needle shaped

Industry

CPC
H01J2201/30415

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2201/00Electrodes common to discharge tubes

Current Industry

H01J2201/30415needle shaped

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Field-emission type electron source and charged particle beam devic...
- Patent number 11,935,720
- Issue date Mar 19, 2024
- Dazhi Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field-emission type electron source and charged particle beam devic...
- Patent number 11,848,169
- Issue date Dec 19, 2023
- Dazhi Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of producing microrods for electron emitters, and associated...
- Patent number 11,651,924
- Issue date May 16, 2023
- FEI Company
- Kun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cathode structure for cold field electron emission and method of fa...
- Patent number 11,158,479
- Issue date Oct 26, 2021
- National University of Singapore
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Iridium tip, gas field ion source, focused ion beam apparatus, elec...
- Patent number 9,773,634
- Issue date Sep 26, 2017
- Hitachi High-Tech Science Corporation
- Tomokazu Kozakai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Iridium tip, gas field ion source, focused ion beam apparatus, elec...
- Patent number 9,583,299
- Issue date Feb 28, 2017
- Hitachi High-Tech Science Corporation
- Tomokazu Kozakai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun emitting under high voltage, in particular for electro...
- Patent number 9,048,057
- Issue date Jun 2, 2015
- Centre National de la Recherche Scientifique (Cnrs)
- Marc Monthioux
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Particle sources and methods for manufacturing the same
- Patent number 9,017,562
- Issue date Apr 28, 2015
- 38th Research Institute, China Electronics Technology Group Corporation
- Huarong Liu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Two-wafer MEMS ionization device
- Patent number 8,779,531
- Issue date Jul 15, 2014
- UTC Fire & Security Corporation
- Joseph V. Mantese
- G08 - SIGNALLING
Information Patent Grant
Electron beam source and method of manufacturing the same
- Patent number 8,164,071
- Issue date Apr 24, 2012
- Carl Zeiss NTS GmbH
- Volker Drexel
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Field emission array having carbon microstructure and method of man...
- Patent number 8,017,413
- Issue date Sep 13, 2011
- Korea Advanced Institute of Science and Technology
- Seung Seob Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field emission electron source having a carbon nanotube needle
- Patent number 8,013,505
- Issue date Sep 6, 2011
- Tsinghua University
- Yang Wei
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CATHODE STRUCTURE FOR COLD FIELD ELECTRON EMISSION AND METHOD OF FA...
- Publication number 20210159038
- Publication date May 27, 2021
- National University of Singapore
- Anjam KHURSHEED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Iridium Tip, Gas Field Ion Source, Focused Ion Beam Apparatus, Elec...
- Publication number 20170148603
- Publication date May 25, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Tomokazu Kozakai
- G01 - MEASURING TESTING
Information Patent Application
FIELD EMISSION DEVICES AND METHODS OF MANUFACTURING GATE ELECTRODES...
- Publication number 20150060757
- Publication date Mar 5, 2015
- KUMOH NATIONAL INSTITUTE OF TECHNOLOGY
- Dong-gu LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD EMISSION DEVICES AND METHODS OF MANUFACTURING EMITTERS THEREOF
- Publication number 20150060758
- Publication date Mar 5, 2015
- Kumoh National Institute of Technology - Academic Cooperation Foundation
- Donggu LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN EMITTING UNDER HIGH VOLTAGE, IN PARTICULAR FOR ELECTRO...
- Publication number 20130234025
- Publication date Sep 12, 2013
- Centre National De La Recherche Scientifique (CNRS)
- Marc Monthioux
- B82 - NANO-TECHNOLOGY
Information Patent Application
TWO-WAFER MEMS IONIZATION DEVICE
- Publication number 20130168781
- Publication date Jul 4, 2013
- UTC FIRE & SECURITY CORPORATION
- Joseph V. Mantese
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE SOURCES AND METHODS FOR MANUFACTURING THE SAME
- Publication number 20130112138
- Publication date May 9, 2013
- 38th Research Institute, China Electronics Technology Group Corporation
- Huarong LIU
- B82 - NANO-TECHNOLOGY
Information Patent Application
ELECTRON BEAM SOURCE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20120131785
- Publication date May 31, 2012
- NANOTOOLS GMBH
- Volker Drexel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD EMISSION ARRAY HAVING CARBON MICROSTRUCTURE AND METHOD OF MAN...
- Publication number 20110089396
- Publication date Apr 21, 2011
- Korea Advanced Institute of Science and Technology
- Seung Seob Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING METHOD OF ELECTRON SOURCE
- Publication number 20110036810
- Publication date Feb 17, 2011
- Fumihiro Nakahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM SOURCE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20100078557
- Publication date Apr 1, 2010
- CARL ZEISS NTS GMBH
- Volker Drexel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PREPARING AN ULTRA SHARP TIP, APPARATUS FOR PREPARING AN...
- Publication number 20100006447
- Publication date Jan 14, 2010
- ICT, INTEGRATED CIRCUIT TESTING GESELLSCHAFT FUER HALBLEITERPRUEFTECHNIK MBH
- Dieter WINKLER
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Field emission electron source having carbon nanotubes
- Publication number 20090236961
- Publication date Sep 24, 2009
- Tsinghua University
- Yang Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and Methods for Growing Nanofibres and Nanotips
- Publication number 20090078561
- Publication date Mar 26, 2009
- Kenneth Boh Khin Teo
- G01 - MEASURING TESTING

needle shaped

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Field-emission type electron source and charged particle beam devic...

Field-emission type electron source and charged particle beam devic...

Method of producing microrods for electron emitters, and associated...

Cathode structure for cold field electron emission and method of fa...

Iridium tip, gas field ion source, focused ion beam apparatus, elec...

Iridium tip, gas field ion source, focused ion beam apparatus, elec...

Electron gun emitting under high voltage, in particular for electro...

Particle sources and methods for manufacturing the same

Two-wafer MEMS ionization device

Electron beam source and method of manufacturing the same

Field emission array having carbon microstructure and method of man...

Field emission electron source having a carbon nanotube needle

Patents Applicationslast 30 patents

CATHODE STRUCTURE FOR COLD FIELD ELECTRON EMISSION AND METHOD OF FA...

Iridium Tip, Gas Field Ion Source, Focused Ion Beam Apparatus, Elec...

FIELD EMISSION DEVICES AND METHODS OF MANUFACTURING GATE ELECTRODES...

FIELD EMISSION DEVICES AND METHODS OF MANUFACTURING EMITTERS THEREOF

ELECTRON GUN EMITTING UNDER HIGH VOLTAGE, IN PARTICULAR FOR ELECTRO...

TWO-WAFER MEMS IONIZATION DEVICE

PARTICLE SOURCES AND METHODS FOR MANUFACTURING THE SAME

ELECTRON BEAM SOURCE AND METHOD OF MANUFACTURING THE SAME

FIELD EMISSION ARRAY HAVING CARBON MICROSTRUCTURE AND METHOD OF MAN...

MANUFACTURING METHOD OF ELECTRON SOURCE

ELECTRON BEAM SOURCE AND METHOD OF MANUFACTURING THE SAME

METHOD OF PREPARING AN ULTRA SHARP TIP, APPARATUS FOR PREPARING AN...

Field emission electron source having carbon nanotubes

Apparatus and Methods for Growing Nanofibres and Nanotips