of connections between components and printed circuit boards (PCB's)

Industry

CPC
G01R31/046

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/046of connections between components and printed circuit boards (PCB's)

Industries

Patents Grantslast 30 patents

Information Patent Grant
Circuit board structure, binding test method and display device
- Patent number 10,616,997
- Issue date Apr 7, 2020
- BOE Technology Group Co., Ltd.
- Kun Li
- G02 - OPTICS
Information Patent Grant
Printed wiring board, crack prediction device, and crack prediction...
- Patent number 10,605,851
- Issue date Mar 31, 2020
- Fujitsu Limited
- Shigeo Iriguchi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System and method for determining if deterioration occurs in interf...
- Patent number 10,495,681
- Issue date Dec 3, 2019
- Mitsubishi Electric Corporation
- Nicolas Degrenne
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining a deterioration of power semiconductor modul...
- Patent number 10,168,381
- Issue date Jan 1, 2019
- Siemens Aktiengesellschaft
- Jimmy-Alexander Butron-Ccoa
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device including connectors and method of operating the...
- Patent number 10,145,888
- Issue date Dec 4, 2018
- Samsung Electronics Co., Ltd.
- Jungchul An
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and aparatus for monitoring a junction between electrical de...
- Patent number 10,114,062
- Issue date Oct 30, 2018
- GM Global Technology Operations LLC
- Evan J. Dawley
- G01 - MEASURING TESTING
Information Patent Grant
Determining the current return path integrity in an electric device...
- Patent number 9,891,256
- Issue date Feb 13, 2018
- International Business Machines Corporation
- Roland Frech
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Circuit boards and circuit board assemblies
- Patent number 9,883,582
- Issue date Jan 30, 2018
- Hamilton Sundstrand Corporation
- Tran Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Driving integrated circuit, display device including the same, and...
- Patent number 9,772,514
- Issue date Sep 26, 2017
- Samsung Display Co., Ltd.
- Jong-Won Moon
- G02 - OPTICS
Information Patent Grant
Semiconductor chip and method for detecting disconnection of wire b...
- Patent number 9,726,709
- Issue date Aug 8, 2017
- Toyota Jidosha Kabushiki Kaisha
- Taro Kajiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Printed wiring board, crack prediction device, and crack prediction...
- Patent number 9,709,619
- Issue date Jul 18, 2017
- Fujitsu Limited
- Shigeo Iriguchi
- G01 - MEASURING TESTING
Information Patent Grant
Resistance measurement
- Patent number 9,684,021
- Issue date Jun 20, 2017
- Infineon Technologies AG
- Peter Bogner
- G01 - MEASURING TESTING
Information Patent Grant
Determining the current return path integrity in an electric device...
- Patent number 9,581,631
- Issue date Feb 28, 2017
- International Business Machines Corporation
- Roland Frech
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Methods, systems, and computer readable media for detecting electri...
- Patent number 9,442,151
- Issue date Sep 13, 2016
- SanDisk Technologies LLC
- Shai Tubul
- G01 - MEASURING TESTING
Information Patent Grant
Communication device in which an unauthorized removal of an electri...
- Patent number 9,426,904
- Issue date Aug 23, 2016
- Harris Corporation
- Cory N. Fitzsimmons
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Substrate of electronic device, electronic device including the sam...
- Patent number 9,299,280
- Issue date Mar 29, 2016
- Samsung Display Co., Ltd.
- Won-Gu Cho
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus and testing method of electronic device
- Patent number 9,285,427
- Issue date Mar 15, 2016
- Wistron Corporation
- Wen-Hwa Luo
- G01 - MEASURING TESTING
Information Patent Grant
Pin verification device and method
- Patent number 9,274,166
- Issue date Mar 1, 2016
- Fujitsu Limited
- Donald Jay Rackley
- G01 - MEASURING TESTING
Information Patent Grant
Equipment provided with one or more plug-in units
- Patent number 9,267,981
- Issue date Feb 23, 2016
- Coriant Oy
- Antti Holma
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Integrated circuit chip and memory device having the same
- Patent number 9,140,741
- Issue date Sep 22, 2015
- SK Hynix Inc.
- Choung-Ki Song
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for detecting the abnormal soldering of an ele...
- Patent number 9,103,867
- Issue date Aug 11, 2015
- Shenzhen China Star Optoelectronics Technology Co., Ltd.
- Mingfeng Deng
- G01 - MEASURING TESTING
Information Patent Grant
Detecting a connection type of a pin
- Patent number 9,086,443
- Issue date Jul 21, 2015
- DSP Group Ltd.
- Efi Vaturi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device having a test pad connected to an exposed pad
- Patent number 8,963,150
- Issue date Feb 24, 2015
- Samsung Display Co., Ltd.
- Dong-Hyun Yeo
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus to detect a broken wire condition in an integr...
- Patent number 8,937,797
- Issue date Jan 20, 2015
- Allegro Microsystems, LLC
- Franco Noel Martin Pirchio
- G01 - MEASURING TESTING
Information Patent Grant
Active pin connection monitoring system and method
- Patent number 8,884,630
- Issue date Nov 11, 2014
- Hewlett-Packard Development Company, L.P.
- Adnan A. Siddiquie
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive tilt data measurement to detect defective bumps
- Patent number 8,860,456
- Issue date Oct 14, 2014
- Medtronic, Inc.
- Sa Huang
- G01 - MEASURING TESTING
Information Patent Grant
Electronic apparatus having circuit board
- Patent number 8,582,310
- Issue date Nov 12, 2013
- Kabushiki Kaisha Toshiba
- Tomoko Monda
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System for testing connections between chips
- Patent number 8,533,543
- Issue date Sep 10, 2013
- Infineon Technologies AG
- Jens Barrenscheen
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and wafer with a test structure and method for...
- Patent number 8,395,399
- Issue date Mar 12, 2013
- NXP B.V.
- Lucie Rousseville
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connection defect detection system and method
- Patent number 8,350,575
- Issue date Jan 8, 2013
- Test Research, Inc.
- Su-Wei Tsai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONTACTLESS TESTING OF ELECTRONIC CIRCUITS
- Publication number 20200348340
- Publication date Nov 5, 2020
- KEYSIGHT TECHNOLOGIES, INC.
- Tie Qiu
- G01 - MEASURING TESTING
Information Patent Application
CONNECTION SUBSTRATE AND DISPLAY DEVICE INCLUDING THE SAME AND PAD...
- Publication number 20200267837
- Publication date Aug 20, 2020
- SAMSUNG DISPLAY CO., LTD.
- Seunghwan CHEONG
- G01 - MEASURING TESTING
Information Patent Application
COMPLIANT PIN WITH SELF SENSING DEFORMATION
- Publication number 20200103454
- Publication date Apr 2, 2020
- International Business Machines Corporation
- Matthew S. Kelly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE, ELECTRONIC CIRCUIT, AND METHOD OF INSPECTING...
- Publication number 20200072891
- Publication date Mar 5, 2020
- RENESAS ELECTRONICS CORPORATION
- Kazuo HENMI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
FACILITATING RELIABLE CIRCUIT BOARD PRESS-FIT CONNECTOR ASSEMBLY FA...
- Publication number 20200057102
- Publication date Feb 20, 2020
- International Business Machines Corporation
- Stephen M. HUGO
- G01 - MEASURING TESTING
Information Patent Application
PROBE, INSPECTION JIG, AND INSPECTION APPARATUS
- Publication number 20200018779
- Publication date Jan 16, 2020
- NIDEC-READ CORPORATION
- Minoru KATO
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY DEVICE INCLUDING FLEXIBLE PRINTED CIRCUIT BOARD AND FOR DET...
- Publication number 20190310302
- Publication date Oct 10, 2019
- SAMSUNG DISPLAY CO., LTD.
- Hee Gwon LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED CAPTURE OF INFORMATION ABOUT FIXED CABLING
- Publication number 20190280438
- Publication date Sep 12, 2019
- CommScope Technologies LLC
- Michael Gregory German
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST SYSTEM FOR TESTING ELECTRICAL CONNECTIONS BETWEEN COMPONENTS A...
- Publication number 20190277903
- Publication date Sep 12, 2019
- Endress + Hauser Flowtec AG
- Thomas Böhler
- G01 - MEASURING TESTING
Information Patent Application
PRINTED CIRCUIT BOARD, METHOD FOR DETERMINING ENGAGEMENT STATE BETW...
- Publication number 20190257874
- Publication date Aug 22, 2019
- CHENGDU BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Bing XU
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM FOR CHECKING ELECTRONIC CONNECTIONS
- Publication number 20190257877
- Publication date Aug 22, 2019
- Endress + Hauser Flowtec AG
- Thomas Böhler
- G01 - MEASURING TESTING
Information Patent Application
DETECTION SYSTEM FOR OPTICAL TRANSCEIVER MODULE
- Publication number 20190215061
- Publication date Jul 11, 2019
- O-NET COMMUNICATIONS (SHENZHEN) LIMITED
- Jiaxi KAN
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INSTALLATION STRUCTURE OF THERMAL FUSE
- Publication number 20190206651
- Publication date Jul 4, 2019
- MANDO CORPORATION
- Donghyun YOUN
- G01 - MEASURING TESTING
Information Patent Application
FUSE PAD, PRINTED CIRCUIT BOARD HAVING THE FUSE PAD, AND METHOD OF...
- Publication number 20190115182
- Publication date Apr 18, 2019
- MANDO CORPORATION
- Se Gyun LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIRCUIT BOARD STRUCTURE, BINDING TEST METHOD AND DISPLAY DEVICE
- Publication number 20190116662
- Publication date Apr 18, 2019
- BOE TECHNOLOGY GROUP CO., LTD.
- Kun LI
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY DEVICE
- Publication number 20190064239
- Publication date Feb 28, 2019
- SAMSUNG DISPLAY CO., LTD.
- Chung Seok Lee
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
TRANSMISSION APPARATUS AND CONNECTION MONITORING METHOD
- Publication number 20180284179
- Publication date Oct 4, 2018
- Fujitsu Limited
- Masato Hashizume
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING IF DETERIORATION OCCURS IN INTERF...
- Publication number 20180188309
- Publication date Jul 5, 2018
- Mitsubishi Electric Corporation
- Nicolas DEGRENNE
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT BOARDS AND CIRCUIT BOARD ASSEMBLIES
- Publication number 20180116047
- Publication date Apr 26, 2018
- HAMILTON SUNDSTRAND CORPORATION
- Tran Lin
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APARATUS FOR MONITORING A JUNCTION BETWEEN ELECTRICAL DE...
- Publication number 20170322251
- Publication date Nov 9, 2017
- GM GLOBAL TECHNOLOGY OPERATIONS LLC
- Evan J. Dawley
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT BOARDS AND CIRCUIT BOARD ASSEMBLIES
- Publication number 20170150595
- Publication date May 25, 2017
- HAMILTON SUNDSTRAND CORPORATION
- Tran Lin
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING THE CURRENT RETURN PATH INTEGRITY IN AN ELECTRIC DEVICE...
- Publication number 20170122993
- Publication date May 4, 2017
- International Business Machines Corporation
- Roland FRECH
- G01 - MEASURING TESTING
Information Patent Application
VACUUM SOCKET AND SEMICONDUCTOR TESTING SYSTEM INCLUDING THE SAME
- Publication number 20170010324
- Publication date Jan 12, 2017
- Samsung Electronics Co., Ltd.
- Jang-Sun Kim
- G01 - MEASURING TESTING
Information Patent Application
PRINTED CIRCUIT BOARD AND DETECTION METHOD FOR DETECTING CONNECTION...
- Publication number 20160341781
- Publication date Nov 24, 2016
- BOE TECHNOLOGY GROUP CO., LTD.
- Xia FENG
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING THE CURRENT RETURN PATH INTEGRITY IN AN ELECTRIC DEVICE...
- Publication number 20160216302
- Publication date Jul 28, 2016
- International Business Machines Corporation
- Roland FRECH
- G01 - MEASURING TESTING
Information Patent Application
METHODS, SYSTEMS, AND COMPUTER READABLE MEDIA FOR DETECTING ELECTRI...
- Publication number 20150355261
- Publication date Dec 10, 2015
- SANDISK TECHNOLOGIES INC.
- Shai Tubul
- G01 - MEASURING TESTING
Information Patent Application
ALTERNATING CURRENT COUPLED ELECTRONIC COMPONENT TEST SYSTEM AND ME...
- Publication number 20150084642
- Publication date Mar 26, 2015
- Bharani Thiruvengadam
- G01 - MEASURING TESTING
Information Patent Application
DETECTION SYSTEM AND METHOD FOR TESTING CONNECTOR
- Publication number 20140361788
- Publication date Dec 11, 2014
- CHO-HAO WANG
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE OF ELECTRONIC DEVICE, ELECTRONIC DEVICE INCLUDING THE SAM...
- Publication number 20140327459
- Publication date Nov 6, 2014
- SAMSUNG DISPLAY CO., LTD.
- Won-Gu CHO
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND TESTING METHOD OF ELECTRONIC DEVICE
- Publication number 20140164858
- Publication date Jun 12, 2014
- Wistron Corporation
- Wen-Hwa Luo
- G01 - MEASURING TESTING

of connections between components and printed circuit boards (PCB's)

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Circuit board structure, binding test method and display device

Printed wiring board, crack prediction device, and crack prediction...

System and method for determining if deterioration occurs in interf...

Method for determining a deterioration of power semiconductor modul...

Electronic device including connectors and method of operating the...

Method and aparatus for monitoring a junction between electrical de...

Determining the current return path integrity in an electric device...

Circuit boards and circuit board assemblies

Driving integrated circuit, display device including the same, and...

Semiconductor chip and method for detecting disconnection of wire b...

Printed wiring board, crack prediction device, and crack prediction...

Resistance measurement

Determining the current return path integrity in an electric device...

Methods, systems, and computer readable media for detecting electri...

Communication device in which an unauthorized removal of an electri...

Substrate of electronic device, electronic device including the sam...

Testing apparatus and testing method of electronic device

Pin verification device and method

Equipment provided with one or more plug-in units

Integrated circuit chip and memory device having the same

Apparatus and method for detecting the abnormal soldering of an ele...

Detecting a connection type of a pin

Semiconductor device having a test pad connected to an exposed pad

Method and apparatus to detect a broken wire condition in an integr...

Active pin connection monitoring system and method

Non-destructive tilt data measurement to detect defective bumps

Electronic apparatus having circuit board

System for testing connections between chips

Semiconductor device and wafer with a test structure and method for...

Electrical connection defect detection system and method

Patents Applicationslast 30 patents

CONTACTLESS TESTING OF ELECTRONIC CIRCUITS

CONNECTION SUBSTRATE AND DISPLAY DEVICE INCLUDING THE SAME AND PAD...

COMPLIANT PIN WITH SELF SENSING DEFORMATION

SEMICONDUCTOR DEVICE, ELECTRONIC CIRCUIT, AND METHOD OF INSPECTING...

FACILITATING RELIABLE CIRCUIT BOARD PRESS-FIT CONNECTOR ASSEMBLY FA...

PROBE, INSPECTION JIG, AND INSPECTION APPARATUS

DISPLAY DEVICE INCLUDING FLEXIBLE PRINTED CIRCUIT BOARD AND FOR DET...

AUTOMATED CAPTURE OF INFORMATION ABOUT FIXED CABLING

TEST SYSTEM FOR TESTING ELECTRICAL CONNECTIONS BETWEEN COMPONENTS A...

PRINTED CIRCUIT BOARD, METHOD FOR DETERMINING ENGAGEMENT STATE BETW...

TEST SYSTEM FOR CHECKING ELECTRONIC CONNECTIONS

DETECTION SYSTEM FOR OPTICAL TRANSCEIVER MODULE

INSTALLATION STRUCTURE OF THERMAL FUSE

FUSE PAD, PRINTED CIRCUIT BOARD HAVING THE FUSE PAD, AND METHOD OF...

CIRCUIT BOARD STRUCTURE, BINDING TEST METHOD AND DISPLAY DEVICE

DISPLAY DEVICE

TRANSMISSION APPARATUS AND CONNECTION MONITORING METHOD

SYSTEM AND METHOD FOR DETERMINING IF DETERIORATION OCCURS IN INTERF...

CIRCUIT BOARDS AND CIRCUIT BOARD ASSEMBLIES

METHOD AND APARATUS FOR MONITORING A JUNCTION BETWEEN ELECTRICAL DE...

CIRCUIT BOARDS AND CIRCUIT BOARD ASSEMBLIES

DETERMINING THE CURRENT RETURN PATH INTEGRITY IN AN ELECTRIC DEVICE...

VACUUM SOCKET AND SEMICONDUCTOR TESTING SYSTEM INCLUDING THE SAME

PRINTED CIRCUIT BOARD AND DETECTION METHOD FOR DETECTING CONNECTION...

DETERMINING THE CURRENT RETURN PATH INTEGRITY IN AN ELECTRIC DEVICE...

METHODS, SYSTEMS, AND COMPUTER READABLE MEDIA FOR DETECTING ELECTRI...

ALTERNATING CURRENT COUPLED ELECTRONIC COMPONENT TEST SYSTEM AND ME...

DETECTION SYSTEM AND METHOD FOR TESTING CONNECTOR

SUBSTRATE OF ELECTRONIC DEVICE, ELECTRONIC DEVICE INCLUDING THE SAM...

TESTING APPARATUS AND TESTING METHOD OF ELECTRONIC DEVICE