operating at elevated pressures

Industry

CPC
H01J2237/2605

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/2605operating at elevated pressures

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Diffraction pattern detection in a transmission charged particle mi...
- Patent number 11,004,655
- Issue date May 11, 2021
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vacuum condition controlling apparatus, system and method for speci...
- Patent number 10,699,874
- Issue date Jun 30, 2020
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Wei He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wide field atmospheric scanning electron microscope
- Patent number 10,262,832
- Issue date Apr 16, 2019
- Gerasimos Daniel Danilatos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, sample observation method, sample pla...
- Patent number 10,241,062
- Issue date Mar 26, 2019
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- G01 - MEASURING TESTING
Information Patent Grant
Electron scanning microscope and image generation method
- Patent number 10,157,724
- Issue date Dec 18, 2018
- Hitachi High-Technologies Corporation
- Shinsuke Kawanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron scanning microscope and image generation method
- Patent number 9,875,877
- Issue date Jan 23, 2018
- Hitachi High-Technologies Corporation
- Shinsuke Kawanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus having a selectively positionabl...
- Patent number 9,741,528
- Issue date Aug 22, 2017
- Carl Zeiss Microscopy GmbH
- Michael Albiez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam microscope with improved imaging gas and method of use
- Patent number 9,633,816
- Issue date Apr 25, 2017
- FEI Company
- Toby Shanley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diaphragm mounting member and charged particle beam device
- Patent number 9,633,817
- Issue date Apr 25, 2017
- Hitachi High-Technologies Corporation
- Shinsuke Kawanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of using an environmental transmission electron microscope
- Patent number 9,570,270
- Issue date Feb 14, 2017
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Holder assembly for cooperating with an environmental cell and an e...
- Patent number 9,524,850
- Issue date Dec 20, 2016
- FEI Company
- Hendrik Willem Zandbergen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Observation apparatus and optical axis adjustment method
- Patent number 9,466,457
- Issue date Oct 11, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 9,466,458
- Issue date Oct 11, 2016
- B-NANO LTD.
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope, an interface and a method for observi...
- Patent number 9,431,213
- Issue date Aug 30, 2016
- B-Nano Ltd.
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and sample observation method
- Patent number 9,418,818
- Issue date Aug 16, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and sample observation method
- Patent number 9,362,083
- Issue date Jun 7, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam instrument
- Patent number 9,318,300
- Issue date Apr 19, 2016
- Jeol Ltd.
- Yasushi Hiroki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 9,263,232
- Issue date Feb 16, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and sample observation method
- Patent number 9,240,305
- Issue date Jan 19, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection method for use in charged-particle microscopy
- Patent number 9,153,416
- Issue date Oct 6, 2015
- FEI Company
- Petr Hlavenka
- G01 - MEASURING TESTING
Information Patent Grant
Interface, a method for observing an object within a non-vacuum env...
- Patent number 9,076,631
- Issue date Jul 7, 2015
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High pressure charged particle beam system
- Patent number 8,921,811
- Issue date Dec 30, 2014
- FEI Company
- Milos Toth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection system using scanning electron microscope
- Patent number 8,890,067
- Issue date Nov 18, 2014
- Samsung Display Co., Ltd.
- Young-Gil Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interface, a method for observing an object within a non-vacuum env...
- Patent number 8,779,358
- Issue date Jul 15, 2014
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector for use in charged-particle microscopy
- Patent number 8,735,849
- Issue date May 27, 2014
- FEI Company
- Petr Hlavenka
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope with an emitter operating in medium vacuum
- Patent number 8,729,470
- Issue date May 20, 2014
- DLA Instruments
- David L. Adler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for scanning electron microscope observation of sample float...
- Patent number 8,698,079
- Issue date Apr 15, 2014
- Hitachi High-Technologies Corporation
- Masamichi Shiono
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle radiation device
- Patent number 8,692,195
- Issue date Apr 8, 2014
- Hitachi High-Technologies Corporation
- Sukehiro Ito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system
- Patent number 8,598,525
- Issue date Dec 3, 2013
- Carl Zeiss Microscopy GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning transmission electron microscope using gas amplification
- Patent number 8,299,432
- Issue date Oct 30, 2012
- FEI Company
- Milos Toth
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DIFFRACTION PATTERN DETECTION IN A TRANSMISSION CHARGED PARTICLE MI...
- Publication number 20200144022
- Publication date May 7, 2020
- FEI Company
- Bart BUIJSSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VACUUM CONDITION CONTROLLING APPARATUS, SYSTEM AND METHOD FOR SPECI...
- Publication number 20200035448
- Publication date Jan 30, 2020
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Wei He
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON SCANNING MICROSCOPE AND IMAGE GENERATION METHOD
- Publication number 20180122617
- Publication date May 3, 2018
- Hitachi High-Technologies Corporation
- Shinsuke KAWANISHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM MICROSCOPE WITH IMPROVED IMAGING GAS AND METHOD OF USE
- Publication number 20160343537
- Publication date Nov 24, 2016
- FEI Company
- Toby Shanley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON SCANNING MICROSCOPE AND IMAGE GENERATION METHOD
- Publication number 20160343538
- Publication date Nov 24, 2016
- Hitachi High-Technologies Corporation
- Shinsuke KAWANISHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Sample Observation Method
- Publication number 20150235803
- Publication date Aug 20, 2015
- Hitachi High-Technologies Corpration
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Instrument
- Publication number 20150137001
- Publication date May 21, 2015
- JEOL Ltd.
- Yasushi Hiroki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTION METHOD FOR USE IN CHARGED-PARTICLE MICROSCOPY
- Publication number 20140374593
- Publication date Dec 25, 2014
- FEI Company
- Petr Hlavenka
- G01 - MEASURING TESTING
Information Patent Application
INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...
- Publication number 20140361166
- Publication date Dec 11, 2014
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION SYSTEM USING SCANNING ELECTRON MICROSCOPE
- Publication number 20140291514
- Publication date Oct 2, 2014
- SAMSUNG DISPLAY CO., LTD.
- Dong-Hyun GONG
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVI...
- Publication number 20140117232
- Publication date May 1, 2014
- B-NANO LTD.
- Dov SHACHAL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION SYSTEM USING SCANNING ELECTRON MICROSCOPE
- Publication number 20130320211
- Publication date Dec 5, 2013
- Young-Gil Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20130284923
- Publication date Oct 31, 2013
- Hitachi High-Technologies Corporation
- Haruhiko Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR SCANNING ELECTRON MICROSCOPE OBSERVATION OF SAMPLE FLOAT...
- Publication number 20130221217
- Publication date Aug 29, 2013
- Hitachi High-Technologies Corporation
- Masamichi Shiono
- G01 - MEASURING TESTING
Information Patent Application
Holder Assembly for Cooperating with an Environmental Cell and an E...
- Publication number 20130213439
- Publication date Aug 22, 2013
- DELFT UNIVERSITY OF TECHNOLOGY
- Hendrik Willem Zandbergen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE RADIATION DEVICE
- Publication number 20130026363
- Publication date Jan 31, 2013
- Hitachi High-Technologies Corporation
- Junichi KATANE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...
- Publication number 20120241608
- Publication date Sep 27, 2012
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detector for Use in Charged-Particle Microscopy
- Publication number 20120205539
- Publication date Aug 16, 2012
- FEI Company
- Petr Hlavenka
- G01 - MEASURING TESTING
Information Patent Application
Particle Beam System
- Publication number 20120199740
- Publication date Aug 9, 2012
- CARL ZEISS NTS GMBH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE RADIATION DEVICE
- Publication number 20110291010
- Publication date Dec 1, 2011
- Junichi Katane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope
- Publication number 20110139986
- Publication date Jun 16, 2011
- JEOL Ltd.
- Shigemasa Ohta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH PRESSURE CHARGED PARTICLE BEAM SYSTEM
- Publication number 20110031394
- Publication date Feb 10, 2011
- FEI Company
- William Ralph Knowles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Beam Apparatus
- Publication number 20110006209
- Publication date Jan 13, 2011
- JEOL Ltd.
- Mitsutoshi Yoshikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron microscope with an emitter operating in medium vacuum
- Publication number 20100314540
- Publication date Dec 16, 2010
- David L. Adler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LAYERED SCANNING CHARGED PARTICLE APPARATUS PACKAGE HAVING AN EMBED...
- Publication number 20100224778
- Publication date Sep 9, 2010
- Lawrence P. Muray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LAYERED SCANNING CHARGED PARTICLE MICROSCOPE WITH DIFFERENTIAL PUMP...
- Publication number 20100224777
- Publication date Sep 9, 2010
- James P. Spallas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...
- Publication number 20100140470
- Publication date Jun 10, 2010
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING TRANSMISSION ELECTRON MICROSCOPE USING GAS AMPLIFICATION
- Publication number 20100108881
- Publication date May 6, 2010
- FEI Company
- MILOS TOTH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20100090109
- Publication date Apr 15, 2010
- Michio Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA AND ELECTRON BEAM ETCHING DEVICE AND METHOD
- Publication number 20090288603
- Publication date Nov 26, 2009
- Neal R. Rueger
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

operating at elevated pressures

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Diffraction pattern detection in a transmission charged particle mi...

Vacuum condition controlling apparatus, system and method for speci...

Wide field atmospheric scanning electron microscope

Charged particle beam device, sample observation method, sample pla...

Electron scanning microscope and image generation method

Electron scanning microscope and image generation method

Charged particle optical apparatus having a selectively positionabl...

Electron beam microscope with improved imaging gas and method of use

Diaphragm mounting member and charged particle beam device

Method of using an environmental transmission electron microscope

Holder assembly for cooperating with an environmental cell and an e...

Observation apparatus and optical axis adjustment method

Scanning electron microscope

Scanning electron microscope, an interface and a method for observi...

Charged particle beam device and sample observation method

Charged particle beam apparatus and sample observation method

Charged particle beam instrument

Charged particle beam device

Charged particle beam device and sample observation method

Detection method for use in charged-particle microscopy

Interface, a method for observing an object within a non-vacuum env...

High pressure charged particle beam system

Inspection system using scanning electron microscope

Interface, a method for observing an object within a non-vacuum env...

Detector for use in charged-particle microscopy

Electron microscope with an emitter operating in medium vacuum

Method for scanning electron microscope observation of sample float...

Charged particle radiation device

Particle beam system

Scanning transmission electron microscope using gas amplification

Patents Applicationslast 30 patents

DIFFRACTION PATTERN DETECTION IN A TRANSMISSION CHARGED PARTICLE MI...

VACUUM CONDITION CONTROLLING APPARATUS, SYSTEM AND METHOD FOR SPECI...

ELECTRON SCANNING MICROSCOPE AND IMAGE GENERATION METHOD

ELECTRON BEAM MICROSCOPE WITH IMPROVED IMAGING GAS AND METHOD OF USE

ELECTRON SCANNING MICROSCOPE AND IMAGE GENERATION METHOD

Charged Particle Beam Device and Sample Observation Method

Charged Particle Beam Instrument

DETECTION METHOD FOR USE IN CHARGED-PARTICLE MICROSCOPY

INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...

INSPECTION SYSTEM USING SCANNING ELECTRON MICROSCOPE

SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVI...

INSPECTION SYSTEM USING SCANNING ELECTRON MICROSCOPE

SCANNING ELECTRON MICROSCOPE

METHOD FOR SCANNING ELECTRON MICROSCOPE OBSERVATION OF SAMPLE FLOAT...

Holder Assembly for Cooperating with an Environmental Cell and an E...

CHARGED PARTICLE RADIATION DEVICE

INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...

Detector for Use in Charged-Particle Microscopy

Particle Beam System

CHARGED PARTICLE RADIATION DEVICE

Electron Microscope

HIGH PRESSURE CHARGED PARTICLE BEAM SYSTEM

Electron Beam Apparatus

Electron microscope with an emitter operating in medium vacuum

LAYERED SCANNING CHARGED PARTICLE APPARATUS PACKAGE HAVING AN EMBED...

LAYERED SCANNING CHARGED PARTICLE MICROSCOPE WITH DIFFERENTIAL PUMP...

INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...

SCANNING TRANSMISSION ELECTRON MICROSCOPE USING GAS AMPLIFICATION

SCANNING ELECTRON MICROSCOPE

PLASMA AND ELECTRON BEAM ETCHING DEVICE AND METHOD