of threshold voltage

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G11C29/50004

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GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

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G11C29/50004of threshold voltage

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Patents Grantslast 30 patents

Information Patent Grant
Wordline system architecture supporting erase operation and I-V cha...
- Patent number 12,176,053
- Issue date Dec 24, 2024
- GLOBALFOUNDRIES U.S. Inc.
- Ramesh Raghavan
- G11 - INFORMATION STORAGE
Information Patent Grant
Scan-based voltage frequency scaling
- Patent number 12,170,124
- Issue date Dec 17, 2024
- Micron Technology, Inc.
- Leon Zlotnik
- G11 - INFORMATION STORAGE
Information Patent Grant
Three-dimensional memory device and method for detecting leakage state
- Patent number 12,165,727
- Issue date Dec 10, 2024
- Yangtze Memory Technologies Co., Ltd.
- Weihua Shi
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of reprogramming data in nonvolatile memory device, method o...
- Patent number 12,154,646
- Issue date Nov 26, 2024
- Samsung Electronics Co., Ltd.
- Junyeong Seok
- G11 - INFORMATION STORAGE
Information Patent Grant
Readout from memory cells subjected to perturbations in threshold v...
- Patent number 12,148,496
- Issue date Nov 19, 2024
- Apple Inc.
- Nir Tishbi
- G11 - INFORMATION STORAGE
Information Patent Grant
Three-dimensional semiconductor memory device and method of detecti...
- Patent number 12,144,178
- Issue date Nov 12, 2024
- Samsung Electronics Co., Ltd.
- Taeyoung Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Soft decoding correctable page assisted reference voltage tracking
- Patent number 12,136,464
- Issue date Nov 5, 2024
- INNOGRIT TECHNOLOGIES CO., LTD.
- Chenrong Xiong
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device, memory system including the memory device, and test...
- Patent number 12,125,550
- Issue date Oct 22, 2024
- SK hynix Inc.
- Jun Hyuk Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Host apparatus and extension device
- Patent number 12,112,788
- Issue date Oct 8, 2024
- Kioxia Corporation
- Akihisa Fujimoto
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-volatile memory device, operating method thereof, controller fo...
- Patent number 12,094,552
- Issue date Sep 17, 2024
- Samsung Electronics Co., Ltd.
- Sehwan Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Mediating directed refresh management induced row hammer and row ac...
- Patent number 12,086,270
- Issue date Sep 10, 2024
- Micron Technology, Inc.
- Yang Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for estimating and compensating for leakage curre...
- Patent number 12,073,903
- Issue date Aug 27, 2024
- Meta Platforms Technologies, LLP
- Umanath Ramachandra Kamath
- G11 - INFORMATION STORAGE
Information Patent Grant
Error detection for programming single level cells
- Patent number 12,067,255
- Issue date Aug 20, 2024
- Micron Technology, Inc.
- Tomer Tzvi Eliash
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Storage device and operating method thereof
- Patent number 12,062,406
- Issue date Aug 13, 2024
- SK Hynix Inc.
- Byoung Sung You
- G11 - INFORMATION STORAGE
Information Patent Grant
Test devices having parallel impedances to reduce measurement input...
- Patent number 12,051,478
- Issue date Jul 30, 2024
- Micron Technology, Inc.
- Eric J. Stave
- G11 - INFORMATION STORAGE
Information Patent Grant
Imprint recovery for memory cells
- Patent number 12,040,038
- Issue date Jul 16, 2024
- Micron Technology, Inc.
- Jonathan D. Harms
- G11 - INFORMATION STORAGE
Information Patent Grant
Chip test method and apparatus, computer device, and readable stora...
- Patent number 12,033,712
- Issue date Jul 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yinchuan Gu
- G11 - INFORMATION STORAGE
Information Patent Grant
Program and operating methods of nonvolatile memory device
- Patent number 12,020,761
- Issue date Jun 25, 2024
- Samsung Electronics Co., Ltd.
- Boh-Chang Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of determining defective die containing non-volatile memory...
- Patent number 12,020,762
- Issue date Jun 25, 2024
- Silicon Storage Technology, Inc.
- Yuri Tkachev
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of screening non-volatile memory cells
- Patent number 12,014,793
- Issue date Jun 18, 2024
- Silicon Storage Technology, Inc.
- Viktor Markov
- G11 - INFORMATION STORAGE
Information Patent Grant
Program and operating methods of nonvolatile memory device
- Patent number 12,009,046
- Issue date Jun 11, 2024
- Samsung Electronics Co., Ltd.
- Boh-Chang Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Voltage testing circuit with error protection scheme
- Patent number 11,984,184
- Issue date May 14, 2024
- Micron Technology, Inc.
- Subhasis Sasmal
- G11 - INFORMATION STORAGE
Information Patent Grant
Techniques for checking vulnerability to cross-temperature read err...
- Patent number 11,972,804
- Issue date Apr 30, 2024
- SanDisk Technologies, LLC
- Xuan Tian
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory using dual sense amplifiers for error detection and correction
- Patent number 11,935,612
- Issue date Mar 19, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jia Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods for optimizing semiconductor device placement on a substrat...
- Patent number 11,929,139
- Issue date Mar 12, 2024
- Micron Technology, Inc.
- James S. Rehmeyer
- G11 - INFORMATION STORAGE
Information Patent Grant
Varying-polarity read operations for polarity-written memory cells
- Patent number 11,923,002
- Issue date Mar 5, 2024
- Micron Technology, Inc.
- Innocenzo Tortorelli
- G11 - INFORMATION STORAGE
Information Patent Grant
Storage device and operating method for controller
- Patent number 11,923,022
- Issue date Mar 5, 2024
- SK Hynix Inc.
- Chol Su Chae
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory system
- Patent number 11,923,029
- Issue date Mar 5, 2024
- Kioxia Corporation
- Marie Takada
- G11 - INFORMATION STORAGE
Information Patent Grant
Leakage detection for three-dimensional NAND memory
- Patent number 11,923,032
- Issue date Mar 5, 2024
- Yangtze Memory Technologies Co., Ltd.
- Kun Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
Tracking charge loss in memory sub-systems
- Patent number 11,923,031
- Issue date Mar 5, 2024
- Micron Technology, Inc.
- Guang Shen
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
NON-VOLATILE MEMORY WITH ADJUSTABLE RAMP RATE
- Publication number 20240412804
- Publication date Dec 12, 2024
- Western Digital Technologies, Inc.
- Sai Gautham Thoppa
- G11 - INFORMATION STORAGE
Information Patent Application
DATA CLUSTERING SYSTEM AND READ VOLTAGE DETERMINATION APPARATUS FOR...
- Publication number 20240404618
- Publication date Dec 5, 2024
- SK HYNIX INC.
- Jae Yong SON
- G11 - INFORMATION STORAGE
Information Patent Application
MULTIPLIER BASED DEVICE DEGRADATION READOUT CIRCUIT
- Publication number 20240386941
- Publication date Nov 21, 2024
- Micron Technology, Inc.
- Zhi Qi Huang
- G11 - INFORMATION STORAGE
Information Patent Application
READ VOLTAGE CALIBRATION METHOD, MEMORY STORAGE DEVICE AND MEMORY C...
- Publication number 20240377972
- Publication date Nov 14, 2024
- PHISON ELECTRONICS CORP.
- Szu-Wei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGE LOSS TRACKING THROUGH TARGETED BIT COUNT
- Publication number 20240363188
- Publication date Oct 31, 2024
- Micron Technology, Inc.
- Steven Michael Kientz
- G11 - INFORMATION STORAGE
Information Patent Application
READ PASS VOLTAGE ADJUSTMENT AMONG MULTIPLE ERASE BLOCKS COUPLED TO...
- Publication number 20240347126
- Publication date Oct 17, 2024
- Micron Technology, Inc.
- Akira Goda
- G11 - INFORMATION STORAGE
Information Patent Application
VOLTAGE DOMAIN BASED ERROR MANAGEMENT
- Publication number 20240321380
- Publication date Sep 26, 2024
- Micron Technology, Inc.
- Leon Zlotnik
- G11 - INFORMATION STORAGE
Information Patent Application
VARYING-POLARITY READ OPERATIONS FOR POLARITY-WRITTEN MEMORY CELLS
- Publication number 20240312518
- Publication date Sep 19, 2024
- Micron Technology, Inc.
- Innocenzo Tortorelli
- G11 - INFORMATION STORAGE
Information Patent Application
MULTI-VOLTAGE RAM USED TO CROSS CLOCK AND VOLTAGE DOMAINS
- Publication number 20240296875
- Publication date Sep 5, 2024
- NVIDIA Corporation
- Jason Golbus
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE WITH DUAL INTERFACE, TEST METHOD AND TEST SYSTEM THEREOF
- Publication number 20240296900
- Publication date Sep 5, 2024
- SILICON MOTION, INC.
- Hsu-Ping OU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method And System For Estimating And Compensating For Leakage Curre...
- Publication number 20240282398
- Publication date Aug 22, 2024
- Meta Platforms Technologies, LLC
- Umanath Ramachandra Kamath
- G11 - INFORMATION STORAGE
Information Patent Application
TRACKING CHARGE LOSS IN MEMORY SUB-SYSTEMS
- Publication number 20240242774
- Publication date Jul 18, 2024
- Micron Technology, Inc.
- Guang Shen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TIME DEPENDENT DIELECTRIC BREAKDOWN RELIABILITY TESTING OF A SRAM
- Publication number 20240203519
- Publication date Jun 20, 2024
- International Business Machines Corporation
- Giuseppe La Rosa
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS FOR OPTIMIZING SEMICONDUCTOR DEVICE PLACEMENT ON A SUBSTRAT...
- Publication number 20240177743
- Publication date May 30, 2024
- Micron Technology, Inc.
- James S. Rehmeyer
- G11 - INFORMATION STORAGE
Information Patent Application
POWER SUPPLY CIRCUIT, MEMORY, TESTING DEVICE, MEMORY SYSTEM, AND EL...
- Publication number 20240170041
- Publication date May 23, 2024
- Yangtze Memory Technologies Co., Ltd.
- Yu WANG
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE AND OPERATING METHOD THEREOF
- Publication number 20240170068
- Publication date May 23, 2024
- SK HYNIX INC.
- Yeong Jo MUN
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE AND RETENTION TEST METHOD
- Publication number 20240161860
- Publication date May 16, 2024
- Samsung Electronics Co., Ltd.
- MYEONGJIN OH
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND MEMORY DEVICE WITH INCREASED READ AND WRITE MARGIN
- Publication number 20240136008
- Publication date Apr 25, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hung-Chang Yu
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEMS AND METHODS TO DETECT CELL-INTERNAL DEFECTS
- Publication number 20240087668
- Publication date Mar 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ankita Patidar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-ZONE TEMPERATURE TESTING SYSTEM
- Publication number 20240071552
- Publication date Feb 29, 2024
- Dell Products L.P.
- Robert Proulx
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR CHIP AND SEQUENCE CHECKING CIRCUIT
- Publication number 20240055067
- Publication date Feb 15, 2024
- Global Unichip Corporation
- Shih-Cheng KAO
- G11 - INFORMATION STORAGE
Information Patent Application
PERFORMING SENSE OPERATIONS IN MEMORY
- Publication number 20240038322
- Publication date Feb 1, 2024
- Micron Technology, Inc.
- Michele Maria Venturini
- G11 - INFORMATION STORAGE
Information Patent Application
VOLTAGE TESTING CIRCUIT WITH ERROR PROTECTION SCHEME
- Publication number 20240038321
- Publication date Feb 1, 2024
- Micron Technology, Inc.
- Subhasis Sasmal
- G11 - INFORMATION STORAGE
Information Patent Application
NON-VOLATILE MEMORY DEVICE, OPERATING METHOD THEREOF, CONTROLLER FO...
- Publication number 20240029814
- Publication date Jan 25, 2024
- Samsung Electronics Co., Ltd.
- Sehwan PARK
- G11 - INFORMATION STORAGE
Information Patent Application
DATA INTEGRITY CHECKS BASED ON VOLTAGE DISTRIBUTION METRICS
- Publication number 20240021258
- Publication date Jan 18, 2024
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Application
READ WINDOW MANAGEMENT IN A MEMORY SYSTEM
- Publication number 20240021264
- Publication date Jan 18, 2024
- Micron Technology, Inc.
- Li-Te Chang
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY AND ITS ERASE VERIFICATION METHOD, OPERATION METHOD, AND A M...
- Publication number 20240013842
- Publication date Jan 11, 2024
- Yangtze Memory Technologies Co., Ltd.
- Chong Jing
- G11 - INFORMATION STORAGE
Information Patent Application
SOFT DECODING CORRECTABLE PAGE ASSISTED REFERENCE VOLTAGE TRACKING
- Publication number 20240013849
- Publication date Jan 11, 2024
- INNOGRIT TECHNOLOGIES CO., LTD
- Chenrong XIONG
- G11 - INFORMATION STORAGE
Information Patent Application
Readout from memory cells subjected to perturbations in threshold v...
- Publication number 20240006014
- Publication date Jan 4, 2024
- Apple Inc.
- Nir Tishbi
- G11 - INFORMATION STORAGE
Information Patent Application
Tracking of read voltages while reading memory cells
- Publication number 20240006015
- Publication date Jan 4, 2024
- Apple Inc.
- Nir Tishbi
- G11 - INFORMATION STORAGE

of threshold voltage

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Wordline system architecture supporting erase operation and I-V cha...

Scan-based voltage frequency scaling

Three-dimensional memory device and method for detecting leakage state

Method of reprogramming data in nonvolatile memory device, method o...

Readout from memory cells subjected to perturbations in threshold v...

Three-dimensional semiconductor memory device and method of detecti...

Soft decoding correctable page assisted reference voltage tracking

Memory device, memory system including the memory device, and test...

Host apparatus and extension device

Non-volatile memory device, operating method thereof, controller fo...

Mediating directed refresh management induced row hammer and row ac...

Method and system for estimating and compensating for leakage curre...

Error detection for programming single level cells

Storage device and operating method thereof

Test devices having parallel impedances to reduce measurement input...

Imprint recovery for memory cells

Chip test method and apparatus, computer device, and readable stora...

Program and operating methods of nonvolatile memory device

Method of determining defective die containing non-volatile memory...

Method of screening non-volatile memory cells

Program and operating methods of nonvolatile memory device

Voltage testing circuit with error protection scheme

Techniques for checking vulnerability to cross-temperature read err...

Memory using dual sense amplifiers for error detection and correction

Methods for optimizing semiconductor device placement on a substrat...

Varying-polarity read operations for polarity-written memory cells

Storage device and operating method for controller

Memory system

Leakage detection for three-dimensional NAND memory

Tracking charge loss in memory sub-systems

Patents Applicationslast 30 patents

NON-VOLATILE MEMORY WITH ADJUSTABLE RAMP RATE

DATA CLUSTERING SYSTEM AND READ VOLTAGE DETERMINATION APPARATUS FOR...

MULTIPLIER BASED DEVICE DEGRADATION READOUT CIRCUIT

READ VOLTAGE CALIBRATION METHOD, MEMORY STORAGE DEVICE AND MEMORY C...

CHARGE LOSS TRACKING THROUGH TARGETED BIT COUNT

READ PASS VOLTAGE ADJUSTMENT AMONG MULTIPLE ERASE BLOCKS COUPLED TO...

VOLTAGE DOMAIN BASED ERROR MANAGEMENT

VARYING-POLARITY READ OPERATIONS FOR POLARITY-WRITTEN MEMORY CELLS

MULTI-VOLTAGE RAM USED TO CROSS CLOCK AND VOLTAGE DOMAINS

MEMORY DEVICE WITH DUAL INTERFACE, TEST METHOD AND TEST SYSTEM THEREOF

Method And System For Estimating And Compensating For Leakage Curre...

TRACKING CHARGE LOSS IN MEMORY SUB-SYSTEMS

TIME DEPENDENT DIELECTRIC BREAKDOWN RELIABILITY TESTING OF A SRAM

METHODS FOR OPTIMIZING SEMICONDUCTOR DEVICE PLACEMENT ON A SUBSTRAT...

POWER SUPPLY CIRCUIT, MEMORY, TESTING DEVICE, MEMORY SYSTEM, AND EL...

MEMORY DEVICE AND OPERATING METHOD THEREOF

SEMICONDUCTOR DEVICE AND RETENTION TEST METHOD

METHOD AND MEMORY DEVICE WITH INCREASED READ AND WRITE MARGIN

SYSTEMS AND METHODS TO DETECT CELL-INTERNAL DEFECTS

MULTI-ZONE TEMPERATURE TESTING SYSTEM

SEMICONDUCTOR CHIP AND SEQUENCE CHECKING CIRCUIT

PERFORMING SENSE OPERATIONS IN MEMORY

VOLTAGE TESTING CIRCUIT WITH ERROR PROTECTION SCHEME

NON-VOLATILE MEMORY DEVICE, OPERATING METHOD THEREOF, CONTROLLER FO...

DATA INTEGRITY CHECKS BASED ON VOLTAGE DISTRIBUTION METRICS

READ WINDOW MANAGEMENT IN A MEMORY SYSTEM

MEMORY AND ITS ERASE VERIFICATION METHOD, OPERATION METHOD, AND A M...

SOFT DECODING CORRECTABLE PAGE ASSISTED REFERENCE VOLTAGE TRACKING

Readout from memory cells subjected to perturbations in threshold v...

Tracking of read voltages while reading memory cells