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G01B11/0691

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

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G01B11/0691of objects while moving

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for improving strain guage to blade tip timing co...
- Patent number 12,085,478
- Issue date Sep 10, 2024
- Government of the United States of America as Represented by the Secretary of...
- Daniel Gillaugh
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for detecting an object
- Patent number 12,078,471
- Issue date Sep 3, 2024
- Sikora AG
- Harald Sikora
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring thickness of unit cell
- Patent number 12,038,269
- Issue date Jul 16, 2024
- LG ENERGY SOLUTION, LTD.
- Min Jun Choi
- G01 - MEASURING TESTING
Information Patent Grant
THz measuring device and THz measuring method for determining a lay...
- Patent number 11,988,499
- Issue date May 21, 2024
- CiTEX Holding GmbH
- Roland Böhm
- G01 - MEASURING TESTING
Information Patent Grant
Mobile device for measuring amount of snowfall and method of contro...
- Patent number 11,982,786
- Issue date May 14, 2024
- NATIONAL INSTITUTE OF METEOROLOGICAL SCIENCES
- Yoo Jun Kim
- G01 - MEASURING TESTING
Information Patent Grant
In-situ metrology and process control
- Patent number 11,908,718
- Issue date Feb 20, 2024
- Applied Materials, Inc.
- Ramesh Krishnamurthy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement device and measurement method for measuring a physical...
- Patent number 11,867,636
- Issue date Jan 9, 2024
- Yokogawa Electric Corporation
- Kazuki Setsuda
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for detecting slurry spread volume using terahertz wave,...
- Patent number 11,846,584
- Issue date Dec 19, 2023
- Hyundai Motor Company
- Ha Seung Seong
- G01 - MEASURING TESTING
Information Patent Grant
Sheet thickness measurement device
- Patent number 11,796,303
- Issue date Oct 24, 2023
- Maysun Corporation
- Shigeru Ichikawa
- G01 - MEASURING TESTING
Information Patent Grant
Method to determine properties of a coating on a transparent film,...
- Patent number 11,703,319
- Issue date Jul 18, 2023
- TDK ELECTRONICS AG
- Ramón García Rojo
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for improving strain gauge to blade tip timing co...
- Patent number 11,650,130
- Issue date May 16, 2023
- United States of America as represented by the Secretary of the Air Force
- Daniel Gillaugh
- G01 - MEASURING TESTING
Information Patent Grant
Hardware improvements and methods for the analysis of a spinning re...
- Patent number 11,624,607
- Issue date Apr 11, 2023
- Tokyo Electron Limited
- Michael Carcasi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical monitor
- Patent number 11,542,596
- Issue date Jan 3, 2023
- Viavi Solutions Inc.
- Markus K. Tilsch
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Device and method for contactless thickness measurement of a planar...
- Patent number 11,371,832
- Issue date Jun 28, 2022
- VALMET AUTOMATION OY
- Toni Muotio
- G01 - MEASURING TESTING
Information Patent Grant
Method for length measurement of a flat good in a goods processing...
- Patent number 11,293,798
- Issue date Apr 5, 2022
- Francotyp-Postalia GmbH
- Frank Geserich
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
In-situ metrology and process control
- Patent number 11,289,352
- Issue date Mar 29, 2022
- Applied Materials, Inc.
- Ramesh Krishnamurthy
- G01 - MEASURING TESTING
Information Patent Grant
Thickness determination of web product by mid-infrared wavelength s...
- Patent number 11,255,659
- Issue date Feb 22, 2022
- Honeywell ASCa
- Michael Kon Yew Hughes
- G01 - MEASURING TESTING
Information Patent Grant
Stone-block analysis device and methods for the evaluation of stone...
- Patent number 11,243,173
- Issue date Feb 8, 2022
- R&W INDUSTRIEAUTOMATION GMBH
- Uwe Rahn
- G01 - MEASURING TESTING
Information Patent Grant
System and method for thickness measurement in tortilla production
- Patent number 11,236,989
- Issue date Feb 1, 2022
- PREMIER INNOVATIONS, LLC
- Brian E. Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Process for the manufacturing of a steel strip for packaging and as...
- Patent number 11,214,873
- Issue date Jan 4, 2022
- Arcelormittal
- Mathias Stouff
- G01 - MEASURING TESTING
Information Patent Grant
Tissue paper converting line and method
- Patent number 11,174,595
- Issue date Nov 16, 2021
- Fabio Perini S.p.A.
- Franco Montagnani
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Hardware improvements and methods for the analysis of a spinning re...
- Patent number 11,168,978
- Issue date Nov 9, 2021
- Tokyo Electron Limited
- Michael Carcasi
- G01 - MEASURING TESTING
Information Patent Grant
Image forming apparatus
- Patent number 11,162,779
- Issue date Nov 2, 2021
- Canon Kabushiki Kaisha
- Yuji Mitsui
- G01 - MEASURING TESTING
Information Patent Grant
Optical intensity method to measure the thickness of coatings depos...
- Patent number 11,125,549
- Issue date Sep 21, 2021
- Arkema Inc.
- Gunter E. Moeller
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Optical displacement meter
- Patent number 11,112,236
- Issue date Sep 7, 2021
- Keyence Corporation
- Tatsuro Homma
- G01 - MEASURING TESTING
Information Patent Grant
Film thickness test apparatus and method and vapor deposition device
- Patent number 11,092,429
- Issue date Aug 17, 2021
- BOE Technology Group Co., Ltd.
- Chihwei Su
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical displacement meter
- Patent number 11,073,376
- Issue date Jul 27, 2021
- Keyence Corporation
- Akira Fuyuno
- G01 - MEASURING TESTING
Information Patent Grant
Sheet characterization of crepe paper
- Patent number 11,015,293
- Issue date May 25, 2021
- Solenis Technologies, L.P.
- Timothy Patterson
- B31 - MAKING ARTICLES OF PAPER OR CARDBOARD WORKING PAPER OR CARDBOARD
Information Patent Grant
Film thickness measuring method and film thickness measuring apparatus
- Patent number 11,009,340
- Issue date May 18, 2021
- Toyota Jidosha Kabushiki Kaisha
- Masanori Miura
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device, web processing device, fiber feedstock recycling...
- Patent number 11,001,966
- Issue date May 11, 2021
- Seiko Epson Corporation
- Nao Kobayashi
- D21 - PAPER-MAKING PRODUCTION OF CELLULOSE

Patents Applicationslast 30 patents

Information Patent Application
WAFER THICKNESS MEASUREMENT DEVICE AND METHOD FOR SAME
- Publication number 20240401931
- Publication date Dec 5, 2024
- KOBELCO RESEARCH INSTITUTE, INC.
- Kazuhiko TAHARA
- G01 - MEASURING TESTING
Information Patent Application
Assembly for Measuring the Thickness of a Continuous Material Web
- Publication number 20240384981
- Publication date Nov 21, 2024
- MATTHEWS INTERNATIONAL GMBH
- Thomas HACKFORT
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
DEVICE AND METHOD FOR CHARACTERIZING A TIRE IN TERMS OF UNIFORMITY
- Publication number 20240241014
- Publication date Jul 18, 2024
- COMPAGNIE GENERALE DES ETABLISSEMENTS MICHELIN
- CHRISTOPHE DE-KERMADEC
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECTS IN THE SURFACE OF CURVED...
- Publication number 20240183791
- Publication date Jun 6, 2024
- NORDISCHER MASCHINENBAU RUD. BAADER GMBH + CO. KG
- Ulf Jacobsen
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INSPECTING HOLLOW GLASS PRODUCTS OF GLASS PRODUCT MATERIAL
- Publication number 20240035807
- Publication date Feb 1, 2024
- Centrum Voor Technische Informatica B.V.
- Joop DALSTRA
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Application
A DEVICE AND A METHOD TO MEASURE AND MONITOR PHYSICAL PROPERTIES OF...
- Publication number 20240003677
- Publication date Jan 4, 2024
- Lohia Mechatronik Private Limited
- Siddharth Lohia
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL AXIS ADJUSTMENT JIG AND OPTICAL AXIS ADJUSTMENT METHOD
- Publication number 20230332881
- Publication date Oct 19, 2023
- Toyota Jidosha Kabushiki Kaisha
- Keito HORIBA
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR INSPECTING OBJECTS IN A MOVING FLOW AND MACHINE COMPRISI...
- Publication number 20230273014
- Publication date Aug 31, 2023
- PELLENC SELECTIVE TECHNOLOGIES
- Antoine BOURELY
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
Printer with High Productivity Media Scanning
- Publication number 20230271433
- Publication date Aug 31, 2023
- ELECTRONICS FOR IMAGING, INC.
- Jorge las Murria de las Heras
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
METHOD FOR CALIBRATING A THZ MEASURING DEVICE AND EXTRUSION AND MEA...
- Publication number 20230221113
- Publication date Jul 13, 2023
- CiTEX Holding GmbH
- Andrej UNRUH
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR CHARACTERIZATION OF GRAPHENE OXIDE COATINGS
- Publication number 20230213332
- Publication date Jul 6, 2023
- Via Separations, Inc.
- Brandon Ian MACDONALD
- G01 - MEASURING TESTING
Information Patent Application
THz MEASURING AND THz MEASURING DEVICE FOR MEASURING A CORRUGATED PIPE
- Publication number 20230194243
- Publication date Jun 22, 2023
- CiTEX Holding GmbH
- Jan Hendrik PETERMANN
- G01 - MEASURING TESTING
Information Patent Application
SUPERCONTINUUM LASER BASED WEB GAUGING SYSTEM
- Publication number 20230168204
- Publication date Jun 1, 2023
- Thermo Electron Scientific Instruments LLC
- Damian ASHMEAD
- G01 - MEASURING TESTING
Information Patent Application
MOBILE DEVICE FOR MEASURING AMOUNT OF SNOWFALL AND METHOD OF CONTRO...
- Publication number 20230116186
- Publication date Apr 13, 2023
- NATIONAL INSTITUTE of METEOROLOGICAL SCIENCES
- Yoo Jun KIM
- G01 - MEASURING TESTING
Information Patent Application
HEIGHT MEASUREMENT APPARATUS AND HEIGHT MEASUREMENT METHOD
- Publication number 20230066638
- Publication date Mar 2, 2023
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CHECKING A WALL THICKNESS OF A CONTAINER MADE OF AN AT L...
- Publication number 20230003508
- Publication date Jan 5, 2023
- Krones Aktiengesellschaft
- Stefan PIANA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING FILM THICKNESS, METHOD FOR PRODUCING A FILM...
- Publication number 20230003509
- Publication date Jan 5, 2023
- STORA ENSO OYJ
- Ari Jäsberg
- D21 - PAPER-MAKING PRODUCTION OF CELLULOSE
Information Patent Application
MEASUREMENT DEVICE AND METHOD FOR DETECTING LOCAL THICKENINGS IN A...
- Publication number 20220412724
- Publication date Dec 29, 2022
- Covestro Intellectual Property GmbH & Co. KG
- Alexander PAULUS
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
METHODS AND SYSTEMS FOR BLOWN FILM THICKNESS MEASUREMENT
- Publication number 20220412723
- Publication date Dec 29, 2022
- 3M Innovative Properties Company
- Thomas J. Strey
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR MANUFACTURING A GLASS RIBBON
- Publication number 20220396517
- Publication date Dec 15, 2022
- Corning Incorporated
- Jeffrey Howard Ahrens
- G01 - MEASURING TESTING
Information Patent Application
DETECTION DEVICE AND IMAGE FORMING APPARATUS
- Publication number 20220381554
- Publication date Dec 1, 2022
- Shinya OHISHI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING THICKNESS OF UNIT CELL
- Publication number 20220244040
- Publication date Aug 4, 2022
- LG ENERGY SOLUTION, LTD.
- Min Jun CHOI
- G01 - MEASURING TESTING
Information Patent Application
In-Situ Metrology And Process Control
- Publication number 20220181179
- Publication date Jun 9, 2022
- Applied Materials, Inc.
- Ramesh Krishnamurthy
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR CALIBRATING A THZ MEASURING APPARATUS, THZ MEASURING MET...
- Publication number 20220178677
- Publication date Jun 9, 2022
- CiTEX Holding GmbH
- Roland BÖHM
- G01 - MEASURING TESTING
Information Patent Application
THZ MEASURING DEVICE AND THZ MEASURING METHOD FOR DETERMINING A LAY...
- Publication number 20220146251
- Publication date May 12, 2022
- CiTEX Holding GmbH
- Roland BÖHM
- G01 - MEASURING TESTING
Information Patent Application
REAL-TIME RAIL WEAR AND DEFECT MONITORING SYSTEM EMPLOYING DISTANCE...
- Publication number 20220073113
- Publication date Mar 10, 2022
- AVANTE INTERNATIONAL TECHNOLOGY, INC.
- Kevin Kwong-Tai Chung
- B61 - RAILWAYS
Information Patent Application
DEVICE AND METHOD FOR DETECTING AN OBJECT
- Publication number 20220034648
- Publication date Feb 3, 2022
- Sikora AG
- Harald Sikora
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEDIA SENSOR WITH BLOWER
- Publication number 20220011093
- Publication date Jan 13, 2022
- Hewlett-Packard Development Company, L.P.
- Sachiyo YAMADA
- G01 - MEASURING TESTING
Information Patent Application
Hardware Improvements and Methods for the Analysis of a Spinning Re...
- Publication number 20210207951
- Publication date Jul 8, 2021
- TOKYO ELECTRON LIMITED
- Michael Carcasi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
System and method for thickness measurement in tortilla production
- Publication number 20210164773
- Publication date Jun 3, 2021
- Premier Innovations, LLC
- Brian E. Bartlett
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL

of objects while moving

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and system for improving strain guage to blade tip timing co...

Device and method for detecting an object

Apparatus and method for measuring thickness of unit cell

THz measuring device and THz measuring method for determining a lay...

Mobile device for measuring amount of snowfall and method of contro...

In-situ metrology and process control

Measurement device and measurement method for measuring a physical...

Apparatus for detecting slurry spread volume using terahertz wave,...

Sheet thickness measurement device

Method to determine properties of a coating on a transparent film,...

Method and system for improving strain gauge to blade tip timing co...

Hardware improvements and methods for the analysis of a spinning re...

Optical monitor

Device and method for contactless thickness measurement of a planar...

Method for length measurement of a flat good in a goods processing...

In-situ metrology and process control

Thickness determination of web product by mid-infrared wavelength s...

Stone-block analysis device and methods for the evaluation of stone...

System and method for thickness measurement in tortilla production

Process for the manufacturing of a steel strip for packaging and as...

Tissue paper converting line and method

Hardware improvements and methods for the analysis of a spinning re...

Image forming apparatus

Optical intensity method to measure the thickness of coatings depos...

Optical displacement meter

Film thickness test apparatus and method and vapor deposition device

Optical displacement meter

Sheet characterization of crepe paper

Film thickness measuring method and film thickness measuring apparatus

Measuring device, web processing device, fiber feedstock recycling...

Patents Applicationslast 30 patents

WAFER THICKNESS MEASUREMENT DEVICE AND METHOD FOR SAME

Assembly for Measuring the Thickness of a Continuous Material Web

DEVICE AND METHOD FOR CHARACTERIZING A TIRE IN TERMS OF UNIFORMITY

METHOD AND APPARATUS FOR DETECTING DEFECTS IN THE SURFACE OF CURVED...

METHOD FOR INSPECTING HOLLOW GLASS PRODUCTS OF GLASS PRODUCT MATERIAL

A DEVICE AND A METHOD TO MEASURE AND MONITOR PHYSICAL PROPERTIES OF...

OPTICAL AXIS ADJUSTMENT JIG AND OPTICAL AXIS ADJUSTMENT METHOD

DEVICE FOR INSPECTING OBJECTS IN A MOVING FLOW AND MACHINE COMPRISI...

Printer with High Productivity Media Scanning

METHOD FOR CALIBRATING A THZ MEASURING DEVICE AND EXTRUSION AND MEA...

APPARATUS FOR CHARACTERIZATION OF GRAPHENE OXIDE COATINGS

THz MEASURING AND THz MEASURING DEVICE FOR MEASURING A CORRUGATED PIPE

SUPERCONTINUUM LASER BASED WEB GAUGING SYSTEM

MOBILE DEVICE FOR MEASURING AMOUNT OF SNOWFALL AND METHOD OF CONTRO...

HEIGHT MEASUREMENT APPARATUS AND HEIGHT MEASUREMENT METHOD

METHOD FOR CHECKING A WALL THICKNESS OF A CONTAINER MADE OF AN AT L...

METHOD FOR DETERMINING FILM THICKNESS, METHOD FOR PRODUCING A FILM...

MEASUREMENT DEVICE AND METHOD FOR DETECTING LOCAL THICKENINGS IN A...

METHODS AND SYSTEMS FOR BLOWN FILM THICKNESS MEASUREMENT

METHODS AND APPARATUS FOR MANUFACTURING A GLASS RIBBON

DETECTION DEVICE AND IMAGE FORMING APPARATUS

APPARATUS AND METHOD FOR MEASURING THICKNESS OF UNIT CELL

In-Situ Metrology And Process Control

METHOD FOR CALIBRATING A THZ MEASURING APPARATUS, THZ MEASURING MET...

THZ MEASURING DEVICE AND THZ MEASURING METHOD FOR DETERMINING A LAY...

REAL-TIME RAIL WEAR AND DEFECT MONITORING SYSTEM EMPLOYING DISTANCE...

DEVICE AND METHOD FOR DETECTING AN OBJECT

OPTICAL MEDIA SENSOR WITH BLOWER

Hardware Improvements and Methods for the Analysis of a Spinning Re...

System and method for thickness measurement in tortilla production