Multiple-type SPM

Industry

CPC
G01Q60/02

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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

Current Industry

G01Q60/02Multiple-type SPM

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope with case and elastic body
- Patent number 11,073,535
- Issue date Jul 27, 2021
- Shimadzu Corporation
- Masato Hirade
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing a probe suitable for scanning probe microscopy
- Patent number 11,035,880
- Issue date Jun 15, 2021
- Imec VZW
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Grant
Numerically controlled rotary probe switching device based on envir...
- Patent number 10,739,377
- Issue date Aug 11, 2020
- Southwest Jiaotong University
- Liang Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Methods, systems, and computer readable media for dual resonance fr...
- Patent number 9,395,388
- Issue date Jul 19, 2016
- The University of North Carolina at Chapel Hill
- Dong Wu
- G01 - MEASURING TESTING
Information Patent Grant
System and method for providing electromagnetic imaging through ele...
- Patent number 9,395,317
- Issue date Jul 19, 2016
- Massachusetts Institute of Technology
- Benjamin Louis Cannon
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and a method for investigating a sample by means of sever...
- Patent number 9,080,937
- Issue date Jul 14, 2015
- JPK Instruments AG
- Gerd Behme
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of the surface potential of a material
- Patent number 8,763,160
- Issue date Jun 24, 2014
- Centre National de la Recherche Scientifique CNRS
- Thierry Melin
- G01 - MEASURING TESTING
Information Patent Grant
System and method for providing electromagnetic imaging through mag...
- Patent number 8,742,770
- Issue date Jun 3, 2014
- Massachusetts Institute of Technology
- David L. Trumper
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Real space mapping of ionic diffusion and electrochemical activity...
- Patent number 8,719,961
- Issue date May 6, 2014
- UT-Battelle, LLC
- Sergei V. Kalinin
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System and method for providing electromagnetic imaging through ele...
- Patent number 8,669,771
- Issue date Mar 11, 2014
- Massachusetts Institute of Technology
- David L. Trumper
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Multifunctional micropipette biological sensor
- Patent number 8,602,644
- Issue date Dec 10, 2013
- University of North Texas
- Tae-Youl Choi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System and method for providing electromagnetic imaging through mag...
- Patent number 8,482,300
- Issue date Jul 9, 2013
- Massachusetts Institute of Technology
- David L. Trumper
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe arrangement
- Patent number 7,870,616
- Issue date Jan 11, 2011
- CSEM Centre Suisse D'Electronique et de Microtechnique SA
- André Meister
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope assembly and method for making spectropho...
- Patent number 7,615,738
- Issue date Nov 10, 2009
- General Nanotechnology, L.L.C.
- Victor B. Kley
- G11 - INFORMATION STORAGE
Information Patent Grant
Spin microscope based on optically detected magnetic resonance
- Patent number 7,615,739
- Issue date Nov 10, 2009
- The United States of America as represented by the United States Department o...
- Gennady P. Berman
- G01 - MEASURING TESTING
Information Patent Grant
Sensors for electrochemical, electrical or topographical analysis
- Patent number 7,444,856
- Issue date Nov 4, 2008
- The Board of Trustees of the Leland Stanford Junior University
- Friedrich B. Prinz
- G01 - MEASURING TESTING
Information Patent Grant
Spin microscope based on optically detected magnetic resonance
- Patent number 7,305,869
- Issue date Dec 11, 2007
- U.S. Department of Energy
- Gennady P. Berman
- G01 - MEASURING TESTING
Information Patent Grant
Electrical scanning probe microscope apparatus
- Patent number 7,193,424
- Issue date Mar 20, 2007
- National Applied Research Laboratories
- Mao-Nan Chang
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope assembly
- Patent number 7,091,476
- Issue date Aug 15, 2006
- General Nanotechnology L.L.C.
- Victor B. Kley
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for producing a device for simultaneously carrying out an el...
- Patent number 7,074,340
- Issue date Jul 11, 2006
- Innovationsagentur Gesellschaft
- Alois Lugstein
- G01 - MEASURING TESTING
Information Patent Grant
Near-field magneto-optical microscope
- Patent number 6,972,562
- Issue date Dec 6, 2005
- The United States of America as represented by the United States Department o...
- Vitalii K. Vlasko-Vlasov
- G01 - MEASURING TESTING
Information Patent Grant
Device for simultaneously carrying out an electrochemical and a top...
- Patent number 6,894,272
- Issue date May 17, 2005
- Innovationsagentur Gesellschaft m.b.H.
- Christine Kranz
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope assembly and method for making confocal,...
- Patent number 6,515,277
- Issue date Feb 4, 2003
- General Nanotechnology L.L.C.
- Vic B. Kley
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and device for tunnel microscopy
- Patent number 6,476,386
- Issue date Nov 5, 2002
- Max-Planck- Gesselschaft zur Forderung der Wissenschaften e.V.
- Jürgen Kirschner
- G11 - INFORMATION STORAGE
Information Patent Grant
Multi-probe test head and process using same
- Patent number 6,426,499
- Issue date Jul 30, 2002
- Deutsche Telekom AG
- Hans Wilfried Peter Koops
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope assembly and method for making confocal,...
- Patent number 6,396,054
- Issue date May 28, 2002
- General Nanotechnology L.L.C.
- Vic B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope assembly and method for making confocal,...
- Patent number 6,369,379
- Issue date Apr 9, 2002
- General Nanotechnology L.L.C.
- Vic B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope assembly and method for making spectropho...
- Patent number 6,339,217
- Issue date Jan 15, 2002
- General Nanotechnology L.L.C.
- Victor B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope assembly and method for making confocal,...
- Patent number 6,281,491
- Issue date Aug 28, 2001
- General Nanotechnology, L.L.C.
- Vic B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope assembly and method for making confocal,...
- Patent number 6,242,734
- Issue date Jun 5, 2001
- General Nanotechnology, L.L.C.
- Victor B. Kley
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Scanning Probe Microscope
- Publication number 20200341027
- Publication date Oct 29, 2020
- Shimadzu Corporation
- Masato HIRADE
- G01 - MEASURING TESTING
Information Patent Application
Numerically Controlled Rotary Probe Switching Device Based on Envir...
- Publication number 20200096539
- Publication date Mar 26, 2020
- Southwest Jiaotong University
- Liang JIANG
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ION CONDUCTANCE MICROSCOPY
- Publication number 20170016933
- Publication date Jan 19, 2017
- OPENIOLABS LTD
- Andrew James Richardson
- G01 - MEASURING TESTING
Information Patent Application
METHODS, SYSTEMS, AND COMPUTER READABLE MEDIA FOR DUAL RESONANCE FR...
- Publication number 20150241470
- Publication date Aug 27, 2015
- Dong Wu
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR PROVIDING ELECTROMAGNETIC IMAGING THROUGH ELE...
- Publication number 20140159748
- Publication date Jun 12, 2014
- Massachusetts lnstitute of Technology
- Benjamin Louis Cannon
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HEAD
- Publication number 20140096293
- Publication date Apr 3, 2014
- Hitachi High-Technologies Corporation
- Yoshinori KITANO
- B82 - NANO-TECHNOLOGY
Information Patent Application
APPARATUS AND A METHOD FOR INVESTIGATING A SAMPLE BY MEANS OF SEVER...
- Publication number 20140016119
- Publication date Jan 16, 2014
- GERD BEHME
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR PROVIDING ELECTROMAGNETIC IMAGING THROUGH MAG...
- Publication number 20130271123
- Publication date Oct 17, 2013
- David L. Trumper
- B82 - NANO-TECHNOLOGY
Information Patent Application
MEASUREMENT OF THE SURFACE POTENTIAL OF A MATERIAL
- Publication number 20120304342
- Publication date Nov 29, 2012
- UNIVERSITE DES SCIENCES ET TECHNOLOGIES DE LILLE
- Thierry Melin
- B82 - NANO-TECHNOLOGY
Information Patent Application
REAL SPACE MAPPING OF IONIC DIFFUSION AND ELECTROCHEMICAL ACTIVITY...
- Publication number 20120125783
- Publication date May 24, 2012
- Sergei V. Kalinin
- G01 - MEASURING TESTING
Information Patent Application
DETECTION AND CHARACTERIZATION OF LASER-INDUCED HEAT AFFECTED ZONES...
- Publication number 20110302677
- Publication date Dec 8, 2011
- Amaranth Medical Pte.
- Kamal RAMZIPOOR
- G01 - MEASURING TESTING
Information Patent Application
Probe Microscope
- Publication number 20100306886
- Publication date Dec 2, 2010
- Hitachi, Ltd
- Motoko HARADA
- G01 - MEASURING TESTING
Information Patent Application
MULTIFUNCTIONAL MICROPIPETTE BIOLOGICAL SENSOR
- Publication number 20100285210
- Publication date Nov 11, 2010
- University of North Texas
- Tae-Youl Choi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SYSTEM AND METHOD FOR PROVIDING ELECTROMAGNETIC IMAGING THROUGH MAG...
- Publication number 20100253332
- Publication date Oct 7, 2010
- Massachusetts Institute of Technology
- David L. Trumper
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR PROVIDING ELECTROMAGNETIC IMAGING THROUGH ELE...
- Publication number 20100194374
- Publication date Aug 5, 2010
- Massachusetts Institute of Technology
- David L. Trumper
- G01 - MEASURING TESTING
Information Patent Application
NEAR FIELD SCANNING MEASUREMENT-ALTERNATING CURRENT-SCANNING ELECTR...
- Publication number 20100115673
- Publication date May 6, 2010
- Christine Kranz
- G01 - MEASURING TESTING
Information Patent Application
PROBE ARRANGEMENT
- Publication number 20080302960
- Publication date Dec 11, 2008
- Andre Meister
- G01 - MEASURING TESTING
Information Patent Application
SPIN MICROSCOPE BASED ON OPTICALLY DETECTED MAGNETIC RESONANCE
- Publication number 20080173812
- Publication date Jul 24, 2008
- Gennady P. Berman
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for detecting magnetic signals and signals of electric tu...
- Publication number 20070268016
- Publication date Nov 22, 2007
- Cheng-Chung Chi
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope assembly and method for making spectropho...
- Publication number 20060237639
- Publication date Oct 26, 2006
- General Nanotechnology LLC
- Victor B. Kley
- G02 - OPTICS
Information Patent Application
Sensors for electrochemical, electrical or topographical analysis
- Publication number 20060213259
- Publication date Sep 28, 2006
- Friedrich B. Prinz
- G01 - MEASURING TESTING
Information Patent Application
Electrical scanning probe microscope apparatus
- Publication number 20050269510
- Publication date Dec 8, 2005
- NATIONAL APPLIED RESEARCH LABORATORIES
- Mao-Nan Chang
- G01 - MEASURING TESTING
Information Patent Application
Sample for simultaneously conducting electro-chemical and topograph...
- Publication number 20040004182
- Publication date Jan 8, 2004
- Christine Kranz
- G01 - MEASURING TESTING
Information Patent Application
Method for producing a device for simultaneously carrying out an el...
- Publication number 20030190425
- Publication date Oct 9, 2003
- Alois Lugstein
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope assembly
- Publication number 20020135755
- Publication date Sep 26, 2002
- Victor B. Kley
- B82 - NANO-TECHNOLOGY

Multiple-type SPM

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Scanning probe microscope with case and elastic body

Method for producing a probe suitable for scanning probe microscopy

Numerically controlled rotary probe switching device based on envir...

Methods, systems, and computer readable media for dual resonance fr...

System and method for providing electromagnetic imaging through ele...

Apparatus and a method for investigating a sample by means of sever...

Measurement of the surface potential of a material

System and method for providing electromagnetic imaging through mag...

Real space mapping of ionic diffusion and electrochemical activity...

System and method for providing electromagnetic imaging through ele...

Multifunctional micropipette biological sensor

System and method for providing electromagnetic imaging through mag...

Probe arrangement

Scanning probe microscope assembly and method for making spectropho...

Spin microscope based on optically detected magnetic resonance

Sensors for electrochemical, electrical or topographical analysis

Spin microscope based on optically detected magnetic resonance

Electrical scanning probe microscope apparatus

Scanning probe microscope assembly

Method for producing a device for simultaneously carrying out an el...

Near-field magneto-optical microscope

Device for simultaneously carrying out an electrochemical and a top...

Scanning probe microscope assembly and method for making confocal,...

Method and device for tunnel microscopy

Multi-probe test head and process using same

Scanning probe microscope assembly and method for making confocal,...

Scanning probe microscope assembly and method for making confocal,...

Scanning probe microscope assembly and method for making spectropho...

Scanning probe microscope assembly and method for making confocal,...

Scanning probe microscope assembly and method for making confocal,...

Patents Applicationslast 30 patents

Scanning Probe Microscope

Numerically Controlled Rotary Probe Switching Device Based on Envir...

SCANNING ION CONDUCTANCE MICROSCOPY

METHODS, SYSTEMS, AND COMPUTER READABLE MEDIA FOR DUAL RESONANCE FR...

SYSTEM AND METHOD FOR PROVIDING ELECTROMAGNETIC IMAGING THROUGH ELE...

METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HEAD

APPARATUS AND A METHOD FOR INVESTIGATING A SAMPLE BY MEANS OF SEVER...

SYSTEM AND METHOD FOR PROVIDING ELECTROMAGNETIC IMAGING THROUGH MAG...

MEASUREMENT OF THE SURFACE POTENTIAL OF A MATERIAL

REAL SPACE MAPPING OF IONIC DIFFUSION AND ELECTROCHEMICAL ACTIVITY...

DETECTION AND CHARACTERIZATION OF LASER-INDUCED HEAT AFFECTED ZONES...

Probe Microscope

MULTIFUNCTIONAL MICROPIPETTE BIOLOGICAL SENSOR

SYSTEM AND METHOD FOR PROVIDING ELECTROMAGNETIC IMAGING THROUGH MAG...

SYSTEM AND METHOD FOR PROVIDING ELECTROMAGNETIC IMAGING THROUGH ELE...

NEAR FIELD SCANNING MEASUREMENT-ALTERNATING CURRENT-SCANNING ELECTR...

PROBE ARRANGEMENT

SPIN MICROSCOPE BASED ON OPTICALLY DETECTED MAGNETIC RESONANCE

Apparatus for detecting magnetic signals and signals of electric tu...

Scanning probe microscope assembly and method for making spectropho...

Sensors for electrochemical, electrical or topographical analysis

Electrical scanning probe microscope apparatus

Sample for simultaneously conducting electro-chemical and topograph...

Method for producing a device for simultaneously carrying out an el...

Scanning probe microscope assembly