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G01B11/0616

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

Current Industry

G01B11/0616of coating

Industries

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Patents Grantslast 30 patents

Information Patent Grant
System, apparatus and method for improved location identification w...
- Patent number 12,162,160
- Issue date Dec 10, 2024
- Gecko Robotics, Inc.
- Alberto Pinero
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Thin film metrology
- Patent number 12,158,332
- Issue date Dec 3, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chih Hung Chen
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device and method of operating a measuring device
- Patent number 12,146,733
- Issue date Nov 19, 2024
- Helmut Fischer GmbH Institut für Elektronik und Messtechnik
- Rüdiger Mästle
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous multi-surface non-contact optical profiler
- Patent number 12,140,495
- Issue date Nov 12, 2024
- Opto-Alignment Technology, Inc.
- Rognvald P. Garden
- G01 - MEASURING TESTING
Information Patent Grant
Non-invasive quantitative multilayer assessment method and resultin...
- Patent number 12,140,412
- Issue date Nov 12, 2024
- GE INFRASTRUCTURE TECHNOLOGY LLC
- Johannes Clemens Schab
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Inspection robot having adjustable resolution
- Patent number 12,061,484
- Issue date Aug 13, 2024
- Gecko Robotics, Inc.
- Mark Loosararian
- B60 - VEHICLES IN GENERAL
Information Patent Grant
System, method, and apparatus for inspecting a surface
- Patent number 12,061,483
- Issue date Aug 13, 2024
- Gecko Robotics, Inc.
- Mark Loosararian
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Payload with adjustable and rotatable sensor sleds for robotic insp...
- Patent number 12,013,705
- Issue date Jun 18, 2024
- Gecko Robotics, Inc.
- Mark Loosararian
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Temperature measurement system, temperature measurement method, and...
- Patent number 11,972,921
- Issue date Apr 30, 2024
- Tokyo Electron Limited
- Takeshi Kobayashi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Intelligent piping inspection machine
- Patent number 11,965,728
- Issue date Apr 23, 2024
- Saudi Arabian Oil Company
- Mazin M. Fathi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated non-contact thickness inspection and projection system us...
- Patent number 11,953,309
- Issue date Apr 9, 2024
- Lockheed Martin Corporation
- Shane Whitaker
- G01 - MEASURING TESTING
Information Patent Grant
Multiple reflectometry for measuring etch parameters
- Patent number 11,927,543
- Issue date Mar 12, 2024
- Applied Materials, Inc.
- Blake Erickson
- G01 - MEASURING TESTING
Information Patent Grant
Optical metrology tool equipped with modulated illumination sources
- Patent number 11,913,874
- Issue date Feb 27, 2024
- KLA Corporation
- Andrei V. Shchegrov
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for driving an inspection robot with motor havi...
- Patent number 11,872,707
- Issue date Jan 16, 2024
- Gecko Robotics, Inc.
- Edward A. Bryner
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Paint and other materials including a taggant
- Patent number 11,851,579
- Issue date Dec 26, 2023
- Henry Guy Stevens
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for detecting slurry spread volume using terahertz wave,...
- Patent number 11,846,584
- Issue date Dec 19, 2023
- Hyundai Motor Company
- Ha Seung Seong
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous multi-surface non-contact optical profiler
- Patent number 11,835,418
- Issue date Dec 5, 2023
- Opto-Alignment Technology, Inc.
- Rognvald P. Garden
- G01 - MEASURING TESTING
Information Patent Grant
System and method for power transmission line monitoring
- Patent number 11,835,570
- Issue date Dec 5, 2023
- LineVision, Inc.
- Nathan Douglas Pinney
- G01 - MEASURING TESTING
Information Patent Grant
Thin film metrology
- Patent number 11,761,751
- Issue date Sep 19, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chih Hung Chen
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for identifying a coating on an implant
- Patent number 11,747,269
- Issue date Sep 5, 2023
- Warsaw Orthopedic, Inc.
- Leenaporn Jongpaiboonkit
- G01 - MEASURING TESTING
Information Patent Grant
System, method, and apparatus for acoustic inspection of a surface
- Patent number 11,740,635
- Issue date Aug 29, 2023
- Gecko Robotics, Inc.
- Mark Loosararian
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method for detecting thicknesses of coating layers of nuclear fuel...
- Patent number 11,728,056
- Issue date Aug 15, 2023
- Hunan University
- Jian Liu
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection robot with stability assist device
- Patent number 11,673,272
- Issue date Jun 13, 2023
- Gecko Robotics, Inc.
- Mark J. Loosararian
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Inspection robot having a laser profiler
- Patent number 11,669,100
- Issue date Jun 6, 2023
- Gecko Robotics, Inc.
- Mark Loosararian
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Systems, methods, and apparatus for tracking location of an inspect...
- Patent number 11,648,671
- Issue date May 16, 2023
- Gecko Robotics, Inc.
- Edward A. Bryner
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Multiple reflectometry for measuring etch parameters
- Patent number 11,619,594
- Issue date Apr 4, 2023
- Applied Materials, Inc.
- Blake Erickson
- G01 - MEASURING TESTING
Information Patent Grant
Predetermining the thickness of a coating
- Patent number 11,592,281
- Issue date Feb 28, 2023
- Siemens Energy Global GmbH & Co. KG
- Alexandr Sadovoy
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Wafer inspection apparatus and method
- Patent number 11,579,096
- Issue date Feb 14, 2023
- Samsung Electronics Co., Ltd.
- Sungha Kim
- G01 - MEASURING TESTING
Information Patent Grant
System and method for configuring an inspection robot for inspectin...
- Patent number 11,565,417
- Issue date Jan 31, 2023
- Gecko Robotics, Inc.
- Edward A. Bryner
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Substrate inspection system, substrate inspection method and record...
- Patent number 11,555,691
- Issue date Jan 17, 2023
- Tokyo Electron Limited
- Hiroshi Nakamura
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
CLEANING PLANT FOR METAL PRODUCTS
- Publication number 20240376609
- Publication date Nov 14, 2024
- Danieli & C. Officine Meccaniche Spa
- Luciano Vignolo
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD AND DEVICE FOR DETERMINING A TRANSMISSION OF AN OBJECT FOR E...
- Publication number 20240369350
- Publication date Nov 7, 2024
- Helmut Fischer GmbH Institut fur Elektronik und Messtechnik
- Rüdiger Mästle
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD, AND APPARATUS FOR INSPECTING A SURFACE
- Publication number 20240345580
- Publication date Oct 17, 2024
- Gecko Robotics, Inc.
- Mark Loosararian
- B60 - VEHICLES IN GENERAL
Information Patent Application
METHOD FOR MEASURING A THICKNESS OF A FILM OR PLATE, SYSTEM FOR MAN...
- Publication number 20240328778
- Publication date Oct 3, 2024
- Albrecht Baumer GmbH & Co. KG
- Jan Horsthemke
- B26 - HAND CUTTING TOOLS CUTTING SEVERING
Information Patent Application
SYSTEM, APPARATUS AND METHOD FOR IMPROVED LOCATION IDENTIFICATION W...
- Publication number 20240316775
- Publication date Sep 26, 2024
- Gecko Robotics, Inc.
- Alberto Pinero
- B60 - VEHICLES IN GENERAL
Information Patent Application
ORGANIC LIGHT EMITTING DIODE DISPLAY DEVICE INCLUDING MEASUREMENT H...
- Publication number 20240260359
- Publication date Aug 1, 2024
- LG Display Co., Ltd.
- Bong-Jun KIM
- G01 - MEASURING TESTING
Information Patent Application
ROTARY KILN INTERIOR COATING ANALYTICS AND MONITORING SYSTEMS
- Publication number 20240240864
- Publication date Jul 18, 2024
- Quantum IR Technologies, LLC
- Mark Israelsen
- F27 - FURNACES KILNS OVENS RETORTS
Information Patent Application
Automated Non-Contact Thickness Inspection and Projection System
- Publication number 20240210162
- Publication date Jun 27, 2024
- Lockheed Martin Corporation
- Shane Whitaker
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY SYSTEMS, MEASUREMENT OF WEAR SYSTEMS AND METHODS THEREOF
- Publication number 20240167809
- Publication date May 23, 2024
- ASML Holding N.V.
- Venkata Siva Chaithanya CHILLARA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE FOR DETERMINING A DISTRIBUTION OF A HEAT TRANSFER...
- Publication number 20240142222
- Publication date May 2, 2024
- Deutsches Zentrum für Luft- und Raumfahrt e.V.
- Austin Franke
- F24 - HEATING RANGES VENTILATING
Information Patent Application
Simultaneous Multi-Surface Non-Contact Optical Profiler
- Publication number 20240077381
- Publication date Mar 7, 2024
- Opto-Alignment Technology, Inc.
- Rognvald P. Garden
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING THICKNESS OF A THIN FILM LAYER ON GLASS
- Publication number 20240027185
- Publication date Jan 25, 2024
- NATIONAL CHUNG CHENG UNIVERSITY
- Hsiang-Chen Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION ROBOT
- Publication number 20230390930
- Publication date Dec 7, 2023
- Gecko Robotics, Inc.
- Mark J. Loosararian
- B60 - VEHICLES IN GENERAL
Information Patent Application
THIN FILM METROLOGY
- Publication number 20230375330
- Publication date Nov 23, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chih Hung CHEN
- G01 - MEASURING TESTING
Information Patent Application
VISUAL AND/OR DIMENSIONAL TIP INSPECTION SYSTEMS AND METHODS
- Publication number 20230366673
- Publication date Nov 16, 2023
- Raytheon Technologies Corporation
- KEITH R. BOISLARD
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD, AND APPARATUS FOR ACOUSTIC INSPECTION OF A SURFACE
- Publication number 20230341865
- Publication date Oct 26, 2023
- Gecko Robotics, Inc.
- Mark Loosararian
- B60 - VEHICLES IN GENERAL
Information Patent Application
INSPECTION ROBOT HAVING ADJUSTABLE RESOLUTION
- Publication number 20230333566
- Publication date Oct 19, 2023
- Gecko Robotics, Inc.
- Mark Loosararian
- B60 - VEHICLES IN GENERAL
Information Patent Application
A MEASURING SYSTEM
- Publication number 20230273013
- Publication date Aug 31, 2023
- TUSAS- TURK HAVACILIK VE UZAY SANAYII ANONIM SIRKETI
- Busra AYKAC
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
FILM-THICKNESS MEASURING METHOD AND FILM-THICKNESS MEASURING APPARATUS
- Publication number 20230204342
- Publication date Jun 29, 2023
- EBARA CORPORATION
- Masaki KINOSHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE REFLECTOMETRY FOR MEASURING ETCH PARAMETERS
- Publication number 20230168210
- Publication date Jun 1, 2023
- Applied Materials, Inc.
- Blake Erickson
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR POWER TRANSMISSION LINE MONITORING
- Publication number 20230145515
- Publication date May 11, 2023
- LineVision, Inc.
- Nathan Douglas Pinney
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR IDENTIFYING A COATING ON AN IMPLANT
- Publication number 20230147097
- Publication date May 11, 2023
- WARSAW ORTHOPEDIC, INC.
- Leenaporn Jongpaiboonkit
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD AND DEVICE FOR DETECTING THICKNESSES OF COATING LAYERS OF NU...
- Publication number 20230126979
- Publication date Apr 27, 2023
- HUNAN UNIVERSITY
- Jian Liu
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Simultaneous Multi-Surface Non-Contact Optical Profiler
- Publication number 20230099285
- Publication date Mar 30, 2023
- Opto-Alignment Technology, Inc.
- Rognvald P. Garden
- G01 - MEASURING TESTING
Information Patent Application
Automated Non-Contact Thickness Inspection and Projection System
- Publication number 20230090145
- Publication date Mar 23, 2023
- Lockheed Martin Corporation
- Shane Whitaker
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD, AND ST...
- Publication number 20230085325
- Publication date Mar 16, 2023
- TOKYO ELECTRON LIMITED
- Hirokazu KYOKANE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NON-INVASIVE QUANTITATIVE MULTILAYER ASSESSMENT METHOD AND RESULTIN...
- Publication number 20230038239
- Publication date Feb 9, 2023
- GENERAL ELECTRIC COMPANY
- Johannes Clemens SCHAB
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
GRIPPER TOOL FOR CABLE-PREPARATION SYSTEM
- Publication number 20230035721
- Publication date Feb 2, 2023
- 3M Innovative Properties Company
- Douglas B. Gundel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PORE MEASUREMENT DEVICE
- Publication number 20220404276
- Publication date Dec 22, 2022
- The Regents of the University of California
- Niall O'Dowd
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE REFLECTOMETRY FOR MEASURING ETCH PARAMETERS
- Publication number 20220349833
- Publication date Nov 3, 2022
- Applied Materials, Inc.
- Blake Erickson
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System, apparatus and method for improved location identification w...

Thin film metrology

Measuring device and method of operating a measuring device

Simultaneous multi-surface non-contact optical profiler

Non-invasive quantitative multilayer assessment method and resultin...

Inspection robot having adjustable resolution

System, method, and apparatus for inspecting a surface

Payload with adjustable and rotatable sensor sleds for robotic insp...

Temperature measurement system, temperature measurement method, and...

Intelligent piping inspection machine

Automated non-contact thickness inspection and projection system us...

Multiple reflectometry for measuring etch parameters

Optical metrology tool equipped with modulated illumination sources

Systems and methods for driving an inspection robot with motor havi...

Paint and other materials including a taggant

Apparatus for detecting slurry spread volume using terahertz wave,...

Simultaneous multi-surface non-contact optical profiler

System and method for power transmission line monitoring

Thin film metrology

Systems and methods for identifying a coating on an implant

System, method, and apparatus for acoustic inspection of a surface

Method for detecting thicknesses of coating layers of nuclear fuel...

Inspection robot with stability assist device

Inspection robot having a laser profiler

Systems, methods, and apparatus for tracking location of an inspect...

Multiple reflectometry for measuring etch parameters

Predetermining the thickness of a coating

Wafer inspection apparatus and method

System and method for configuring an inspection robot for inspectin...

Substrate inspection system, substrate inspection method and record...

Patents Applicationslast 30 patents

CLEANING PLANT FOR METAL PRODUCTS

METHOD AND DEVICE FOR DETERMINING A TRANSMISSION OF AN OBJECT FOR E...

SYSTEM, METHOD, AND APPARATUS FOR INSPECTING A SURFACE

METHOD FOR MEASURING A THICKNESS OF A FILM OR PLATE, SYSTEM FOR MAN...

SYSTEM, APPARATUS AND METHOD FOR IMPROVED LOCATION IDENTIFICATION W...

ORGANIC LIGHT EMITTING DIODE DISPLAY DEVICE INCLUDING MEASUREMENT H...

ROTARY KILN INTERIOR COATING ANALYTICS AND MONITORING SYSTEMS

Automated Non-Contact Thickness Inspection and Projection System

METROLOGY SYSTEMS, MEASUREMENT OF WEAR SYSTEMS AND METHODS THEREOF

MEASURING DEVICE FOR DETERMINING A DISTRIBUTION OF A HEAT TRANSFER...

Simultaneous Multi-Surface Non-Contact Optical Profiler

METHOD FOR MEASURING THICKNESS OF A THIN FILM LAYER ON GLASS

INSPECTION ROBOT

THIN FILM METROLOGY

VISUAL AND/OR DIMENSIONAL TIP INSPECTION SYSTEMS AND METHODS

SYSTEM, METHOD, AND APPARATUS FOR ACOUSTIC INSPECTION OF A SURFACE

INSPECTION ROBOT HAVING ADJUSTABLE RESOLUTION

A MEASURING SYSTEM

FILM-THICKNESS MEASURING METHOD AND FILM-THICKNESS MEASURING APPARATUS

MULTIPLE REFLECTOMETRY FOR MEASURING ETCH PARAMETERS

SYSTEM AND METHOD FOR POWER TRANSMISSION LINE MONITORING

SYSTEMS AND METHODS FOR IDENTIFYING A COATING ON AN IMPLANT

METHOD AND DEVICE FOR DETECTING THICKNESSES OF COATING LAYERS OF NU...

Simultaneous Multi-Surface Non-Contact Optical Profiler

Automated Non-Contact Thickness Inspection and Projection System

SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD, AND ST...

NON-INVASIVE QUANTITATIVE MULTILAYER ASSESSMENT METHOD AND RESULTIN...

GRIPPER TOOL FOR CABLE-PREPARATION SYSTEM

PORE MEASUREMENT DEVICE

MULTIPLE REFLECTOMETRY FOR MEASURING ETCH PARAMETERS