of integrated circuits

Industry

CPC
G01R31/303

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/303of integrated circuits

Industries

Patents Grantslast 30 patents

Information Patent Grant
Test equipment for testing a device under test having an antenna
- Patent number 12,099,088
- Issue date Sep 24, 2024
- Advantest Corporation
- Jan Hesselbarth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device examination method and semiconductor device ex...
- Patent number 12,044,729
- Issue date Jul 23, 2024
- Hamamatsu Photonics K.K.
- Tomochika Takeshima
- G01 - MEASURING TESTING
Information Patent Grant
Sonic testing method, apparatus and applications
- Patent number 11,867,754
- Issue date Jan 9, 2024
- Cornell University
- Amit Lal
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Grant
Opto electrical test measurement system for integrated photonic dev...
- Patent number 11,680,870
- Issue date Jun 20, 2023
- STMicroelectronics (Crolles 2) SAS
- Philippe Grosse
- G01 - MEASURING TESTING
Information Patent Grant
X-ray filter
- Patent number 11,506,709
- Issue date Nov 22, 2022
- Intel Corporation
- Mario Pacheco
- G01 - MEASURING TESTING
Information Patent Grant
System and method of production testing of impedance of radio frequ...
- Patent number 11,226,371
- Issue date Jan 18, 2022
- Silicon Laboratories Inc.
- Yuwono Kurnia Rahman
- G01 - MEASURING TESTING
Information Patent Grant
Opto electrical test measurement system for integrated photonic dev...
- Patent number 11,187,613
- Issue date Nov 30, 2021
- STMicroelectronics (Crolles 2) SAS
- Philippe Grosse
- G01 - MEASURING TESTING
Information Patent Grant
IC with test structures and e-beam pads embedded within a contiguou...
- Patent number 11,081,476
- Issue date Aug 3, 2021
- PDF Solutions, Inc.
- Stephen Lam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Contactless coupling between test and measurement system and a devi...
- Patent number 11,041,880
- Issue date Jun 22, 2021
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and method for multiple antenna measurements wit...
- Patent number 10,969,427
- Issue date Apr 6, 2021
- Rohde & Schwarz GmbH & Co. KG
- Corbett Rowell
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting a specimen and system thereof
- Patent number 10,928,437
- Issue date Feb 23, 2021
- Applied Materials Israel Ltd.
- Zvi Goren
- G01 - MEASURING TESTING
Information Patent Grant
Wireless test system for testing microelectronic devices integrated...
- Patent number 10,852,349
- Issue date Dec 1, 2020
- Mediatek Inc.
- Chih-Yang Liu
- G01 - MEASURING TESTING
Information Patent Grant
Opto electrical test measurement system for integrated photonic dev...
- Patent number 10,677,684
- Issue date Jun 9, 2020
- STMicroelectronics (Crolles 2) SAS
- Philippe Grosse
- G01 - MEASURING TESTING
Information Patent Grant
Crosstalk suppression in wireless testing of semiconductor devices
- Patent number 10,641,821
- Issue date May 5, 2020
- STMicroelectronics S.r.l.
- Alberto Pagani
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor storage device, operating method thereof and analysis...
- Patent number 10,641,825
- Issue date May 5, 2020
- Winbond Electronics Corp.
- Makoto Senoo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
On-chip, wideband, differentially fed antennas with integrated bias...
- Patent number 10,473,587
- Issue date Nov 12, 2019
- OHIO STATE INNOVATION FOUNDATION
- Kubilay Sertel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of inspecting a specimen and system thereof
- Patent number 10,444,274
- Issue date Oct 15, 2019
- Applied Materials Israel Ltd.
- Zvi Goren
- G01 - MEASURING TESTING
Information Patent Grant
Soft error rate calculation device and calculation method for semic...
- Patent number 10,401,424
- Issue date Sep 3, 2019
- Hitachi, Ltd.
- Takumi Uezono
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive determination of components of integrated circuits
- Patent number 10,386,409
- Issue date Aug 20, 2019
- International Business Machines Corporation
- Lynne M. Gignac
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting semiconductor device structure
- Patent number 10,345,373
- Issue date Jul 9, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Baohua Niu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor device and wafer with reference circuit and related m...
- Patent number 10,274,395
- Issue date Apr 30, 2019
- STMicroelectronics S.A.
- Jean-Francois Carpentier
- G02 - OPTICS
Information Patent Grant
Controlling a test run on a device under test without directly cont...
- Patent number 10,254,335
- Issue date Apr 9, 2019
- International Business Machines Corporation
- Steve L. LeClerc
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test device and method, and data analysis device
- Patent number 10,191,099
- Issue date Jan 29, 2019
- Samsung Electronics Co., Ltd.
- Soon-Young Lee
- G01 - MEASURING TESTING
Information Patent Grant
Opto electrical test measurement system for integrated photonic dev...
- Patent number 10,180,373
- Issue date Jan 15, 2019
- STMicroelectronics (Crolles 2) SAS
- Philippe Grosse
- G02 - OPTICS
Information Patent Grant
Semiconductor device, method of manufacturing the same, and signal...
- Patent number 10,115,783
- Issue date Oct 30, 2018
- Renesas Electronics Corporation
- Yasutaka Nakashiba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Digital test system
- Patent number 10,107,858
- Issue date Oct 23, 2018
- The United States of America, as represented by the Secretary of the Navy
- Matthew Gadlage
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning method for screening of electronic devices
- Patent number 10,094,874
- Issue date Oct 9, 2018
- National Technology & Engineering Solutions of Sandia, LLC
- Paiboon Tangyunyong
- G01 - MEASURING TESTING
Information Patent Grant
Wireless probes
- Patent number 10,018,670
- Issue date Jul 10, 2018
- eSilicon Corporation
- Javier DeLaCruz
- G01 - MEASURING TESTING
Information Patent Grant
Circuit tracing using a focused ion beam
- Patent number 9,915,628
- Issue date Mar 13, 2018
- TECHINSIGHTS INC.
- Christopher Pawlowicz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Module test socket for over the air testing of radio frequency inte...
- Patent number 9,863,976
- Issue date Jan 9, 2018
- KEYSSA SYSTEMS, INC.
- Bhupendra Sakerlal Sarhad
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
BENCHMARK DEVICE AND METHOD FOR EVALUATING A SEMICONDUCTOR WAFER
- Publication number 20230408578
- Publication date Dec 21, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- LAN-CHOU CHO
- G01 - MEASURING TESTING
Information Patent Application
FAULT ISOLATION ANALYSIS METHOD AND COMPUTER-READABLE STORAGE MEDIUM
- Publication number 20220254691
- Publication date Aug 11, 2022
- Changxin Memory Technologies, Inc.
- Yuanjie XU
- G01 - MEASURING TESTING
Information Patent Application
NEAR FIELD WIRELESS COMMUNICATION SYSTEM FOR MOTHER TO PACKAGE AND...
- Publication number 20220206064
- Publication date Jun 30, 2022
- Intel Corporation
- Zhen ZHOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE EXAMINATION METHOD AND SEMICONDUCTOR DEVICE EX...
- Publication number 20220206063
- Publication date Jun 30, 2022
- Hamamatsu Photonics K.K.
- Tomochika TAKESHIMA
- G01 - MEASURING TESTING
Information Patent Application
OPTO ELECTRICAL TEST MEASUREMENT SYSTEM FOR INTEGRATED PHOTONIC DEV...
- Publication number 20220050010
- Publication date Feb 17, 2022
- STMicroelectronics (Crolles 2) SAS
- Philippe Grosse
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF PRODUCTION TESTING OF IMPEDANCE OF RADIO FREQU...
- Publication number 20210148973
- Publication date May 20, 2021
- Silicon Laboratories Inc.
- Yuwono Kurnia Rahman
- G01 - MEASURING TESTING
Information Patent Application
OPTO ELECTRICAL TEST MEASUREMENT SYSTEM FOR INTEGRATED PHOTONIC DEV...
- Publication number 20200256759
- Publication date Aug 13, 2020
- STMicroelectronics (Crolles 2) SAS
- Philippe Grosse
- G01 - MEASURING TESTING
Information Patent Application
SONIC TESTING METHOD, APPARATUS AND APPLICATIONS
- Publication number 20200182930
- Publication date Jun 11, 2020
- Cornell University
- Amit Lal
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FILTER
- Publication number 20200166569
- Publication date May 28, 2020
- Intel Corporation
- Mario Pacheco
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING A SPECIMEN AND SYSTEM THEREOF
- Publication number 20200018789
- Publication date Jan 16, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Zvi GOREN
- G01 - MEASURING TESTING
Information Patent Application
WIRELESS TEST SYSTEM FOR TESTING MICROELECTRONIC DEVICES INTEGRATED...
- Publication number 20190310314
- Publication date Oct 10, 2019
- MEDIATEK INC.
- Chih-Yang Liu
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR STORAGE DEVICE, OPERATING METHOD THEREOF AND ANALYSIS...
- Publication number 20190227123
- Publication date Jul 25, 2019
- WINBOND ELECTRONICS CORP.
- Makoto Senoo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTO ELECTRICAL TEST MEASUREMENT SYSTEM FOR INTEGRATED PHOTONIC DEV...
- Publication number 20190113415
- Publication date Apr 18, 2019
- STMicroelectronics (Crolles 2) SAS
- Philippe Grosse
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INSPECTING SEMICONDUCTOR DEVICE STRUCTURE
- Publication number 20190101586
- Publication date Apr 4, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Baohua NIU
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING A SPECIMEN AND SYSTEM THEREOF
- Publication number 20180321299
- Publication date Nov 8, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Zvi GOREN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOFT ERROR RATE CALCULATION DEVICE AND CALCULATION METHOD FOR SEMIC...
- Publication number 20180149695
- Publication date May 31, 2018
- Hitachi, Ltd
- Takumi UEZONO
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT TEMPERATURE DETERMINATION USING PHOTON EMISSION...
- Publication number 20180100891
- Publication date Apr 12, 2018
- International Business Machines Corporation
- Franco Stellari
- G01 - MEASURING TESTING
Information Patent Application
CROSSTALK SUPPRESSION IN WIRELESS TESTING OF SEMICONDUCTOR DEVICES
- Publication number 20180045775
- Publication date Feb 15, 2018
- STMicroelectronics S.r.l.
- Alberto Pagani
- G01 - MEASURING TESTING
Information Patent Application
OPTO ELECTRICAL TEST MEASUREMENT SYSTEM FOR INTEGRATED PHOTONIC DEV...
- Publication number 20170307687
- Publication date Oct 26, 2017
- STMicroelectronics (Crolles 2) SAS
- Philippe Grosse
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING THE SAME, AND SIGNAL...
- Publication number 20170256602
- Publication date Sep 7, 2017
- RENESAS ELECTRONICS CORPORATION
- Yasutaka NAKASHIBA
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ TRANSMISSION CONTACTLESS PROBING AND SCANNING FOR SIGNAL...
- Publication number 20170089951
- Publication date Mar 30, 2017
- Mayue Xie
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE DETERMINATION OF COMPONENTS OF INTEGRATED CIRCUITS
- Publication number 20170074927
- Publication date Mar 16, 2017
- International Business Machines Corporation
- Lynne M. Gignac
- G01 - MEASURING TESTING
Information Patent Application
Particle Beam Heating to Identify Defects
- Publication number 20160370425
- Publication date Dec 22, 2016
- DCG SYSTEMS, INC.
- Richard Stallcup
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL TEST SYSTEM
- Publication number 20160258999
- Publication date Sep 8, 2016
- The United States of America as represented by the Secretary of the Navy
- Matthew Gadlage
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT TRACING USING A FOCUSED ION BEAM
- Publication number 20160187419
- Publication date Jun 30, 2016
- TECHINSIGHTS INC.
- Christopher PAWLOWICZ
- G01 - MEASURING TESTING
Information Patent Application
WIRELESS PROBES
- Publication number 20160161554
- Publication date Jun 9, 2016
- eSilicon Corporation
- Javier DeLaCruz
- G01 - MEASURING TESTING
Information Patent Application
Adjusting the Use of a Chip/Socket Having a Damaged Pin
- Publication number 20160132383
- Publication date May 12, 2016
- Lenovo Enterprise Solutions (Singapore) Pte. Ltd.
- MICHAEL DECESARIS
- G01 - MEASURING TESTING
Information Patent Application
PASSIVE PROBING OF VARIOUS LOCATIONS IN A WIRELESS ENABLED INTEGRAT...
- Publication number 20150276856
- Publication date Oct 1, 2015
- BROADCOM CORPORATION
- Jesus Alfonso Castaneda
- G01 - MEASURING TESTING
Information Patent Application
DETECTION OF MIS-SOLDERED CIRCUITS BY SIGNAL ECHO CHARACTERISTICS
- Publication number 20150015269
- Publication date Jan 15, 2015
- NVIDIA Corporation
- Hans Wolfgang SCHULZE
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT TRACING USING A FOCUSED ION BEAM
- Publication number 20140319343
- Publication date Oct 30, 2014
- Chris Pawlowicz
- G01 - MEASURING TESTING

of integrated circuits

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Test equipment for testing a device under test having an antenna

Semiconductor device examination method and semiconductor device ex...

Sonic testing method, apparatus and applications

Opto electrical test measurement system for integrated photonic dev...

X-ray filter

System and method of production testing of impedance of radio frequ...

Opto electrical test measurement system for integrated photonic dev...

IC with test structures and e-beam pads embedded within a contiguou...

Contactless coupling between test and measurement system and a devi...

Measurement system and method for multiple antenna measurements wit...

Method of inspecting a specimen and system thereof

Wireless test system for testing microelectronic devices integrated...

Opto electrical test measurement system for integrated photonic dev...

Crosstalk suppression in wireless testing of semiconductor devices

Semiconductor storage device, operating method thereof and analysis...

On-chip, wideband, differentially fed antennas with integrated bias...

Method of inspecting a specimen and system thereof

Soft error rate calculation device and calculation method for semic...

Non-destructive determination of components of integrated circuits

Method for inspecting semiconductor device structure

Semiconductor device and wafer with reference circuit and related m...

Controlling a test run on a device under test without directly cont...

Semiconductor test device and method, and data analysis device

Opto electrical test measurement system for integrated photonic dev...

Semiconductor device, method of manufacturing the same, and signal...

Digital test system

Scanning method for screening of electronic devices

Wireless probes

Circuit tracing using a focused ion beam

Module test socket for over the air testing of radio frequency inte...

Patents Applicationslast 30 patents

BENCHMARK DEVICE AND METHOD FOR EVALUATING A SEMICONDUCTOR WAFER

FAULT ISOLATION ANALYSIS METHOD AND COMPUTER-READABLE STORAGE MEDIUM

NEAR FIELD WIRELESS COMMUNICATION SYSTEM FOR MOTHER TO PACKAGE AND...

SEMICONDUCTOR DEVICE EXAMINATION METHOD AND SEMICONDUCTOR DEVICE EX...

OPTO ELECTRICAL TEST MEASUREMENT SYSTEM FOR INTEGRATED PHOTONIC DEV...

SYSTEM AND METHOD OF PRODUCTION TESTING OF IMPEDANCE OF RADIO FREQU...

OPTO ELECTRICAL TEST MEASUREMENT SYSTEM FOR INTEGRATED PHOTONIC DEV...

SONIC TESTING METHOD, APPARATUS AND APPLICATIONS

X-RAY FILTER

METHOD OF INSPECTING A SPECIMEN AND SYSTEM THEREOF

WIRELESS TEST SYSTEM FOR TESTING MICROELECTRONIC DEVICES INTEGRATED...

SEMICONDUCTOR STORAGE DEVICE, OPERATING METHOD THEREOF AND ANALYSIS...

OPTO ELECTRICAL TEST MEASUREMENT SYSTEM FOR INTEGRATED PHOTONIC DEV...

METHOD FOR INSPECTING SEMICONDUCTOR DEVICE STRUCTURE

METHOD OF INSPECTING A SPECIMEN AND SYSTEM THEREOF

SOFT ERROR RATE CALCULATION DEVICE AND CALCULATION METHOD FOR SEMIC...

INTEGRATED CIRCUIT TEMPERATURE DETERMINATION USING PHOTON EMISSION...

CROSSTALK SUPPRESSION IN WIRELESS TESTING OF SEMICONDUCTOR DEVICES

OPTO ELECTRICAL TEST MEASUREMENT SYSTEM FOR INTEGRATED PHOTONIC DEV...

SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING THE SAME, AND SIGNAL...

TERAHERTZ TRANSMISSION CONTACTLESS PROBING AND SCANNING FOR SIGNAL...

NON-DESTRUCTIVE DETERMINATION OF COMPONENTS OF INTEGRATED CIRCUITS

Particle Beam Heating to Identify Defects

DIGITAL TEST SYSTEM

CIRCUIT TRACING USING A FOCUSED ION BEAM

WIRELESS PROBES

Adjusting the Use of a Chip/Socket Having a Damaged Pin

PASSIVE PROBING OF VARIOUS LOCATIONS IN A WIRELESS ENABLED INTEGRAT...

DETECTION OF MIS-SOLDERED CIRCUITS BY SIGNAL ECHO CHARACTERISTICS

CIRCUIT TRACING USING A FOCUSED ION BEAM