of printed or hybrid circuits or circuit substrates

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CPC
G01R31/309

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/309of printed or hybrid circuits or circuit substrates

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for high precision optical characterization of...
- Patent number 11,940,488
- Issue date Mar 26, 2024
- XCalipr Corporation
- William W. Chism
- G01 - MEASURING TESTING
Information Patent Grant
System and method for rapid inspection of printed circuit board usi...
- Patent number 11,906,578
- Issue date Feb 20, 2024
- Battelle Memorial Institute
- Thomas F. Kent
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, method of inspecting magnetic disk device, and electronic c...
- Patent number 11,609,285
- Issue date Mar 21, 2023
- Kabushiki Kaisha Toshiba
- Yoshihiro Amemiya
- G01 - MEASURING TESTING
Information Patent Grant
Immunity evaluation system and immunity evaluation method
- Patent number 11,609,267
- Issue date Mar 21, 2023
- Hitachi, Ltd.
- Isao Houda
- G01 - MEASURING TESTING
Information Patent Grant
Temperature monitoring for printed circuit board assemblies during...
- Patent number 11,525,736
- Issue date Dec 13, 2022
- International Business Machines Corporation
- Stevana Coliukos
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
High precision optical characterization of carrier transport proper...
- Patent number 11,402,429
- Issue date Aug 2, 2022
- XCalipr Corporation
- William W. Chism
- G01 - MEASURING TESTING
Information Patent Grant
Integrated photonic test circuit
- Patent number 11,131,710
- Issue date Sep 28, 2021
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Stéphane Bernabe
- G01 - MEASURING TESTING
Information Patent Grant
Measurement models of nanowire semiconductor structures based on re...
- Patent number 11,036,898
- Issue date Jun 15, 2021
- KLA-Tencor Corporation
- Houssam Chouaib
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High precision optical characterization of carrier transport proper...
- Patent number 10,921,369
- Issue date Feb 16, 2021
- XCalipr Corporation
- William W. Chism
- G01 - MEASURING TESTING
Information Patent Grant
Method of forming a plurality of electro-optical module assemblies
- Patent number 10,687,425
- Issue date Jun 16, 2020
- International Business Machines Corporation
- Paul S. Andry
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Integrated electro-optical module assembly
- Patent number 10,670,656
- Issue date Jun 2, 2020
- International Business Machines Corporation
- Paul S. Andry
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection apparatus and method
- Patent number 10,650,510
- Issue date May 12, 2020
- Koh Young Technology Inc.
- Seung Ae Seo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of forming a plurality of electro-optical module assemblies
- Patent number 10,638,613
- Issue date Apr 28, 2020
- International Business Machines Corporation
- Paul S. Andry
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Test apparatus and methods for arc mitigation device
- Patent number 10,613,146
- Issue date Apr 7, 2020
- Eaton Intelligent Power Limited
- Robert J. Burns
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Feedback control of mounted chip production
- Patent number 10,546,226
- Issue date Jan 28, 2020
- AVERY DENNISON RETAIL INFORMATION SERVICES LLC
- Ian J. Forster
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated electro-optical module assembly
- Patent number 10,393,798
- Issue date Aug 27, 2019
- International Business Machines Corporation
- Paul S. Andry
- G01 - MEASURING TESTING
Information Patent Grant
Metrology test structure design and measurement scheme for measurin...
- Patent number 10,359,369
- Issue date Jul 23, 2019
- Nova Measuring Instruments Ltd.
- Gilad Barak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical electrical measurement system, a measurement probe and a me...
- Patent number 10,330,706
- Issue date Jun 25, 2019
- Telefonaktiebolaget LM Ericsson (publ)
- Sverker Sander
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical electrical measurement system, a measurement probe and a me...
- Patent number 10,295,569
- Issue date May 21, 2019
- Telefonaktiebolaget LM Ericsson (publ)
- Sverker Sander
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus and method for non-contact sample analyzing using teraher...
- Patent number 10,215,554
- Issue date Feb 26, 2019
- Industry-University Cooperation Foundation Hanyang University
- Hak-Sung Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for generating X-ray inspection image of elect...
- Patent number 10,151,711
- Issue date Dec 11, 2018
- SHENZHEN KANA TECHNOLOGY CO., LTD.
- Wenxue Wan
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Graphic user interface for a three dimensional board inspection app...
- Patent number 10,025,898
- Issue date Jul 17, 2018
- Koh Young Technology Inc.
- Joongki Jeong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for detecting micro-cracks in wafers
- Patent number 9,651,502
- Issue date May 16, 2017
- Bluplanet Pte Ltd
- Sok Leng Chan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Substrate inspection device and component mounting device
- Patent number 9,511,455
- Issue date Dec 6, 2016
- CKD Corporation
- Manabu Okuda
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Board inspection apparatus and method
- Patent number 9,470,752
- Issue date Oct 18, 2016
- Koh Young Technology Inc.
- Joong-Ki Jeong
- G01 - MEASURING TESTING
Information Patent Grant
Adjustable split-beam optical probing (ASOP)
- Patent number 9,417,281
- Issue date Aug 16, 2016
- CHECKPOINT TECHNOLOGIES LLC
- Horst E. Groneberg
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact testing of printed electronics
- Patent number 9,360,519
- Issue date Jun 7, 2016
- Corning Incorporated
- Robert Addison Boudreau
- G01 - MEASURING TESTING
Information Patent Grant
Board inspection apparatus and method
- Patent number 9,091,725
- Issue date Jul 28, 2015
- Koh Young Technology Inc.
- Joong-Ki Jeong
- G01 - MEASURING TESTING
Information Patent Grant
Defect correcting method and defect correcting device for an electr...
- Patent number 8,957,962
- Issue date Feb 17, 2015
- Japan Display Inc.
- Takeshi Arai
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspection of electrical circuits
- Patent number 8,773,140
- Issue date Jul 8, 2014
- Photon Dynamics, Inc.
- Sam-Soo Jung
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SOLDER MASK FAULT FIBER OPTICS SENSOR
- Publication number 20240284590
- Publication date Aug 22, 2024
- Micron Technology, Inc.
- Chan H. Yoo
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR RAPID INSPECTION OF PRINTED CIRCUIT BOARD USI...
- Publication number 20240142516
- Publication date May 2, 2024
- Battelle Memorial Institute
- Thomas F. Kent
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RADIO FREQUENCY CONDUCTION TEST METHOD AND RELATED APPARATUS
- Publication number 20240036109
- Publication date Feb 1, 2024
- HONOR DEVICE CO., LTD.
- Wei ZHAI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR HIGH PRECISION OPTICAL CHARACTERIZATION OF...
- Publication number 20220291281
- Publication date Sep 15, 2022
- XCALIPR CORPORATION
- William W. Chism
- G01 - MEASURING TESTING
Information Patent Application
Immunity Evaluation System and Immunity Evaluation Method
- Publication number 20220268836
- Publication date Aug 25, 2022
- Hitachi, Ltd
- Isao HOUDA
- G01 - MEASURING TESTING
Information Patent Application
METHOD, METHOD OF INSPECTING MAGNETIC DISK DEVICE, AND ELECTRONIC C...
- Publication number 20210286030
- Publication date Sep 16, 2021
- Kabushiki Kaisha Toshiba
- Yoshihiro Amemiya
- G01 - MEASURING TESTING
Information Patent Application
HIGH PRECISION OPTICAL CHARACTERIZATION OF CARRIER TRANSPORT PROPER...
- Publication number 20210165040
- Publication date Jun 3, 2021
- XCALIPR CORPORATION
- William W. Chism
- G01 - MEASURING TESTING
Information Patent Application
AI-based Automatic Judgment Unit for Quality Classification of Semi...
- Publication number 20210158499
- Publication date May 27, 2021
- AT&S (Chongqing) Company Limited
- Seok Kim Tay
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED PHOTONIC TEST CIRCUIT
- Publication number 20200174067
- Publication date Jun 4, 2020
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Stéphane Bernabe
- G01 - MEASURING TESTING
Information Patent Application
Measurement Models Of Nanowire Semiconductor Structures Based On Re...
- Publication number 20190286787
- Publication date Sep 19, 2019
- KLA-Tencor Corporation
- Houssam Chouaib
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
High Precision Optical Characterization of Carrier Transport Proper...
- Publication number 20180188319
- Publication date Jul 5, 2018
- William W. Chism
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED ELECTRO-OPTICAL MODULE ASSEMBLY
- Publication number 20180098433
- Publication date Apr 5, 2018
- International Business Machines Corporation
- Paul S. Andry
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED ELECTRO-OPTICAL MODULE ASSEMBLY
- Publication number 20180095125
- Publication date Apr 5, 2018
- International Business Machines Corporation
- Paul S. Andry
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED ELECTRO-OPTICAL MODULE ASSEMBLY
- Publication number 20170322255
- Publication date Nov 9, 2017
- International Business Machines Corporation
- Paul S. Andry
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR GENERATING X-RAY INSPECTION IMAGE OF ELECT...
- Publication number 20170269007
- Publication date Sep 21, 2017
- SHENZHEN KANA TECHNOLOGY CO., LTD.
- Wenxue WAN
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY TEST STRUCTURE DESIGN AND MEASUREMENT SCHEME FOR MEASURIN...
- Publication number 20170227474
- Publication date Aug 10, 2017
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
WIRING INSPECTING METHOD, WIRING INSPECTING APPARATUS, WIRING INSPE...
- Publication number 20140204199
- Publication date Jul 24, 2014
- Sharp Kabushiki Kaisha
- Eiji Yamada
- G01 - MEASURING TESTING
Information Patent Application
INTERPOSER TESTING DEVICE AND METHOD THEREOF
- Publication number 20140160269
- Publication date Jun 12, 2014
- Industrial Technology Research Institute
- Ka-Yi Yeh
- G01 - MEASURING TESTING
Information Patent Application
LASER SCANNING DEVICE AND LASER SCANNING METHOD
- Publication number 20130215917
- Publication date Aug 22, 2013
- Samsung Electro-Mechanics Co., Ltd.
- Taeg Gyum Kim
- G02 - OPTICS
Information Patent Application
BOARD INSPECTION APPARATUS AND METHOD
- Publication number 20130215262
- Publication date Aug 22, 2013
- KOH YOUNG TECHNOLOGY INC.
- Joong-Ki JEONG
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT TESTING OF PRINTED ELECTRONICS
- Publication number 20130127487
- Publication date May 23, 2013
- Robert Addison Boudreau
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTION OF ELECTRICAL CIRCUITS
- Publication number 20130027050
- Publication date Jan 31, 2013
- Photon Dynamics, Inc.
- Sam-Soo JUNG
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MEASURING CONDUCTIVE PATTERN ON SUBSTRATE
- Publication number 20120025839
- Publication date Feb 2, 2012
- Industrial Technology Research Institute
- Yong-Tong ZOU
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING DEFECTS IN CIRCUIT PATTERN
- Publication number 20110128011
- Publication date Jun 2, 2011
- Seung Seoup LEE
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING DEFECTS IN CIRCUIT PATTERN OF SUBSTRATE
- Publication number 20110116084
- Publication date May 19, 2011
- Seung Seoup LEE
- G01 - MEASURING TESTING
Information Patent Application
BOARD INSPECTION APPARATUS AND METHOD
- Publication number 20110002527
- Publication date Jan 6, 2011
- KOH YOUNG TECHNOLOGY INC.
- Joong-Ki JEONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT CORRECTING METHOD AND DEFECT CORRECTING DEVICE FOR AN ELECTR...
- Publication number 20100302360
- Publication date Dec 2, 2010
- Takeshi Arai
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT TESTING OF PRINTED ELECTRONICS
- Publication number 20100283499
- Publication date Nov 11, 2010
- Robert Addison Bourdreau
- G01 - MEASURING TESTING
Information Patent Application
Producing method of wired circuit board
- Publication number 20100208250
- Publication date Aug 19, 2010
- Nitto Denko Corporation
- Terukazu Ihara
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20100158348
- Publication date Jun 24, 2010
- Hitachi High-Technologies Corporation
- Hiroshi Kawaguchi
- G06 - COMPUTING CALCULATING COUNTING

of printed or hybrid circuits or circuit substrates

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for high precision optical characterization of...

System and method for rapid inspection of printed circuit board usi...

Method, method of inspecting magnetic disk device, and electronic c...

Immunity evaluation system and immunity evaluation method

Temperature monitoring for printed circuit board assemblies during...

High precision optical characterization of carrier transport proper...

Integrated photonic test circuit

Measurement models of nanowire semiconductor structures based on re...

High precision optical characterization of carrier transport proper...

Method of forming a plurality of electro-optical module assemblies

Integrated electro-optical module assembly

Substrate inspection apparatus and method

Method of forming a plurality of electro-optical module assemblies

Test apparatus and methods for arc mitigation device

Feedback control of mounted chip production

Integrated electro-optical module assembly

Metrology test structure design and measurement scheme for measurin...

Optical electrical measurement system, a measurement probe and a me...

Optical electrical measurement system, a measurement probe and a me...

Apparatus and method for non-contact sample analyzing using teraher...

Method and apparatus for generating X-ray inspection image of elect...

Graphic user interface for a three dimensional board inspection app...

Method and system for detecting micro-cracks in wafers

Substrate inspection device and component mounting device

Board inspection apparatus and method

Adjustable split-beam optical probing (ASOP)

Non-contact testing of printed electronics

Board inspection apparatus and method

Defect correcting method and defect correcting device for an electr...

System and method for inspection of electrical circuits

Patents Applicationslast 30 patents

SOLDER MASK FAULT FIBER OPTICS SENSOR

SYSTEM AND METHOD FOR RAPID INSPECTION OF PRINTED CIRCUIT BOARD USI...

RADIO FREQUENCY CONDUCTION TEST METHOD AND RELATED APPARATUS

SYSTEMS AND METHODS FOR HIGH PRECISION OPTICAL CHARACTERIZATION OF...

Immunity Evaluation System and Immunity Evaluation Method

METHOD, METHOD OF INSPECTING MAGNETIC DISK DEVICE, AND ELECTRONIC C...

HIGH PRECISION OPTICAL CHARACTERIZATION OF CARRIER TRANSPORT PROPER...

AI-based Automatic Judgment Unit for Quality Classification of Semi...

INTEGRATED PHOTONIC TEST CIRCUIT

Measurement Models Of Nanowire Semiconductor Structures Based On Re...

High Precision Optical Characterization of Carrier Transport Proper...

INTEGRATED ELECTRO-OPTICAL MODULE ASSEMBLY

INTEGRATED ELECTRO-OPTICAL MODULE ASSEMBLY

INTEGRATED ELECTRO-OPTICAL MODULE ASSEMBLY

METHOD AND APPARATUS FOR GENERATING X-RAY INSPECTION IMAGE OF ELECT...

METROLOGY TEST STRUCTURE DESIGN AND MEASUREMENT SCHEME FOR MEASURIN...

WIRING INSPECTING METHOD, WIRING INSPECTING APPARATUS, WIRING INSPE...

INTERPOSER TESTING DEVICE AND METHOD THEREOF

LASER SCANNING DEVICE AND LASER SCANNING METHOD

BOARD INSPECTION APPARATUS AND METHOD

NON-CONTACT TESTING OF PRINTED ELECTRONICS

SYSTEM AND METHOD FOR INSPECTION OF ELECTRICAL CIRCUITS

APPARATUS FOR MEASURING CONDUCTIVE PATTERN ON SUBSTRATE

APPARATUS AND METHOD FOR INSPECTING DEFECTS IN CIRCUIT PATTERN

METHOD OF INSPECTING DEFECTS IN CIRCUIT PATTERN OF SUBSTRATE

BOARD INSPECTION APPARATUS AND METHOD

DEFECT CORRECTING METHOD AND DEFECT CORRECTING DEVICE FOR AN ELECTR...

NON-CONTACT TESTING OF PRINTED ELECTRONICS

Producing method of wired circuit board

INSPECTION SYSTEM AND INSPECTION METHOD