of integrated circuits

Industry

CPC
G01R31/307

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/307of integrated circuits

Industries

Patents Grantslast 30 patents

Information Patent Grant
In-line electrical detection of defects at wafer level
- Patent number 12,061,229
- Issue date Aug 13, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yu-Hsuan Huang
- G01 - MEASURING TESTING
Information Patent Grant
In-line detection of electrical fails on integrated circuits
- Patent number 12,013,442
- Issue date Jun 18, 2024
- Intel Corporation
- Enlan Yuan
- G01 - MEASURING TESTING
Information Patent Grant
Analysis method and analysis system of voltage contrast defect
- Patent number 11,927,625
- Issue date Mar 12, 2024
- Powerchip Semiconductor Manufacturing Corporation
- Yue-Ying Yen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Conduction inspection method for multipole aberration corrector, an...
- Patent number 11,915,902
- Issue date Feb 27, 2024
- NuFlare Technology, Inc.
- Atsushi Ando
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor inspection device
- Patent number 11,719,746
- Issue date Aug 8, 2023
- HITACHI HIGH-TECH CORPORATION
- Masaaki Komori
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection device and probe unit
- Patent number 11,513,138
- Issue date Nov 29, 2022
- HITACHI HIGH-TECH CORPORATION
- Masaaki Komori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-line device electrical property estimating method and test struc...
- Patent number 11,480,606
- Issue date Oct 25, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chen-Han Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for defect inspection and review
- Patent number 11,450,122
- Issue date Sep 20, 2022
- ASML Netherlands B.V.
- Wei Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for monitoring and controlling an integrated circuit testing...
- Patent number 11,428,735
- Issue date Aug 30, 2022
- Maxim Integrated Products, Inc.
- Ruel Jucoy Mijares
- G01 - MEASURING TESTING
Information Patent Grant
Soft error inspection method, soft error inspection apparatus, and...
- Patent number 11,054,460
- Issue date Jul 6, 2021
- Fujitsu Limited
- Takeshi Soeda
- G01 - MEASURING TESTING
Information Patent Grant
System for detection of passive voltage contrast
- Patent number 11,035,899
- Issue date Jun 15, 2021
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Changqing Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting pattern defect
- Patent number 10,969,428
- Issue date Apr 6, 2021
- Samsung Electronics Co., Ltd.
- Young-Hoon Sohn
- G01 - MEASURING TESTING
Information Patent Grant
Forecasting wafer defects using frequency domain analysis
- Patent number 10,867,116
- Issue date Dec 15, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yang-Hung Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Over-the-air test system and method for testing a device under test
- Patent number 10,809,296
- Issue date Oct 20, 2020
- Rohde & Schwarz GmbH & Co. KG
- Joachim Danz
- G01 - MEASURING TESTING
Information Patent Grant
Pattern defect detection method
- Patent number 10,802,073
- Issue date Oct 13, 2020
- TASMIT, INC.
- Ryo Shimoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatuses including test segment circuits having latch circuits f...
- Patent number 10,663,513
- Issue date May 26, 2020
- Micron Technology, Inc.
- Kevin G. Werhane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for and method of net trace prior level subtraction
- Patent number 10,649,026
- Issue date May 12, 2020
- GLOBALFOUNDRIES Inc.
- Oliver D. Patterson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test apparatus and methods for arc mitigation device
- Patent number 10,613,146
- Issue date Apr 7, 2020
- Eaton Intelligent Power Limited
- Robert J. Burns
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Process for making semiconductor dies, chips, and wafers using in-l...
- Patent number 10,593,604
- Issue date Mar 17, 2020
- PDF Solutions, Inc.
- Stephen Lam
- G01 - MEASURING TESTING
Information Patent Grant
Voltage contrast based fault and defect inference in logic chips
- Patent number 10,539,612
- Issue date Jan 21, 2020
- KLA-Tencor Corporation
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Grant
Forecasting wafer defects using frequency domain analysis
- Patent number 10,521,548
- Issue date Dec 31, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yang-Hung Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methodology for early detection of TS to PC short issue
- Patent number 10,451,666
- Issue date Oct 22, 2019
- GLOBALFOUNDRIES Inc.
- Ming Lei
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive determination of components of integrated circuits
- Patent number 10,386,409
- Issue date Aug 20, 2019
- International Business Machines Corporation
- Lynne M. Gignac
- G01 - MEASURING TESTING
Information Patent Grant
Defect analysis
- Patent number 10,373,881
- Issue date Aug 6, 2019
- FEI Company
- Thomas G. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Apparatuses including test segment circuits having latch circuits f...
- Patent number 10,330,726
- Issue date Jun 25, 2019
- Micron Technology, Inc.
- Kevin G. Werhane
- G01 - MEASURING TESTING
Information Patent Grant
Test device for defect inspection
- Patent number 10,274,537
- Issue date Apr 30, 2019
- Hermes Microvision Inc.
- Chang-Chun Yeh
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 10,103,075
- Issue date Oct 16, 2018
- Renesas Electronics Corporation
- Yoshiki Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Scanning method for screening of electronic devices
- Patent number 10,094,874
- Issue date Oct 9, 2018
- National Technology & Engineering Solutions of Sandia, LLC
- Paiboon Tangyunyong
- G01 - MEASURING TESTING
Information Patent Grant
System for detection of a photon emission generated by a device and...
- Patent number 9,964,589
- Issue date May 8, 2018
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Lei Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing through-silicon vias at wafer sort using electro...
- Patent number 9,903,910
- Issue date Feb 27, 2018
- Brian D. Erickson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IN-LINE ELECTRICAL DETECTION OF DEFECTS AT WAFER LEVEL
- Publication number 20240361381
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu-Hsuan Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENHANCED ELECTRON BEAM (E-BEAM) APPARATUS AND METHODOLOGY WITH NANO...
- Publication number 20240219460
- Publication date Jul 4, 2024
- Xianghong TONG
- G01 - MEASURING TESTING
Information Patent Application
COUPLING A THERMALLY CONDUCTIVE PLATE TO A SEMICONDUCTOR DEVICE FOR...
- Publication number 20240103073
- Publication date Mar 28, 2024
- Intel Corporation
- Patrick PARDY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-LINE ELECTRICAL DETECTION OF DEFECTS AT WAFER LEVEL
- Publication number 20230417830
- Publication date Dec 28, 2023
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY
- Yu-Hsuan Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER LEVEL ELECTRON BEAM PROBER
- Publication number 20230305057
- Publication date Sep 28, 2023
- Intel Corporation
- Xianghong Tong
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF FAILURE ANALYSIS FOR SEMICONDUCT...
- Publication number 20230243888
- Publication date Aug 3, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shih-Wei PENG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WORK FUNCTION MEASUREMENTS FOR SURFACE ANALYSIS
- Publication number 20230243766
- Publication date Aug 3, 2023
- COZAI LTD
- Hagai COHEN
- G01 - MEASURING TESTING
Information Patent Application
IN-LINE DEVICE ELECTRICAL PROPERTY ESTIMATING METHOD AND TEST STRUC...
- Publication number 20230043999
- Publication date Feb 9, 2023
- Taiwan Semiconductor Manufacturing Company Limited
- Chen-Han Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONDUCTION INSPECTION METHOD FOR MULTIPOLE ABERRATION CORRECTOR, AN...
- Publication number 20220277922
- Publication date Sep 1, 2022
- NuFlare Technology, Inc.
- Atsushi Ando
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTO-ELECTRICAL EVOLUTION DEFECT INSPECTION
- Publication number 20220270849
- Publication date Aug 25, 2022
- ASML NETHERLANDS B.V.
- Jun JIANG
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS METHOD AND ANALYSIS SYSTEM OF VOLTAGE CONTRAST DEFECT
- Publication number 20220043054
- Publication date Feb 10, 2022
- Powerchip Semiconductor Manufacturing Corporation
- Yue-Ying Yen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor Inspection Device
- Publication number 20210270891
- Publication date Sep 2, 2021
- Hitachi High-Tech Corporation
- Masaaki KOMORI
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Inspection Device and Probe Unit
- Publication number 20210263075
- Publication date Aug 26, 2021
- Hitachi High-Tech Corporation
- Masaaki KOMORI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR DETECTION OF PASSIVE VOLTAGE CONTRAST
- Publication number 20200363469
- Publication date Nov 19, 2020
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Changqing CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR DEFECT INSPECTION AND REVIEW
- Publication number 20200334446
- Publication date Oct 22, 2020
- ASML NETHERLANDS B.V.
- Wei FANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Forecasting Wafer Defects Using Frequency Domain Analysis
- Publication number 20200125785
- Publication date Apr 23, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Yang-Hung Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IN-LINE DETECTION OF ELECTRICAL FAILS ON INTEGRATED CIRCUITS
- Publication number 20200103451
- Publication date Apr 2, 2020
- Enlan YUAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOFT ERROR INSPECTION METHOD, SOFT ERROR INSPECTION APPARATUS, AND...
- Publication number 20200081056
- Publication date Mar 12, 2020
- Fujitsu Limited
- Takeshi Soeda
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES INCLUDING TEST SEGMENT CIRCUITS HAVING LATCH CIRCUITS F...
- Publication number 20190271739
- Publication date Sep 5, 2019
- Micron Technology, Inc.
- KEVIN G. WERHANE
- G01 - MEASURING TESTING
Information Patent Application
System and method of preparing integrated circuits for backside pro...
- Publication number 20190227119
- Publication date Jul 25, 2019
- FEI Company
- James VICKERS
- G01 - MEASURING TESTING
Information Patent Application
OVER-THE-AIR TEST SYSTEM AND METHOD FOR TESTING A DEVICE UNDER TEST
- Publication number 20190162780
- Publication date May 30, 2019
- ROHDE & SCHWARZ GMBH & CO. KG
- Joachim Danz
- G01 - MEASURING TESTING
Information Patent Application
PATTERN DEFECT DETECTION METHOD
- Publication number 20190025371
- Publication date Jan 24, 2019
- NGR Inc.
- Ryo SHIMODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUSES INCLUDING TEST SEGMENT CIRCUITS AND METHODS FOR TESTING...
- Publication number 20180364303
- Publication date Dec 20, 2018
- Micron Technology, Inc.
- KEVIN G. WERHANE
- G01 - MEASURING TESTING
Information Patent Application
Defect Analysis
- Publication number 20180182676
- Publication date Jun 28, 2018
- FEI Company
- Thomas G. Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR DETECTION OF A PHOTON EMISSION GENERATED BY A DEVICE AND...
- Publication number 20180128874
- Publication date May 10, 2018
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Lei Zhu
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20170287795
- Publication date Oct 5, 2017
- RENESAS ELECTRONICS CORPORATION
- Yoshiki YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
METHODOLOGY FOR EARLY DETECTION OF TS TO PC SHORT ISSUE
- Publication number 20170192050
- Publication date Jul 6, 2017
- GLOBALFOUNDRIES INC.
- Ming LEI
- G01 - MEASURING TESTING
Information Patent Application
Method For Testing Through-Silicon Vias At Wafer Sort Using Electro...
- Publication number 20170102428
- Publication date Apr 13, 2017
- Brian D. Erickson
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE DETERMINATION OF COMPONENTS OF INTEGRATED CIRCUITS
- Publication number 20170074927
- Publication date Mar 16, 2017
- International Business Machines Corporation
- Lynne M. Gignac
- G01 - MEASURING TESTING
Information Patent Application
Particle Beam Heating to Identify Defects
- Publication number 20160370425
- Publication date Dec 22, 2016
- DCG SYSTEMS, INC.
- Richard Stallcup
- G01 - MEASURING TESTING

of integrated circuits

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

In-line electrical detection of defects at wafer level

In-line detection of electrical fails on integrated circuits

Analysis method and analysis system of voltage contrast defect

Conduction inspection method for multipole aberration corrector, an...

Semiconductor inspection device

Semiconductor inspection device and probe unit

In-line device electrical property estimating method and test struc...

Methods and systems for defect inspection and review

System for monitoring and controlling an integrated circuit testing...

Soft error inspection method, soft error inspection apparatus, and...

System for detection of passive voltage contrast

Method of inspecting pattern defect

Forecasting wafer defects using frequency domain analysis

Over-the-air test system and method for testing a device under test

Pattern defect detection method

Apparatuses including test segment circuits having latch circuits f...

Apparatus for and method of net trace prior level subtraction

Test apparatus and methods for arc mitigation device

Process for making semiconductor dies, chips, and wafers using in-l...

Voltage contrast based fault and defect inference in logic chips

Forecasting wafer defects using frequency domain analysis

Methodology for early detection of TS to PC short issue

Non-destructive determination of components of integrated circuits

Defect analysis

Apparatuses including test segment circuits having latch circuits f...

Test device for defect inspection

Semiconductor device and manufacturing method thereof

Scanning method for screening of electronic devices

System for detection of a photon emission generated by a device and...

Method for testing through-silicon vias at wafer sort using electro...

Patents Applicationslast 30 patents

IN-LINE ELECTRICAL DETECTION OF DEFECTS AT WAFER LEVEL

ENHANCED ELECTRON BEAM (E-BEAM) APPARATUS AND METHODOLOGY WITH NANO...

COUPLING A THERMALLY CONDUCTIVE PLATE TO A SEMICONDUCTOR DEVICE FOR...

IN-LINE ELECTRICAL DETECTION OF DEFECTS AT WAFER LEVEL

WAFER LEVEL ELECTRON BEAM PROBER

SEMICONDUCTOR DEVICE AND METHOD OF FAILURE ANALYSIS FOR SEMICONDUCT...

WORK FUNCTION MEASUREMENTS FOR SURFACE ANALYSIS

IN-LINE DEVICE ELECTRICAL PROPERTY ESTIMATING METHOD AND TEST STRUC...

CONDUCTION INSPECTION METHOD FOR MULTIPOLE ABERRATION CORRECTOR, AN...

PHOTO-ELECTRICAL EVOLUTION DEFECT INSPECTION

ANALYSIS METHOD AND ANALYSIS SYSTEM OF VOLTAGE CONTRAST DEFECT

Semiconductor Inspection Device

Semiconductor Inspection Device and Probe Unit

SYSTEM FOR DETECTION OF PASSIVE VOLTAGE CONTRAST

METHODS AND SYSTEMS FOR DEFECT INSPECTION AND REVIEW

Forecasting Wafer Defects Using Frequency Domain Analysis

IN-LINE DETECTION OF ELECTRICAL FAILS ON INTEGRATED CIRCUITS

SOFT ERROR INSPECTION METHOD, SOFT ERROR INSPECTION APPARATUS, AND...

APPARATUSES INCLUDING TEST SEGMENT CIRCUITS HAVING LATCH CIRCUITS F...

System and method of preparing integrated circuits for backside pro...

OVER-THE-AIR TEST SYSTEM AND METHOD FOR TESTING A DEVICE UNDER TEST

PATTERN DEFECT DETECTION METHOD

APPARATUSES INCLUDING TEST SEGMENT CIRCUITS AND METHODS FOR TESTING...

Defect Analysis

SYSTEM FOR DETECTION OF A PHOTON EMISSION GENERATED BY A DEVICE AND...

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

METHODOLOGY FOR EARLY DETECTION OF TS TO PC SHORT ISSUE

Method For Testing Through-Silicon Vias At Wafer Sort Using Electro...

NON-DESTRUCTIVE DETERMINATION OF COMPONENTS OF INTEGRATED CIRCUITS

Particle Beam Heating to Identify Defects