of coaxial or concentric type

Industry

CPC
G01R27/2647

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom

Current Industry

G01R27/2647of coaxial or concentric type

Industries

Patents Grantslast 30 patents

Information Patent Grant
Sensor and method for determining a dielectric property of a medium
- Patent number 10,317,444
- Issue date Jun 11, 2019
- Siemens Aktiengesellschaft
- Dominikus Joachim Müller
- G01 - MEASURING TESTING
Information Patent Grant
Aerospace transparency having moisture sensors
- Patent number 9,983,171
- Issue date May 29, 2018
- PPG Industries Ohio, Inc.
- Yu Jiao
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Aerospace transparency having moisture sensors
- Patent number 9,975,646
- Issue date May 22, 2018
- PPG Industries Ohio, Inc.
- Yu Jiao
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Apparatus and method for the measurement of electrical conductivity...
- Patent number 8,552,750
- Issue date Oct 8, 2013
- D-2, Inc.
- Alan J. Fougere
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for complex permittivity measurements as a functi...
- Patent number 7,642,785
- Issue date Jan 5, 2010
- Schlumberger Technology Corporation
- Tarek M. Habashy
- G01 - MEASURING TESTING
Information Patent Grant
Integrated VI probe
- Patent number 7,154,256
- Issue date Dec 26, 2006
- Tokyo Electron Limited
- Richard Parsons
- G01 - MEASURING TESTING
Information Patent Grant
Automatic wire dielectric analyzer
- Patent number 7,031,856
- Issue date Apr 18, 2006
- Northrop Grumman Corporation
- Stanley Teich
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining the permeability of a magnetic material by c...
- Patent number 6,677,762
- Issue date Jan 13, 2004
- Commissariat a l'Energie Atomique
- Anne Lise Adenot
- G01 - MEASURING TESTING
Information Patent Grant
Permittivity measurement of thin films
- Patent number 6,559,656
- Issue date May 6, 2003
- Honeywell Advanced Circuits, Inc.
- Yutaka Doi
- G01 - MEASURING TESTING
Information Patent Grant
Time-based method and device for determining the dielectric constan...
- Patent number 5,898,308
- Issue date Apr 27, 1999
- Teleflex Incorporated
- James R. Champion
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for identifying and quantifying layered substances
- Patent number 5,621,332
- Issue date Apr 15, 1997
- Stuart Inkpen
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Device and method for identifying and quantifying layered substances
- Patent number 5,394,340
- Issue date Feb 28, 1995
- Instrumar Limited
- Stuart Inkpen
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Waveguide structure for estimating the electromagnetic characterist...
- Patent number 4,866,369
- Issue date Sep 12, 1989
- Aerospatiale Societe Nationale Industrielle
- Bernard P. Y. Guillou
- G01 - MEASURING TESTING
Information Patent Grant
Cryogenic density and mass-flow measurement system
- Patent number 4,835,456
- Issue date May 30, 1989
- Quantum Dynamics Company, Inc.
- Frederick F. Liu
- G01 - MEASURING TESTING
Information Patent Grant
Determination of moisture level in materials
- Patent number 4,352,059
- Issue date Sep 28, 1982
- Massachusetts Institute of Technology
- Nam P. Suh
- G01 - MEASURING TESTING
Information Patent Grant
3768006
- Patent number 3,768,006
- Issue date Oct 23, 1973
- G01 - MEASURING TESTING
Information Patent Grant
3403335
- Patent number 3,403,335
- Issue date Sep 24, 1968
- G01 - MEASURING TESTING
Information Patent Grant
3093729
- Patent number 3,093,729
- Issue date Jun 11, 1963
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
1975226
- Patent number 1,975,226
- Issue date Oct 2, 1934
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SENSOR AND METHOD FOR DETERMINING A DIELECTRIC PROPERTY OF A MEDIUM
- Publication number 20160025787
- Publication date Jan 28, 2016
- Dominikus Joachim Müller
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for the measurement of electrical conductivity...
- Publication number 20100188111
- Publication date Jul 29, 2010
- D-2, Inc.
- Alan J. Fougere
- G01 - MEASURING TESTING
Information Patent Application
Method and device for complex permittivity measurements as a functi...
- Publication number 20070090846
- Publication date Apr 26, 2007
- SCHLUMBERGER TECHNOLOGY CORPORATION, Incorporated in the State of Texas
- Tarek M. Habashy
- G01 - MEASURING TESTING
Information Patent Application
Integrated vi probe
- Publication number 20050184668
- Publication date Aug 25, 2005
- TOKYO ELECTRON LIMITED
- Rick Parsons
- G01 - MEASURING TESTING
Information Patent Application
Automatic wire dielectric analyzer
- Publication number 20040153264
- Publication date Aug 5, 2004
- Stanley Teich
- G01 - MEASURING TESTING
Information Patent Application
Permittivity measurement of thin films
- Publication number 20020118026
- Publication date Aug 29, 2002
- Yutaka Doi
- G01 - MEASURING TESTING

of coaxial or concentric type

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Sensor and method for determining a dielectric property of a medium

Aerospace transparency having moisture sensors

Aerospace transparency having moisture sensors

Apparatus and method for the measurement of electrical conductivity...

Method and device for complex permittivity measurements as a functi...

Integrated VI probe

Automatic wire dielectric analyzer

Method for determining the permeability of a magnetic material by c...

Permittivity measurement of thin films

Time-based method and device for determining the dielectric constan...

Device and method for identifying and quantifying layered substances

Device and method for identifying and quantifying layered substances

Waveguide structure for estimating the electromagnetic characterist...

Cryogenic density and mass-flow measurement system

Determination of moisture level in materials

3768006

3403335

3093729

1975226

Patents Applicationslast 30 patents

SENSOR AND METHOD FOR DETERMINING A DIELECTRIC PROPERTY OF A MEDIUM

Apparatus and method for the measurement of electrical conductivity...

Method and device for complex permittivity measurements as a functi...

Integrated vi probe

Automatic wire dielectric analyzer

Permittivity measurement of thin films