of cathode ray oscilloscopes

Industry

CPC
G01R35/002

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R35/00Testing or calibrating of apparatus covered by the preceding groups

Current Industry

G01R35/002of cathode ray oscilloscopes

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method of customized setting as well as measurement system
- Patent number 11,619,920
- Issue date Apr 4, 2023
- Rohde & Schwarz GmbH & Co. KG
- Florian Ramian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test system and method for testing a device under test having sever...
- Patent number 10,969,455
- Issue date Apr 6, 2021
- Rohde & Schwarz GmbH & Co. KG
- Yi Jin
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device and a method for measuring a high-frequency signal...
- Patent number 10,168,411
- Issue date Jan 1, 2019
- Rohde & Schwarz GmbH & Co. KG
- Thomas Kuhwald
- G01 - MEASURING TESTING
Information Patent Grant
Method of calibrating interleaved digitizer channels
- Patent number 8,788,234
- Issue date Jul 22, 2014
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Grant
Self-calibration circuit with gyrated output impedance
- Patent number 8,446,143
- Issue date May 21, 2013
- National Instruments Corporation
- Mark Whittington
- G01 - MEASURING TESTING
Information Patent Grant
Oscilloscope probe calibrating system
- Patent number 8,332,175
- Issue date Dec 11, 2012
- HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.
- Hui Li
- G01 - MEASURING TESTING
Information Patent Grant
System and method for calibrating oscillograph channels
- Patent number 8,255,177
- Issue date Aug 28, 2012
- Hon Hai Precision Industry Co., Ltd.
- Hsien-Chuan Liang
- G01 - MEASURING TESTING
Information Patent Grant
Sequential timebase
- Patent number 7,653,500
- Issue date Jan 26, 2010
- LeCroy Corporation
- Kensuke Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Signal analysis system and calibration method
- Patent number 7,460,983
- Issue date Dec 2, 2008
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Grant
Sequential timebase
- Patent number 7,280,930
- Issue date Oct 9, 2007
- LeCroy Corporation
- Kensuke Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Calibration cache and database
- Patent number 6,919,728
- Issue date Jul 19, 2005
- LeCroy Corporation
- Aaron Hager
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for calibrating a sampling circuit
- Patent number 6,795,787
- Issue date Sep 21, 2004
- Agilent Technologies, Inc.
- Jonathan B. Scott
- G01 - MEASURING TESTING
Information Patent Grant
Digital frequency response compensator and arbitrary response gener...
- Patent number 6,701,335
- Issue date Mar 2, 2004
- LeCroy Corporation
- Peter J. Pupalaikis
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing addressable emissive cathodes
- Patent number 6,559,818
- Issue date May 6, 2003
- Micron Technology, Inc.
- Jim Browning
- G01 - MEASURING TESTING
Information Patent Grant
Fast edge generator with wide dynamic range
- Patent number 6,556,000
- Issue date Apr 29, 2003
- Fluke Precision Measurement LTD
- Simon Timothy Hollingworth
- G01 - MEASURING TESTING
Information Patent Grant
Timebase calibration method for an equivalent time sampling digitiz...
- Patent number 6,522,983
- Issue date Feb 18, 2003
- Tektronix, Inc.
- Laszlo Dobos
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing emissive cathodes in matrix addressable displays
- Patent number 6,441,634
- Issue date Aug 27, 2002
- Micron Technology, Inc.
- Jim Browning
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing emissive cathodes
- Patent number 6,429,835
- Issue date Aug 6, 2002
- Micron Technologies, Inc.
- Jim Browning
- G01 - MEASURING TESTING
Information Patent Grant
Calibrating combinations of probes and channels in an oscilloscope
- Patent number 6,351,112
- Issue date Feb 26, 2002
- Agilent Technologies, Inc.
- Jimmie D. Felps
- G01 - MEASURING TESTING
Information Patent Grant
Self-calibration of an oscilloscope using a square-wave test signal
- Patent number 6,269,317
- Issue date Jul 31, 2001
- LeCroy Corporation
- Joseph M. Schachner
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing emissive cathodes
- Patent number 5,751,262
- Issue date May 12, 1998
- Micron Display Technology, Inc.
- Jim Browning
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for calibrating electronic scales for the hori...
- Patent number 5,410,245
- Issue date Apr 25, 1995
- Leader Electronics Corp.
- Kenzo Ikuzawa
- G01 - MEASURING TESTING
Information Patent Grant
Automatic skew calibration for multi-channel signal sources
- Patent number 5,384,781
- Issue date Jan 24, 1995
- Tektronix, Inc.
- Frederick Y. Kawabata
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Vertical amplifier system for multitrace oscilloscope and method fo...
- Patent number 5,272,449
- Issue date Dec 21, 1993
- Kikusui Electronics Corporation
- Masao Izawa
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibrating a display and apparatus for implementing the...
- Patent number 5,266,938
- Issue date Nov 30, 1993
- Leader Electronics Corp.
- Susumu Mogi
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically calibrated trigger for oscilloscopes
- Patent number 5,184,062
- Issue date Feb 2, 1993
- Nicolet Instrument Corporation
- Gregory J. Ladwig
- G01 - MEASURING TESTING
Information Patent Grant
Self-calibrating CRT measuring instrument
- Patent number 5,180,973
- Issue date Jan 19, 1993
- U.S. Philips Corporation
- Gerardus N. A. Hoogendijk
- G01 - MEASURING TESTING
Information Patent Grant
Real-time, uninterrupted time-interval to voltage converter
- Patent number 5,122,996
- Issue date Jun 16, 1992
- Tektronix, Inc.
- Stanley K. Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for automatically calibrating the gain and off...
- Patent number 4,958,139
- Issue date Sep 18, 1990
- Nicolet Instrument Corporation
- James R. Hyatt
- G01 - MEASURING TESTING
Information Patent Grant
Frame buffer self-test
- Patent number 4,780,755
- Issue date Oct 25, 1988
- Tektronix, Inc.
- David L. Knierim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST SYSTEM AS WELL AS METHOD FOR TESTING A DEVICE UNDER TEST
- Publication number 20200116812
- Publication date Apr 16, 2020
- ROHDE & SCHWARZ GMBH & CO. KG
- Yi Jin
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR A SIGNAL ANALYZING DEVICE
- Publication number 20180088151
- Publication date Mar 29, 2018
- Rohde& Schwarz GmbH & Co. KG
- Barry Rowland
- G01 - MEASURING TESTING
Information Patent Application
A MEASURING DEVICE AND A METHOD FOR MEASURING A HIGH-FREQUENCY SIGN...
- Publication number 20160252600
- Publication date Sep 1, 2016
- Rohde& Schwarz GmbH & Co. KG
- Thomas Kuhwald
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION APPARATUS FOR PROBES
- Publication number 20120299574
- Publication date Nov 29, 2012
- HON HAI Precision Industry CO., LTD.
- CHUANG-WEI TSENG
- G01 - MEASURING TESTING
Information Patent Application
Method of Calibrating Interleaved Digitizer Channels
- Publication number 20120095713
- Publication date Apr 19, 2012
- Tektronix, Inc.
- John J. PICKERD
- G01 - MEASURING TESTING
Information Patent Application
OSCILLOSCOPE PROBE CALIBRATING SYSTEM
- Publication number 20110320159
- Publication date Dec 29, 2011
- HON HAI Precision Industry CO., LTD.
- HUI LI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR CALIBRATING OSCILLOGRAPH CHANNELS
- Publication number 20110098955
- Publication date Apr 28, 2011
- HON HAI Precision Industry CO., LTD.
- HSIEN-CHUAN LIANG
- G01 - MEASURING TESTING
Information Patent Application
Self-Calibration Circuit With Gyrated Output Impedance
- Publication number 20090322310
- Publication date Dec 31, 2009
- Mark Whittington
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Sequential timebase
- Publication number 20080054967
- Publication date Mar 6, 2008
- LeCroy Corporation
- Kensuke Kobayashi
- G01 - MEASURING TESTING
Information Patent Application
Signal analysis system and calibration method
- Publication number 20080052028
- Publication date Feb 28, 2008
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for processing a signal under test using a tri...
- Publication number 20070273389
- Publication date Nov 29, 2007
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Application
Calibration method and apparatus using a trigger signal synchronous...
- Publication number 20070276622
- Publication date Nov 29, 2007
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
Scaling method and apparatus for displaying signals
- Publication number 20060256137
- Publication date Nov 16, 2006
- Chenjing Fernando
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Sequential timebase
- Publication number 20060178850
- Publication date Aug 10, 2006
- LeCroy Corporation
- Kensuke Kobayashi
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for calibrating a sampling circuit
- Publication number 20040064282
- Publication date Apr 1, 2004
- Jonathan B. Scott
- G01 - MEASURING TESTING
Information Patent Application
Calibration cache and database
- Publication number 20030218466
- Publication date Nov 27, 2003
- Aaron Hager
- G01 - MEASURING TESTING
Information Patent Application
Digital frequency response compensator and arbitrary response gener...
- Publication number 20030161420
- Publication date Aug 28, 2003
- Peter J. Pupalaikis
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Scaling method and apparatus for displaying signals
- Publication number 20030076337
- Publication date Apr 24, 2003
- Chenjing Fernando
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Device and method for testing and calibrating multi-meters in a cat...
- Publication number 20020153903
- Publication date Oct 24, 2002
- Sony Corporation and Sony Electronics Inc.
- David Allen Murtishaw
- G01 - MEASURING TESTING
Information Patent Application
Fast edge generator with wide dynamic range
- Publication number 20010005131
- Publication date Jun 28, 2001
- Fluke Precision Measurement Ltd
- Simon Timothy Hollingworth
- G01 - MEASURING TESTING

of cathode ray oscilloscopes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of customized setting as well as measurement system

Test system and method for testing a device under test having sever...

Measuring device and a method for measuring a high-frequency signal...

Method of calibrating interleaved digitizer channels

Self-calibration circuit with gyrated output impedance

Oscilloscope probe calibrating system

System and method for calibrating oscillograph channels

Sequential timebase

Signal analysis system and calibration method

Sequential timebase

Calibration cache and database

Method and apparatus for calibrating a sampling circuit

Digital frequency response compensator and arbitrary response gener...

Method of testing addressable emissive cathodes

Fast edge generator with wide dynamic range

Timebase calibration method for an equivalent time sampling digitiz...

Apparatus for testing emissive cathodes in matrix addressable displays

Method and apparatus for testing emissive cathodes

Calibrating combinations of probes and channels in an oscilloscope

Self-calibration of an oscilloscope using a square-wave test signal

Method and apparatus for testing emissive cathodes

Method and apparatus for calibrating electronic scales for the hori...

Automatic skew calibration for multi-channel signal sources

Vertical amplifier system for multitrace oscilloscope and method fo...

Method for calibrating a display and apparatus for implementing the...

Dynamically calibrated trigger for oscilloscopes

Self-calibrating CRT measuring instrument

Real-time, uninterrupted time-interval to voltage converter

Method and apparatus for automatically calibrating the gain and off...

Frame buffer self-test

Patents Applicationslast 30 patents

TEST SYSTEM AS WELL AS METHOD FOR TESTING A DEVICE UNDER TEST

PROBE FOR A SIGNAL ANALYZING DEVICE

A MEASURING DEVICE AND A METHOD FOR MEASURING A HIGH-FREQUENCY SIGN...

CALIBRATION APPARATUS FOR PROBES

Method of Calibrating Interleaved Digitizer Channels

OSCILLOSCOPE PROBE CALIBRATING SYSTEM

SYSTEM AND METHOD FOR CALIBRATING OSCILLOGRAPH CHANNELS

Self-Calibration Circuit With Gyrated Output Impedance

Sequential timebase

Signal analysis system and calibration method

Apparatus and method for processing a signal under test using a tri...

Calibration method and apparatus using a trigger signal synchronous...

Scaling method and apparatus for displaying signals

Sequential timebase

Method and apparatus for calibrating a sampling circuit

Calibration cache and database

Digital frequency response compensator and arbitrary response gener...

Scaling method and apparatus for displaying signals

Device and method for testing and calibrating multi-meters in a cat...

Fast edge generator with wide dynamic range