAL POLA...

INTERFEROMETRY SYSTEM AND METHODS FOR SUBSTRATE PROCESSING

INTERFEROMETRY SYSTEM AND ASSOCIATED METHODS

COHERENT RECEIVER ARRAY

OPTICAL MODULE FOR OPTICAL HEIGHT MEASUREMENT

INTERFEROMETRIC POSITION SENSOR

DUAL-HOMODYNE LASER INTERFEROMETRIC NANOMETER DISPLACEMENT MEASURIN...