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G01R27/2652
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R27/00
Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
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G01R27/2652
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Patents Grants
last 30 patents
Information
Patent Grant
System for measuring a microwave dielectric property of a solid mat...
Patent number
11,892,490
Issue date
Feb 6, 2024
Central South University
Lixin Wu
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for measuring dielectric permitivity of cylind...
Patent number
8,860,418
Issue date
Oct 14, 2014
Schlumberger Technology Corporation
Mohammed Badri
G01 - MEASURING TESTING
Information
Patent Grant
Device and handling system for measurement of mobility and sheet ch...
Patent number
8,207,748
Issue date
Jun 26, 2012
Lehighton Electronics, Inc.
Austin Blew
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for nondestructive measurement and mapping of...
Patent number
7,109,724
Issue date
Sep 19, 2006
Lehighton Electronics, Inc.
Nikolai Eberhardt
G01 - MEASURING TESTING
Information
Patent Grant
Bulls-eye mid-frequency impedance probe
Patent number
6,201,400
Issue date
Mar 13, 2001
The Boeing Company
Arthur C. Lind
G01 - MEASURING TESTING
Information
Patent Grant
Device and apparatus for measuring dielectric properties of materials
Patent number
5,744,971
Issue date
Apr 28, 1998
Tsing Yee Amy Chan
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for non-destructive testing of dielectric/magnetic materials
Patent number
5,389,875
Issue date
Feb 14, 1995
Grumman Aerospace Corporation
Mark D. A. Rosen
G01 - MEASURING TESTING
Information
Patent Grant
Device for the dielectric characterization of samples made of a mat...
Patent number
5,077,522
Issue date
Dec 31, 1991
Aerospatiale Societe Nationale Industrielle
Pierre Lahitte
G01 - MEASURING TESTING
Information
Patent Grant
Method and means for determining rock properties using time-domain...
Patent number
4,626,773
Issue date
Dec 2, 1986
Exxon Production Research Co.
Michael K. Kroeger
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SENSOR DEVICE FOR MONITORING THE DIELECTRIC STRENGTH OF A DIELECTRI...
Publication number
20240230747
Publication date
Jul 11, 2024
ELTEK S.P.A
Marco PIZZI
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR MEASURING A MICROWAVE DIELECTRIC PROPERTY OF A SOLID MAT...
Publication number
20210132130
Publication date
May 6, 2021
Central South University
Lixin WU
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR MEASURING DIELECTIC PERMITIVITY OF CYLINDR...
Publication number
20140028318
Publication date
Jan 30, 2014
SCHLUMBERGER TECHNOLOGY CORPORATION
MOHAMMED BADRI
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND HANDLING SYSTEM FOR MEASUREMENT OF MOBILITY AND SHEET CH...
Publication number
20090295407
Publication date
Dec 3, 2009
LEHIGHTON ELECTRONICS INC.
Austin Blew
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for nondestructive measurement and mapping of...
Publication number
20050253594
Publication date
Nov 17, 2005
Nikolai Eberhardt
G01 - MEASURING TESTING