of plate type

Industry

CPC
G01R27/2641

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom

Current Industry

G01R27/2641of plate type

Industries

Patents Grantslast 30 patents

Information Patent Grant
Tuning of narrowband near-field probes
- Patent number 11,585,840
- Issue date Feb 21, 2023
- Raytheon Company
- Thomas G. Lavedas
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus for measuring wideband dielectric measurements of objects...
- Patent number 11,320,558
- Issue date May 3, 2022
- Geophysical Survey Systems, Inc.
- Roger Roberts
- G01 - MEASURING TESTING
Information Patent Grant
Near-field electrostatic communications system
- Patent number 11,099,222
- Issue date Aug 24, 2021
- Christopher T. Baumgartner
- G01 - MEASURING TESTING
Information Patent Grant
Dielectric constant microscope and method of observing organic spec...
- Patent number 10,634,635
- Issue date Apr 28, 2020
- Toshihiko Ogura
- G02 - OPTICS
Information Patent Grant
Aerospace transparency having moisture sensors
- Patent number 9,983,171
- Issue date May 29, 2018
- PPG Industries Ohio, Inc.
- Yu Jiao
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Aerospace transparency having moisture sensors
- Patent number 9,975,646
- Issue date May 22, 2018
- PPG Industries Ohio, Inc.
- Yu Jiao
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Measurement of thickness of dielectric films on surfaces
- Patent number 8,521,471
- Issue date Aug 27, 2013
- University of Utah Research Foundation
- Mikhail Skliar
- G01 - MEASURING TESTING
Information Patent Grant
Methods for measuring dielectric properties of parts
- Patent number 7,973,539
- Issue date Jul 5, 2011
- Lam Research Corporation
- Jaehyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Methods for measuring dielectric properties of parts
- Patent number 7,911,213
- Issue date Mar 22, 2011
- Lam Research Corporation
- Jaehyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting process performance for use in...
- Patent number 7,737,706
- Issue date Jun 15, 2010
- Tokyo Electron Limited
- Yohei Yamazawa
- G01 - MEASURING TESTING
Information Patent Grant
Wall detector
- Patent number 7,508,221
- Issue date Mar 24, 2009
- Hilti Aktiengesellschaft
- Christoph Wuersch
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive plate dielectrometer method and system for measuring die...
- Patent number 7,479,790
- Issue date Jan 20, 2009
- The Boeing Company
- Christopher Y. Choi
- G01 - MEASURING TESTING
Information Patent Grant
Impedance monitoring system and method
- Patent number 7,019,543
- Issue date Mar 28, 2006
- Tokyo Electron Limited
- Bill H. Quon
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for characterizing ferroelectric materials
- Patent number 7,009,390
- Issue date Mar 7, 2006
- Centre Nationa de la Recherche Scientifique-CNRS
- Lionel Cima
- G01 - MEASURING TESTING
Information Patent Grant
Precise high resolution non-contact method to measure dielectric ho...
- Patent number 5,874,832
- Issue date Feb 23, 1999
- Raytheon Company
- Stephen A. Gabelich
- G01 - MEASURING TESTING
Information Patent Grant
Dielectric sensor apparatus
- Patent number 5,654,643
- Issue date Aug 5, 1997
- Metriguard Inc.
- Friend K. Bechtel
- G01 - MEASURING TESTING
Information Patent Grant
Quick-mount measuring device for evaluating the electrical characte...
- Patent number 5,451,866
- Issue date Sep 19, 1995
- The United States of America as represented by the Secretary of the Army
- William C. Drach
- G01 - MEASURING TESTING
Information Patent Grant
Dielectric sensor
- Patent number 5,394,097
- Issue date Feb 28, 1995
- Friend K. Bechtel
- G01 - MEASURING TESTING
Information Patent Grant
Parallel plate dielectric constant measuring apparatus having means...
- Patent number 5,389,884
- Issue date Feb 14, 1995
- Seiko Instruments Inc.
- Nobutaka Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Differential dielectric analyzer
- Patent number 5,309,110
- Issue date May 3, 1994
- The Perkin-Elmer Corporation
- Michael J. O'Neill
- G01 - MEASURING TESTING
Information Patent Grant
Electrode system to facilitate dielectric measurement of materials
- Patent number 5,140,273
- Issue date Aug 18, 1992
- Hewlett-Packard Company
- Hideyuki Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring electrostatic polarization
- Patent number 4,833,392
- Issue date May 23, 1989
- Regents of the University of California
- Erwin L. Hahn
- G01 - MEASURING TESTING
Information Patent Grant
Scanning combination thickness and moisture gauge for moving sheet...
- Patent number 4,791,353
- Issue date Dec 13, 1988
- Impact Systems, Inc.
- Pekka Typpo
- G01 - MEASURING TESTING
Information Patent Grant
Detector device and method for distinguishing between fluids having...
- Patent number 4,751,476
- Issue date Jun 14, 1988
- Fisher Scientific Company
- Robert Meijer
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for the measurement of the properties of sheet...
- Patent number 4,739,249
- Issue date Apr 19, 1988
- Imatran Voima Oy
- Ebbe G. Nyfors
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring the moisture content of moving materials
- Patent number 4,733,166
- Issue date Mar 22, 1988
- Delmer W. Wagner
- G01 - MEASURING TESTING
Information Patent Grant
Bridgeless dielectric measurement
- Patent number 4,345,204
- Issue date Aug 17, 1982
- Armstrong World Industries, Inc.
- Donald L. Shelley
- G01 - MEASURING TESTING
Information Patent Grant
Detector for locating the interfacial boundary level between two li...
- Patent number 4,209,740
- Issue date Jun 24, 1980
- Societe Nationale Elf Aquitaine (Production)
- Louis Marthe
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for investigating dielectric semiconductor mat...
- Patent number 4,208,624
- Issue date Jun 17, 1980
- Bell Telephone Laboratories, Incorporated
- Gabriel L. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus employing thin conductive films on flexible no...
- Patent number 3,942,107
- Issue date Mar 2, 1976
- Western Electric Company, Inc.
- Allen Robert Gerhard
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DIELECTRIC CHARACTERISTIC MEASUREMENT METHOD AND DIELECTRIC CHARACT...
- Publication number 20240168071
- Publication date May 23, 2024
- EM labs, Inc.
- Yoshiyuki YANAGIMOTO
- G01 - MEASURING TESTING
Information Patent Application
TUNING OF NARROWBAND NEAR-FIELD PROBES
- Publication number 20220065911
- Publication date Mar 3, 2022
- Raytheon Company
- Thomas G. Lavedas
- G01 - MEASURING TESTING
Information Patent Application
Near-Field Electrostatic Communications System
- Publication number 20200233023
- Publication date Jul 23, 2020
- Big Monster Toys
- Christopher T. Baumgartner
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DIELECTRIC CONSTANT MICROSCOPE AND METHOD OF OBSERVING ORGANIC SPEC...
- Publication number 20190049399
- Publication date Feb 14, 2019
- National Institute of Advanced Industrial Science and Technology
- Toshihiko OGURA
- G02 - OPTICS
Information Patent Application
METHODS FOR MEASURING DIELECTRIC PROPERTIES OF PARTS
- Publication number 20110140715
- Publication date Jun 16, 2011
- LAM RESEARCH CORPORATION
- Jaehyun Kim
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OF THICKNESS OF DIELECTRIC FILMS ON SURFACES
- Publication number 20100198554
- Publication date Aug 5, 2010
- UNIVERSITY OF UTAH RESEARCH FOUNDATION
- Mikhail Skliar
- G01 - MEASURING TESTING
Information Patent Application
Methods for Measuring Dielectric Properties of Parts
- Publication number 20100079152
- Publication date Apr 1, 2010
- LAM RESEARCH CORPORATION
- Jaehyun Kim
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING PROCESS PERFORMANCE FOR USE IN...
- Publication number 20080174324
- Publication date Jul 24, 2008
- TOKYO ELECTRON LIMITED
- Yohei YAMAZAWA
- G01 - MEASURING TESTING
Information Patent Application
Capacitive plate dielectrometer method and system for measuring die...
- Publication number 20080111559
- Publication date May 15, 2008
- Christopher Y. Choi
- G01 - MEASURING TESTING
Information Patent Application
Wall detector
- Publication number 20070035313
- Publication date Feb 15, 2007
- Hilti Aktiengesellschaft
- Christoph Wuersch
- G01 - MEASURING TESTING
Information Patent Application
Method and device for characterizing ferroelectric materials
- Publication number 20050248973
- Publication date Nov 10, 2005
- Centre National De La Recherche Scientifique-cnrs
- Lionel Cima
- G01 - MEASURING TESTING
Information Patent Application
Impedance monitoring system and method
- Publication number 20040135590
- Publication date Jul 15, 2004
- Bill H. Quon
- G01 - MEASURING TESTING

of plate type

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Tuning of narrowband near-field probes

Apparatus for measuring wideband dielectric measurements of objects...

Near-field electrostatic communications system

Dielectric constant microscope and method of observing organic spec...

Aerospace transparency having moisture sensors

Aerospace transparency having moisture sensors

Measurement of thickness of dielectric films on surfaces

Methods for measuring dielectric properties of parts

Methods for measuring dielectric properties of parts

Method and apparatus for inspecting process performance for use in...

Wall detector

Capacitive plate dielectrometer method and system for measuring die...

Impedance monitoring system and method

Method and device for characterizing ferroelectric materials

Precise high resolution non-contact method to measure dielectric ho...

Dielectric sensor apparatus

Quick-mount measuring device for evaluating the electrical characte...

Dielectric sensor

Parallel plate dielectric constant measuring apparatus having means...

Differential dielectric analyzer

Electrode system to facilitate dielectric measurement of materials

Apparatus and method for measuring electrostatic polarization

Scanning combination thickness and moisture gauge for moving sheet...

Detector device and method for distinguishing between fluids having...

Method and apparatus for the measurement of the properties of sheet...

Apparatus for measuring the moisture content of moving materials

Bridgeless dielectric measurement

Detector for locating the interfacial boundary level between two li...

Method and apparatus for investigating dielectric semiconductor mat...

Method and apparatus employing thin conductive films on flexible no...

Patents Applicationslast 30 patents

DIELECTRIC CHARACTERISTIC MEASUREMENT METHOD AND DIELECTRIC CHARACT...

TUNING OF NARROWBAND NEAR-FIELD PROBES

Near-Field Electrostatic Communications System

DIELECTRIC CONSTANT MICROSCOPE AND METHOD OF OBSERVING ORGANIC SPEC...

METHODS FOR MEASURING DIELECTRIC PROPERTIES OF PARTS

MEASUREMENT OF THICKNESS OF DIELECTRIC FILMS ON SURFACES

Methods for Measuring Dielectric Properties of Parts

METHOD AND APPARATUS FOR INSPECTING PROCESS PERFORMANCE FOR USE IN...

Capacitive plate dielectrometer method and system for measuring die...

Wall detector

Method and device for characterizing ferroelectric materials

Impedance monitoring system and method