Membership
Tour
Register
Log in
Niobium (Nb) as principal constituent
Follow
Industry
CPC
H01L2224/45179
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
H
ELECTRICITY
H01
Electric elements
H01L
SEMICONDUCTOR DEVICES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
H01L2224/00
Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
Current Industry
H01L2224/45179
Niobium (Nb) as principal constituent
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device and inspection device
Patent number
12,040,303
Issue date
Jul 16, 2024
Kabushiki Kaisha Toshiba
Mitsuaki Kato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Cryogenic electronic packages and assemblies
Patent number
10,586,909
Issue date
Mar 10, 2020
Massachusetts Institute of Technology
Rabindra N. Das
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Electronic component of a high frequency current suppression type a...
Patent number
6,903,440
Issue date
Jun 7, 2005
NEC Tokin Corp.
Shigeyoshi Yoshida
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Electronic component of a high frequency current suppression type a...
Patent number
6,635,961
Issue date
Oct 21, 2003
NEC Tokin Corp.
Shigeyoshi Yoshida
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method of making super conducting bonds for thin film devices
Patent number
5,592,732
Issue date
Jan 14, 1997
Wisconsin Alumni Research Foundation
Arthur C. Leuthold
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Superconducting bonds for thin film devices
Patent number
5,110,034
Issue date
May 5, 1992
Quantum Magnetics, Inc.
Michael B. Simmonds
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR DEVICE AND INSPECTION DEVICE
Publication number
20210296279
Publication date
Sep 23, 2021
Kabushiki Kaisha Toshiba
Mitsuaki KATO
G01 - MEASURING TESTING
Information
Patent Application
Electronic component of a high frequency current suppression type a...
Publication number
20040188833
Publication date
Sep 30, 2004
Shigeyoshi Yoshida
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Electronic component of a high frequency current suppression type a...
Publication number
20010026016
Publication date
Oct 4, 2001
Shigeyoshi Yoshida
H01 - BASIC ELECTRIC ELEMENTS