Observing the objects or the point of impact on the object

Industry

CPC
H01J37/3005

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

Current Industry

H01J37/3005Observing the objects or the point of impact on the object

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Systems, devices, and methods for aligning a particle beam and perf...
- Patent number 12,020,897
- Issue date Jun 25, 2024
- PDF Solutions, Inc.
- Indranil De
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for cross-sectioning a sample with a preset thick...
- Patent number RE50001
- Issue date Jun 4, 2024
- FIBICS INCORPORATED
- Michael William Phaneuf
Information Patent Grant
Methods and structures for semiconductor device testing
- Patent number 11,982,709
- Issue date May 14, 2024
- Yangtze Memory Technologies Co., Ltd.
- Lin Qi
- G01 - MEASURING TESTING
Information Patent Grant
Microscopy imaging method for 3D tomography with predictive drift t...
- Patent number 11,923,168
- Issue date Mar 5, 2024
- FIBICS INCORPORATED
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Processing an object using a material processing device
- Patent number 11,862,428
- Issue date Jan 2, 2024
- Carl Zeiss Microscopy GmbH
- Fabian Perez-Willard
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Writing data generating method, multi charged particle beam writing...
- Patent number 11,774,860
- Issue date Oct 3, 2023
- NuFlare Technology, Inc.
- Kenichi Yasui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FIB delayering endpoint detection by monitoring sputtered materials...
- Patent number 11,694,934
- Issue date Jul 4, 2023
- Applied Materials Israel Ltd.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Uniform milling of adjacent materials using parallel scanning fib
- Patent number 11,636,997
- Issue date Apr 25, 2023
- Applied Materials Israel Ltd.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems, devices, and methods for aligning a particle beam and perf...
- Patent number 11,605,526
- Issue date Mar 14, 2023
- PDF Solutions, Inc.
- Indranil De
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for iteratively cross-sectioning a sample to corr...
- Patent number 11,462,383
- Issue date Oct 4, 2022
- Fibics Incorporated
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam inspection of ungrounded samples
- Patent number 11,448,607
- Issue date Sep 20, 2022
- ASML Netherlands B.V.
- Chiyan Kuan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for generating reciprocal space map
- Patent number 11,430,632
- Issue date Aug 30, 2022
- FEI Company
- Andrew Barnum
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,430,630
- Issue date Aug 30, 2022
- Hitachi High-Technologies Corporation
- Ryo Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,385,192
- Issue date Jul 12, 2022
- NuFlare Technology, Inc.
- Masataka Shiratsuchi
- G01 - MEASURING TESTING
Information Patent Grant
System and method for spatially resolved optical metrology of an io...
- Patent number 11,380,517
- Issue date Jul 5, 2022
- Applied Materials, Inc.
- Gang Shu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Line-based endpoint detection
- Patent number 11,355,313
- Issue date Jun 7, 2022
- FEI Company
- Brian Routh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam irradiation apparatus
- Patent number 11,335,534
- Issue date May 17, 2022
- Hitachi High-Tech Science Corporation
- Takuma Aso
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for aligning a particle beam and performing a non-contact e...
- Patent number 11,328,899
- Issue date May 10, 2022
- PDF Solutions, Inc.
- Indranil De
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Holes tilt angle measurement using FIB diagonal cut
- Patent number 11,280,749
- Issue date Mar 22, 2022
- Applied Materials Israel Ltd.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection device
- Patent number 11,276,551
- Issue date Mar 15, 2022
- Hitachi, Ltd.
- Atsuko Shintani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fixture for vapor deposition system
- Patent number 11,276,556
- Issue date Mar 15, 2022
- Raytheon Technologies Corporation
- James W. Neal
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Detecting method and detecting equipment therefor
- Patent number 11,237,414
- Issue date Feb 1, 2022
- HKC CORPORATION LIMITED
- Chung-Kuang Chien
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,239,046
- Issue date Feb 1, 2022
- Hitachi High-Tech Science Corporation
- Ayana Muraki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Writing data generating method, multi charged particle beam writing...
- Patent number 11,199,781
- Issue date Dec 14, 2021
- NuFlare Technology, Inc.
- Kenichi Yasui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
End-point detection for similar adjacent materials
- Patent number 11,199,401
- Issue date Dec 14, 2021
- Applied Materials Israel Ltd.
- Yehuda Zur
- G01 - MEASURING TESTING
Information Patent Grant
Dual beam microscope system for imaging during sample processing
- Patent number 11,183,364
- Issue date Nov 23, 2021
- FEI Company
- Yuchen Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion milling device
- Patent number 11,133,153
- Issue date Sep 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Toru Iwaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of preparing thin film sample piece and charged particle bea...
- Patent number 11,094,503
- Issue date Aug 17, 2021
- Hitachi High-Tech Science Corporation
- Masato Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Depth-controllable ion milling
- Patent number 11,049,690
- Issue date Jun 29, 2021
- SELA—SOLUTIONS ENABLING NANO ANALYSIS LTD.
- Vladimir Zheleznyak
- G01 - MEASURING TESTING
Information Patent Grant
Sample holder system and sample observation apparatus
- Patent number 10,930,467
- Issue date Feb 23, 2021
- Jeol Ltd.
- Tsutomu Negishi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Integrated Circuit with FIB-Ready Structures
- Publication number 20240321548
- Publication date Sep 26, 2024
- Nuvoton Technology Corporation
- Yuval Kirschner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERF...
- Publication number 20240304414
- Publication date Sep 12, 2024
- PDF Solutions, Inc.
- Indranil DE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PREPARING A SAMPLE FOR TRANSMISSION ELECTRON MICROSCOPY (...
- Publication number 20240297015
- Publication date Sep 5, 2024
- FEI Company
- Ludek Cervinka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC TWEEZERS
- Publication number 20240234084
- Publication date Jul 11, 2024
- Zhejiang University
- He TIAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Processor System, Correction Method, and Correction Program
- Publication number 20240222064
- Publication date Jul 4, 2024
- HITACHI HIGH-TECH CORPORATION
- Mayuka OSAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPY IMAGING METHOD AND SYSTEM
- Publication number 20240177966
- Publication date May 30, 2024
- Fibics Incorporated
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONIC TWEEZERS
- Publication number 20240136149
- Publication date Apr 25, 2024
- Zhejiang University
- He TIAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENHANCED DEPOSITION RATE BY APPLYING A NEGATIVE VOLTAGE TO A GAS IN...
- Publication number 20240105421
- Publication date Mar 28, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD AND APPARATUS FOR PREPARING SAMPLES FOR IMAGING
- Publication number 20240038486
- Publication date Feb 1, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu-Ching Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND STRUCTURES FOR SEMICONDUCTOR DEVICE TESTING
- Publication number 20230375616
- Publication date Nov 23, 2023
- Yangtze Memory Technologies Co., Ltd.
- Lin QI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERF...
- Publication number 20230282444
- Publication date Sep 7, 2023
- PDF Solutions, Inc.
- Indranil DE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Tweezers, Conveyance Device, and Method for Conveying Sample Piece
- Publication number 20230268156
- Publication date Aug 24, 2023
- Hitachi High-Tech Corporation
- Naoki SAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPY FEEDBACK FOR IMPROVED MILLING ACCURACY
- Publication number 20230197403
- Publication date Jun 22, 2023
- FEI Company
- Thomas Gary Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method Of Imaging And Milling A Sample
- Publication number 20230162945
- Publication date May 25, 2023
- FEI Company
- Jaroslav Velcovský
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
FIB DELAYERING ENDPOINT DETECTION BY MONITORING SPUTTERED MATERIALS...
- Publication number 20230104390
- Publication date Apr 6, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PROCESSING AN OBJECT USING A MATERIAL PROCESSING DEVICE,...
- Publication number 20230097540
- Publication date Mar 30, 2023
- CARL ZEISS MICROSCOPY GMBH
- Fabian Perez Willard
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPY IMAGING METHOD AND SYSTEM
- Publication number 20230044598
- Publication date Feb 9, 2023
- Fibics Incorporated
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING DISCHARGE SITE
- Publication number 20230028337
- Publication date Jan 26, 2023
- NuFlare Technology, Inc.
- Toru ARIIZUMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERF...
- Publication number 20220336187
- Publication date Oct 20, 2022
- PDF Solutions, Inc.
- Indranil DE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR GENERATING RECIPROCAL SPACE MAP
- Publication number 20220181117
- Publication date Jun 9, 2022
- FEI Company
- Andrew Barnum
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY REFERENCE OBJECT, X-RAY DETECTOR, ADDITIVE MANUFACTURING APPA...
- Publication number 20220143709
- Publication date May 12, 2022
- Arcam AB
- Christian Ekberg
- B22 - CASTING POWDER METALLURGY
Information Patent Application
WRITING DATA GENERATING METHOD, MULTI CHARGED PARTICLE BEAM WRITING...
- Publication number 20220100099
- Publication date Mar 31, 2022
- NuFlare Technology, Inc.
- Kenichi YASUI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
UNIFORM MILLING OF ADJACENT MATERIALS USING PARALLEL SCANNING FIB
- Publication number 20220005670
- Publication date Jan 6, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LINE-BASED ENDPOINT DETECTION
- Publication number 20210407765
- Publication date Dec 30, 2021
- FEI Company
- Brian Routh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL BEAM MICROSCOPE SYSTEM FOR IMAGING DURING SAMPLE PROCESSING
- Publication number 20210391145
- Publication date Dec 16, 2021
- FEI Company
- Yuchen Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPY IMAGING METHOD AND SYSTEM
- Publication number 20210159046
- Publication date May 27, 2021
- Fibics Incorporated
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERF...
- Publication number 20210098229
- Publication date Apr 1, 2021
- Indranil DE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM IRRADIATION APPARATUS
- Publication number 20210090853
- Publication date Mar 25, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Takuma ASO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20210010959
- Publication date Jan 14, 2021
- NuFlare Technology, Inc.
- Masataka SHIRATSUCHI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE
- Publication number 20200365364
- Publication date Nov 19, 2020
- Hitachi, Ltd
- Atsuko SHINTANI
- H01 - BASIC ELECTRIC ELEMENTS

Observing the objects or the point of impact on the object

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems, devices, and methods for aligning a particle beam and perf...

Method and system for cross-sectioning a sample with a preset thick...

Methods and structures for semiconductor device testing

Microscopy imaging method for 3D tomography with predictive drift t...

Processing an object using a material processing device

Writing data generating method, multi charged particle beam writing...

FIB delayering endpoint detection by monitoring sputtered materials...

Uniform milling of adjacent materials using parallel scanning fib

Systems, devices, and methods for aligning a particle beam and perf...

Method and system for iteratively cross-sectioning a sample to corr...

Charged particle beam inspection of ungrounded samples

Method and system for generating reciprocal space map

Charged particle beam apparatus

Inspection apparatus and inspection method

System and method for spatially resolved optical metrology of an io...

Line-based endpoint detection

Particle beam irradiation apparatus

Methods for aligning a particle beam and performing a non-contact e...

Holes tilt angle measurement using FIB diagonal cut

Inspection device

Fixture for vapor deposition system

Detecting method and detecting equipment therefor

Charged particle beam apparatus

Writing data generating method, multi charged particle beam writing...

End-point detection for similar adjacent materials

Dual beam microscope system for imaging during sample processing

Ion milling device

Method of preparing thin film sample piece and charged particle bea...

Depth-controllable ion milling

Sample holder system and sample observation apparatus

Patents Applicationslast 30 patents

Integrated Circuit with FIB-Ready Structures

SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERF...

METHOD OF PREPARING A SAMPLE FOR TRANSMISSION ELECTRON MICROSCOPY (...

ELECTRONIC TWEEZERS

Processor System, Correction Method, and Correction Program

MICROSCOPY IMAGING METHOD AND SYSTEM

ELECTRONIC TWEEZERS

ENHANCED DEPOSITION RATE BY APPLYING A NEGATIVE VOLTAGE TO A GAS IN...

METHOD AND APPARATUS FOR PREPARING SAMPLES FOR IMAGING

METHODS AND STRUCTURES FOR SEMICONDUCTOR DEVICE TESTING

SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERF...

Tweezers, Conveyance Device, and Method for Conveying Sample Piece

MICROSCOPY FEEDBACK FOR IMPROVED MILLING ACCURACY

Method Of Imaging And Milling A Sample

FIB DELAYERING ENDPOINT DETECTION BY MONITORING SPUTTERED MATERIALS...

METHOD OF PROCESSING AN OBJECT USING A MATERIAL PROCESSING DEVICE,...

MICROSCOPY IMAGING METHOD AND SYSTEM

METHOD AND APPARATUS FOR DETECTING DISCHARGE SITE

SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERF...

METHOD AND SYSTEM FOR GENERATING RECIPROCAL SPACE MAP

X-RAY REFERENCE OBJECT, X-RAY DETECTOR, ADDITIVE MANUFACTURING APPA...

WRITING DATA GENERATING METHOD, MULTI CHARGED PARTICLE BEAM WRITING...

UNIFORM MILLING OF ADJACENT MATERIALS USING PARALLEL SCANNING FIB

LINE-BASED ENDPOINT DETECTION

DUAL BEAM MICROSCOPE SYSTEM FOR IMAGING DURING SAMPLE PROCESSING

MICROSCOPY IMAGING METHOD AND SYSTEM

SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERF...

PARTICLE BEAM IRRADIATION APPARATUS

INSPECTION APPARATUS AND INSPECTION METHOD

INSPECTION DEVICE