Optical aspects

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CPC
G01R31/31728

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/31728Optical aspects

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Photonic wafer level testing systems, devices, and methods of opera...
- Patent number 12,216,020
- Issue date Feb 4, 2025
- STMicroelectronics S.r.l.
- Marco Piazza
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus, test method, and computer-readable storage medium
- Patent number 12,130,324
- Issue date Oct 29, 2024
- Advantest Corporation
- Kotaro Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Optoelectronic chip and method for testing photonic circuits of suc...
- Patent number 12,123,910
- Issue date Oct 22, 2024
- STMicroelectronics (Crolles 2) SAS
- Patrick Le Maitre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test system for memory card
- Patent number 12,038,470
- Issue date Jul 16, 2024
- Huawei Technologies Co., Ltd.
- Weiwen Pang
- G01 - MEASURING TESTING
Information Patent Grant
Wireless sensor device and system thereof for light bulb diagnostic...
- Patent number 11,879,624
- Issue date Jan 23, 2024
- Hendrik J Volkerink
- F21 - LIGHTING
Information Patent Grant
Bi-directional coupler with termination point for a test point
- Patent number 11,802,903
- Issue date Oct 31, 2023
- ARRIS Enterprises LLC
- Zhijian Sun
- G01 - MEASURING TESTING
Information Patent Grant
Techniques for wafer level die testing using sacrificial structures
- Patent number 11,788,929
- Issue date Oct 17, 2023
- Aeva, Inc.
- Brett E. Huff
- G02 - OPTICS
Information Patent Grant
Devices, methods and sample holder for testing photonic integrated...
- Patent number 11,782,088
- Issue date Oct 10, 2023
- Carl Zeiss SMT GmbH
- Philipp Huebner
- G01 - MEASURING TESTING
Information Patent Grant
Opto electrical test measurement system for integrated photonic dev...
- Patent number 11,680,870
- Issue date Jun 20, 2023
- STMicroelectronics (Crolles 2) SAS
- Philippe Grosse
- G01 - MEASURING TESTING
Information Patent Grant
Optoelectronic chip and method for testing photonic circuits of suc...
- Patent number 11,555,852
- Issue date Jan 17, 2023
- STMicroelectronics (Crolles 2) SAS
- Patrick Le Maitre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic anti-tamper device
- Patent number 11,379,624
- Issue date Jul 5, 2022
- BLUESKYTEC LTD
- Christopher Mobley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Opto electrical test measurement system for integrated photonic dev...
- Patent number 11,187,613
- Issue date Nov 30, 2021
- STMicroelectronics (Crolles 2) SAS
- Philippe Grosse
- G01 - MEASURING TESTING
Information Patent Grant
Control method of touch display apparatus
- Patent number 11,144,198
- Issue date Oct 12, 2021
- MPI CORPORATION
- Chien-Hung Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for optical transceiver calibration and test
- Patent number 11,143,698
- Issue date Oct 12, 2021
- Juniper Networks, Inc.
- Roberto Marcoccia
- G01 - MEASURING TESTING
Information Patent Grant
Integrated laser voltage probe pad for measuring DC or low frequenc...
- Patent number 11,079,432
- Issue date Aug 3, 2021
- NXP B.V.
- Pieter Gustaaf Nierop
- G01 - MEASURING TESTING
Information Patent Grant
Display method of display apparatus
- Patent number 11,036,390
- Issue date Jun 15, 2021
- MPI CORPORATION
- Chien-Hung Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Photonic wafer level testing systems, devices, and methods of opera...
- Patent number 11,022,522
- Issue date Jun 1, 2021
- STMicroelectronics S.r.l.
- Marco Piazza
- G02 - OPTICS
Information Patent Grant
Semiconductor device inspection method and semiconductor device ins...
- Patent number 10,983,162
- Issue date Apr 20, 2021
- Hamamatsu Photonics K.K.
- Yoshitaka Iwaki
- G01 - MEASURING TESTING
Information Patent Grant
Automated scan chain diagnostics using emission
- Patent number 10,928,448
- Issue date Feb 23, 2021
- International Business Machines Corporation
- Franco Stellari
- G01 - MEASURING TESTING
Information Patent Grant
Optoelectronic chip and method for testing photonic circuits of suc...
- Patent number 10,921,370
- Issue date Feb 16, 2021
- STMicroelectronics (Crolles 2) SAS
- Patrick Le Maitre
- G01 - MEASURING TESTING
Information Patent Grant
Detecting die repeating programmed defects located in backgrounds w...
- Patent number 10,677,742
- Issue date Jun 9, 2020
- KLA-Tencor Corp.
- Dhiraj Ramesh Gawhane
- G01 - MEASURING TESTING
Information Patent Grant
Opto electrical test measurement system for integrated photonic dev...
- Patent number 10,677,684
- Issue date Jun 9, 2020
- STMicroelectronics (Crolles 2) SAS
- Philippe Grosse
- G01 - MEASURING TESTING
Information Patent Grant
Automated scan chain diagnostics using emission
- Patent number 10,591,539
- Issue date Mar 17, 2020
- International Business Machines Corporation
- Franco Stellari
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement apparatus
- Patent number 10,520,391
- Issue date Dec 31, 2019
- Industrial Technology Research Institute
- Shang-Chun Chen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for optically isolated current or voltage sensing
- Patent number 10,520,548
- Issue date Dec 31, 2019
- Toshiba America Electronic Components, Inc.
- Jurgis Astrauskas
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Optical measurement apparatus
- Patent number 10,520,392
- Issue date Dec 31, 2019
- Industrial Technology Research Institute
- Shang-Chun Chen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Automated scan chain diagnostics using emission
- Patent number 10,302,697
- Issue date May 28, 2019
- International Business Machines Corporation
- Franco Stellari
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method using the same
- Patent number 10,281,409
- Issue date May 7, 2019
- LG Display Co., Ltd.
- Jeong-Bok Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and wafer with reference circuit and related m...
- Patent number 10,274,395
- Issue date Apr 30, 2019
- STMicroelectronics S.A.
- Jean-Francois Carpentier
- G02 - OPTICS
Information Patent Grant
Compact electronics test system having user programmable device int...
- Patent number 10,247,781
- Issue date Apr 2, 2019
- The United States of America, as represented by the Secretary of the Navy
- Adam Duncan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM
- Publication number 20250012847
- Publication date Jan 9, 2025
- Advantest Corporation
- Kotaro HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
PHOTONIC WAVEGUIDE POWER AND PHASE MONITOR
- Publication number 20240385243
- Publication date Nov 21, 2024
- IMEC vzw
- Wim BOGAERTS
- G01 - MEASURING TESTING
Information Patent Application
MULTI-ORDER OPTICAL MODULATOR AND MODULATION METHOD FOR ON-CHIP OPT...
- Publication number 20240353487
- Publication date Oct 24, 2024
- SUN YAT-SEN UNIVERSITY
- Zhaohui LI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL WAFER-SCALE PHOTODIODE BANDWIDTH MEASUREMENT SYSTEM
- Publication number 20240241309
- Publication date Jul 18, 2024
- Cisco Technology, Inc.
- Attila MEKIS
- G01 - MEASURING TESTING
Information Patent Application
DEPTH DETECTOR SYSTEMS
- Publication number 20240110946
- Publication date Apr 4, 2024
- Cascade Corporation
- Mauro POGGIANI
- G01 - MEASURING TESTING
Information Patent Application
OPTOELECTRONIC CHIP AND METHOD FOR TESTING PHOTONIC CIRCUITS OF SUC...
- Publication number 20230136742
- Publication date May 4, 2023
- STMicroelectronics (Crolles 2) SAS
- Patrick Le Maitre
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE AND PROCESS FOR TESTING THE CONFIGURATION OF AN EXTERNA...
- Publication number 20230034166
- Publication date Feb 2, 2023
- Benjamin Maximus Son
- G01 - MEASURING TESTING
Information Patent Application
GENERAL DIGITAL SIGNAL PROCESSING WAVEFORM MACHINE LEARNING CONTROL...
- Publication number 20220390515
- Publication date Dec 8, 2022
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
CHIP DETECTION METHOD AND DEVICE
- Publication number 20220310186
- Publication date Sep 29, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Jianbo ZHOU
- G11 - INFORMATION STORAGE
Information Patent Application
TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM
- Publication number 20220221504
- Publication date Jul 14, 2022
- Advantest Corporation
- Kotaro HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
Test System for Memory Card
- Publication number 20220074986
- Publication date Mar 10, 2022
- Huawei Technologies Co., Ltd
- Weiwen Pang
- G01 - MEASURING TESTING
Information Patent Application
OPTO ELECTRICAL TEST MEASUREMENT SYSTEM FOR INTEGRATED PHOTONIC DEV...
- Publication number 20220050010
- Publication date Feb 17, 2022
- STMicroelectronics (Crolles 2) SAS
- Philippe Grosse
- G01 - MEASURING TESTING
Information Patent Application
BI-DIRECTIONAL COUPLER WITH TERMINATION POINT FOR A TEST POINT
- Publication number 20210341532
- Publication date Nov 4, 2021
- ARRIS Enterprises LLC
- Zhijian SUN
- G01 - MEASURING TESTING
Information Patent Application
Photonic Wafer Level Testing Systems, Devices, and Methods of Opera...
- Publication number 20210270699
- Publication date Sep 2, 2021
- STMicroelectronics S.r.l.
- Marco Piazza
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED LASER VOLTAGE PROBE PAD FOR MEASURING DC OR LOW FREQUENC...
- Publication number 20200264232
- Publication date Aug 20, 2020
- NPX B.V.
- Pieter Gustaaf Nierop
- G01 - MEASURING TESTING
Information Patent Application
OPTO ELECTRICAL TEST MEASUREMENT SYSTEM FOR INTEGRATED PHOTONIC DEV...
- Publication number 20200256759
- Publication date Aug 13, 2020
- STMicroelectronics (Crolles 2) SAS
- Philippe Grosse
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED OPTICAL INSPECTION EQUIPMENT WITH ADJUSTABLE IMAGE CAPTUR...
- Publication number 20200096455
- Publication date Mar 26, 2020
- CENZ Automation Co. Ltd.
- Chyi-Yeu Lin
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED SCAN CHAIN DIAGNOSTICS USING EMISSION
- Publication number 20200088791
- Publication date Mar 19, 2020
- International Business Machines Corporation
- Franco Stellari
- G01 - MEASURING TESTING
Information Patent Application
Photonic Wafer Level Testing Systems, Devices, and Methods of Opera...
- Publication number 20200033228
- Publication date Jan 30, 2020
- Marco Piazza
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC ANTI-TAMPER DEVICE
- Publication number 20200026888
- Publication date Jan 23, 2020
- BLUESKYTEC LTD
- Christopher MOBLEY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DISPLAY METHOD OF DISPLAY APPARATUS
- Publication number 20190361074
- Publication date Nov 28, 2019
- MPI Corporation
- Chien-Hung Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICES, METHODS AND SAMPLE HOLDER FOR TESTING PHOTONIC INTEGRATED...
- Publication number 20190339327
- Publication date Nov 7, 2019
- Carl Zeiss SMT GMBH
- Philipp Huebner
- G02 - OPTICS
Information Patent Application
DETECTING DIE REPEATING PROGRAMMED DEFECTS LOCATED IN BACKGROUNDS W...
- Publication number 20190277776
- Publication date Sep 12, 2019
- KLA-Tencor Corporation
- Dhiraj Ramesh Gawhane
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INS...
- Publication number 20190265297
- Publication date Aug 29, 2019
- Hamamatsu Photonics K.K.
- Yoshitaka IWAKI
- G01 - MEASURING TESTING
Information Patent Application
Optoelectronic Chip and Method for Testing Photonic Circuits of Suc...
- Publication number 20190250213
- Publication date Aug 15, 2019
- STMicroelectronics (Crolles 2) SAS
- Patrick Le Maitre
- G02 - OPTICS
Information Patent Application
Optoelectronic Chip and Method for Testing Photonic Circuits of Suc...
- Publication number 20190250212
- Publication date Aug 15, 2019
- STMicroelectronics (Crolles 2) SAS
- Patrick Le Maitre
- G02 - OPTICS
Information Patent Application
AUTOMATED SCAN CHAIN DIAGNOSTICS USING EMISSION
- Publication number 20190212388
- Publication date Jul 11, 2019
- International Business Machines Corporation
- Franco Stellari
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR OPTICALLY ISOLATED CURRENT OR VOLTAGE SENSING
- Publication number 20190113570
- Publication date Apr 18, 2019
- Toshiba America Electronic Components, Inc
- Jurgis ASTRAUSKAS
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
OPTO ELECTRICAL TEST MEASUREMENT SYSTEM FOR INTEGRATED PHOTONIC DEV...
- Publication number 20190113415
- Publication date Apr 18, 2019
- STMicroelectronics (Crolles 2) SAS
- Philippe Grosse
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR OPTICAL TRANSCEIVER CALIBRATION AND TEST
- Publication number 20180348294
- Publication date Dec 6, 2018
- Juniper Networks, Inc.
- Roberto Marcoccia
- G01 - MEASURING TESTING

Optical aspects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Photonic wafer level testing systems, devices, and methods of opera...

Test apparatus, test method, and computer-readable storage medium

Optoelectronic chip and method for testing photonic circuits of suc...

Test system for memory card

Wireless sensor device and system thereof for light bulb diagnostic...

Bi-directional coupler with termination point for a test point

Techniques for wafer level die testing using sacrificial structures

Devices, methods and sample holder for testing photonic integrated...

Opto electrical test measurement system for integrated photonic dev...

Optoelectronic chip and method for testing photonic circuits of suc...

Electronic anti-tamper device

Opto electrical test measurement system for integrated photonic dev...

Control method of touch display apparatus

Methods and apparatus for optical transceiver calibration and test

Integrated laser voltage probe pad for measuring DC or low frequenc...

Display method of display apparatus

Photonic wafer level testing systems, devices, and methods of opera...

Semiconductor device inspection method and semiconductor device ins...

Automated scan chain diagnostics using emission

Optoelectronic chip and method for testing photonic circuits of suc...

Detecting die repeating programmed defects located in backgrounds w...

Opto electrical test measurement system for integrated photonic dev...

Automated scan chain diagnostics using emission

Optical measurement apparatus

System and method for optically isolated current or voltage sensing

Optical measurement apparatus

Automated scan chain diagnostics using emission

Inspection apparatus and inspection method using the same

Semiconductor device and wafer with reference circuit and related m...

Compact electronics test system having user programmable device int...

Patents Applicationslast 30 patents

TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM

PHOTONIC WAVEGUIDE POWER AND PHASE MONITOR

MULTI-ORDER OPTICAL MODULATOR AND MODULATION METHOD FOR ON-CHIP OPT...

OPTICAL WAFER-SCALE PHOTODIODE BANDWIDTH MEASUREMENT SYSTEM

DEPTH DETECTOR SYSTEMS

OPTOELECTRONIC CHIP AND METHOD FOR TESTING PHOTONIC CIRCUITS OF SUC...

TEST DEVICE AND PROCESS FOR TESTING THE CONFIGURATION OF AN EXTERNA...

GENERAL DIGITAL SIGNAL PROCESSING WAVEFORM MACHINE LEARNING CONTROL...

CHIP DETECTION METHOD AND DEVICE

TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM

Test System for Memory Card

OPTO ELECTRICAL TEST MEASUREMENT SYSTEM FOR INTEGRATED PHOTONIC DEV...

BI-DIRECTIONAL COUPLER WITH TERMINATION POINT FOR A TEST POINT

Photonic Wafer Level Testing Systems, Devices, and Methods of Opera...

INTEGRATED LASER VOLTAGE PROBE PAD FOR MEASURING DC OR LOW FREQUENC...

OPTO ELECTRICAL TEST MEASUREMENT SYSTEM FOR INTEGRATED PHOTONIC DEV...

AUTOMATED OPTICAL INSPECTION EQUIPMENT WITH ADJUSTABLE IMAGE CAPTUR...

AUTOMATED SCAN CHAIN DIAGNOSTICS USING EMISSION

Photonic Wafer Level Testing Systems, Devices, and Methods of Opera...

ELECTRONIC ANTI-TAMPER DEVICE

DISPLAY METHOD OF DISPLAY APPARATUS

DEVICES, METHODS AND SAMPLE HOLDER FOR TESTING PHOTONIC INTEGRATED...

DETECTING DIE REPEATING PROGRAMMED DEFECTS LOCATED IN BACKGROUNDS W...

SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INS...

Optoelectronic Chip and Method for Testing Photonic Circuits of Suc...

Optoelectronic Chip and Method for Testing Photonic Circuits of Suc...

AUTOMATED SCAN CHAIN DIAGNOSTICS USING EMISSION

SYSTEM AND METHOD FOR OPTICALLY ISOLATED CURRENT OR VOLTAGE SENSING

OPTO ELECTRICAL TEST MEASUREMENT SYSTEM FOR INTEGRATED PHOTONIC DEV...

METHODS AND APPARATUS FOR OPTICAL TRANSCEIVER CALIBRATION AND TEST