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H01J2237/162

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/162Open vessel

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit analysis systems and methods with localized evac...
- Patent number 10,373,795
- Issue date Aug 6, 2019
- FEI Company
- Yakov Bobrov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
User interface for an electron microscope
- Patent number 9,865,427
- Issue date Jan 9, 2018
- FEI Company
- Martinus Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 9,263,232
- Issue date Feb 16, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method of sterilizing containers with a charge carrie...
- Patent number 9,078,935
- Issue date Jul 14, 2015
- Krones AG
- Josef Knott
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
User interface for an electron microscope
- Patent number 9,025,018
- Issue date May 5, 2015
- FEI Company
- Martinus Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 8,610,061
- Issue date Dec 17, 2013
- Honda Motor Co., Ltd.
- Kenji Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low-temperature, converging, reactive gas source and method of use
- Patent number 8,328,982
- Issue date Dec 11, 2012
- Surfx Technologies LLC
- Steve Babayan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Compact scanning electron microscope
- Patent number 8,309,921
- Issue date Nov 13, 2012
- FEI Company
- Martinus Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact scanning electron microscope
- Patent number 7,906,762
- Issue date Mar 15, 2011
- FEI Company
- Mart Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Material processing system and method
- Patent number 7,868,290
- Issue date Jan 11, 2011
- Carl Zeiss NTS GmbH
- Hans W. P. Koops
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chamberless substrate handling
- Patent number 7,550,743
- Issue date Jun 23, 2009
- KLA-Tencor Corporation
- Douglas K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chamberless substrate handling
- Patent number 7,550,744
- Issue date Jun 23, 2009
- KLA-Tencor Corporation
- George R. Koch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for inspection and testing of flat panel displ...
- Patent number 7,435,956
- Issue date Oct 14, 2008
- Multibeam Systems, Inc.
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Material processing system and method
- Patent number 7,435,973
- Issue date Oct 14, 2008
- Carl Zeiss NTS GmbH
- Hans W. P. Koops
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated in situ scanning electronic microscope review station in...
- Patent number 7,428,850
- Issue date Sep 30, 2008
- Applied Materials, Israel,Ltd.
- Ron Naftali
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam for enhancing optical properties of materials
- Patent number 7,125,587
- Issue date Oct 24, 2006
- Varian Semiconductor Equipment Associates Inc.
- Gary L. Viviani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam irradiation apparatus and electron beam irradiating m...
- Patent number 6,737,660
- Issue date May 18, 2004
- Sony Corporation
- Yoshihisa Miura
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for electron beam irradiation
- Patent number 6,734,437
- Issue date May 11, 2004
- Jeol Ltd.
- Setsuo Norioka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam irradiation system and electron beam irradiation method
- Patent number 6,649,859
- Issue date Nov 18, 2003
- Sony Corporation
- Yoshihisa Miura
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Portable apparatus for thin deposition
- Patent number 6,136,167
- Issue date Oct 24, 2000
- CE.TE.V Centro Technologie Del Vuoto
- Carlo Misiano
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Process for imaging a ferroelectric printing form and printing head
- Patent number 6,031,551
- Issue date Feb 29, 2000
- MAN Roland Druckmaschinen AG
- Alfred Hirt
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Sputtering process burnable poison coating
- Patent number 5,272,735
- Issue date Dec 21, 1993
- Combustion Engineering, Inc.
- William J. Bryan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and apparatus for cleaning surfaces with plasma
- Patent number 5,236,512
- Issue date Aug 17, 1993
- Thiokol Corporation
- Ernest E. Rogers
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Plasma reactor chamber
- Patent number 5,190,703
- Issue date Mar 2, 1993
- Himont, Incorporated
- Peter W. Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam lithography machine incorporating localized v...
- Patent number 4,607,167
- Issue date Aug 19, 1986
- Varian Associates, Inc.
- Paul F. Petric
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Localized vacuum processing apparatus
- Patent number 4,524,261
- Issue date Jun 18, 1985
- Varian Associates, Inc.
- Paul F. Petric
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
PLASMA CHAMBER WITH GAS CROSS-FLOW, MICROWAVE RESONATORS AND A ROTA...
- Publication number 20230395356
- Publication date Dec 7, 2023
- Applied Materials, Inc.
- Anantha Subramani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Device For Generating A Dielectric Barrier Discharge And Method For...
- Publication number 20230046192
- Publication date Feb 16, 2023
- TDK Electronics AG
- Dariusz Korzec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECIMEN CONTROL MEANS FOR PARTICLE BEAM MICROSCOPY
- Publication number 20210285899
- Publication date Sep 16, 2021
- Gerasimos Daniel DANILATOS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20170263414
- Publication date Sep 14, 2017
- Taiwan Electron Microscope Instrument Corporation
- FU-RONG CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEPOSITION DEVICE
- Publication number 20160071699
- Publication date Mar 10, 2016
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Toshiki SEGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARC-PLASMA FILM FORMATION DEVICE
- Publication number 20160071702
- Publication date Mar 10, 2016
- Shimadzu Corporation
- Masayasu SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD OF STERILIZING CONTAINERS WITH A CHARGE CARRIE...
- Publication number 20130084211
- Publication date Apr 4, 2013
- KRONES AG
- Josef Knott
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20120145899
- Publication date Jun 14, 2012
- Honda Motor Co., Ltd.
- Kenji Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPACT SCANNING ELECTRON MICROSCOPE
- Publication number 20110133083
- Publication date Jun 9, 2011
- FEI Company
- MART PETRUS MARIA BIERHOFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Compact Scanning Electron Microscope
- Publication number 20100230590
- Publication date Sep 16, 2010
- FEI Company
- Mart Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
User Interface for an Electron Microscope
- Publication number 20100194874
- Publication date Aug 5, 2010
- FEI Company
- Mart Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPACT SCANNING ELECTRON MICROSCOPE
- Publication number 20100171037
- Publication date Jul 8, 2010
- FEI Company
- Mart Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Material processing system and method
- Publication number 20090121132
- Publication date May 14, 2009
- CARL ZEISS NTS GMBH
- Hans W.P. Koops
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Portable scanning electron microscope
- Publication number 20070145267
- Publication date Jun 28, 2007
- David L. Adler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron microscope apparatus using CRT-type optics
- Publication number 20070145266
- Publication date Jun 28, 2007
- Avi Cohen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated in situ scanning electronic microscope review station in...
- Publication number 20070022831
- Publication date Feb 1, 2007
- Ron Naftali
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Material processing system and method
- Publication number 20060284090
- Publication date Dec 21, 2006
- CARL ZEISS NTS GMBH
- Hans W.P. Koops
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for inspection and testing of flat panel displ...
- Publication number 20060145087
- Publication date Jul 6, 2006
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Material processing system and method
- Publication number 20050103272
- Publication date May 19, 2005
- LEO Elektronenmikroskopie GmbH
- Hans W.P. Koops
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion beam for enhancing optical properties of materials
- Publication number 20030215579
- Publication date Nov 20, 2003
- Gary L. Viviani
- G02 - OPTICS
Information Patent Application
System and method for electron beam irradiation
- Publication number 20030178582
- Publication date Sep 25, 2003
- JEOL Ltd.
- Setsuo Norioka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam irradiation apparatus and electron beam irradiating m...
- Publication number 20030178581
- Publication date Sep 25, 2003
- Yoshihisa Miura
- G11 - INFORMATION STORAGE
Information Patent Application
Electron beam irradiation system and electron beam irradiation method
- Publication number 20020121504
- Publication date Sep 5, 2002
- Yoshihisa Miura
- B82 - NANO-TECHNOLOGY

Open vessel

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Integrated circuit analysis systems and methods with localized evac...

User interface for an electron microscope

Charged particle beam device

Apparatus and method of sterilizing containers with a charge carrie...

User interface for an electron microscope

Scanning electron microscope

Low-temperature, converging, reactive gas source and method of use

Compact scanning electron microscope

Compact scanning electron microscope

Material processing system and method

Chamberless substrate handling

Chamberless substrate handling

Apparatus and method for inspection and testing of flat panel displ...

Material processing system and method

Integrated in situ scanning electronic microscope review station in...

Ion beam for enhancing optical properties of materials

Electron beam irradiation apparatus and electron beam irradiating m...

System and method for electron beam irradiation

Electron beam irradiation system and electron beam irradiation method

Portable apparatus for thin deposition

Process for imaging a ferroelectric printing form and printing head

Sputtering process burnable poison coating

Method and apparatus for cleaning surfaces with plasma

Plasma reactor chamber

Charged particle beam lithography machine incorporating localized v...

Localized vacuum processing apparatus

Patents Applicationslast 30 patents

PLASMA CHAMBER WITH GAS CROSS-FLOW, MICROWAVE RESONATORS AND A ROTA...

Device For Generating A Dielectric Barrier Discharge And Method For...

SPECIMEN CONTROL MEANS FOR PARTICLE BEAM MICROSCOPY

ELECTRON MICROSCOPE

DEPOSITION DEVICE

ARC-PLASMA FILM FORMATION DEVICE

APPARATUS AND METHOD OF STERILIZING CONTAINERS WITH A CHARGE CARRIE...

SCANNING ELECTRON MICROSCOPE

COMPACT SCANNING ELECTRON MICROSCOPE

Compact Scanning Electron Microscope

User Interface for an Electron Microscope

COMPACT SCANNING ELECTRON MICROSCOPE

Material processing system and method

Portable scanning electron microscope

Electron microscope apparatus using CRT-type optics

Integrated in situ scanning electronic microscope review station in...

Material processing system and method

Apparatus and method for inspection and testing of flat panel displ...

Material processing system and method

Ion beam for enhancing optical properties of materials

System and method for electron beam irradiation

Electron beam irradiation apparatus and electron beam irradiating m...

Electron beam irradiation system and electron beam irradiation method