object rotates

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CPC
G01N2223/3306

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/3306object rotates

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Secondary image removal using high resolution x-ray transmission so...
- Patent number 12,181,423
- Issue date Dec 31, 2024
- Sigray, Inc.
- Sylvia Jia Yun Lewis
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Rotational X-ray inspection system and method
- Patent number 12,061,156
- Issue date Aug 13, 2024
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
Battery holder device and battery test system including the same
- Patent number 12,061,157
- Issue date Aug 13, 2024
- SK ON CO., LTD.
- Hye Ju Jang
- G01 - MEASURING TESTING
Information Patent Grant
Transmissive small-angle scattering device
- Patent number 12,019,036
- Issue date Jun 25, 2024
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
X-ray beam shaping apparatus and method
- Patent number 12,007,343
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Grant
Ore component analysis device and method
- Patent number 11,953,455
- Issue date Apr 9, 2024
- SHANDONG UNIVERSITY
- Chen Liu
- G01 - MEASURING TESTING
Information Patent Grant
Device for hosting a probe solution of molecules in a plurality of...
- Patent number 11,933,746
- Issue date Mar 19, 2024
- Paul Scherrer Institut
- Soichiro Tsujino
- G01 - MEASURING TESTING
Information Patent Grant
Screening system
- Patent number 11,913,890
- Issue date Feb 27, 2024
- Halo X Ray Technologies Limited
- Anthony Dicken
- G01 - MEASURING TESTING
Information Patent Grant
Fast industrial CT scanning system and method
- Patent number 11,821,853
- Issue date Nov 21, 2023
- Shandong University
- Jipeng Wang
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectroscopic analysis apparatus and elemental analysis method
- Patent number 11,796,491
- Issue date Oct 24, 2023
- Shimadzu Corporation
- Shinji Miyauchi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatuses and methods for combined simultaneous analyses of mater...
- Patent number 11,796,492
- Issue date Oct 24, 2023
- INEL S.A.S.
- Henry Pilliere
- G01 - MEASURING TESTING
Information Patent Grant
Transmissive small-angle scattering device
- Patent number 11,754,515
- Issue date Sep 12, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device and control method thereof
- Patent number 11,742,172
- Issue date Aug 29, 2023
- HITACHI HIGH-TECH CORPORATION
- Takashi Dobashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Specimen radiography system comprising cabinet and a specimen drawe...
- Patent number 11,730,434
- Issue date Aug 22, 2023
- Hologic, Inc.
- Kenneth Defreitas
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray inspection device, management server for X-ray inspection dev...
- Patent number 11,656,189
- Issue date May 23, 2023
- Shimadzu Corporation
- Futoshi Ueki
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device, inspection method, and method for producing obje...
- Patent number 11,639,904
- Issue date May 2, 2023
- Nikon Corporation
- Takeshi Ohbayashi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray seed imaging system, cabinet x-ray device, and methods of eva...
- Patent number 11,630,095
- Issue date Apr 18, 2023
- Monsanto Technology LLC
- Eric Borrowman
- G01 - MEASURING TESTING
Information Patent Grant
CT scanner and method for performing a CT examination of an object
- Patent number 11,609,189
- Issue date Mar 21, 2023
- BIOMETIC S.R.L.
- Thomas Prenn
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Fast industrial, computed tomography for large objects
- Patent number 11,585,767
- Issue date Feb 21, 2023
- GE Sensing & Inspection Technologies GmbH
- Eberhard Neuser
- G01 - MEASURING TESTING
Information Patent Grant
Method acquiring projection image, control apparatus, control progr...
- Patent number 11,543,367
- Issue date Jan 3, 2023
- Rigaku Corporation
- Yoshihiro Takeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for analysing and processing granular material
- Patent number 11,519,868
- Issue date Dec 6, 2022
- Sorterra Global Pty Ltd
- Jan Verboomen
- G01 - MEASURING TESTING
Information Patent Grant
Scanner load frame
- Patent number 11,448,605
- Issue date Sep 20, 2022
- PSYLOTECH, INC.
- G. Alexis Arzoumanidis
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for performing a tomographic examination of an...
- Patent number 11,428,648
- Issue date Aug 30, 2022
- Microtec S.R.L.
- Enrico Ursella
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analysis method for fine structure, and apparatus and program thereof
- Patent number 11,408,837
- Issue date Aug 9, 2022
- Rigaku Corporation
- Yoshiyasu Ito
- G01 - MEASURING TESTING
Information Patent Grant
Tomographic imaging system and connection assembly thereof
- Patent number 11,378,528
- Issue date Jul 5, 2022
- Delta Electronics, Inc.
- Fu-Xuan Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Nanofabricated structures for sub-beam resolution and spectral enha...
- Patent number 11,340,179
- Issue date May 24, 2022
- BAE Systems Information and Electronic System Integration INC
- Eugene M. Lavely
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing separator roll
- Patent number 11,322,795
- Issue date May 3, 2022
- Sumitomo Chemical Company, Limited
- Yoshitaka Shinomiya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adaption for a turntable of a CT system
- Patent number 11,262,318
- Issue date Mar 1, 2022
- Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung E.V.
- Michael Salamon
- G01 - MEASURING TESTING
Information Patent Grant
System and method for computed laminography x-ray fluorescence imaging
- Patent number 11,143,605
- Issue date Oct 12, 2021
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR COMPUTED TOMOGRAPHY INACCURACY COMPENSATION
- Publication number 20240420386
- Publication date Dec 19, 2024
- Baker Hughes Holdings LLC
- Alexander Suppes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION DEVICE USED FOR SCANNING AND INSPECTING OBJECT TO BE INS...
- Publication number 20240410838
- Publication date Dec 12, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
ATTITUDE ADJUSTMENT STRUCTURE, CONVEYING DEVICE, RADIATION IMAGING...
- Publication number 20240410837
- Publication date Dec 12, 2024
- Nuctech Company Limited
- Qingping HUANG
- G01 - MEASURING TESTING
Information Patent Application
BATTERY HOLDER DEVICE AND BATTERY TEST SYSTEM INCLUDING THE SAME
- Publication number 20240345004
- Publication date Oct 17, 2024
- SK On Co., Ltd.
- Hye Ju JANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CYCLIC IMAGING A ROCK SAMPLE
- Publication number 20240328966
- Publication date Oct 3, 2024
- Saudi Arabian Oil Company
- Sinan Caliskan
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SCANNING OF AN OBJECT IN A SCANNING APPARATUS
- Publication number 20240295509
- Publication date Sep 5, 2024
- Rolls-Royce plc
- Akhil MULLOTH
- G01 - MEASURING TESTING
Information Patent Application
MACHINE FOR THE COMPOSITE SCANNING OF OBJECTS
- Publication number 20240295510
- Publication date Sep 5, 2024
- GILARDONI S.P.A.
- Davide Baratto
- G01 - MEASURING TESTING
Information Patent Application
CELL ASSEMBLY FOR ELECTRODE STRUCTURAL OBSERVATION
- Publication number 20240264097
- Publication date Aug 8, 2024
- Honda Motor Co., Ltd.
- Atsushi SAKURAI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SCANNING OF OBJECTS IN A SCANNING APPARATUS
- Publication number 20240219320
- Publication date Jul 4, 2024
- Rolls-Royce plc
- Akhil MULLOTH
- G01 - MEASURING TESTING
Information Patent Application
X-RAY PHASE IMAGING APPARATUS AND X-RAY PHASE IMAGING METHOD
- Publication number 20240102946
- Publication date Mar 28, 2024
- Shimadzu Corporation
- Kana KOJIMA
- G01 - MEASURING TESTING
Information Patent Application
RAPID X-RAY RADIATION IMAGING SYSTEM AND RELATED METHOD
- Publication number 20240102944
- Publication date Mar 28, 2024
- JST POWER EQUIPMENT, INC.
- Haoning Liang
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Generating High-Energy Three-Dimensional Co...
- Publication number 20240094147
- Publication date Mar 21, 2024
- Rapiscan Holdings, Inc.
- Mark Procter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Monitoring properties of X-ray beam during X-ray analysis
- Publication number 20240077437
- Publication date Mar 7, 2024
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Application
Rapid High-Resolution Computerized Tomography
- Publication number 20240044811
- Publication date Feb 8, 2024
- Baker Hughes Holdings LLC
- Eberhard Neuser
- G01 - MEASURING TESTING
Information Patent Application
Rotational X-ray Inspection System and Method
- Publication number 20240044812
- Publication date Feb 8, 2024
- Viken Detection Corporation
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN RADIOGRAPHY SYSTEM COMPRISING CABINET AND A SPECIMEN DRAWE...
- Publication number 20230404499
- Publication date Dec 21, 2023
- HOLOGIC, INC.
- Kenneth DEFREITAS
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
- Publication number 20230384248
- Publication date Nov 30, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
- Publication number 20230375485
- Publication date Nov 23, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
AN X-RAY INSPECTION SYSTEM, AN X-RAY IMAGING ACCESSORY, A SAMPLE SU...
- Publication number 20230304946
- Publication date Sep 28, 2023
- Nordson Corporation
- Bill Walker
- G01 - MEASURING TESTING
Information Patent Application
A Detection System and Method for Investigating a Content of an Item
- Publication number 20230266257
- Publication date Aug 24, 2023
- Dynaxion B.V.
- Emma Wooldridge
- G01 - MEASURING TESTING
Information Patent Application
ROTARY IMAGING SYSTEM, PLANT IMAGER, ANIMAL IMAGER, AND ANIMAL AND...
- Publication number 20230263490
- Publication date Aug 24, 2023
- CLINX SCIENCE INSTRUMENTS CO., LTD
- Rongwei CAI
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHODS FOR ANALYZING INTERMOLECULAR INTERACTIONS IN MICROCRYSTALS
- Publication number 20230228695
- Publication date Jul 20, 2023
- The Regents of the University of California
- Tamir Gonen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
3D Particle Analysis and Separation Using Dual Seeding
- Publication number 20230143179
- Publication date May 11, 2023
- Carl Zeiss X-ray Microscopy, Inc.
- Evan Drake
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and system for analytical X-ray calibration, reconstruction...
- Publication number 20230143112
- Publication date May 11, 2023
- Carl Zeiss X-ray Microscopy, Inc.
- Matthew Andrew
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH RESOLUTION CONTINUOUS ROTATION INDUSTRIAL RADIOGRAPHY IMAGING...
- Publication number 20230083059
- Publication date Mar 16, 2023
- Illinois Tool Works Inc.
- Camaron Mitchell Lemmer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING SHORT-WAVELENGTH CHARACTERISTIC X-R...
- Publication number 20220412901
- Publication date Dec 29, 2022
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin ZHENG
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR HOSTING A PROBE SOLUTION OF MOLECULES IN A PLURALITY OF...
- Publication number 20220404296
- Publication date Dec 22, 2022
- PAUL SCHERRER INSTITUT
- Soichiro Tsujino
- G01 - MEASURING TESTING
Information Patent Application
BELOW-GROUND COMPUTED TOMOGRAPHY CARGO INSPECTION SYSTEM AND METHOD
- Publication number 20220390391
- Publication date Dec 8, 2022
- SMITHS DETECTION INC.
- Joseph BENDAHAN
- G01 - MEASURING TESTING
Information Patent Application
RAPID X-RAY RADIATION IMAGING SYSTEM AND MOBILE IMAGING SYSTEM
- Publication number 20220326165
- Publication date Oct 13, 2022
- JST POWER EQUIPMENT, INC.
- Haoning Liang
- G01 - MEASURING TESTING
Information Patent Application
FAST INDUSTRIAL CT SCANNING SYSTEM AND METHOD
- Publication number 20220244196
- Publication date Aug 4, 2022
- SHANDONG UNIVERSITY
- Jipeng Wang
- G01 - MEASURING TESTING

object rotates

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Secondary image removal using high resolution x-ray transmission so...

Device and method for measuring short-wavelength characteristic X-r...

Rotational X-ray inspection system and method

Battery holder device and battery test system including the same

Transmissive small-angle scattering device

X-ray beam shaping apparatus and method

Ore component analysis device and method

Device for hosting a probe solution of molecules in a plurality of...

Screening system

Fast industrial CT scanning system and method

X-ray spectroscopic analysis apparatus and elemental analysis method

Apparatuses and methods for combined simultaneous analyses of mater...

Transmissive small-angle scattering device

Charged particle beam device and control method thereof

Specimen radiography system comprising cabinet and a specimen drawe...

X-ray inspection device, management server for X-ray inspection dev...

Inspection device, inspection method, and method for producing obje...

X-ray seed imaging system, cabinet x-ray device, and methods of eva...

CT scanner and method for performing a CT examination of an object

Fast industrial, computed tomography for large objects

Method acquiring projection image, control apparatus, control progr...

Apparatus and method for analysing and processing granular material

Scanner load frame

Method and apparatus for performing a tomographic examination of an...

Analysis method for fine structure, and apparatus and program thereof

Tomographic imaging system and connection assembly thereof

Nanofabricated structures for sub-beam resolution and spectral enha...

Method for producing separator roll

Adaption for a turntable of a CT system

System and method for computed laminography x-ray fluorescence imaging

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR COMPUTED TOMOGRAPHY INACCURACY COMPENSATION

INSPECTION DEVICE USED FOR SCANNING AND INSPECTING OBJECT TO BE INS...

ATTITUDE ADJUSTMENT STRUCTURE, CONVEYING DEVICE, RADIATION IMAGING...

BATTERY HOLDER DEVICE AND BATTERY TEST SYSTEM INCLUDING THE SAME

METHOD AND APPARATUS FOR CYCLIC IMAGING A ROCK SAMPLE

METHOD FOR SCANNING OF AN OBJECT IN A SCANNING APPARATUS

MACHINE FOR THE COMPOSITE SCANNING OF OBJECTS

CELL ASSEMBLY FOR ELECTRODE STRUCTURAL OBSERVATION

METHOD FOR SCANNING OF OBJECTS IN A SCANNING APPARATUS

X-RAY PHASE IMAGING APPARATUS AND X-RAY PHASE IMAGING METHOD

RAPID X-RAY RADIATION IMAGING SYSTEM AND RELATED METHOD

Systems and Methods for Generating High-Energy Three-Dimensional Co...

Monitoring properties of X-ray beam during X-ray analysis

Rapid High-Resolution Computerized Tomography

Rotational X-ray Inspection System and Method

SPECIMEN RADIOGRAPHY SYSTEM COMPRISING CABINET AND A SPECIMEN DRAWE...

TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE

TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE

AN X-RAY INSPECTION SYSTEM, AN X-RAY IMAGING ACCESSORY, A SAMPLE SU...

A Detection System and Method for Investigating a Content of an Item

ROTARY IMAGING SYSTEM, PLANT IMAGER, ANIMAL IMAGER, AND ANIMAL AND...

METHODS FOR ANALYZING INTERMOLECULAR INTERACTIONS IN MICROCRYSTALS

3D Particle Analysis and Separation Using Dual Seeding

Method and system for analytical X-ray calibration, reconstruction...

HIGH RESOLUTION CONTINUOUS ROTATION INDUSTRIAL RADIOGRAPHY IMAGING...

DEVICE AND METHOD FOR MEASURING SHORT-WAVELENGTH CHARACTERISTIC X-R...

DEVICE FOR HOSTING A PROBE SOLUTION OF MOLECULES IN A PLURALITY OF...

BELOW-GROUND COMPUTED TOMOGRAPHY CARGO INSPECTION SYSTEM AND METHOD

RAPID X-RAY RADIATION IMAGING SYSTEM AND MOBILE IMAGING SYSTEM

FAST INDUSTRIAL CT SCANNING SYSTEM AND METHOD