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G11C29/50016

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GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

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G11C29/50016of retention

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Imprint recovery for memory arrays
- Patent number 12,190,947
- Issue date Jan 7, 2025
- Micron Technology, Inc.
- Jonathan J. Strand
- G11 - INFORMATION STORAGE
Information Patent Grant
DRAM retention test method for dynamic error correction
- Patent number 12,190,974
- Issue date Jan 7, 2025
- RAMBUS INC.
- Ely Tsern
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for estimating and compensating for leakage curre...
- Patent number 12,073,903
- Issue date Aug 27, 2024
- Meta Platforms Technologies, LLP
- Umanath Ramachandra Kamath
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of screening non-volatile memory cells
- Patent number 12,014,793
- Issue date Jun 18, 2024
- Silicon Storage Technology, Inc.
- Viktor Markov
- G11 - INFORMATION STORAGE
Information Patent Grant
Signal timing alignment based on a common data strobe in memory dev...
- Patent number 11,935,578
- Issue date Mar 19, 2024
- III Holdings 2, LLC
- Michael C. Stephens
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory with efficient DVS controlled by asynchronous inputs
- Patent number 11,837,313
- Issue date Dec 5, 2023
- QUALCOMM Incorporated
- Pradeep Raj
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods for correcting data errors in memory
- Patent number 11,755,410
- Issue date Sep 12, 2023
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Retention voltage management for a volatile memory
- Patent number 11,688,486
- Issue date Jun 27, 2023
- Apple Inc.
- Shahzad Nazar
- G11 - INFORMATION STORAGE
Information Patent Grant
DRAM retention test method for dynamic error correction
- Patent number 11,646,090
- Issue date May 9, 2023
- RAMBUS INC.
- Ely Tsern
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imprint management for memory
- Patent number 11,631,473
- Issue date Apr 18, 2023
- Micron Technology, Inc.
- Shashank Bangalore Lakshman
- G11 - INFORMATION STORAGE
Information Patent Grant
Test method and test apparatus for semiconductor device
- Patent number 11,605,443
- Issue date Mar 14, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yu-Ting Cheng
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for detecting leakage position in memory and device for dete...
- Patent number 11,594,275
- Issue date Feb 28, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Xing Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory circuit including tracking circuit
- Patent number 11,443,786
- Issue date Sep 13, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Kuoyuan (Peter) Hsu
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods for correcting data errors in memory
- Patent number 11,429,482
- Issue date Aug 30, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Signal timing alignment based on a common data strobe in memory dev...
- Patent number 11,398,267
- Issue date Jul 26, 2022
- III Holdings 2, LLC
- Michael C. Stephens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory test apparatus and testing method thereof including built-in...
- Patent number 11,309,048
- Issue date Apr 19, 2022
- Samsung Electronics Co., Ltd.
- Hong-Mook Choi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imprint recovery for memory arrays
- Patent number 11,217,303
- Issue date Jan 4, 2022
- Micron Technology, Inc.
- Jonathan J. Strand
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory inspecting method and memory inspecting system
- Patent number 11,195,592
- Issue date Dec 7, 2021
- Integrated Silicon Solution Inc.
- PaiLu Dennis Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Imprint management for memory
- Patent number 11,094,394
- Issue date Aug 17, 2021
- Micron Technology, Inc.
- Shashank Bangalore Lakshman
- G11 - INFORMATION STORAGE
Information Patent Grant
Retention voltage management for a volatile memory
- Patent number 11,094,395
- Issue date Aug 17, 2021
- Apple Inc.
- Shahzad Nazar
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory circuit including tracking circuit
- Patent number 11,017,825
- Issue date May 25, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Kuoyuan (Peter) Hsu
- G11 - INFORMATION STORAGE
Information Patent Grant
DRAM retention test method for dynamic error correction
- Patent number 11,011,248
- Issue date May 18, 2021
- RAMBUS INC.
- Ely Tsern
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Identification of susceptibility to induced charge leakage
- Patent number 10,978,171
- Issue date Apr 13, 2021
- Microsoft Technology Licensing, LLC
- Stefan Saroiu
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods for correcting data errors in memory
- Patent number 10,936,413
- Issue date Mar 2, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Signal timing alignment based on a common data strobe in memory dev...
- Patent number 10,923,176
- Issue date Feb 16, 2021
- III Holdings 2, LLC
- Michael C. Stephens
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and methods for determining read voltages for a read oper...
- Patent number 10,923,200
- Issue date Feb 16, 2021
- Micron Technology, Inc.
- Luca De Santis
- G11 - INFORMATION STORAGE
Information Patent Grant
SRAM with error correction in retention mode
- Patent number 10,885,972
- Issue date Jan 5, 2021
- Ambiq Micro, Inc.
- Christophe J. Chevallier
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory devices for pattern matching
- Patent number 10,776,362
- Issue date Sep 15, 2020
- Micron Technology, Inc.
- Luca De Santis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory storage apparatus and forming method of resistive memory dev...
- Patent number 10,770,167
- Issue date Sep 8, 2020
- Winbond Electronics Corp.
- Ping-Kun Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for detection refresh starvation of a memory
- Patent number 10,755,763
- Issue date Aug 25, 2020
- Micron Technology, Inc.
- Donald M. Morgan
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
NON-VOLATILE MEMORY
- Publication number 20240420794
- Publication date Dec 19, 2024
- Samsung Electronics Co., Ltd.
- Youhwan Kim
- G11 - INFORMATION STORAGE
Information Patent Application
Method And System For Estimating And Compensating For Leakage Curre...
- Publication number 20240282398
- Publication date Aug 22, 2024
- Meta Platforms Technologies, LLC
- Umanath Ramachandra Kamath
- G11 - INFORMATION STORAGE
Information Patent Application
SIGNAL TIMING ALIGNMENT BASED ON A COMMON DATA STROBE IN MEMORY DEV...
- Publication number 20240265961
- Publication date Aug 8, 2024
- III Holdings 2, LLC
- Michael C. Stephens
- G11 - INFORMATION STORAGE
Information Patent Application
DRAM RETENTION TEST METHOD FOR DYNAMIC ERROR CORRECTION
- Publication number 20230377668
- Publication date Nov 23, 2023
- Rambus Inc.
- Ely Tsern
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF SCREENING NON-VOLATILE MEMORY CELLS
- Publication number 20230335212
- Publication date Oct 19, 2023
- Silicon Storage Technology, Inc.
- Viktor Markov
- G11 - INFORMATION STORAGE
Information Patent Application
IMPRINT MANAGEMENT FOR MEMORY
- Publication number 20230253064
- Publication date Aug 10, 2023
- Micron Technology, Inc.
- Shashank Bangalore Lakshman
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY WITH EFFICIENT DVS CONTROLLED BY ASYNCHRONOUS INPUTS
- Publication number 20230139283
- Publication date May 4, 2023
- QUALCOMM Incorporated
- Pradeep RAJ
- G11 - INFORMATION STORAGE
Information Patent Application
TEST METHOD AND TEST APPARATUS FOR SEMICONDUCTOR DEVICE
- Publication number 20230009303
- Publication date Jan 12, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- YU-TING CHENG
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR DETECTING MEMORY AND DEVICE FOR DETECTING MEMORY
- Publication number 20230010129
- Publication date Jan 12, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Xing Liu
- G11 - INFORMATION STORAGE
Information Patent Application
Systems and Methods for Correcting Data Errors in Memory
- Publication number 20220358013
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIGNAL TIMING ALIGNMENT BASED ON A COMMON DATA STROBE IN MEMORY DEV...
- Publication number 20220328091
- Publication date Oct 13, 2022
- III Holdings 2, LLC
- Michael C. Stephens
- G11 - INFORMATION STORAGE
Information Patent Application
IMPRINT RECOVERY FOR MEMORY ARRAYS
- Publication number 20220199155
- Publication date Jun 23, 2022
- Micron Technology, Inc.
- Jonathan J. Strand
- G11 - INFORMATION STORAGE
Information Patent Application
IMPRINT MANAGEMENT FOR MEMORY
- Publication number 20220044759
- Publication date Feb 10, 2022
- Micron Technology, Inc.
- Shashank Bangalore Lakshman
- G11 - INFORMATION STORAGE
Information Patent Application
Retention Voltage Management for a Volatile Memory
- Publication number 20220028479
- Publication date Jan 27, 2022
- Apple Inc.
- Shahzad Nazar
- G11 - INFORMATION STORAGE
Information Patent Application
DRAM RETENTION TEST METHOD FOR DYNAMIC ERROR CORRECTION
- Publication number 20210335437
- Publication date Oct 28, 2021
- Rambus Inc.
- Ely Tsern
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY CIRCUIT INCLUDING TRACKING CIRCUIT
- Publication number 20210280229
- Publication date Sep 9, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kuoyuan (Peter) HSU
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY INSPECTING METHOD AND MEMORY INSPECTING SYSTEM
- Publication number 20210257042
- Publication date Aug 19, 2021
- Integrated Silicon Solution Inc.
- PaiLu Dennis WANG
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY TEST APPARATUS AND TESTING METHOD THEREOF
- Publication number 20210249096
- Publication date Aug 12, 2021
- Samsung Electronics Co., Ltd.
- HONG-MOOK CHOI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and Methods for Correcting Data Errors in Memory
- Publication number 20210173739
- Publication date Jun 10, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- YU-DER CHIH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RETENTION VOLTAGE MANAGEMENT FOR A VOLATILE MEMORY
- Publication number 20210142863
- Publication date May 13, 2021
- Apple Inc.
- Shahzad Nazar
- G11 - INFORMATION STORAGE
Information Patent Application
SIGNAL TIMING ALIGNMENT BASED ON A COMMON DATA STROBE IN MEMORY DEV...
- Publication number 20210134348
- Publication date May 6, 2021
- III Holdings 2, LLC
- Michael C. Stephens
- G11 - INFORMATION STORAGE
Information Patent Application
IMPRINT RECOVERY FOR MEMORY ARRAYS
- Publication number 20210090641
- Publication date Mar 25, 2021
- Micron Technology, Inc.
- Jonathan J. Strand
- G11 - INFORMATION STORAGE
Information Patent Application
IMPRINT MANAGEMENT FOR MEMORY
- Publication number 20210090680
- Publication date Mar 25, 2021
- Micron Technology, Inc.
- Shashank Bangalore Lakshman
- G11 - INFORMATION STORAGE
Information Patent Application
IDENTIFICATION OF SUSCEPTIBILITY TO INDUCED CHARGE LEAKAGE
- Publication number 20210035654
- Publication date Feb 4, 2021
- Microsoft Technology Licensing, LLC
- Stefan SAROIU
- G11 - INFORMATION STORAGE
Information Patent Application
Method for Retaining Data
- Publication number 20200279610
- Publication date Sep 3, 2020
- Goke Taiwan Research Laboratory Ltd.
- Po-Chien Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY STORAGE APPARATUS AND FORMING METHOD OF RESISTIVE MEMORY DEV...
- Publication number 20200265914
- Publication date Aug 20, 2020
- WINBOND ELECTRONICS CORP.
- Ping-Kun Wang
- G11 - INFORMATION STORAGE
Information Patent Application
SRAM with Error Correction in Retention Mode
- Publication number 20200227115
- Publication date Jul 16, 2020
- Ambiq Micro, Inc.
- Christophe J. Chevallier
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DRAM RETENTION TEST METHOD FOR DYNAMIC ERROR CORRECTION
- Publication number 20200168288
- Publication date May 28, 2020
- RAMBUS INC.
- Ely Tsern
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY CIRCUIT INCLUDING TRACKING CIRCUIT
- Publication number 20200168258
- Publication date May 28, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kuoyuan (Peter) HSU
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS AND METHODS FOR DETERMINING READ VOLTAGES FOR A READ OPER...
- Publication number 20200152278
- Publication date May 14, 2020
- Micron Technology, Inc.
- Luca De Santis
- G11 - INFORMATION STORAGE

of retention

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Imprint recovery for memory arrays

DRAM retention test method for dynamic error correction

Method and system for estimating and compensating for leakage curre...

Method of screening non-volatile memory cells

Signal timing alignment based on a common data strobe in memory dev...

Memory with efficient DVS controlled by asynchronous inputs

Systems and methods for correcting data errors in memory

Retention voltage management for a volatile memory

DRAM retention test method for dynamic error correction

Imprint management for memory

Test method and test apparatus for semiconductor device

Method for detecting leakage position in memory and device for dete...

Memory circuit including tracking circuit

Systems and methods for correcting data errors in memory

Signal timing alignment based on a common data strobe in memory dev...

Memory test apparatus and testing method thereof including built-in...

Imprint recovery for memory arrays

Memory inspecting method and memory inspecting system

Imprint management for memory

Retention voltage management for a volatile memory

Memory circuit including tracking circuit

DRAM retention test method for dynamic error correction

Identification of susceptibility to induced charge leakage

Systems and methods for correcting data errors in memory

Signal timing alignment based on a common data strobe in memory dev...

Apparatus and methods for determining read voltages for a read oper...

SRAM with error correction in retention mode

Memory devices for pattern matching

Memory storage apparatus and forming method of resistive memory dev...

Apparatuses and methods for detection refresh starvation of a memory

Patents Applicationslast 30 patents

NON-VOLATILE MEMORY

Method And System For Estimating And Compensating For Leakage Curre...

SIGNAL TIMING ALIGNMENT BASED ON A COMMON DATA STROBE IN MEMORY DEV...

DRAM RETENTION TEST METHOD FOR DYNAMIC ERROR CORRECTION

METHOD OF SCREENING NON-VOLATILE MEMORY CELLS

IMPRINT MANAGEMENT FOR MEMORY

MEMORY WITH EFFICIENT DVS CONTROLLED BY ASYNCHRONOUS INPUTS

TEST METHOD AND TEST APPARATUS FOR SEMICONDUCTOR DEVICE

METHOD FOR DETECTING MEMORY AND DEVICE FOR DETECTING MEMORY

Systems and Methods for Correcting Data Errors in Memory

SIGNAL TIMING ALIGNMENT BASED ON A COMMON DATA STROBE IN MEMORY DEV...

IMPRINT RECOVERY FOR MEMORY ARRAYS

IMPRINT MANAGEMENT FOR MEMORY

Retention Voltage Management for a Volatile Memory

DRAM RETENTION TEST METHOD FOR DYNAMIC ERROR CORRECTION

MEMORY CIRCUIT INCLUDING TRACKING CIRCUIT

MEMORY INSPECTING METHOD AND MEMORY INSPECTING SYSTEM

MEMORY TEST APPARATUS AND TESTING METHOD THEREOF

Systems and Methods for Correcting Data Errors in Memory

RETENTION VOLTAGE MANAGEMENT FOR A VOLATILE MEMORY

SIGNAL TIMING ALIGNMENT BASED ON A COMMON DATA STROBE IN MEMORY DEV...

IMPRINT RECOVERY FOR MEMORY ARRAYS

IMPRINT MANAGEMENT FOR MEMORY

IDENTIFICATION OF SUSCEPTIBILITY TO INDUCED CHARGE LEAKAGE

Method for Retaining Data

MEMORY STORAGE APPARATUS AND FORMING METHOD OF RESISTIVE MEMORY DEV...

SRAM with Error Correction in Retention Mode

DRAM RETENTION TEST METHOD FOR DYNAMIC ERROR CORRECTION

MEMORY CIRCUIT INCLUDING TRACKING CIRCUIT

APPARATUS AND METHODS FOR DETERMINING READ VOLTAGES FOR A READ OPER...