of components or parts made of semiconducting materials; of LV components or parts

Industry

CPC
G01R31/129

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/129of components or parts made of semiconducting materials; of LV components or parts

Industries

Patents Grantslast 30 patents

Information Patent Grant
Breakdown voltage detection
- Patent number 12,140,622
- Issue date Nov 12, 2024
- X-FAB Global Services GmbH
- Alexander Zimmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laminate sheet and method of use thereof
- Patent number 11,961,771
- Issue date Apr 16, 2024
- Mitsui Mining & Smelting Co., Ltd.
- Yoshinori Matsuura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device, and method for manufacturing semiconductor de...
- Patent number 11,862,672
- Issue date Jan 2, 2024
- Rohm Co., Ltd.
- Katsuhisa Nagao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time dependent dielectric breakdown test structure and test method...
- Patent number 11,187,740
- Issue date Nov 30, 2021
- Yangtze Memory Technologies Co., Ltd.
- Shengwei Yang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device, and method for manufacturing semiconductor de...
- Patent number 11,075,263
- Issue date Jul 27, 2021
- ROHM CO, , LTD.
- Katsuhisa Nagao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit having insulation breakdown detection
- Patent number 10,753,968
- Issue date Aug 25, 2020
- ALLEGRO MICROSYSTEMS, LLC
- Robert A. Briano
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Testing of semiconductor devices and devices, and designs thereof
- Patent number 10,698,022
- Issue date Jun 30, 2020
- Infineon Technologies AG
- Michael Roehner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dielectric breakdown monitor
- Patent number 10,564,213
- Issue date Feb 18, 2020
- International Business Machines Corporation
- Tam N. Huynh
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Stationary bath for testing electronic components
- Patent number 10,481,198
- Issue date Nov 19, 2019
- Texas Instruments Incorporated
- David Wayne Kaase
- G01 - MEASURING TESTING
Information Patent Grant
Parallel test structure
- Patent number 10,475,677
- Issue date Nov 12, 2019
- GLOBALFOUNDRIES Inc.
- Tian Shen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diagnostic apparatus for switchgear
- Patent number 10,444,284
- Issue date Oct 15, 2019
- LSIS Co., Ltd.
- Jinho Lee
- G01 - MEASURING TESTING
Information Patent Grant
On-chip test circuit for magnetic random access memory (MRAM)
- Patent number 10,416,217
- Issue date Sep 17, 2019
- Intel Corporation
- Sasikanth Manipatruni
- G11 - INFORMATION STORAGE
Information Patent Grant
High-voltage dry apparatus provided with a continuous monitoring de...
- Patent number 10,352,979
- Issue date Jul 16, 2019
- NEXANS
- Pierre Mirebeau
- G01 - MEASURING TESTING
Information Patent Grant
Circuit and method for internally assessing dielectric reliability...
- Patent number 10,242,922
- Issue date Mar 26, 2019
- Infineon Technologies AG
- Michael Röhner
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device, and method for manufacturing semiconductor de...
- Patent number 10,211,285
- Issue date Feb 19, 2019
- Rohm Co., Ltd.
- Katsuhisa Nagao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods, apparatus and system for screening process splits for tech...
- Patent number 10,054,630
- Issue date Aug 21, 2018
- GLOBALFOUNDRIES Inc.
- Suresh Uppal
- G01 - MEASURING TESTING
Information Patent Grant
Testing of semiconductor devices and devices, and designs thereof
- Patent number 9,945,899
- Issue date Apr 17, 2018
- Infineon Technologies AG
- Michael Roehner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection of electrical arcs in photovoltaic equipment
- Patent number 9,746,528
- Issue date Aug 29, 2017
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Nicolas Chaintreuil
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Methods, apparatus and system for screening process splits for tech...
- Patent number 9,702,926
- Issue date Jul 11, 2017
- GLOBALFOUNDRIES Inc.
- Suresh Uppal
- G01 - MEASURING TESTING
Information Patent Grant
Partial SOI on power device for breakdown voltage improvement
- Patent number 9,698,024
- Issue date Jul 4, 2017
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Long-Shih Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring apparatus
- Patent number 9,684,027
- Issue date Jun 20, 2017
- Mitsubishi Electric Corporation
- Takaya Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Methods of manufacturing wide band gap semiconductor device and sem...
- Patent number 9,640,619
- Issue date May 2, 2017
- Sumitomo Electric Industries, Ltd
- Mitsuhiko Sakai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device, and method for manufacturing semiconductor de...
- Patent number 9,595,584
- Issue date Mar 14, 2017
- Rohm Co., Ltd.
- Katsuhisa Nagao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Smart junction box for photovoltaic systems
- Patent number 9,541,598
- Issue date Jan 10, 2017
- Mei Zhang
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method for measuring potential induced degradation of at least one...
- Patent number 9,506,975
- Issue date Nov 29, 2016
- Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung E.V.
- Henning Nagel
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Dielectric strength voltage testing method for electronics device
- Patent number 9,404,958
- Issue date Aug 2, 2016
- Canon Kabushiki Kaisha
- Tetsuya Nozaki
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing semiconductor device
- Patent number 9,401,314
- Issue date Jul 26, 2016
- Mitsubishi Electric Corporation
- Eiko Otsuki
- G01 - MEASURING TESTING
Information Patent Grant
Testing of semiconductor devices and devices, and designs thereof
- Patent number 9,377,502
- Issue date Jun 28, 2016
- Infineon Technologies AG
- Michael Roehner
- G01 - MEASURING TESTING
Information Patent Grant
Device for high voltage testing of semiconductor components
- Patent number 9,291,664
- Issue date Mar 22, 2016
- Rainer Gaggl
- G01 - MEASURING TESTING
Information Patent Grant
Testing of integrated circuits with external clearance requirements
- Patent number 9,239,353
- Issue date Jan 19, 2016
- Texas Instruments Incorporated
- John Paul Tellkamp
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTROMAGNETIC WAVE DETECTOR AND ELECTROMAGNETIC WAVE DETECTOR ARRAY
- Publication number 20230332942
- Publication date Oct 19, 2023
- Mitsubishi Electric Corporation
- Masaaki SHIMATANI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DE...
- Publication number 20220406887
- Publication date Dec 22, 2022
- ROHM CO., LTD.
- Katsuhisa NAGAO
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD ESTIMATING BREAKDOWN VOLTAGE OF SILICON DIOXID...
- Publication number 20220236313
- Publication date Jul 28, 2022
- Samsung Electronics Co., Ltd.
- Bumsuk CHUNG
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DE...
- Publication number 20210313418
- Publication date Oct 7, 2021
- ROHM CO., LTD.
- Katsuhisa NAGAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LAMINATE SHEET AND METHOD OF USE THEREOF
- Publication number 20210313237
- Publication date Oct 7, 2021
- Mitsui Mining and Smelting Co., Ltd.
- Yoshinori MATSUURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BREAKDOWN VOLTAGE DETECTION
- Publication number 20210255231
- Publication date Aug 19, 2021
- X-FAB Global Services GmbH
- Alexander Zimmer
- G01 - MEASURING TESTING
Information Patent Application
Time Dependent Dielectric Breakdown Test Structure and Test Method...
- Publication number 20200141995
- Publication date May 7, 2020
- Yangtze Memory Technologies Co., Ltd.
- Shengwei Yang
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT HAVING INSULATION BREAKDOWN DETECTION
- Publication number 20190265292
- Publication date Aug 29, 2019
- Allegro Microsystems, LLC
- Robert A. Briano
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
STATIONARY BATH FOR TESTING ELECTRONIC COMPONENTS
- Publication number 20190204377
- Publication date Jul 4, 2019
- TEXAS INSTRUMENTS INCORPORATED
- David Wayne Kaase
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DE...
- Publication number 20190165091
- Publication date May 30, 2019
- ROHM CO., LTD.
- Katsuhisa NAGAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Testing of Semiconductor Devices and Devices, and Designs Thereof
- Publication number 20180292450
- Publication date Oct 11, 2018
- INFINEON TECHNOLOGIES AG
- Michael Roehner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIELECTRIC BREAKDOWN MONITOR
- Publication number 20180246159
- Publication date Aug 30, 2018
- International Business Machines Corporation
- Tam N. Huynh
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHODS, APPARATUS AND SYSTEM FOR SCREENING PROCESS SPLITS FOR TECH...
- Publication number 20170292986
- Publication date Oct 12, 2017
- GLOBALFOUNDRIES, Inc.
- Suresh Uppal
- G01 - MEASURING TESTING
Information Patent Application
HIGH-VOLTAGE DRY APPARATUS PROVIDED WITH A CONTINUOUS MONITORING DE...
- Publication number 20170184651
- Publication date Jun 29, 2017
- NEXANS
- Pierre MIREBEAU
- G01 - MEASURING TESTING
Information Patent Application
Smart Junction Box for Photovoltaic Systems
- Publication number 20160061881
- Publication date Mar 3, 2016
- Mei Zhang
- G01 - MEASURING TESTING
Information Patent Application
METHODS, APPARATUS AND SYSTEM FOR SCREENING PROCESS SPLITS FOR TECH...
- Publication number 20150346271
- Publication date Dec 3, 2015
- GLOBALFOUNDRIES INC.
- Suresh Uppal
- G01 - MEASURING TESTING
Information Patent Application
TESTING OF INTEGRATED CIRCUITS WITH EXTERNAL CLEARANCE REQUIREMENTS
- Publication number 20140375350
- Publication date Dec 25, 2014
- John Paul Tellkamp
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF TESTING SEMICONDUCTOR DEVICE
- Publication number 20140363906
- Publication date Dec 11, 2014
- Mitsubishi Electric Corporation
- Eiko OTSUKI
- G01 - MEASURING TESTING
Information Patent Application
PARTIAL SOI ON POWER DEVICE FOR BREAKDOWN VOLTAGE IMPROVEMENT
- Publication number 20140322871
- Publication date Oct 30, 2014
- Long-Shih Lin
- G01 - MEASURING TESTING
Information Patent Application
DETECTION OF ELECTRICAL ARCS IN PHOTOVOLTAIC EQUIPMENT
- Publication number 20140247066
- Publication date Sep 4, 2014
- Commisariat a I'energie atomique et aux ene alt
- Nicolas Chaintreuil
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DIELECTRIC BREAKDOWN IN A DYNAMIC MODE
- Publication number 20140195175
- Publication date Jul 10, 2014
- International Business Machines Corporation
- Eduard A. Cartier
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING POTENTIAL INDUCED DEGRADATION OF AT LEAST ONE...
- Publication number 20140132302
- Publication date May 15, 2014
- Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V.
- Henning Nagel
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR HIGH VOLTAGE TESTING OF SEMICONDUCTOR COMPONENTS
- Publication number 20140002118
- Publication date Jan 2, 2014
- Rainer Gaggl
- G01 - MEASURING TESTING
Information Patent Application
DIELECTRIC STRENGTH VOLTAGE TESTING METHOD FOR ELECTRONICS DEVICE
- Publication number 20130257451
- Publication date Oct 3, 2013
- Canon Kabushiki Kaisha
- Tetsuya Nozaki
- G01 - MEASURING TESTING
Information Patent Application
OVERVOLTAGE TESTING APPARATUS
- Publication number 20130221342
- Publication date Aug 29, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Kannan Soundarapandian
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC TEST SYSTEM AND ASSOCIATED METHOD
- Publication number 20130113508
- Publication date May 9, 2013
- Taiwan Semiconductor Manufacturing Co., LTD
- Shin-Cheng Chu
- G01 - MEASURING TESTING
Information Patent Application
JIG FOR USE IN SEMICONDUCTOR TEST AND METHOD OF MEASURING BREAKDOWN...
- Publication number 20130106453
- Publication date May 2, 2013
- MITSUBISHI ELECTRIC CORPORATION
- Masaaki IKEGAMI
- G01 - MEASURING TESTING
Information Patent Application
JIG FOR SEMICONDUCTOR TEST
- Publication number 20120299613
- Publication date Nov 29, 2012
- MITSUBISHI ELECTRIC CORPORATION
- Naoto KAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
Detection of Pre-Catastrophic, Stress Induced Leakage Current Condi...
- Publication number 20120229145
- Publication date Sep 13, 2012
- INFINEON TECHNOLOGIES AG
- Martin Kerber
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETECTING ISOLATION BARRIER BREAKDOWN
- Publication number 20120153964
- Publication date Jun 21, 2012
- Analog Devices, Inc.
- Baoxing CHEN
- G01 - MEASURING TESTING

of components or parts made of semiconducting materials; of LV components or parts

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Breakdown voltage detection

Laminate sheet and method of use thereof

Semiconductor device, and method for manufacturing semiconductor de...

Time dependent dielectric breakdown test structure and test method...

Semiconductor device, and method for manufacturing semiconductor de...

Integrated circuit having insulation breakdown detection

Testing of semiconductor devices and devices, and designs thereof

Dielectric breakdown monitor

Stationary bath for testing electronic components

Parallel test structure

Diagnostic apparatus for switchgear

On-chip test circuit for magnetic random access memory (MRAM)

High-voltage dry apparatus provided with a continuous monitoring de...

Circuit and method for internally assessing dielectric reliability...

Semiconductor device, and method for manufacturing semiconductor de...

Methods, apparatus and system for screening process splits for tech...

Testing of semiconductor devices and devices, and designs thereof

Detection of electrical arcs in photovoltaic equipment

Methods, apparatus and system for screening process splits for tech...

Partial SOI on power device for breakdown voltage improvement

Measuring apparatus

Methods of manufacturing wide band gap semiconductor device and sem...

Semiconductor device, and method for manufacturing semiconductor de...

Smart junction box for photovoltaic systems

Method for measuring potential induced degradation of at least one...

Dielectric strength voltage testing method for electronics device

Method of testing semiconductor device

Testing of semiconductor devices and devices, and designs thereof

Device for high voltage testing of semiconductor components

Testing of integrated circuits with external clearance requirements

Patents Applicationslast 30 patents

ELECTROMAGNETIC WAVE DETECTOR AND ELECTROMAGNETIC WAVE DETECTOR ARRAY

SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DE...

APPARATUS AND METHOD ESTIMATING BREAKDOWN VOLTAGE OF SILICON DIOXID...

SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DE...

LAMINATE SHEET AND METHOD OF USE THEREOF

BREAKDOWN VOLTAGE DETECTION

Time Dependent Dielectric Breakdown Test Structure and Test Method...

INTEGRATED CIRCUIT HAVING INSULATION BREAKDOWN DETECTION

STATIONARY BATH FOR TESTING ELECTRONIC COMPONENTS

SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DE...

Testing of Semiconductor Devices and Devices, and Designs Thereof

DIELECTRIC BREAKDOWN MONITOR

METHODS, APPARATUS AND SYSTEM FOR SCREENING PROCESS SPLITS FOR TECH...

HIGH-VOLTAGE DRY APPARATUS PROVIDED WITH A CONTINUOUS MONITORING DE...

Smart Junction Box for Photovoltaic Systems

METHODS, APPARATUS AND SYSTEM FOR SCREENING PROCESS SPLITS FOR TECH...

TESTING OF INTEGRATED CIRCUITS WITH EXTERNAL CLEARANCE REQUIREMENTS

METHOD OF TESTING SEMICONDUCTOR DEVICE

PARTIAL SOI ON POWER DEVICE FOR BREAKDOWN VOLTAGE IMPROVEMENT

DETECTION OF ELECTRICAL ARCS IN PHOTOVOLTAIC EQUIPMENT

MEASURING DIELECTRIC BREAKDOWN IN A DYNAMIC MODE

METHOD FOR MEASURING POTENTIAL INDUCED DEGRADATION OF AT LEAST ONE...

DEVICE FOR HIGH VOLTAGE TESTING OF SEMICONDUCTOR COMPONENTS

DIELECTRIC STRENGTH VOLTAGE TESTING METHOD FOR ELECTRONICS DEVICE

OVERVOLTAGE TESTING APPARATUS

ELECTRONIC TEST SYSTEM AND ASSOCIATED METHOD

JIG FOR USE IN SEMICONDUCTOR TEST AND METHOD OF MEASURING BREAKDOWN...

JIG FOR SEMICONDUCTOR TEST

Detection of Pre-Catastrophic, Stress Induced Leakage Current Condi...

SYSTEM AND METHOD FOR DETECTING ISOLATION BARRIER BREAKDOWN